Apparatus and method for inspecting of electrode assembly

Abstract

An inspection apparatus and method for an electrode assembly are disclosed. An inspection apparatus for an electrode assembly according to one aspect of the present invention includes at least one displacement sensor for scanning an end of an electrode assembly, and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and anode plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scanning of the displacement sensor.

Description

Technology Field

[0001] The present disclosure relates to an inspection apparatus and method for an electrode assembly capable of inspecting miss winding in a jelly-roll type electrode assembly. Background Technology

[0003] Unlike primary batteries, secondary batteries can undergo repeated charging and discharging and generally include an electrode assembly, a case housing the electrode assembly, and a cap assembly sealing the opening of the case.

[0004] For example, an electrode assembly is formed by laminating positive and negative plates on opposite sides with a separator in between, or by winding them into a jelly roll shape. The separator prevents short circuits between the positive and negative plates while enabling the movement of electrolyte or ions.

[0005] In a jellyroll-type electrode assembly, the positive and negative plates, i.e., the electrode plates, are inserted into the insertion groove of a mandrel via a separator and wound onto the outer surface of a rotating mandrel while guided by a transfer roll. During the transfer process, the electrode plates and the separator come into contact with the transfer roll.

[0006] At this time, the contact position between the transfer roll and the electrode plate and the contact position between the transfer roll and the separator are not constant, and as a result, the electrode plate and the separator proceed in a state where they are obliquely wound with respect to the transfer roll, so that they can finally be obliquely wound onto the mandrel.

[0007] Therefore, when cutting after winding, the cutting lines of the electrode plates and separators become non-uniform in the width direction. This results in non-uniformity on the sides of the wound electrode assembly. Specifically, the depths of the electrode plate ends and the separator ends become non-uniform, which may cause short circuits at the ends of the electrode plates.

[0008] Accordingly, it is necessary to measure the depth of each end of the cathode plate, separator, and anode plate of the electrode assembly to check whether it is crooked.

[0009] However, the electrode assembly has a large difference in aspect ratio due to the different depths (heights) of the cathode plate, separator, and anode plate. For example, the aspect ratio of the electrode assembly can be 20:1 to 50:1. Due to the large difference in aspect ratio, the electrode assembly is in the shape of a narrow and deep well, making it difficult for light to enter and difficult for the light that enters to be reflected out, which causes a problem in measuring the height of each end.

[0010] In addition, while the separator of the electrode assembly has good reflectivity, the cathode plate and the anode plate have low reflectivity, so there is a problem in that it is difficult to measure the depth (height) of the ends of the cathode plate and the anode plate. That is, since the cathode plate and the anode plate have low reflectivity, light is not specularly reflected but diffusely reflected, so there is a problem in that it is difficult to measure the depth (height) of the ends of the cathode plate and the anode plate. In addition, if the separator is tilted, it becomes difficult for light to be incident and reflected, so there is a problem in that it is difficult to measure the height of the ends of the separator.

[0011] The background technology of the present invention is disclosed in Korean Registered Patent Publication No. 10-2217201 (February 18, 2021). The problem to be solved

[0013] The purpose of the present invention is to provide an inspection device and method for an electrode assembly that can inspect for miss winding in a jelly-roll type electrode assembly.

[0014] However, the technical problems that the present invention aims to solve are not limited to those described above, and other unmentioned problems can be clearly understood by those skilled in the art from the description of the invention below. means of solving the problem

[0016] An inspection device for an electrode assembly according to an embodiment of the present invention for solving the above technical problem comprises at least one displacement sensor that scans the end of an electrode assembly, and a control unit that controls the movement of the displacement sensor and calculates the relative depth for each end of the negative plate, separator, and positive plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scan of the displacement sensor.

[0017] The present invention may further include a driving unit for adjusting the height and position of the displacement sensor according to the control of the control unit.

[0018] In the present invention, the displacement sensor may be a spectroscopic interference displacement sensor.

[0019] In the present invention, when the spectroscopic interference displacement sensor is composed of a single spectroscopic interference displacement sensor, the spectroscopic interference displacement sensor can generate first depth dispersion data for the cathode plate end and the separator end by scanning the electrode assembly end in a first direction at a position spaced a first distance from the electrode assembly end, and generate second depth dispersion data for the cathode plate end and the anode plate end by scanning the electrode assembly end in a second direction opposite to the first direction at a position spaced a second distance from the first distance, which represents a position lowered in the direction of the electrode assembly by a preset offset.

[0020] In the present invention, when the spectroscopic interference displacement sensor is composed of a first spectroscopic interference displacement sensor and a second spectroscopic interference displacement sensor, the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor are arranged in a joined manner and connected through a head portion to simultaneously scan the end of the electrode assembly, wherein the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor can scan the end of the electrode assembly with a height difference equal to a preset offset.

[0021] In the present invention, when the spectroscopic interference displacement sensor is composed of a first spectroscopic interference displacement sensor and a second spectroscopic interference displacement sensor, the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor are arranged at a certain distance apart in the scanning direction and are connected through a head part to simultaneously scan the end of the electrode assembly, wherein the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor can scan the end of the electrode assembly with a height difference equal to a preset offset.

[0022] In the present invention, when the spectroscopic interference displacement sensor is composed of a first spectroscopic interference displacement sensor and a second spectroscopic interference displacement sensor, the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor are arranged at a certain distance apart in a direction perpendicular to the scanning direction and are connected through a head portion to simultaneously scan the end of the electrode assembly, wherein the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor can scan the end of the electrode assembly with a height difference equal to a preset offset.

[0023] In the present invention, the depth dispersion data of the electrode assembly end may include first depth dispersion data for the cathode plate end and the separator end, and second depth dispersion data for the cathode plate end and the anode plate end.

[0024] In the present invention, the control unit can align the first depth dispersion data and the second depth dispersion data by correcting the first depth dispersion data or the second depth dispersion data by a preset offset, and obtain the depth of the negative plate end and the depth of the positive plate end based on the separator from the aligned first depth dispersion data and the second depth dispersion data.

[0025] In the present invention, the offset may represent the height difference of the displacement sensor when measuring the first depth dispersion data and when measuring the second depth dispersion data.

[0026] In the present invention, the control unit can determine whether the electrode assembly is normal by using at least one of the depth of the negative electrode end, the depth of the separator end, and the depth of the positive electrode end.

[0027] In the present invention, the control unit calculates at least one of the average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end, and compares at least one of the calculated average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end with a preset reference value to determine whether the electrode assembly is normal.

[0028] In the present invention, the control unit can generate a depth pattern of each end using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, and determine whether the electrode assembly is normal by comparing the generated depth pattern of each end with a predefined reference pattern.

[0030] A method for inspecting an electrode assembly according to another embodiment of the present invention for solving the above technical problem may include the step of a control unit receiving depth dispersion data for an end of an electrode assembly from at least one displacement sensor, and the step of the control unit determining whether the electrode assembly is normal based on the depth dispersion data.

[0031] In the present invention, the depth dispersion data may include first depth dispersion data for the cathode plate end and the separator end, and second depth dispersion data for the cathode plate end and the anode plate end.

[0032] In the present invention, the step of determining whether the electrode assembly is normal may include: the control unit aligning the first depth dispersion data and the second depth dispersion data by correcting the first depth dispersion data or the second depth dispersion data by a preset offset; the control unit obtaining the depth of the negative electrode end and the depth of the positive electrode end based on the separator in the first depth dispersion data and the second depth dispersion data that have been aligned; and the control unit determining whether the electrode assembly is normal using at least one of the depth of the negative electrode end, the depth of the separator end, and the depth of the positive electrode end.

[0033] In the present invention, the offset may represent the height difference of the displacement sensor when measuring the first depth dispersion data and when measuring the second depth dispersion data.

[0034] The present invention, in the step of determining whether the electrode assembly is normal using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, wherein the control unit,

[0035] At least one of the average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end is calculated, and at least one of the calculated average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end is compared with a preset reference value to determine whether the electrode assembly is normal.

[0036] The present invention, in the step of determining whether the electrode assembly is normal using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, the control unit generates a depth pattern of each end using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, and compares the generated depth pattern of each end with a predefined reference pattern to determine whether the electrode assembly is normal. Effects of the invention

[0038] According to the present invention, by scanning the end of an electrode assembly using a spectroscopic interference displacement sensor, depth dispersion data of the end of a deep and narrow jellyroll-shaped electrode assembly can be measured more accurately, thereby having the effect of preventing defects and fires in the electrode assembly in advance.

[0039] According to the present invention, by scanning the end of the electrode assembly once or scanning the end of the electrode assembly twice depending on the arrangement of the spectroscopic interference displacement sensor, and measuring the depth of each end of the cathode plate, separator, and anode plate, there is an effect of being able to inspect the degree of comb winding of the electrode assembly more accurately.

[0040] However, the effects obtainable through the present invention are not limited to those described above, and other unmentioned technical effects will be clearly understood by those skilled in the art from the description of the invention below. Brief explanation of the drawing

[0042] FIG. 1 is a perspective view of an electrode assembly winding system according to one embodiment of the present invention. FIG. 2 is a block diagram schematically showing the configuration of an inspection device for an electrode assembly according to one embodiment of the present invention. FIG. 3 is a cross-sectional view taken along line V-V of an electrode assembly according to one embodiment of the present invention. FIG. 4 is an illustrative diagram for explaining the operation of a displacement sensor according to one embodiment of the present invention. FIG. 5 is an illustrative diagram for explaining a method of scanning an electrode assembly using a single spectroscopic interference displacement sensor according to an embodiment of the present invention. FIG. 6 is an illustrative diagram for explaining a scanning method of an electrode assembly using two spectroscopic interference displacement sensors according to an embodiment of the present invention. FIG. 7 is an illustrative diagram for explaining depth dispersion data according to one embodiment of the present invention. FIG. 8 is an exemplary diagram illustrating a method for measuring first depth dispersion data and second depth dispersion data using a spectroscopic interference displacement sensor according to one embodiment of the present invention. FIG. 9 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using two spectroscopic interference displacement sensors according to another embodiment of the present invention. FIG. 10 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using two spectroscopic interference displacement sensors according to another embodiment of the present invention. FIG. 11 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using two spectroscopic interference displacement sensors according to another embodiment of the present invention. FIG. 12 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using a line laser sensor and a spectroscopic interference displacement sensor according to another embodiment of the present invention. Specific details for implementing the invention

[0043] Preferred embodiments of the present invention will be described in detail below with reference to the attached drawings. Prior to this, terms and words used in this specification and claims should not be interpreted as being limited to their ordinary or dictionary meanings. Instead, based on the principle that the inventor may appropriately define the concepts of terms to best describe his invention, they should be interpreted in a meaning and concept consistent with the technical spirit of the present invention. Therefore, it should be understood that the embodiments described in this specification and the configurations illustrated in the drawings are merely some of the most preferred embodiments of the present invention and do not represent all of the technical spirit of the present invention; thus, various equivalents and modifications that can replace them may exist at the time of filing this application. Furthermore, as used in this specification, "comprise" or "include" and / or "comprising" or "including" specify the presence of the mentioned features, numbers, steps, actions, parts, elements, and / or groups thereof, and do not exclude the presence or addition of one or more other features, numbers, actions, parts, elements, and / or groups. In addition, when describing embodiments of the present invention, "may" and "may be" may include "one or more embodiments of the present invention."

[0044] Additionally, to aid in understanding the invention, the attached drawings are not drawn to actual scale, and the dimensions of some components may be exaggerated. Furthermore, the same reference numerals may be assigned to identical components in different embodiments.

[0045] The statement that two subjects of comparison are 'identical' means that they are 'substantially identical.' Therefore, substantial identity may include deviations considered low in the industry, for example, deviations within 5%. Additionally, the statement that a parameter is uniform in a given area may mean that it is uniform from an average perspective.

[0046] Although terms such as "first," "second," etc., are used to describe various components, it goes without saying that these components are not limited by these terms. These terms are used merely to distinguish one component from another, and unless specifically stated otherwise, the first component may also be the second component.

[0047] Throughout the specification, unless specifically stated otherwise, each component may be singular or plural.

[0048] The fact that any configuration is placed on the "upper (or lower)" of a component or on the "upper (or lower)" of a component may mean not only that any configuration is placed in contact with the upper (or lower) surface of said component, but also that another configuration may be interposed between said component and any configuration placed on (or below) said component.

[0049] Furthermore, where it is stated that one component is "connected," "coupled," or "connected" to another component, it should be understood that while said components may be directly connected or connected to each other, another component may be "interposed" between each component, or that each component may be "connected," "coupled," or "connected" through another component. Additionally, when it is stated that a part is electrically coupled with another part, this includes not only cases where they are directly connected but also cases where they are connected with another component in between.

[0050] Throughout the specification, "A and / or B" means A, B, or A and B unless specifically stated otherwise. That is, "and / or" includes any combination or any combination of the enumerated items. "C to D" means C or more and D or less, unless specifically stated otherwise.

[0052] FIG. 1 is a perspective view of an electrode assembly winding system according to one embodiment of the present invention.

[0053] Referring to FIG. 1, an electrode assembly winding system according to one embodiment of the present invention includes a winder (100) for winding electrode plates (11, 12) and a separator (21) that form an electrode assembly (10), and an inspection device (200) for measuring the depth dispersion of each end of the electrode plates (11, 12) and the separator (21) in the wound state.

[0054] The winder (100) is formed to produce an electrode assembly (10) by winding a first electrode plate (11), a second electrode plate (12), and a separator (21). For example, the winder (100) may include first, second, third, and fourth supply rolls (R11, R12, R13, R14), first, second, third, and fourth transfer rolls (R21, R22, R23, R24), a nip roll (R5), and a mandrel (M).

[0055] The first and second supply rolls (R11, R12) each supply the first and second electrode plates (11, 12) in the shape of a wound strip. The third and fourth supply rolls (R13, R14) can each supply the separator (21) in the shape of a wound strip.

[0056] The first and second transfer rolls (R21, R22) can support the first and second electrode plates (11, 12) supplied from the first and second supply rolls (R11, R12) and transfer them to the nip roll (R5). The third and fourth transfer rolls (R23, R24) can support the separator (21) supplied from the third and fourth supply rolls (R13, R14) and transfer it to the nip roll (R5).

[0057] Additionally, the first and fourth transfer rolls (R21, R24) can transport the separator (21) and the second electrode plate (12) together, which are transported from the third and second transfer rolls (R23, R22). The first, second, third, and fourth transfer rolls (R21, R22, R23, R24) are each provided in multiple numbers to transport the first and second electrode plates (11, 12) and the separator (21) in various states.

[0058] For example, the first electrode plate (11) can form a negative electrode in the electrode assembly (10), in which case it can be formed of a thin copper sheet. The second electrode plate (12) can form a positive electrode in the electrode assembly (10), in which case it can be formed of a thin aluminum sheet.

[0059] A pair of nip rolls (R5) are arranged on one side (e.g., downward) of the first, second, third, and fourth transfer rolls (R21, R22, R23, R24). The nip rolls (R5) can gather the first and second electrode plates (11, 12) and the separator (21) passing through the first, second, third, and fourth transfer rolls (R21, R22, R23, R24) in one place and guide the transfer by stacking them in the order of the first electrode plate (11), the separator (21), and the second electrode plate (12).

[0060] In the first electrode plate (11), separator (21), and second electrode plate (12) guided by the nip roll (R5), each end can be inserted into a cross groove (not shown) formed in the center of the mandrel (M) and connected to the mandrel (M). In this state, the mandrel (M) can rotate and wind the first electrode plate (11), separator (21), and second electrode plate (12) into a jelly roll state on its outer surface.

[0061] After winding, the first electrode plate (11), the separator (21), and the second electrode plate (12) are cut, and by attaching a fixing tape (not shown) to the cutting line, the electrode assembly (10) can be maintained in a jelly roll state without unraveling.

[0062] The jelly roll-shaped electrode assembly (10) can form a stacked structure of first and second electrode plates (11, 12) with a separator (21) in between.

[0063] Meanwhile, the electrode assembly (10) may form the depths of the ends of the first electrode plate (11), the separator (21), and the second electrode plate (12) differently depending on various factors such as the mechanical configuration and winding conditions of the winder (100). If this depth deviates from the set range, the electrode assembly (10) may be determined to be defective.

[0064] Therefore, it is necessary to measure the depth of each end of the first electrode plate (11), the separator (21), and the second electrode plate (12).

[0065] Accordingly, the inspection device (200) may be formed to measure the depth (height) (hereinafter referred to as "depth" for convenience) of each end of the first electrode plate (11), the separator (21), and the second electrode plate (12) in the electrode assembly (10) separated from the mandrel (M), and to calculate the depth dispersion of the ends from the measurement data to determine the quality of the electrode assembly (10).

[0066] Conventionally, an inspection device (200) was formed using a laser optical inspection device such as a line laser or a line confocal, and the depth of the end of the first electrode plate (11), the end of the separator (21), and the end of the second electrode plate (120) was measured using the laser optical inspection device.

[0067] However, when using a line laser, there is the inconvenience of having to align the electrode assembly (10) in the direction of the laser for measurement, and there is a problem in that the signal from the positive plate (12) part is weak, so the depth of the positive plate (12) end cannot be properly measured.

[0068] In addition, when using a line confocal, there is a problem in that only the depth of the end of the separator (21) is measured, and the depth of the end of the anode plate (12) and the cathode plate (11) is not properly measured.

[0069] As such, the laser optical inspection device had limitations in inspecting the electrode assembly (10) which was deep and narrow, and thus could not obtain accurate depth dispersion data.

[0070] Accordingly, the present invention aims to provide an inspection device (200) that can obtain accurate depth dispersion data even when inspecting a deep and narrow electrode assembly (10).

[0071] For convenience of explanation, the first electrode plate will be referred to as the negative electrode plate (11) and the second electrode plate as the positive electrode plate (12).

[0073] FIG. 2 is a block diagram schematically showing the configuration of an inspection device for an electrode assembly according to an embodiment of the present invention; FIG. 3 is a cross-sectional view taken along line V-V of an electrode assembly according to an embodiment of the present invention; FIG. 4 is an illustrative diagram for explaining the operation of a displacement sensor according to an embodiment of the present invention; FIG. 5 is an illustrative diagram for explaining a method of scanning an electrode assembly using one spectroscopic interference displacement sensor according to an embodiment of the present invention; FIG. 6 is an illustrative diagram for explaining a method of scanning an electrode assembly using two spectroscopic interference displacement sensors according to an embodiment of the present invention; and FIG. 7 is an illustrative diagram for explaining depth dispersion data according to an embodiment of the present invention.

[0074] Referring to FIG. 2, an inspection device (200) of an electrode assembly according to one embodiment of the present invention includes at least one displacement sensor (210), a driving unit (220), and a control unit (230).

[0075] The displacement sensor (210) can be positioned to face the end of the electrode assembly (10).

[0076] The displacement sensor (210) can scan the ends of the electrode assembly (10) to measure the depth of each end of the negative plate (11), the separator (21), and the positive plate (12).

[0077] The electrode assembly (10) wound from the winder (100) may have a structure in which a negative plate (11) and a positive plate (12) are stacked with a separator (21) in between, as shown in FIG. 3. Accordingly, the displacement sensor (210) can scan the ends of the electrode assembly (10) as shown in FIG. 4 to measure the depth of each end of the negative plate (11), the separator (21), and the positive plate (12).

[0078] The displacement sensor (210) measures the distance to each end using a laser and measures the depth of each end, and can be implemented as a spectroscopic interference displacement sensor (210).

[0079] The spectroscopic interference displacement sensor (210) is a sensor that measures distance by irradiating a laser spot, and can obtain accurate depth measurement data when inspecting deep and narrow-shaped products.

[0080] However, the spectroscopic interference displacement sensor (210) has a measurement range of 1 to 2 mm, so it can measure the depth of the separator (21) and the cathode plate (11) with an end depth of less than 2 mm, but it cannot measure the depth of the anode plate (12) with an end depth of 2 mm or more (e.g., 3 mm).

[0081] Therefore, a technology is required to measure the depths of each of the cathode plate end (11a), separator end (21a), and anode plate end (12a) using a spectroscopic interference displacement sensor (210) with a limited measurement range.

[0082] Accordingly, in an embodiment of the present invention, the electrode assembly end is scanned once or the electrode assembly end is scanned twice depending on the arrangement of the spectroscopic interference displacement sensor (210) so that the depth of each end of the negative plate (11), separator (21), and positive plate (12) can be measured.

[0083] For example, when using a single spectroscopic interference displacement sensor (210), the spectroscopic interference displacement sensor (210) scans the electrode assembly end twice to measure the depth of each end of the cathode plate (11), separator (21), and anode plate (12). That is, when measuring the depth of each end of the electrode assembly using a single spectroscopic interference displacement sensor (210), the spectroscopic interference displacement sensor (210) scans the electrode assembly end in a first direction at a position spaced apart by a first distance from the electrode assembly end as shown in FIG. 5, and scans the electrode assembly end in a second direction opposite to the first direction at a position spaced apart by a second distance representing a position lowered in the direction of the electrode assembly (Z-axis) by a preset offset from the first distance, thereby enabling the measurement of the depth of each end of the cathode plate (11), separator (21), and anode plate (12).

[0084] Additionally, when the spectroscopic interference displacement sensor (210) is composed of a first spectroscopic interference displacement sensor (210a) and a second spectroscopic interference displacement sensor (210b), the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are positioned with a height difference equal to a preset offset as shown in FIG. 6 and can be connected through a head portion (215). Accordingly, the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can simultaneously scan the electrode assembly end once to measure the depth of each end of the negative plate (11), separator (21), and positive plate (12). That is, the first spectroscopic interference displacement sensor (210a) can scan the end of the electrode assembly in the first direction at a position spaced apart by a first distance from the end of the electrode assembly, and the second spectroscopic interference displacement sensor (210b) can scan the end of the electrode assembly in the first direction at a position spaced apart by a second distance, which represents a position lowered in the direction of the electrode assembly (Z-axis) by an offset from the first distance.

[0085] The spectroscopic interference displacement sensor (210) can generate first depth dispersion data by scanning the electrode assembly end at a position spaced apart from the electrode assembly end by a first distance and measuring the depth of each end. At this time, the spectroscopic interference displacement sensor (210) can measure the depth of the separator (21) and the cathode plate (11) with an end depth of less than 2 mm, but cannot measure the depth of the anode plate (12) with a depth of 2 mm or more. Therefore, the first depth dispersion data may include data on the depth of the separator end (21a) and the cathode plate end (11a).

[0086] The spectroscopic interference displacement sensor (210) can generate second depth dispersion data by scanning the electrode assembly end at a position separated by a second distance, which represents a position lowered in the direction of the electrode assembly (Z-axis) by a preset offset from the first distance, and measuring the depth of each end. At this time, since the spectroscopic interference displacement sensor (210) is closer to the electrode assembly by an offset from the first distance, it can measure the depth of the positive plate (12) and the negative plate (11) with a depth of 2 mm or more, but it may not be able to accurately measure the depth of the separator (21). Therefore, the second depth dispersion data may include data regarding the depth of the negative plate end (11a) and the positive plate end (12a). The second depth dispersion data may be data measured by the spectroscopic interference displacement sensor (210) lowering in the direction of the electrode assembly by an offset compared to when the first depth dispersion data was measured.

[0087] As described above, depending on the arrangement of the spectroscopic interference displacement sensor (210), the electrode assembly end can be scanned once or the electrode assembly end can be scanned twice to measure the depth of each end of the cathode plate (11), separator (21), and anode plate (12).

[0088] A detailed description of the scanning method according to the arrangement of the spectroscopic interference displacement sensor (210) will be made by referring to FIGS. 8 to 13.

[0089] The driving unit (220) can adjust the height and position of the displacement sensor (210) according to the control of the control unit (230) and move the displacement sensor (210) according to the scan direction.

[0090] The driving unit (220) can be implemented, for example, by a motor. Since the driving unit (220) can utilize known technology, a detailed description thereof is omitted.

[0091] The control unit (230) controls the movement of the displacement sensor (210) and can calculate the relative depth for each end of the negative plate (11), separator (21), and positive plate (12) of the electrode assembly (10) based on depth dispersion data measured according to the scan of the displacement sensor (210). Here, the depth dispersion data may include first depth dispersion data for the negative plate end (11a) and the separator end (21a), and second depth dispersion data for the negative plate end (11a) and the positive plate end (12a).

[0092] Hereinafter, the operation of the control unit (230) will be described in detail.

[0093] The control unit (230) can set a scan trigger for the measurement time (period, interval) of the displacement sensor (210). For example, the control unit (230) can set a scan trigger to measure the depth of each end of the electrode assembly at intervals of 1 μm.

[0094] When the scan trigger is set, the displacement sensor (210) can measure the depth of each end of the electrode assembly at a measurement time (period, interval) while moving in the scan direction by the driving unit (220). That is, the displacement sensor (210) can measure the depth of each end of the electrode assembly (10) by irradiating a laser beam onto the electrode assembly (10) at the measurement time.

[0095] The control unit (230) can receive first depth dispersion data and second depth dispersion data from the displacement sensor (210).

[0096] Since the second depth dispersion data is data measured by the spectral interference displacement sensor (210) descending in the direction of the electrode assembly (10) by an offset compared to when the first depth dispersion data is measured, it is necessary to align the first depth dispersion data and the second depth dispersion data.

[0097] Accordingly, the control unit (230) can align the first depth dispersion data and the second depth dispersion data by correcting the first depth dispersion data or the second depth dispersion data by an offset.

[0098] For example, the control unit (230) can align the first depth dispersion data and the second depth dispersion data by performing a correction that increases (raises) the second depth dispersion data by an offset.

[0099] When the first depth dispersion data and the second depth dispersion data are aligned, the control unit (230) can obtain depth dispersion data as illustrated in FIG. 7. Referring to FIG. 7, when the first depth dispersion data and the second depth dispersion data are aligned, it can be seen that the depth of the negative plate end (11a) in the first depth dispersion data and the depth of the negative plate end (11a) in the second depth dispersion data are similar (or identical). It can be seen that the depth of the positive plate end (12a) maintains the deepest level, the depth of the negative plate end (11a) maintains the intermediate level, and the depth of the separator end (21a) maintains the lowest level.

[0100] Since the electrode assembly (10) is wound in the order of a separator (21), a negative plate (11), a separator (21), and a positive plate (12), the control unit (230) can obtain the depth of the negative plate end (11a) and the relative depth of the positive plate end (12a) based on the separator (21).

[0101] In the first depth dispersion data and the second depth dispersion data that are aligned, the depths of each end may be repeatedly displayed (included) in the order of the separator (21), the cathode plate (11), the separator (21), and the anode plate (12) according to the winding order of the electrode assembly (10). Accordingly, the control unit (230) can calculate the average depth for each using the depths of the multiple cathode plate ends (11a), the depths of the multiple separator ends (21a), and the depths of the multiple anode plate ends (12a).

[0102] When the average depth of the negative electrode end (11a), the average depth of the separator end (21a), and the average depth of the positive electrode end (12a) are calculated, the control unit (230) can determine whether the electrode assembly (10) is normal by comparing the average depth of each end with a preset reference value.

[0103] The control unit (230) compares the average depth of the negative plate end (11a) with the reference depth of the negative plate end (11a), and if the average depth of the negative plate end (11a) differs from the reference depth by more than the error range, it can determine that the negative plate (11) is crooked. If the average depth of the negative plate end (11a) differs from the reference depth by less than the error range, the control unit (230) can determine that the negative plate (11) is normal.

[0104] The control unit (230) compares the average depth of the membrane end (21a) with the reference depth of the membrane end (21a), and if the average depth of the membrane end (21a) differs from the reference depth by more than the error range, it can determine that the membrane (21) is crooked. If the average depth of the membrane end (21a) differs from the reference depth by less than the error range, the control unit (230) can determine that the membrane (21) is normal.

[0105] The control unit (230) compares the average depth of the positive plate end (12a) with the reference depth of the separator end (21a), and if the average depth of the positive plate end (12a) differs from the reference depth by more than the error range, it can determine that the positive plate (12) is crooked. If the average depth of the positive plate end (12a) differs from the reference depth by less than the error range, the control unit (230) can determine that the positive plate (12) is normal.

[0106] According to another embodiment of the present invention, the control unit (230) may determine whether the electrode assembly (10) is normal by comparing the depth pattern of each end with a predefined reference pattern.

[0107] The control unit (230) compares the depth pattern of the negative plate end (11a) with the reference pattern of the negative plate end (11a), and if the depth pattern of the negative plate end (11a) differs from the reference pattern by more than the error range, it can determine that the negative plate (11) is crooked. If the depth pattern of the negative plate end (11a) differs from the reference pattern by less than the error range, the control unit (230) can determine that the negative plate (11) is normal.

[0108] The control unit (230) compares the depth pattern of the membrane end (21a) with the reference pattern of the membrane end (21a), and if the depth pattern of the membrane end (21a) differs from the reference pattern by more than the error range, it can determine that the membrane (21) is crooked. If the depth pattern of the membrane end (21a) differs from the reference pattern by less than the error range, the control unit (230) can determine that the membrane (21) is normal.

[0109] The control unit (230) compares the depth pattern of the positive plate end (12a) with the reference pattern of the positive plate end (12a), and if the depth pattern of the positive plate end (12a) differs from the reference pattern by more than the error range, it can determine that the positive plate (12) is crooked. If the depth pattern of the positive plate end (12a) differs from the reference pattern by less than the error range, the control unit (230) can determine that the positive plate (12) is normal.

[0110] The control unit (230) is the entity that controls the operation of the displacement sensor (210) and the driving unit (220), and can be implemented as a central processing unit (CPU), a system on chip (SoC), a processor, or a programmable logic controller (PLC). It can control multiple hardware or software components connected to the control unit (230) by running an operating system or application, and can perform various data processing and calculations. The control unit (230) can be configured to execute at least one command stored in memory (not shown) and to store the execution result data in memory.

[0112] FIG. 8 is an exemplary diagram illustrating a method for measuring first depth dispersion data and second depth dispersion data using a spectroscopic interference displacement sensor (210) according to one embodiment of the present invention.

[0113] Referring to FIG. 8, the spectroscopic interference displacement sensor (210) can generate first depth dispersion data by scanning the end of the electrode assembly (10) in a first direction at a position spaced apart by a first distance from the end of the electrode assembly (10) (①), and can generate second depth dispersion data by scanning the end of the electrode assembly (10) in a second direction opposite to the first direction at a position spaced apart by a second distance (②) representing a position lowered in the direction of the electrode assembly (10) (Z-axis) by an offset from the first distance (③).

[0114] To this end, the control unit (230) can control the driving unit (220) so that the spectroscopic interference displacement sensor (210) is separated from the end by a first distance in the longitudinal direction (Z-axis direction) of the electrode assembly (10). The driving unit (220) can adjust the position so that the spectroscopic interference displacement sensor (210) is separated by the first distance. When the spectroscopic interference displacement sensor (210) is separated from the electrode assembly (10) by the first distance, the spectroscopic interference displacement sensor (210) can measure the depth of each end of the electrode assembly (10) at a measurement time (period, interval) while moving in a first direction based on a scan trigger set by the control unit (230). Through this, the spectroscopic interference displacement sensor (210) can generate first depth dispersion data.

[0115] When the depth measurement of each end of the electrode assembly (10) in the first direction is completed, the control unit (230) controls the driving unit (220) to move (down) the spectroscopic interference displacement sensor (210) in the direction of the electrode assembly (10) by a preset offset from the first distance, thereby adjusting the position so that it is separated by a second distance.

[0116] When the spectroscopic interference displacement sensor (210) is separated from the electrode assembly (10) by a second distance, the spectroscopic interference displacement sensor (210) can measure the depth of each end of the electrode assembly (10) at a measurement time (period, interval) while moving in a second direction opposite to the first direction based on a scan trigger set by the control unit (230). Through this, the spectroscopic interference displacement sensor (210) can generate second depth dispersion data.

[0118] FIG. 9 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using two spectroscopic interference displacement sensors according to another embodiment of the present invention.

[0119] Referring to FIG. 9, the spectroscopic interference displacement sensor (210) includes a first spectroscopic interference displacement sensor (210a) and a second spectroscopic interference displacement sensor (210b), and the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can be joined together. In this case, the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are connected through a head portion (215) so that the end of the electrode assembly (10) can be scanned simultaneously once. At this time, the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can scan the end of the electrode assembly (10) with a height difference equal to a preset offset.

[0120] Specifically, the first spectroscopic interference displacement sensor (210a) can generate first depth dispersion data by scanning the end of the electrode assembly in a first direction at a position spaced apart by a first distance from the end of the electrode assembly, and the second spectroscopic interference displacement sensor (210b) can generate second depth dispersion data by scanning the end of the electrode assembly in a first direction at a position spaced apart by a second distance, which represents a position lowered in the direction of the electrode assembly (Z-axis) by an offset from the first distance. At this time, since the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are connected through the head portion (215), the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can simultaneously scan the end of the electrode assembly (10) in a first direction to generate first depth dispersion data and second depth dispersion data.

[0121] The control unit (230) can control the driving unit (220) so that the first spectroscopic interference displacement sensor (210a) is separated by a first distance from the end of the electrode assembly, and can control the driving unit (220) so that the second spectroscopic interference displacement sensor (210b) is separated by a second distance that is moved (down) in the direction of the electrode assembly by an offset from the first distance.

[0123] FIG. 10 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using two spectroscopic interference displacement sensors according to another embodiment of the present invention.

[0124] Referring to FIG. 10, the spectroscopic interference displacement sensor (210) includes a first spectroscopic interference displacement sensor (210a) and a second spectroscopic interference displacement sensor (210b), and the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) may be spaced apart by a certain distance in the scanning direction (diameter direction of the electrode assembly end).

[0125] The first spectroscopic interference displacement sensor (210a) may be positioned at the outer edge of the electrode assembly end, and the second spectroscopic interference displacement sensor (210b) may be positioned at the center of the electrode assembly end. At this time, the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) may be connected and supported through the head portion (215).

[0126] Since the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are connected through the head portion (215), the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can scan once simultaneously. At this time, the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can scan the end of the electrode assembly (10) with a height difference equal to a preset offset.

[0127] Specifically, the first spectroscopic interference displacement sensor (210a) can generate first depth dispersion data by scanning the end of the electrode assembly in a first direction at a position spaced a first distance from the end of the electrode assembly, and the second spectroscopic interference displacement sensor (210b) can generate second depth dispersion data by scanning the end of the electrode assembly in a first direction at a position spaced a second distance, which is a position lowered in the direction of the electrode assembly (Z-axis) by an offset from the first distance. That is, the first spectroscopic interference displacement sensor (210a) can generate first depth dispersion data by scanning from the outer edge to the center of the end of the electrode assembly in a first direction, and the second spectroscopic interference displacement sensor (210b) can generate second dispersion data by scanning from the center to the outer edge of the end of the electrode assembly in a first direction. At this time, since the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are connected through the head portion (215), the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can simultaneously scan the end of the electrode assembly (10) in the first direction to generate first depth dispersion data and second depth dispersion data.

[0128] The control unit (230) can control the driving unit (220) so that the first spectroscopic interference displacement sensor (210a) is separated by a first distance from the end of the electrode assembly, and can control the driving unit (220) so that the second spectroscopic interference displacement sensor (210b) is separated by a second distance that is moved (down) in the direction of the electrode assembly by an offset from the first distance.

[0130] FIG. 11 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using two spectroscopic interference displacement sensors according to another embodiment of the present invention.

[0131] Referring to FIG. 11, the spectroscopic interference displacement sensor (210) includes a first spectroscopic interference displacement sensor (210a) and a second spectroscopic interference displacement sensor (210b), and the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) may be spaced apart by a certain distance in a vertical direction of the scan direction.

[0132] The first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can be connected and supported through the head portion (215). Since the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are connected through the head portion (215), the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can simultaneously scan the end of the electrode assembly once. At this time, the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can scan the end of the electrode assembly (10) with a height difference equal to a preset offset.

[0133] Specifically, the first spectroscopic interference displacement sensor (210a) can generate first depth dispersion data by scanning the end of the electrode assembly in a first direction at a position spaced apart by a first distance from the end of the electrode assembly, and the second spectroscopic interference displacement sensor (210b) can generate second depth dispersion data by scanning the end of the electrode assembly in a first direction at a position spaced apart by a second distance, which represents a position lowered in the direction of the electrode assembly (Z-axis) by an offset from the first distance. At this time, since the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) are connected through the head portion (215), the first spectroscopic interference displacement sensor (210a) and the second spectroscopic interference displacement sensor (210b) can simultaneously scan the end of the electrode assembly (10) in a first direction to generate first depth dispersion data and second depth dispersion data.

[0134] The control unit (230) can control the driving unit (220) so that the first spectroscopic interference displacement sensor (210a) is separated by a first distance from the end of the electrode assembly, and can control the driving unit (220) so that the second spectroscopic interference displacement sensor (210b) is separated by a second distance that is moved (down) in the direction of the electrode assembly by an offset from the first distance.

[0136] FIG. 12 is an illustrative diagram for explaining a method of measuring first depth dispersion data and second depth dispersion data using a line laser sensor and a spectroscopic interference displacement sensor according to another embodiment of the present invention.

[0137] Referring to FIG. 12, a line laser sensor can generate first depth dispersion data by scanning the end of the electrode assembly at a position spaced apart by a first distance from the end of the electrode assembly, and a spectroscopic interference displacement sensor (210) can generate second depth dispersion data by scanning the end of the electrode assembly in the first direction at a position spaced apart by a second distance, which represents a position lowered in the direction of the electrode assembly (Z-axis) by an offset from the first distance.

[0139] As described above, according to the present embodiment, by scanning the end of the electrode assembly using a spectroscopic interference displacement sensor, depth dispersion data of the end of the deep and narrow jellyroll-shaped electrode assembly can be measured more accurately, thereby having the effect of preventing defects and fires in the electrode assembly in advance.

[0140] According to the present embodiment, by scanning the end of the electrode assembly once or scanning the end of the electrode assembly twice depending on the arrangement of the spectroscopic interference displacement sensor, and measuring the depth of each end of the negative plate (11), separator (21), and positive plate (12), the effect is to more accurately inspect the degree of curvature of the electrode assembly.

[0141] As used herein, the term “part” may include a unit implemented in hardware, software, or firmware, and may be used interchangeably with terms such as logic, logic block, component, or circuit. The “part” may be a component formed integrally, or a minimum unit of said component or a part thereof that performs one or more functions. For example, according to one embodiment, the “part” may be implemented in the form of an Application-Specific Integrated Circuit (ASIC).

[0142] The implementations described herein may be implemented, for example, as methods or processes, devices, software programs, data streams, or signals. Even if discussed only in the context of a single form of implementation (e.g., discussed only as a method), the implementation of the discussed features may also be implemented in other forms (e.g., devices or programs). Devices may be implemented in appropriate hardware, software, and firmware, etc. Methods may be implemented in devices such as processors, which generally refer to processing devices including, for example, computers, microprocessors, integrated circuits, or programmable logic devices. Processors also include communication devices such as computers, cell phones, portable / personal digital assistants ("PDAs"), and other devices that facilitate the communication of information between end-users.

[0143] Although the present invention has been described with reference to the embodiments illustrated in the drawings, this is merely illustrative, and those skilled in the art will understand that various modifications and equivalent alternative embodiments are possible therefrom. Accordingly, the technical scope of protection of the present invention should be determined by the following claims. Explanation of the symbols

[0145] 10: Electrode assembly 11: Cathode plate 12: Positive plate 21 : Separator 100 : Winder 200 : Inspection device 210: Displacement sensor 215 : Head section 220 : Drive unit 230 : Control unit

Claims

Claim 1 An inspection device for an electrode assembly comprising: at least one displacement sensor for scanning the end of an electrode assembly; and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and anode plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scanning of the displacement sensor, wherein the depth dispersion data of the end of the electrode assembly comprises a first depth dispersion data for the end of the negative plate and the end of the separator, and a second depth dispersion data for the end of the negative plate and the end of the anode plate. Claim 2 An inspection device for an electrode assembly according to claim 1, further comprising a driving unit for adjusting the height and position of the displacement sensor according to the control of the control unit. Claim 3 An inspection device for an electrode assembly according to claim 1, wherein the displacement sensor is a spectroscopic interference displacement sensor. Claim 4 An inspection device for an electrode assembly comprising: at least one displacement sensor for scanning the end of an electrode assembly; and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and positive plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scan of the displacement sensor, wherein the displacement sensor is a spectroscopic interference displacement sensor, and when the spectroscopic interference displacement sensor is composed of a single spectroscopic interference displacement sensor, the spectroscopic interference displacement sensor generates first depth dispersion data for the end of the negative plate and the separator by scanning the end of the electrode assembly in a first direction at a position spaced apart by a first distance from the end of the electrode assembly, and generates second depth dispersion data for the end of the negative plate and the positive plate by scanning the end of the electrode assembly in a second direction opposite to the first direction at a position spaced apart by a second distance representing a position lowered in the direction of the electrode assembly by a preset offset from the first distance. Claim 5 An inspection device for an electrode assembly comprising: at least one displacement sensor for scanning the end of an electrode assembly; and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and anode plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scan of the displacement sensor, wherein the displacement sensor is a spectroscopic interference displacement sensor, and when the spectroscopic interference displacement sensor is composed of a first spectroscopic interference displacement sensor and a second spectroscopic interference displacement sensor, the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor are arranged in a joined manner and connected through a head unit to simultaneously scan the end of the electrode assembly, wherein the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor scan the end of the electrode assembly with a height difference of a preset offset. Claim 6 An inspection device for an electrode assembly comprising: at least one displacement sensor for scanning the end of an electrode assembly; and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and anode plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scan of the displacement sensor, wherein the displacement sensor is a spectroscopic interference displacement sensor, and when the spectroscopic interference displacement sensor is composed of a first spectroscopic interference displacement sensor and a second spectroscopic interference displacement sensor, the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor are arranged spaced apart by a certain distance in the scanning direction and connected through a head unit to simultaneously scan the end of the electrode assembly, wherein the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor scan the end of the electrode assembly with a height difference equal to a preset offset. Claim 7 An inspection device for an electrode assembly comprising: at least one displacement sensor for scanning the end of an electrode assembly; and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and anode plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scan of the displacement sensor, wherein the displacement sensor is a spectroscopic interference displacement sensor, and when the spectroscopic interference displacement sensor is composed of a first spectroscopic interference displacement sensor and a second spectroscopic interference displacement sensor, the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor are arranged spaced apart by a certain distance in a direction perpendicular to the scan direction and are connected through a head unit to simultaneously scan the end of the electrode assembly, wherein the first spectroscopic interference displacement sensor and the second spectroscopic interference displacement sensor scan the end of the electrode assembly with a height difference equal to a preset offset. Claim 8 delete Claim 9 An inspection device for an electrode assembly comprising: at least one displacement sensor for scanning the end of an electrode assembly; and a control unit for controlling the movement of the displacement sensor and calculating the relative depth for each end of the negative plate, separator, and positive plate of the electrode assembly based on depth dispersion data of the end of the electrode assembly measured by the scan of the displacement sensor, wherein the depth dispersion data of the end of the electrode assembly comprises a first depth dispersion data for the end of the negative plate and the end of the separator, and a second depth dispersion data for the end of the negative plate and the end of the positive plate, wherein the control unit aligns the first depth dispersion data and the second depth dispersion data by correcting the first depth dispersion data or the second depth dispersion data by a preset offset, and obtains the depth of the end of the negative plate and the depth of the end of the positive plate based on the separator from the aligned first depth dispersion data and the second depth dispersion data. Claim 10 An inspection device for an electrode assembly according to claim 9, wherein the offset refers to the height difference of the displacement sensor when measuring the first depth dispersion data and when measuring the second depth dispersion data. Claim 11 An inspection device for an electrode assembly according to claim 1, wherein the control unit determines whether the electrode assembly is normal using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end. Claim 12 An inspection device for an electrode assembly according to claim 11, wherein the control unit calculates at least one of the average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end, and compares at least one of the calculated average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end with a preset reference value to determine whether the electrode assembly is normal. Claim 13 An inspection device for an electrode assembly according to claim 11, wherein the control unit generates a depth pattern for each end using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, and compares the generated depth pattern for each end with a predefined reference pattern to determine whether the electrode assembly is normal. Claim 14 A method for inspecting an electrode assembly, comprising: a step of a control unit receiving depth dispersion data for an end of an electrode assembly from at least one displacement sensor; and a step of the control unit determining whether the electrode assembly is normal based on the depth dispersion data, wherein the depth dispersion data includes a first depth dispersion data for a cathode plate end and a separator end, and a second depth dispersion data for a cathode plate end and an anode plate end. Claim 15 delete Claim 16 In claim 14, the step of determining whether the electrode assembly is normal comprises: a step in which the control unit aligns the first depth dispersion data and the second depth dispersion data by correcting the first depth dispersion data or the second depth dispersion data by a preset offset; a step in which the control unit obtains the depth of the negative electrode end and the depth of the positive electrode end based on the separator in the first depth dispersion data and the second depth dispersion data that have been aligned; and a step in which the control unit determines whether the electrode assembly is normal using at least one of the depth of the negative electrode end, the depth of the separator end, and the depth of the positive electrode end. Claim 17 A method for inspecting an electrode assembly according to claim 16, wherein the offset refers to the height difference of the displacement sensor when measuring the first depth dispersion data and when measuring the second depth dispersion data. Claim 18 In claim 16, a method for inspecting an electrode assembly is characterized in that, in the step of determining whether the electrode assembly is normal using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, the control unit calculates at least one of the average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end, and compares at least one of the calculated average depth of the cathode plate end, the average depth of the separator end, and the average depth of the anode plate end with a preset reference value to determine whether the electrode assembly is normal. Claim 19 A method for inspecting an electrode assembly according to claim 14, wherein, in the step of determining whether the electrode assembly is normal using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, the control unit generates a depth pattern for each end using at least one of the depth of the cathode plate end, the depth of the separator end, and the depth of the anode plate end, and compares the generated depth pattern for each end with a predefined reference pattern to determine whether the electrode assembly is normal.

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