Apparatus for measuring deterioration of switching element and method thereof

KR103018902B1Active Publication Date: 2026-09-15KOREA AUTOMOTIVE TECH INST
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Patent Information

Application Number
KR1020240137644
Authority / Receiving Office
KR · KR
Patent Type
Patents
Current Assignee / Owner
Filing Date
2024-10-10
Publication Date
2026-09-15
Estimated Expiration
2044-10-10

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Abstract

The present invention relates to a device for measuring the degradation of a switching element, and is characterized by comprising: a normal value storage module that stores a resistance value between a drain (D) and a source (S) measured in a normal switching element during the initial production stage; and a processor that measures the current resistance value between a drain (D) and a source (S) of the switching element and calculates a resistance increase rate by comparing it with a previously stored resistance value to identify the degradation of the switching element.
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Citation Information

Patent Citations

  • Current sensing circuit

    KR100836900B1

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    US20200408829A1