Apparatus for alignment measuring of display device and method for alignment measuring of display device using the same

Abstract

An alignment inspection device and an alignment inspection method for a display device are provided. The alignment inspection device for a display device includes a support on which a display device is mounted, the support including a first display substrate and a second display substrate disposed on top of the first display substrate; a light source unit disposed on top of the support and emitting inspection light toward the support; a camera unit disposed on top of the support and capturing the first display substrate and the second display substrate to generate image data; and a control unit that calculates a first pixel pattern of the first display substrate and a second pixel pattern of the second display substrate from the image data, and determines whether there is an alignment defect between the first display substrate and the second display substrate using the first pixel pattern and the second pixel pattern.

Description

Technology Field

[0001] The present invention relates to an alignment inspection device for a display device and an alignment inspection method using the same. Background Technology

[0002] The importance of display devices is gradually increasing with the development of multimedia. In response to this, various display devices such as Liquid Crystal Display Devices (LCDs) and Organic Light Emitting Diode Display Devices (OLEDs) are being developed.

[0003] Among the display devices, the organic light-emitting display device includes an organic light-emitting element that is a self-luminous element. The organic light-emitting element may include two opposing electrodes and an organic light-emitting layer interposed between them. Electrons and holes provided from the two electrodes recombine in the light-emitting layer to generate excitons, and light may be emitted as the generated excitons change from an excited state to a ground state.

[0004] Since these self-emissive display devices do not require a separate light source, they not only have low power consumption and can be configured in a lightweight, thin form factor, but also possess high-quality characteristics such as a wide viewing angle, high brightness and contrast, and fast response speed, making them a focus of attention as next-generation display devices. The problem to be solved

[0005] The problem that the present invention aims to solve is to provide an alignment inspection device for a display device capable of calculating each pixel pattern of a first display substrate and a second display substrate using an optical system and inspecting whether there is an alignment defect between the first display substrate and the second display substrate using the same.

[0006] The problem to be solved by the present invention is to provide an alignment inspection method for a display device that calculates each pixel pattern of a first display substrate and a second display substrate using an optical system and determines whether there is an alignment defect between the first display substrate and the second display substrate using the same.

[0007] The problems of the present invention are not limited to those mentioned above, and other unmentioned technical problems will be clearly understood by those skilled in the art from the description below. means of solving the problem

[0008] An alignment inspection device for a display device according to an embodiment for solving the above problem comprises: a support on which a display device is mounted, the display device including a first display substrate and a second display substrate disposed on top of the first display substrate; a light source unit disposed on top of the support and emitting inspection light toward the support; a camera unit disposed on top of the support and capturing the first display substrate and the second display substrate to generate image data; and a control unit that calculates a first pixel pattern of the first display substrate and a second pixel pattern of the second display substrate from the image data, and determines whether there is an alignment defect between the first display substrate and the second display substrate using the first pixel pattern and the second pixel pattern.

[0009] The above inspection light may be infrared or near-infrared.

[0010] The above display device includes a plurality of pixels, wherein each pixel includes a pixel electrode layer included in the first display substrate, a light-blocking member included in the second display substrate, and a color filter layer disposed in a space partitioned by the light-blocking member, and the first pixel pattern may be the pixel electrode layer and the second pixel pattern may be the color filter layer.

[0011] The control unit can measure the gap between the first pixel pattern and the second pixel pattern, and compare the measured gap with a threshold value to determine whether there is an alignment defect between the first display substrate and the second display substrate.

[0012] The above inspection light may have a low transmittance to the light-blocking member and a high transmittance to the color filter layer and the anode electrode layer.

[0013] The light source unit includes a first light source that emits a first inspection light and a second light source that emits a second inspection light, and the wavelength band of the first inspection light and the wavelength band of the second inspection light may be different from each other.

[0014] The first inspection light may have a high transmittance to the light-shielding member, and the second inspection light may have a low transmittance to the light-shielding member.

[0015] An alignment inspection device for a display device according to one embodiment for solving the above other problems comprises: a support on which a display device is mounted, the support comprising a first display substrate and a second display substrate disposed on top of the first display substrate; a first light source disposed on top of the support and emitting a first inspection light toward the support; a second light source disposed on bottom of the support and emitting a second inspection light toward the support; a camera unit disposed on top of the support to photograph the first display substrate and the second display substrate and generate image data; and a control unit that calculates a first pattern of the first display substrate and a second pattern of the second display substrate from the image data, and determines whether there is an alignment defect between the first display substrate and the second display substrate using the first pattern and the second pattern, wherein the wavelength band of the first inspection light and the wavelength band of the second inspection light are different from each other.

[0016] The first inspection light may be light in the short wavelength band, and the second inspection light may be light in the long wavelength band.

[0017] The first inspection light is white light, and the second inspection light may be infrared or near-infrared.

[0018] The first display substrate includes a conductive layer, and the second display substrate includes a color filter layer, wherein the first pattern is the conductive layer and the second pattern is the color filter layer.

[0019] The control unit can measure the gap between the first pattern and the second pattern, and determine whether there is an alignment defect between the first display substrate and the second display substrate by comparing the measured gap with a threshold range.

[0020] A method for inspecting alignment of a display device according to one embodiment for solving the above other problems comprises the steps of: preparing a display device including a first display substrate and a second display substrate disposed on top of the first display substrate; emitting inspection light from the top of the display device toward the display device; photographing the display device from the top of the display device to produce a first pattern and a second pattern and measuring the distance between the first pattern and the second pattern; and comparing the measured distance with a threshold value to determine whether there is an alignment defect between the first display substrate and the second display substrate, wherein the display device includes a plurality of pixels, and each pixel includes a pixel electrode layer included in the first display substrate, a light-blocking member included in the second display substrate, and a color filter layer included in the second display substrate and disposed in an area partitioned by the light-blocking member.

[0021] The first pattern above may be the pixel electrode layer, and the second pattern may be the color filter layer.

[0022] The distance between the first pattern and the second pattern can be measured by measuring the distance between the sides of the first pattern and the second pattern facing each other.

[0023] The above inspection light may have a low transmittance to the light-blocking member and a high transmittance to the color filter layer and the pixel electrode layer.

[0024] The above inspection light may be infrared or near-infrared.

[0025] The step of determining whether there is an alignment defect between the first display substrate and the second display substrate may include: determining the display device as defective if the measured distance is greater than or equal to the threshold value; and determining the display device as good if the measured distance is less than the threshold value.

[0026] A method for inspecting alignment of a display device according to an embodiment for solving the above problem comprises the steps of: preparing a display device including a first display substrate and a second display substrate disposed on top of the first display substrate; emitting a first inspection light from the top of the display device toward the display device; photographing the display device from the top of the display device to calculate a first pattern and calculating a first center coordinate of the first pattern; emitting a second inspection light from the top of the display device toward the display device; photographing the display device from the top of the display device to calculate a second pattern and calculating a second center coordinate of the second pattern; and comparing the first center coordinate and the second center coordinate to determine whether there is an alignment defect between the first display substrate and the second display substrate, wherein the display device includes a plurality of pixels, and each pixel includes a pixel electrode layer included in the first display substrate, a light-blocking member included in the second display substrate, and a color filter layer included in the second display substrate and disposed in an area partitioned by the light-blocking member.

[0027] The transmittance of the first inspection light to the light-shielding member may be greater than the transmittance of the second inspection light to the light-shielding member.

[0028] The wavelength band of the first inspection light may be larger than the wavelength band of the second inspection light.

[0029] Specific details of other embodiments are included in the detailed description and drawings. Effects of the invention

[0030] An alignment inspection device for a display device according to one embodiment can determine whether there is an alignment defect between the first display substrate and the second display substrate by irradiating light of a specific wavelength range onto the bonded first display substrate and the second display substrate, calculating and comparing the patterns of the pixel electrode layer disposed on the first display substrate and the color filter layer disposed on the second display substrate. Therefore, in a subsequent process, the alignment defect between the first display substrate and the second display substrate can be determined in advance without emitting light on the first display substrate to determine the alignment defect, thereby increasing the efficiency of the manufacturing process.

[0031] The effects according to the embodiments are not limited to those exemplified above, and a wider variety of effects are included in this specification. Brief explanation of the drawing

[0032] FIG. 1 is a schematic perspective view of a display device according to one embodiment. FIG. 2 is a schematic cross-sectional view of a display device according to one embodiment cut along II-II' of FIG. 1. FIG. 3 is a schematic layout diagram showing a pixel arrangement of a display device according to one embodiment. FIG. 4 is a cross-sectional view of another display device of one embodiment cut along IV-IV' of FIG. 3. FIG. 5 is a schematic layout diagram of the circuit layer of the first display substrate of a display device according to one embodiment. FIG. 6 is a schematic layout diagram of a pixel of a display device according to one embodiment. FIG. 7 is a schematic side view of an alignment inspection device according to one embodiment. Figure 8 is a block diagram of an alignment inspection device. FIG. 9 is a flowchart illustrating an inspection method of an alignment inspection device according to one embodiment. Figure 10 is a flowchart showing step S130 of Figure 9 in detail. Figure 11 is a plan view showing an example of step S110 of Figure 9. FIG. 12 is a schematic cross-sectional view showing an example of step S120 of FIG. 9. FIGS. 13 to 16 are plan views for explaining step S130 of FIG. 10. FIG. 17 is a flowchart showing another embodiment of step S130 of FIG. 9. FIG. 18 is a plan view showing an example of step S138 of FIG. 17. FIG. 19 is a schematic side view of an alignment inspection device according to another embodiment. FIG. 20 is a flowchart showing steps S120_2 and S130_2 of FIG. 19 in detail. FIG. 21 is a plan view showing an example of step S120_2 of FIG. 20. FIGS. 22 to 25 are plan views for explaining step S130_2 of FIG. 20. FIG. 26 is a schematic side view of an alignment inspection device according to another embodiment. FIG. 27 is a flowchart showing the alignment inspection method of the alignment inspection device of FIG. 26. FIG. 28 is a plan view showing an example of step S320 of FIG. 27. FIG. 29 is a plan view showing an example of step S330 of FIG. 27. FIG. 30 is a plan view showing an example of step S330 of FIG. 27. Figure 31 is a plan view showing an example of step S340 of Figure 27. FIGS. 32 to 37 are plan views for explaining step S370 of FIG. 27. Specific details for implementing the invention

[0033] The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims.

[0034] When elements or layers are referred to as being on another element or layer, this includes cases where another layer or element is interposed directly on or in the middle of another element. Throughout the specification, the same reference numerals refer to the same components.

[0035] Although terms such as "first," "second," etc., are used to describe various components, it goes without saying that these components are not limited by these terms. These terms are used merely to distinguish one component from another. Therefore, it goes without saying that the first component mentioned below may also be the second component within the technical scope of the present invention.

[0036] Specific embodiments will be described below with reference to the attached drawings.

[0037] FIG. 1 is a schematic perspective view of a display device according to one embodiment. FIG. 2 is a schematic cross-sectional view of a display device according to one embodiment cut along II-II' of FIG. 1.

[0038] Referring to FIG. 1, the display device (1) can be applied to various electronic devices such as tablet PCs, smartphones, car navigation units, cameras, center information displays (CID) provided in cars, wristwatch-type electronic devices, PDA (Personal Digital Assistant), PMP (Portable Multimedia Player), game consoles, small and medium-sized electronic devices, televisions, external billboards, monitors, personal computers, and laptop computers. However, these are presented as exemplary embodiments, and it is obvious that they can be adopted in other electronic devices within the scope of the concept of the present invention.

[0039] The display device (1) can be classified in various ways according to the display method. For example, the classification of the display device (1) may include an organic light-emitting display device (OLED), an inorganic light-emitting display device (inorganic EL), a quantum dot light-emitting display device (QED), a micro-LED display device (micro-LED), a nano-LED display device (nano-LED), a plasma display device (PDP), a field emission display device (FED), a cathode ray display device (CRT), a liquid crystal display device (LCD), an electrophoretic display device (EPD), etc. In the following description, an organic light-emitting display device is used as an example of the display device (1), and unless a special distinction is required, the organic light-emitting display device applied in the embodiment will be simply abbreviated as the display device (1). However, the embodiment is not limited to an organic light-emitting display device, and other display devices (1) listed above or known in the art field may be applied within the scope of sharing the technical concept.

[0040] In the drawings, a first direction (DR1), a second direction (DR2), and a third direction (DR3) are defined. The first direction (DR1) and the second direction (DR2) may be directions perpendicular to each other within a single plane. The third direction (DR3) may be a direction perpendicular to the plane where the first direction (DR1) and the second direction (DR2) are located. The third direction (DR3) is perpendicular to each of the first direction (DR1) and the second direction (DR2). In the embodiments, the third direction (DR3) represents the thickness direction of the display device (1).

[0041] The display device (1) may be formed in a planar rectangular shape. The display device (1) may include two first sides extending in a first direction (DR1) and two second sides extending in a second direction (DR2) that intersects the first direction (DR1). The corners where the first sides and the second sides of the display device (1) meet may be right angles, but are not limited thereto, and may form curved surfaces. The planar shape of the display device (1) is not limited to the examples provided and may be circular or other shapes.

[0042] The display device (1) may include a display area (DA) for displaying an image and a non-display area (NDA) for not displaying an image. The display area (DA) may include a plurality of pixels (PX). The non-display area (NDA) may be located around the display area (DA) and may surround the display area (DA).

[0043] Unless otherwise noted in the embodiments, “top” or “top” indicates the thickness direction of the display device (1) toward one side of the third direction (DR3), and likewise, “top surface” indicates the surface facing toward one side of the third direction (DR3). Additionally, “bottom” or “bottom” indicates the direction opposite to the thickness direction of the display device (1) toward the other side of the third direction (DR3), and “bottom surface” refers to the surface facing toward the other side of the third direction (DR3). Additionally, “left,” “right,” “top,” and “bottom” indicate the direction when the display device (1) is viewed from a plane. For example, “left” indicates the opposite direction of the first direction (DR1), “right” indicates the first direction (DR1), “top” indicates the second direction (DR2), and “bottom” indicates the opposite direction of the second direction (DR2).

[0044] Referring to FIGS. 1 and 2, the display device (1) may include a first display substrate (10) and a second display substrate (20) facing the first display substrate (10). The display device (1) may further include a sealing member (50) that combines the first display substrate (10) and the second display substrate (20), and a filling layer (40) filled between the first display substrate (10) and the second display substrate (20).

[0045] The first display substrate (10) may include elements and circuits for displaying an image, such as a pixel circuit such as a switching element, a pixel defining film that defines a light-emitting region and a non-light-emitting region to be described later in a display area (DA), and a self-light emitting element. In an exemplary embodiment, the self-light emitting element may include at least one of an organic light-emitting diode, a quantum dot light-emitting diode, an inorganic-based micro light-emitting diode (e.g., Micro LED), and an inorganic-based nano light-emitting diode (e.g., nano LED). Hereinafter, the case where the self-light emitting element is an organic light-emitting diode will be described as an example.

[0046] The second display substrate (20) may be positioned on the first display substrate (10) and may face the first display substrate (10). The second display substrate (20) may include a color control structure that converts the color of incident light.

[0047] A sealing member (50) may be positioned between the first display substrate (10) and the second display substrate (20) in a non-display area (NDA). The sealing member (50) may be positioned along the edges of the first display substrate (10) and the second display substrate (20) in the non-display area (NDA) and may surround the display area (DA) in a plan view. The first display substrate (10) and the second display substrate (20) may be joined together through the sealing member (50). In some embodiments, the sealing member (50) may include an organic material. For example, the sealing member (50) may be made of an epoxy resin, but is not limited thereto.

[0048] The filling layer (40) may be disposed in the space between the first display substrate (10) and the second display substrate (20) surrounded by the sealing member (50). The filling layer (40) may fill the space between the first display substrate (10) and the second display substrate (20). The filling layer (40) may be made of a material capable of transmitting light. In some embodiments, the filling layer (40) may include an organic material. For example, the filling layer (40) may be made of a silicon-based organic material, an epoxy-based organic material, etc., but is not limited thereto.

[0049] FIG. 3 is a schematic layout diagram showing a pixel arrangement of a display device according to one embodiment.

[0050] Referring to FIG. 3, the display area (DA) of the display device (1) includes a plurality of pixels (PX). A pixel (PX) represents a repeating minimum unit for display. To display full color, each pixel (PX) may include a plurality of subpixels (PXS: PXS1, PXS2, PXS3) that emit different colors. Each pixel (PX) may include a first subpixel (PXS1) responsible for emitting light of a first color, a second subpixel (PXS2) responsible for emitting light of a second color, and a third subpixel (PXS3) responsible for emitting light of a third color. The first subpixel (PXS1), the second subpixel (PXS2), and the third subpixel (PXS3) may be provided one by one for each pixel (PX). In an exemplary embodiment, the first color light may be red light having a peak wavelength in the range of about 610 nm to about 650 nm, the second color light may be green light having a peak wavelength in the range of about 510 nm to about 550 nm, and the third color light may be blue light having a peak wavelength in the range of about 440 nm to about 480 nm.

[0051] Each pixel (PX) may include a light-emitting region (TA) and a light-blocking region (BA) around it. The light-blocking region (BA) of each pixel (PX) abuts the light-blocking region (BA) of an adjacent pixel (PX). The light-blocking regions (BA) of adjacent pixels (PX) may be connected as one. Furthermore, the light-blocking regions (BA) of multiple pixels (PX) may be connected as one, but are not limited thereto. The light-emitting region (TA) of a sub-pixel (PXS) of each adjacent pixel (PX) may be separated by a light-blocking region (BA). A detailed description of the light-emitting region (TA) and the light-blocking region (BA) will be provided later in conjunction with FIG. 4. (It is not yet stated which wavelength range of light is emitted from the light-emitting region.)

[0052] Each subpixel (PX) of a pixel (PX) may be sequentially arranged along a first direction (DR1) as a first subpixel (PXS1), a second subpixel (PXS2), and a third subpixel (PXS3). Conceptually, adjacent subpixels (PXS) may be interpreted as being in contact. Even in such cases, the boundary between subpixels (PXS) may lie on an integrally connected light-blocking region (BA) and may not be physically separated. The boundary between subpixels (PXS) may lie at the midpoint of the spaced-out area (TA) of adjacent subpixels (PXS) (or at the midpoint in the width direction of the light-blocking region (BA). The overall shape of a subpixel (PXS) may have a similarity relationship with respect to the shape of the light-blocking region (TA) of the corresponding subpixel (PXS), but is not limited thereto.

[0053] The light-emitting regions (TA: TA1, TA2, TA3) of each subpixel (PXS1, PXS2, PXS3) may be spaced apart from each other. The shape of the light-emitting regions (TA: TA1, TA2, TA3) of each subpixel (PXS) may be generally similar. For example, the light-emitting region (TA) of the first subpixel (PXS1) (hereinafter, the first light-emitting region (TA1)), the light-emitting region (TA) of the second subpixel (PXS2) (hereinafter, the second light-emitting region (TA2)), and the light-emitting region (TA) of the third subpixel (PXS3) (hereinafter, the third light-emitting region (TA3)) may generally have a rectangular shape in which the second direction (DR2) is longer than the first direction (DR1). In this specification, "rectangle" or "substantial rectangle" includes not only a perfect rectangle formed by line segments where opposing sides are parallel, but also something that can be viewed as having a generally rectangular shape. For example, even if there are curves or irregularities in at least some sections of each side, if the line segments connecting the overall direction of extension form a rectangular shape, it is interpreted as being included in a substantial rectangle. Furthermore, even if the directions of extension of opposing sides are not perfectly parallel, if the angle of intersection is 15° or less or 5° or less, and they appear generally parallel to the naked eye, they may be interpreted as constituting a rectangular shape.

[0054] The width (WT) measured along the first direction (DR1) of each spaced-apart light-emitting area (TA1, TA2, TA3) of a single pixel (PX) may differ from one another. Specifically, the first width (WT1) measured along the first direction (DR1) of the first light-emitting area (TA1) may be larger than the second width (WT2) measured along the first direction (DR1) of the second light-emitting area (TA2) and the third width (WT3) measured along the first direction (DR1) of the third light-emitting area (TA3). Additionally, the second width (WT2) of the second light-emitting area (TA2) may be larger than the third width (WT3) of the third light-emitting area (TA3). Additionally, the area of ​​the first light-emitting region (TA1) may be larger than the area of ​​the second light-emitting region (TA2) and the third light-emitting region (TA3), and the area of ​​the second light-emitting region (TA2) may be larger than the area of ​​the third light-emitting region (TA3). However, this is not limited thereto, and the first to third widths (WT1, WT2, WT3) in the first direction (DR1) of the first to third light-emitting regions (TA1, TA2, TA3) may be the same as each other. Likewise, the areas of the first to third light-emitting regions (TA1, TA2, TA3) may be the same as each other. In the drawings, a case is illustrated where the width decreases sequentially from the first light-emitting region (TA1) to the third light-emitting region (TA3), but this is not limited thereto.

[0055] Each pixel (PX) containing multiple subpixels (PXS) may be alternately arranged in a matrix direction. The shape and arrangement of the subpixels (PXS) within each pixel (PX) may be identical, but are not limited thereto. The overall shape of each pixel (PX) containing multiple subpixels (PXS) may be a substantially square shape. However, it is not limited thereto, and the shape of each pixel (PX) can be varied in various ways, such as a rhombus or a rectangle.

[0056] FIG. 4 is a cross-sectional view of another display device of one embodiment cut along IV-IV' of FIG. 3.

[0057] Referring to FIG. 4, the display device (1) may include a plurality of subpixel electrodes (PXSE), a light-emitting layer (EML) disposed on the subpixel electrodes (PXSE), an encapsulation structure (170) covering the light-emitting layer (EML), and a color control structure (WCL, TPL, CFL) disposed on the upper part of the encapsulation structure (170). The display device (1) may include a first display substrate (10) and a second display substrate (20). In one embodiment, the above-described plurality of subpixel electrodes (PXSE), the light-emitting layer (EML), and the encapsulation structure (170) may be included in the first display substrate (10), and the color control structure (WCL, TPL, CFL) may be included in the second display substrate (20).

[0058] Specifically, the first display substrate (10) may include a first substrate (110), a plurality of subpixel electrodes (PXSE) disposed on the first substrate (110), a light-emitting layer (EML) disposed on the subpixel electrodes (PXSE), and an encapsulation structure (170) disposed on the light-emitting layer (EML). Additionally, the second display substrate (20) may include a second substrate (210) and a color control structure (WCL, TPL, CFL) disposed on one surface of the second substrate (210) facing the first substrate (110). The color control structure (WCL, TPL, CFL) may include a color filter layer (CFL) and a color control layer (WCL, TPL).

[0059] Hereinafter, the cross-sectional structure of the first display substrate (10) will be described sequentially in the third direction (DR3) in the drawing.

[0060] The first substrate (110) may be an insulating substrate. The first substrate (110) may include a transparent material. For example, the first substrate (110) may include a transparent insulating material such as glass, quartz, etc. The first substrate (110) may be a rigid substrate. However, the first substrate (110) is not limited to the examples given above, and the first substrate (110) may include a plastic such as polyimide, etc., and may have flexible properties that allow it to be bent, folded, or rolled.

[0061] A plurality of subpixel electrodes (PXSE) may be disposed on one side of the first substrate (110). Each subpixel electrode (PXSE) may be disposed for each subpixel (PXS). The subpixel electrodes (PXSE) of adjacent subpixels (PXS) may be separated from each other. A circuit layer (CCL) for driving each subpixel (PXS) may be disposed on the first substrate (110). The circuit layer (CCL) may be disposed between the first substrate (110) and the subpixel electrodes (PXSE). A detailed description of the circuit layer (CCL) will be provided later.

[0062] The subpixel electrode (PXSE) may be a first electrode of a light-emitting element (or light-emitting diode), such as an anode electrode. The subpixel electrode (PXSE) may have a stacked film structure in which a high work function material layer of indium-tin-oxide (ITO), indium-zinc-oxide (IZO), zinc oxide (ZnO), indium oxide (In2O3), and a reflective material layer such as silver (Ag), magnesium (Mg), aluminum (Al), platinum (Pt), lead (Pd), gold (Au), nickel (Ni), neodymium (Nd), iridium (Ir), chromium (Cr), lithium (Li), calcium (Ca), or a mixture thereof are stacked. The high work function material layer may be placed above the reflective material layer and positioned close to the light-emitting layer (EML). The subpixel electrode (PXSE) may have a multilayer structure of ITO / Mg, ITO / MgF, ITO / Ag, or ITO / Ag / ITO, but is not limited thereto.

[0063] A pixel defining film (PDL) may be disposed along the boundary of a subpixel (PXS) on one side of the first substrate (110). The pixel defining film (PDL) is disposed on a subpixel electrode (PXSE) and may include an opening that exposes the subpixel electrode (PXSE). A non-emissive region (NEM) and an emissive region (EMA) may be distinguished by the pixel defining film (PDL) and the opening. The pixel defining film (PDL) may include an organic insulating material such as an acrylic resin (polyacrylates resin), an epoxy resin, a phenolic resin, a polyamide resin, a polyimide resin, an unsaturated polyester resin, a polyphenylene ethers resin, a polyphenylene sulfide resin, or benzocyclobutene (BCB). The pixel definition layer (PDL) may contain inorganic materials.

[0064] A light-emitting layer (EML) is disposed on a subpixel electrode (PXSE) exposed by a pixel definition film (PDL). In one embodiment where the display device is an organic light-emitting display device, the light-emitting layer (EML) may include an organic layer containing an organic material. The organic layer includes the organic light-emitting layer (EML) and, in some cases, may further include a hole injection / transport layer and / or an electron injection / transport layer as an auxiliary layer that assists in light emission. In another embodiment, where the display device (1) is a micro LED display device, a nano LED display device, etc., the light-emitting layer (EML) may include an inorganic material such as an inorganic semiconductor.

[0065] In some embodiments, the light-emitting layer (EML) may have a tandem structure comprising a plurality of organic light-emitting layers (EML) overlapped in the thickness direction and a charge-generating layer disposed between them. Each overlapped organic light-emitting layer (EML) may emit light of the same wavelength, but may also emit light of different wavelengths. At least some of the layers of the light-emitting layer (EML) of each subpixel (PXS) may be separated from the same layer of an adjacent subpixel (PXS).

[0066] The wavelength of light emitted by each light-emitting layer (EML) may be the same for each subpixel (PXS). For example, the light-emitting layer (EML) of each subpixel (PXS) may emit blue light or ultraviolet light, and the color control structure may include a wavelength conversion layer (WCL) to display a color for each subpixel (PXS). However, this is not limited thereto, and the wavelength of light emitted by each light-emitting layer (EML) may differ for each color pixel (PX). For example, the light-emitting layer (EML) of the first subpixel (PXS1) may emit a first color, the light-emitting layer (EML) of the second subpixel (PXS2) may emit a second color, and the light-emitting layer (EML) of the third subpixel (PXS3) may emit a third color.

[0067] A common electrode (CME) may be disposed on the light-emitting layer (EML). The common electrode (CME) may not only be in contact with the light-emitting layer (EML) but also with the upper surface of the pixel defining film (PDL).

[0068] The common electrode (CME) may be connected without distinction between each subpixel (PXS). The common electrode (CME) may be a front electrode that is placed across the entire surface without distinction between subpixels (PXS). The common electrode (CME) may be a second electrode of a light-emitting diode, such as a cathode electrode.

[0069] The common electrode (CME) may include a layer of material with a low work function, such as Li, Ca, LiF / Ca, LiF / Al, Al, Mg, Ag, Pt, Pd, Ni, Au, Nd, Ir, Cr, BaF, Ba, or compounds or mixtures thereof (e.g., a mixture of Ag and Mg). The common electrode (CME) may further include a transparent metal oxide layer disposed on the layer of material with a low work function.

[0070] The subpixel electrode (PXSE), the light-emitting layer (EML), and the common electrode (CME) can constitute a light-emitting device (e.g., an organic light-emitting device). Light emitted from the light-emitting layer (EML) can be emitted upward through the common electrode (CME).

[0071] A thin film encapsulation structure (170) may be disposed on the upper portion of the common electrode (CME). The thin film encapsulation structure (120) may include at least one thin film encapsulation layer. For example, the thin film encapsulation layer may include a first inorganic film (171), an organic film (172), and a second inorganic film (173). The first inorganic film (171) and the second inorganic film (173) may each include silicon nitride, silicon oxide, or silicon oxynitride, etc. The organic film (172) may include an organic insulating material such as an acrylic resin (polyacrylates resin), an epoxy resin, a phenolic resin, a polyamide resin, a polyimide resin, an unsaturated polyester resin, a polyphenylene ethers resin, a polyphenylene sulfide resin, or benzocyclobutene (BCB).

[0072] The second display substrate (20) may be positioned opposite to it on the upper part of the thin film encapsulation structure (120). Below, the cross-sectional structure of the second display substrate (20) will be described sequentially in the direction opposite to the third direction (DR3) in the drawings.

[0073] The second substrate (210) may include a transparent material. The second substrate (210) may include a transparent insulating material such as glass, quartz, etc. The second substrate (210) may be a rigid substrate. However, the second substrate (210) is not limited to the examples above, and the second substrate (210) may include a plastic such as polyimide, etc., and may have flexible properties that allow it to be bent, folded, or rolled.

[0074] The second substrate (210) may be the same substrate as the first substrate (110), but may differ in material, thickness, transmittance, etc. For example, the second substrate (210) may have a higher transmittance than the first substrate (110). The second substrate (210) may be thicker than the first substrate (110) or thinner than it.

[0075] A light-blocking member (BML) may be disposed along the boundary of a subpixel (PXS) on one side of a second substrate (210) facing the first substrate (110). The light-blocking member (BML) may overlap with the pixel definition film (PDL) of the first display substrate (10) and may be located in a non-emissive region (NEM). The light-blocking member (BML) may include an opening that exposes one side of the second substrate (210) overlapping with an emissive region (EMA). The light-blocking member (BML) may be formed in a grid shape in a planar view.

[0076] The light-blocking element (BML) may be composed of organic materials. The light-blocking element (BML) can reduce color distortion caused by external light reflection by absorbing external light. Additionally, the light-blocking element (BML) can serve to prevent light emitted from the light-emitting layer (EML) from intruding into adjacent subpixels (PXS).

[0077] In one embodiment, the light-blocking member (BML) can absorb both visible light wavelengths and near-infrared wavelengths. The light-blocking member (BML) may include a light-absorbing material. For example, the light-blocking member (BML) may be made of a material used as a black matrix of the display device (1).

[0078] A color filter layer (CFL) may be disposed on one side of the second substrate (210). The color filter layer (CFL) may be disposed on one side of the second substrate (210) that is exposed through an opening of a light-blocking member (BML). Furthermore, the color filter layer (CFL) may also be partially disposed on an adjacent light-blocking member (BML). The color filter layer (CFL) may serve to block the emission of light of a color other than the corresponding color of each subpixel (PXS).

[0079] A color filter layer (CFL) may include a first color filter layer (CFL1) disposed in a first subpixel (PXS1), a second color filter layer (CFL2) disposed in a second subpixel (PXS2), and a third color filter layer (CFL3) disposed in a third subpixel (PXS3). Each color filter layer (CFL) may include a colorant, such as a dye or pigment, that absorbs wavelengths other than the corresponding color wavelength. The first color filter layer (CFL1) may be a red color filter layer, the second color filter layer (CFL2) may be a green color filter layer, and the third color filter layer (CFL3) may be a blue color filter layer.

[0080] A first capping layer (220) may be disposed on the color filter layer (CFL). The first capping layer (220) can prevent impurities, such as moisture or air, from penetrating from the outside and damaging or contaminating the color filter layer (CFL). Additionally, the first capping layer (220) can prevent the pigment of the color filter layer (CFL) from spreading to other compositions.

[0081] The first capping layer (220) can be in direct contact with one side (the lower side in FIG. 4) of the color filter layer (CFL). The first capping layer (220) may be made of an inorganic material. For example, the first capping layer (220) may be made of silicon nitride, aluminum nitride, zirconium nitride, titanium nitride, hafnium nitride, tantalum nitride, silicon oxide, aluminum oxide, titanium oxide, tin oxide, silicon oxynitride, etc.

[0082] A color mixing prevention member (MBM) may be disposed on the first capping layer (220). The color mixing prevention member (MBM) is made of a material capable of blocking light transmission and serves to prevent light from invading adjacent subpixels (PXS) and causing color mixing. The color mixing prevention member (MBM) may be disposed along the boundary of the subpixels (PXS). The color mixing prevention member (MBM) may be disposed to overlap with the light-absorbing member (BML). The color mixing prevention member (MBM) may include an opening that exposes the color filter layer (CFL). The color mixing prevention member (MBM) may be disposed along the spacing between the color control layers (WCL, TPL) to fill the valley portion disposed in the spacing between the color control layers (WCL, TPL).

[0083] The color mixing prevention member (MBM) may include an organic material. The color mixing prevention member (MBM) may include a light-absorbing material that absorbs visible light wavelength bands and near-infrared wavelength bands. In one embodiment, the color mixing prevention member (MBM) may include an organic light-blocking material. The color mixing prevention member (MBM) is a type of light-blocking member and may be made of the same material as the light-absorbing member (BML) described above, but is not limited thereto.

[0084] The color mixing prevention member (MBM) can define a light-blocking area (BA) and a light-emitting area (TA). The area where the color mixing prevention member (MBM) is placed becomes the light-blocking area (BA). The color control layer (WCL, TPL) that is not covered by the color mixing prevention member (MBM) or that is exposed by the color mixing prevention member (MBM) can become the light-emitting area (TA).

[0085] The color control layer (WCL, TPL) may be disposed within the space exposed by the opening of the color mixing prevention member (MBM). The color control layer may include a wavelength conversion layer (WCL) that converts the wavelength of incident light and / or a light-transmitting layer (TPL) that maintains and transmits the wavelength of incident light. The wavelength conversion layer (WCL) or the light-transmitting layer (TPL) may be disposed so as to be separated for each subpixel (PXS). The wavelength conversion layer (WCL) or the light-transmitting layer (TPL) may overlap in the thickness direction with respect to the light-emitting region (EMA) and the light-emitting region (TA). Adjacent wavelength conversion layers (WCL) or light-transmitting layers (TPL) may be spaced apart from each other. The spaced-apart space may generally overlap with the light-blocking region (BA). The spaced-apart space forms a valley having a grid shape in the plan view.

[0086] A wavelength conversion layer (WCL) may be disposed in a subpixel (PXS) where the wavelength of light incident from the light-emitting layer (EML) is different from the color of the corresponding subpixel (PXS) and thus requires wavelength conversion. A light-transmitting layer (TPL) may be disposed in a subpixel (PXS) where the wavelength of light incident from the light-emitting layer (EML) is the same as the color of the corresponding subpixel (PXS).

[0087] In an embodiment in which the light-emitting layer (EML) of each subpixel (PXS) included in a pixel (PX) emits a third color, a wavelength conversion layer (WCL) may be disposed in the first subpixel (PXS1) and the second subpixel (PXS2), and a light-transmitting layer (TPL) may be disposed in the third subpixel (PXS3). In the illustrated embodiment, the wavelength conversion layer (WCL) may include a first wavelength conversion pattern (WCL1) disposed in the first subpixel (PXS1) and a second wavelength conversion pattern (WCL2) disposed in the second subpixel (PXS2).

[0088] The first wavelength conversion pattern (WCL1) may include a first base resin (BRS1) and a first wavelength conversion material (WCP1) disposed within the first base resin (BRS1). The second wavelength conversion pattern (WCL2) may include a second base resin (BRS2) and a second wavelength conversion material (WCP2) disposed within the second base resin (BRS2). The light-transmitting layer (TPL) may include a third base resin (BRS3) and a scatterer (SCP) disposed within it.

[0089] The first to third base resins (BRS1, BRS2, ​​BRS3) may include a transparent organic material. For example, the first to third base resins (BRS1, BRS2, ​​BRS3) may be composed of an epoxy resin, an acrylic resin, a cardo resin, or an imide resin. The first to third base resins (BRS1, BRS2, ​​BRS3) may all be composed of the same material, but are not limited thereto.

[0090] The scattering body (SCP) may be a metal oxide particle or an organic particle. Examples of the metal oxide may include titanium oxide (TiO2), zirconium oxide (ZrO2), aluminum oxide (Al2O3), indium oxide (In2O3), zinc oxide (ZnO), or tin oxide (SnO2), and examples of the organic particle material may include acrylic resin or urethane resin.

[0091] The first wavelength conversion material (WCP1) may be a material that converts a third color into a first color, and the second wavelength conversion material (WCP2) may be a material that converts a third color into a second color. The first wavelength conversion material (WCP1) and the second wavelength conversion material (WCP2) may be quantum dots, quantum rods, phosphors, etc. The quantum dots may include group IV nanocrystals, group II-VI compound nanocrystals, group III-V compound nanocrystals, group IV-VI nanocrystals, or a combination thereof. The first wavelength conversion pattern (WCL1) and the second wavelength conversion pattern (WCL2) may further include a scatterer (SCP) that increases wavelength conversion efficiency.

[0092] The light-transmitting layer (TPL) placed in the third subpixel (PXS3) transmits the third color light incident from the light-emitting layer (EML) while maintaining its wavelength. The scatterer (SCP) of the light-transmitting layer (TPL) can serve to regulate the emission path of light emitted through the light-transmitting layer (TPL). The light-transmitting layer (TPL) may not contain a wavelength conversion material.

[0093] A second capping layer (230) is disposed on the wavelength conversion layer (WCL) and the light-transmitting layer (TPL). The second capping layer (230) may be made of an inorganic material. The second capping layer (230) may be made of a material selected from among the materials listed as the material of the first capping layer (220). The second capping layer (230) and the first capping layer (220) may be made of the same material, but are not limited thereto.

[0094] A filling layer (300) may be disposed between the first display substrate (100) and the second display substrate (200). The filling layer (300) fills the space between the first display substrate (100) and the second display substrate (200) and can serve to bond them together. The filling layer (300) may be disposed between the thin film encapsulation structure (170) of the first display substrate (100) and the second capping layer (230) of the second display substrate (200). The filling layer (300) may be composed of Si-based organic materials, epoxy-based organic materials, etc., but is not limited thereto.

[0095] Below, the circuit layer (CCL) of the display device (1) will be described in detail.

[0096] FIG. 5 is a schematic layout diagram of the circuit layer of the first display substrate of a display device according to one embodiment.

[0097] Referring to FIG. 5, a plurality of wires are arranged on a first substrate (110). The plurality of wires may include a gate line (GL), a data line (DL), a first power line, etc.

[0098] The gate line (GL) may be extended in a first direction (DR1). The gate line (GL) may be connected to a gate driver (GDR). The gate driver (GDR) may include a driving circuit composed of a circuit layer (CCL). The gate driver (GDR) may be placed in a non-display area on the first substrate (110). The gate driver (GDR) is connected to a signal connection wire, and at least one end of the signal connection wire may be connected to an external device by forming a pad on the non-display area.

[0099] The data line (DL) may extend into a second direction (DR2) that intersects the first direction (DR1). The data line (DL) may be connected to a data driver (DDR). The first power line (not shown) may include a portion extending into the second direction (DR2). The first power line may further include a portion extending into the first direction (DR1). The first power line may have a mesh structure, but is not limited thereto.

[0100] Each pixel (PX) on the first substrate (110) includes a pixel driving circuit. The wiring described above may pass through each pixel (PX) or around it and apply a driving signal to each pixel driving circuit. The pixel driving circuit may include transistors and capacitors. The number of transistors and capacitors in each pixel driving circuit may vary.

[0101] FIG. 6 is a schematic layout diagram of a pixel of a display device according to one embodiment.

[0102] Referring to FIG. 6, a pixel may include a conductive layer forming a plurality of wires (DL, GL, ELVSL), a subpixel electrode layer (PXSE) forming a subpixel electrode (PXSE), and a color filter layer (CFL). For convenience of explanation, the terms subpixel electrode (PXSE) and subpixel electrode layer (PXSE) will be used interchangeably below.

[0103] The conductive layer may include a gate line (GL), a data line (DL), a first power line (not shown), and a second power line (ELVSL), etc.

[0104] A gate line (GL) may be positioned on the upper and lower sides of a single pixel (PX) on a plane. The gate line (GL) may extend in a first direction (DR1). The gate line (GL) may be positioned to extend to first to third subpixels (PXS) that are included in the single pixel (PX) and located adjacent to it in the first direction (DR1). Additionally, the gate line (GL) may extend to another pixel (PX) located adjacent to it in the first direction (DR1).

[0105] A data line (DL) may include first to third data lines (PXS1_DL, PXS2_DL, PXS3_DL) disposed in each subpixel (PXS). The first to third data lines (PXS1_DL, PXS2_DL, PXS3_DL) may be spaced apart from each other. The first to third data lines (PXS1_DL, PXS2_DL, PXS3_DL) may be disposed in each subpixel (PXS) and extend in a first direction (DR1). The data line (DL) may extend to another pixel (PX) located adjacent to it in a second direction (DR2) of one pixel (PX).

[0106] The second power line (ELVSL) may be placed in the first subpixel (PXS1). The second power line (ELVSL) may be placed spaced apart from the first data line (PXS1_DL) and the first direction (DR1) in the first subpixel (PXS1). The second power line (ELVSL) may be placed to the left of the first subpixel (PXS) on a plane and extend to the second direction (DR2). The second power line (ELVSL) may extend to another first subpixel (PXS1) located adjacent to the first subpixel (PXS1) in the second direction (DR2).

[0107] The conductive layer (DL, GL, ELVSL) may include one or more metals selected from molybdenum (Mo), aluminum (Al), platinum (Pt), palladium (Pd), silver (Ag), magnesium (Mg), gold (Au), nickel (Ni), neodymium (Nd), iridium (Ir), chromium (Cr), calcium (Ca), titanium (Ti), tantalum (Ta), tungsten (W), and copper (Cu). The first conductive layer (1100) may be a single film or a multilayer film.

[0108] The subpixel electrode layer (PXSE) can generally be positioned across the center of each subpixel (PXS). The subpixel electrode layer (PXSE) can have a generally rectangular shape in a planar form. The subpixel electrode layer (PXSE) can be formed in a rectangular shape including a long side and a short side where the second direction (DR2) is longer than the first direction (DR1), but is not limited thereto.

[0109] The color filter layer (CFL) can generally be positioned across the central portion of each subpixel (PXS). The color filter layer (CFL) can be positioned overlapping the subpixel electrode layer (PXSE) in a third direction (DR3). The planar shape of the color filter layer (CFL) can generally resemble the planar shape of the subpixel electrode layer (PXSE). Therefore, if the subpixel electrode layer (PXSE) has a rectangular shape including a long side and a short side in the second direction (DR2) that are longer than the first direction (DR1), the color filter layer (CFL) can also have a rectangular shape including a long side and a short side in the second direction (DR2) that are longer than the first direction (DR1). The color filter layer (CFL) can be formed with a larger area than the subpixel electrode (PXSE). Accordingly, each color filter layer (CFL1, CFL2, CFL3) included in the second display substrate (20) can be arranged to completely cover each sub-pixel electrode layer (PXSE1, PXSE2, PXSE3) included in the first display substrate (10) in the thickness direction.

[0110] FIG. 7 is a schematic side view of an alignment inspection device according to one embodiment. FIG. 8 is a block diagram of the alignment inspection device.

[0111] Referring to FIGS. 7 and 8, an alignment inspection device (50) according to one embodiment may include a support (510), a light source unit (520), a camera unit (530), a moving unit (540), and a control unit (550). The control unit (550) of the alignment inspection device (50) may include a driving unit (551) and a judgment unit (555).

[0112] The support member (510) supports the lower surface (the surface facing the other side of the third direction (DR3)) of the first display substrate (10) which is housed in an alignment inspection device (50) for alignment inspection of the first display substrate (10) and the second display substrate (20). In FIG. 7, the support member (510) is shown to be positioned to support the entire lower surface of the first display substrate (10), but is not limited thereto. The support member (510) may be formed so that at least a portion of the area of ​​the first display substrate (10) on which a plurality of pixels (PX) are arranged is exposed in the third direction (Z) so that, depending on the relative position between the light source unit (520) and the first display substrate (10) described later, the light emitted from the light source unit (520) does not interfere with the output of an image by the camera unit (530) by transmitting and / or reflecting at least a portion of the first display substrate (10). For example, the support (510) may be formed to support the edge of the first display substrate (10), such as a square frame, or to support at least two facing sides of the four sides of the first display substrate (10). The support (510) may include a transparent material that is light-transmitting, but is not limited thereto.

[0113] The moving part (540) may be placed on the support (510). For example, in the alignment inspection process of the first display substrate (10) and the second display substrate (20), when the first display substrate (10) is placed on the upper surface of the support (510), that is, on the upper part of the support (510), the moving part (540) may be placed on the upper part of the support (510). When the first display substrate (10) is seated on the support (510), the moving part (540) may place the second display substrate (20) on the upper surface of the first display substrate (10). The moving part (540) may place the second display substrate (20) on the upper surface of the first display substrate (10) so that the first alignment key (KEY1) formed on the first display substrate (10), which will be described later, and the second alignment key (KEY2) formed on the second display substrate (20) correspond to each other.

[0114] A light source unit (520) may be placed on a support (510). The light source unit (520) may be placed on the upper part of the support (510) to emit inspection light (LT) toward the support (510). In an exemplary embodiment, the inspection light (LT) emitted from the light source unit (520) may be light of a specific wavelength range. Specifically, the inspection light (LT) emitted from the light source unit (520) may be light that is transmitted and reflected in some areas of the display device (1) and absorbed in other areas.

[0115] Specifically, the inspection light (LT) emitted from the light source unit (520) of the alignment inspection device (50) of the display device (1) according to one embodiment may be light in the long wavelength range. For example, the light in the long wavelength range may be long wavelength among visible light, that is, visible light or infrared light having a wavelength range greater than the wavelength range of the first color. The inspection light (LT) emitted from the light irradiation unit (520) may be light in the wavelength range having a low transmittance to the light-blocking member (BML) or color-mixing prevention member (MBM) of the second display substrate (20) placed on the support (510), and a relatively high transmittance to other members. When the inspection light (LT) is visible light or infrared light having a wavelength range greater than that of the first color, the inspection light (LT) emitted from the light irradiation unit (520) may not be converted into the first to third colors even when incident on the color control structure (WCL, TPL, CFL) of the second display substrate (20).

[0116] The camera unit (530) may be placed on the support (510). The camera unit (530) may be placed on the upper part of the support (510) spaced apart from the light source unit (520). After a process is performed in which a filling layer (30) is filled between the second display substrate (20) and the first display substrate (10), and a sealing member (50) is applied to the edges of the first display substrate (10) and the second display substrate (20) so that the second display substrate (20) and the first display substrate (10) are bonded together, the camera unit (530) can photograph the display device (1) placed on the support (510) from the upper part of the support (510). In an exemplary embodiment, the image of the display device (1) captured by the camera unit (530) may be an image in which inspection light (LT) emitted from the light source unit (520) transmits and reflects some areas of the first display substrate (10) and the second display substrate (20) (display device (1)), and absorbs other areas. The camera unit (530) may transmit image data of the display device (1) captured from the top of the display device (1) to the control unit (550).

[0117] The control unit (550) may include a driving unit (551) and a judgment unit (555).

[0118] The driving unit (551) applies a position alignment signal to the moving unit (540) to place the second display substrate (20) on the first display substrate (10). Specifically, when the first display substrate (10) is placed on the support (510) and the second display substrate (20) is placed on the moving unit (540), the driving unit (551) can apply the position alignment signal to the moving unit (540). In an exemplary embodiment, the position alignment signal may be the position coordinates of the first alignment key (KEY1) that the position sensor (not shown) senses after the first display substrate (10) is placed on the support (510). When the driving unit (551) applies the above-described position alignment signal to the moving unit (540), the moving unit (540) can move the second display board (20) so that the second alignment key formed on the second display board (20) corresponds to the position coordinates of the first alignment key.

[0119] The judgment unit (555) receives image data (or image) from the camera unit (530) and can determine whether there is an alignment defect between the first display substrate (10) and the second display substrate (30) through the image data. The judgment unit (555) can calculate at least two patterns through the image data received from the camera unit (530) and determine whether there is an alignment defect between the first display substrate (10) and the second display substrate (30) by comparing the relative positions of the calculated multiple patterns. For example, the judgment unit (555) can measure the distance between multiple patterns and compare the measured distance between patterns with predetermined reference data to determine whether there is an alignment defect between the first display substrate (10) and the second display substrate (20) of the display device (1).

[0120] Embodiments according to the alignment inspection method of the first display substrate (10) and the second display substrate (20) of the alignment inspection device (50) according to one embodiment are described in detail in conjunction with FIGS. 9 to 18.

[0121] FIG. 9 is a flowchart illustrating an inspection method of an alignment inspection device according to one embodiment. FIG. 10 is a flowchart showing step S130 of FIG. 9 in detail. FIG. 11 is a plan view showing an example of step S110 of FIG. 9. FIG. 12 is a schematic cross-sectional view showing an example of step S120 of FIG. 9. FIG. 13 to 16 are plan views for explaining step S130 of FIG. 10.

[0122] Hereinafter, a method for checking alignment of a display device (1) using an alignment inspection device (50) according to one embodiment is briefly described with reference to FIGS. 7 to 16.

[0123] Referring to FIG. 9, a method for checking alignment of a display device according to one embodiment includes the steps of: preparing a display device (1) on a support (510) (S110); emitting inspection light (LT) from a light source (520) toward the display device (1) (S120); and determining whether the display device (1) is misaligned (S130).

[0124] First, a display device (1) comprising a first display substrate (10) and a second display substrate (20) disposed on top of the first display substrate (10) is prepared on a support (510). (S110 of FIG. 9)

[0125] Specifically, with reference to FIGS. 7, 9, and 11, the first display substrate (10) may be placed on the upper part of the support (510). The first display substrate (10) may be seated at a position corresponding to a predetermined area on the support (510). The first display substrate (10) may be placed on the support (510) so as to be supported by the support (510). As described above, the relative positional relationship between the first display substrate (10) and the support (510) is not limited to the range in which the first display substrate (10) is fixed to the support (510) while the alignment inspection of the first display substrate (10) and the second display substrate (20) is performed.

[0126] When the first display substrate (10) is placed on the support (510), the second display substrate (20) can be placed on the upper part of the first display substrate (10). The second display substrate (20) can be placed on the upper part of the first display substrate (10) by the moving part (540) of the alignment inspection device (50) of the second display substrate (20). As described above, a first alignment key is formed on the first display substrate (10) and a second alignment key is formed on the second display substrate (20), so the moving part (540) can place the second display substrate (20) on the first display substrate (10) such that the second alignment key corresponds to the first alignment key. However, not limited thereto, the first display substrate (10) and the second display substrate (20) may be seated on the support (510) in a bonded state.

[0127] Secondly, a light source unit (520) positioned at the top of the display device (1) emits inspection light (LT) toward the display device (1). (S120 of FIG. 9),

[0128] Specifically, with reference to FIGS. 7, 9, and 12, a light source unit (520) positioned on the upper part of a support (510) can emit inspection light (LT), which is light of a specific wavelength range, toward a display device (1) positioned on the support (510). The inspection light (LT) emitted from the light source unit (520) is incident on the upper surface of the second display substrate (20), and in some areas of the second display substrate (20), it is not transmitted, but in other areas, it is transmitted and / or reflected, and is incident on some areas of the first display substrate (10) positioned on the lower part of the second display substrate (20), and can be transmitted and / or reflected.

[0129] In one embodiment, the inspection light (LT) emitted from the light source unit (520) may be light of a wavelength band having a low transmittance to the light-blocking member (BML) and / or color-mixing prevention member (MBM) included in the second display substrate (20), and a high transmittance to the color filter layer (CFL) included in the second display substrate (20) and the sub-pixel electrode (PXSE) included in the first display substrate (10). Additionally, the inspection light (LT) emitted from the light source unit (520) may be light of a long wavelength band that does not emit a first to third color even when incident on the wavelength filter layer (CFL) or the wavelength conversion layer (WCL). For example, the inspection light (LT) may be near-infrared or infrared. When the inspection light (LT) emitted from the light source unit (520) is visible light or infrared light in the long wavelength range, the inspection light (LT) emitted from the light irradiation unit (520) does not emit light because the wavelength range of the inspection light (LT) does not change even when it is incident on and transmitted through the color filter layer (CFL) and the wavelength conversion layer (WCL). However, it is not limited thereto, and depending on the material forming the member included in the first display substrate (10) and the second display substrate (20) of the display device (1), the inspection light (LT) may be light of a different wavelength band.

[0130] Third, the control unit (550) determines whether the first display substrate (10) and the second display substrate (20) are misaligned. (S130 of FIG. 9)

[0131] Examples of step S130 are described in detail in conjunction with FIGS. 10 and FIGS. 13 to 16.

[0132] First, a camera unit (520) positioned on the upper part of the support (1) photographs the first display substrate (10) and the second display substrate (20) positioned on the upper part of the support (510), and calculates a pattern through the captured image data (or image). (S131 of FIG. 10)

[0133] Specifically, with reference to FIGS. 10, 13, and 14, the camera unit (520) is positioned on the upper part of the support (510) and can capture an image in which an inspection light (LT) emitted from the light source unit (520) is incident toward the display device (1) and is reflected and absorbed. A plurality of patterns (PT) may be formed in the image data captured by the camera unit (520). As described above, the inspection light (LT) has a low transmittance to the light-blocking member (BML) placed in the light-blocking area (BA), so the area where the light-blocking member (BML) is placed is visible, and a pattern may be formed. Accordingly, the area where the color filter layer (CFL) is placed in the area partitioned by the light-blocking member (BML) can be patterned and formed. In addition, the area where the pixel electrode (PXE) is placed can be patterned and formed by the height difference between the color filter layer (CFL) and the pixel electrode (PXE) which is overlapped and arranged in the third direction (DR3) with the color filter layer (CFL).

[0134] More specifically, referring to FIG. 14, a pattern (PT) may be formed in the image data captured by the camera unit (520) of the alignment inspection device (50). The pattern (PT) calculated from the image data may include a first pattern (PT1) and a second pattern (PT2). The first pattern (PT1) may be a subpixel electrode (PXSE) of the first display substrate (10), and the second pattern (PT2) may be a color filter layer (CFL) of the second display substrate (20).

[0135] The shapes of the first pattern (PT1) and the second pattern (PT2) may be generally similar. The first pattern (PT1) may have a shape similar to the second pattern (PT2). For example, if the planar shape of the first pattern (PT1) is a rectangular shape, the planar shape of the second pattern (PT2) may also be a rectangular shape. The area of ​​the first pattern (PT1) may be formed to be generally smaller than the area of ​​the second pattern (PT2).

[0136] In an exemplary embodiment, the first pattern (PT1) may be a rectangular shape having first to fourth sides. The first pattern (PT1) may be a rectangular shape consisting of a first side formed on the first side opposite to the first direction (DR1), a second side formed on the second side in the second direction (DR2), a third side formed on the third side in the first direction (DR1), and a fourth side formed on the fourth side opposite to the second direction (DR2). Likewise, the second pattern (PT2) may be a rectangular shape similar to the first pattern (PT1) having first to fourth sides. The second pattern (PT2) may be a rectangular shape consisting of a first side formed on the first side opposite to the first direction (DR1), a second side formed on the second side in the second direction (DR2), a third side formed on the third side in the first direction (DR1), and a fourth side formed on the fourth side opposite to the second direction (DR2).

[0137] Next, the distance between the first pattern (PT1) and the second pattern (PT2) is measured. (S133 in FIG. 10)

[0138] Specifically, referring to FIGS. 10 and FIGS. 14, the distance (w) between the first pattern (PT1) and the second pattern (PT2) may be the distance between two sides of the first pattern (PT1) and the second pattern (PT2) facing each other. The distance (w) between the first pattern (PT1) and the second pattern (PT2) may be the shortest distance between two sides of the first pattern (PT1) and the second pattern (PT2) facing each other.

[0139] In an exemplary embodiment, the distance (w) between the first pattern (PT1) and the second pattern (PT2) can be measured as the distances (Wx1, Wx2, Wy1, Wy2) between the two opposing sides of the first to fourth sides of the first pattern (PT1) and the second pattern (PT2), respectively. The measured first distance (Wx1) may be the distance between the first side of the first pattern (PT1) and the first side of the second pattern (PT2) in the first direction (DR1). The measured second distance (Wy1) may be the distance between the second side of the first pattern (PT1) and the second side of the second pattern (PT2) in the second direction (DR2). The measured third distance (Wx2) may be the distance between the third side of the first pattern (PT1) and the third side of the second pattern (PT2) in the first direction (DR1). The measured fourth distance (Wy2) may be the distance from the fourth side of the first pattern (PT1) to the second direction (DR1) of the fourth side of the second pattern (PT2).

[0140] Next, the measured distance (W) is compared with the threshold value (TH). (S135 in FIG. 10)

[0141] The control unit (550) can compare the first to fourth distances (Wx1, Wx2, Wy1, Wy2) between the measured first pattern (PT1) and the second pattern (PT2) with a predetermined threshold value. The threshold value may include a first threshold value (THx) for the first direction (DR1) and a second threshold value (THy) for the second direction (DR2). The first threshold value (THx) for the first direction (DR1) and the second threshold value (THy) for the second direction (DR2) may be different from each other. The measured first distance (Wx1) and third distance (Wx2) can be compared with the first threshold value (THx), and the measured second distance (Wy1) and fourth distance (Wy2) can be compared with the second threshold value (THy).

[0142] Next, the measured distance (W) is compared with the threshold value (TH), and if the measured distance (W) is less than the threshold value, the judgment unit (555) determines that the display device (1) is a good product because the alignment of the first display substrate (10) and the second display substrate (20) is normal. (S137 of FIG. 10)

[0143] Specifically, if the measured first to fourth distances (Wx1, Wx2, Wy1, Wy2) are all below a threshold value, the judgment unit (555) determines that the display device (1) is a good product because the alignment of the first display substrate (10) and the second display substrate (20) is normal. If the measured first distance (Wx1) and the third distance (Wx2) are both below the first threshold value (THx), and the measured second distance (Wy1) and the fourth distance (Wy2) are both below the second threshold value (THy), the judgment unit (555) can determine that the display device (1) is a good product.

[0144] For example, as shown in FIG. 15, the first distance (Wx1) and the third distance (Wx2) measured are both smaller than the first threshold value (THx), and the second distance (Wy1) and the fourth distance (Wy2) measured are both smaller than the second threshold value (THy), so the judgment unit (555) can determine that the display device (1) is a good product.

[0145] Next, the measured distance (W) is compared with the threshold value (TH), and if the measured distance (W) is greater than or equal to the threshold value, the judgment unit (555) determines that the display device (1) is defective because the alignment of the first display substrate (10) and the second display substrate (20) is poor. (S139 of FIG. 10)

[0146] Specifically, if at least one of the first to fourth measured distances (Wx1, Wx2, Wy1, Wy2) is greater than or equal to a threshold value, the judgment unit (555) determines that the display device (1) is defective because the alignment of the first display substrate (10) and the second display substrate (20) is poor. If at least one of the first measured distance (Wx1) and the third distance (Wx2) is less than the first threshold value (THx), or if at least one of the second measured distance (Wy1) and the fourth distance (Wy2) is less than the second threshold value (THy), the judgment unit (555) may determine that the display device (1) is defective.

[0147] For example, referring to FIG. 16, the measured first distance (Wx1) and third distance (Wx2) are both smaller than the first threshold value (THx), and the fourth distance (Wy2) can be measured as 0. Thus, since the measured first distance (Wx1) and third distance (Wx2) are both smaller than the first threshold value (THx) and the measured fourth distance (Wy2) is smaller than the second threshold value (Thy), but the measured second distance (Wy1) is larger than the second threshold value (THy), the judgment unit (555) can determine that the display device (1) is defective.

[0148] FIG. 17 is a flowchart showing another embodiment of step S130 of FIG. 9. FIG. 18 is a plan view showing one example of step S138 of FIG. 17.

[0149] The embodiment illustrated in FIG. 17 differs from the embodiment illustrated in FIG. 10 in that it further includes a step (S138) for determining whether a stain pattern exists between steps S135 and S137 of FIG. 10. In FIG. 17, descriptions that overlap with the embodiment illustrated in FIG. 8 are omitted.

[0150] Referring to FIG. 17, a method for checking alignment of a display device according to one embodiment may include a step (S138 of FIG. 17) of determining whether a stain pattern exists between steps S137 and S139.

[0151] Referring to FIGS. 17 and 18, a stain pattern (BU1) and / or a budding pattern (BU2) may exist in the image data superimposed on the first pattern (PT1) and the second pattern (PT2). The stain pattern (BU1) and / or a budding pattern (BU2) may be stains caused by bubbles or buddings that occur during the process of forming a filling layer (40) that fills between the first display substrate (10) and the second display substrate (20). Through the image data, it is possible to determine whether stains caused by bubbles or buddings that occur during the manufacturing process of the filling layer (40) exist as the stain pattern (BU1) and / or a budding pattern (BU2).

[0152] If it is determined that there is at least one of the stain pattern (BU1) and the missing pattern (BU2), the display device (1) is determined to be defective. (S138 of FIG. 17) Also, if it is determined that there is no stain pattern (BU1) and no missing pattern (BU2), the display device (1) is determined to be good.

[0153] Hereinafter, other embodiments regarding an alignment inspection device and an alignment inspection method using the alignment inspection device will be described. In the following embodiments, descriptions of components identical to those in the previously described embodiments will be omitted or simplified, and the explanation will focus on the differences.

[0154] FIG. 19 is a schematic side view of an alignment inspection device according to another embodiment. FIG. 20 is a flowchart showing steps S120_2 and S130_2 of FIG. 19 in detail. FIG. 21 is a plan view showing an example of step S120_2 of FIG. 20. FIG. 22 through 25 are plan views for explaining step S130_2 of FIG. 20.

[0155] Referring to FIG. 19, an alignment inspection device (50_2) of a display device according to another embodiment may include a support (510), a light source unit (520_2), a camera unit (530), a moving unit (540), and a control unit (550_2). The alignment inspection device according to this embodiment differs from the embodiment of FIG. 7 in that the light source unit (520_2) includes a plurality of light sources that emit light of different wavelengths, and the plurality of light sources are positioned on the upper and lower parts of the support (510).

[0156] Referring to FIG. 19, the light source unit (520_2) of the alignment inspection device (50_2) according to the present embodiment may include a first light source (521) and a second light source (522).

[0157] The first light source (521) is positioned at the bottom of the support (510) and can emit a first inspection light (LT1) toward the support (510). The first inspection light (LT1) may be infrared or near-infrared light. Accordingly, when the first inspection light (LT1) is incident on the lower side of the first display substrate (10), the plurality of conductive layers (DL) formed of metal cannot be transmitted, while other members can be transmitted and reflected.

[0158] The second light source (522) is positioned on the upper part of the support (520) and can emit a second inspection light (LT2) toward the support (510). The second inspection light (LT2) may be light of a wavelength band different from that of the first inspection light (LT1). The second inspection light (LT2) may be light of a wavelength capable of emitting a first to third color when transmitted through and reflected by the color filter layer (CFL) of the second display substrate (20). For example, the second inspection light (LT2) may be white light.

[0159] Hereinafter, embodiments according to the alignment inspection method of the first display substrate (10) and the second display substrate (20) of the alignment inspection device (50_2) according to another embodiment will be described in detail in conjunction with FIGS. 20 to 25.

[0160] First, a display device (1) comprising a first display substrate (10) and a second display substrate (20) disposed on top of the first display substrate (10) is prepared on a support (510). (S110 of FIG. 20)

[0161] Secondly, a first inspection light (LT1) is emitted from a first light source (521) positioned at the bottom of the display device (1) toward the display device (1), and a second inspection light (LT2) is emitted from a second light source (522) positioned at the top of the display device (1) toward the display device (1). (S120_2 of FIG. 20),

[0162] Specifically, referring to FIGS. 20 and 21, a first light source (521) positioned at the bottom of a support (510) can emit a first inspection light (LT1), which is light of a specific wavelength range, toward a display device (1) positioned on the support (510). The first inspection light (LT1) emitted from the first light source (521) is incident on the lower side of the first display substrate (10), and in some areas of the first display substrate (10), it is not transmitted, but in other areas, it is transmitted and / or reflected, and is incident on a part of the second display substrate (20) positioned on the top of the first display substrate (10), and can be transmitted and / or reflected.

[0163] In one embodiment, the first inspection light (LT1) emitted from the first light source (521) may be light of a wavelength band having low transmittance to a conductive layer (e.g., data line (DL)) included in the first display substrate (10) and high transmittance to other components included in the first display substrate (10). Additionally, the first inspection light (LT1) emitted from the first light source (521) may be light of a long wavelength band that does not emit a first to third color even when incident on the wavelength filter layer (CFL) or wavelength conversion layer (WCL). For example, the first inspection light (LT1) may be near-infrared or infrared. If the first inspection light (LT1) emitted from the first light source (521) is visible light or infrared light in the long wavelength range, the wavelength range of the inspection light (LT) may not change even when the first inspection light (LT1) emitted from the first light source (521) is incident on and transmitted through the color filter layer (CFL) and the wavelength conversion layer (WCL), so it may not emit light. However, it is not limited thereto, and depending on the material forming the member included in the first display substrate (10) and the second display substrate (20) of the display device (1), the first inspection light (LT1) may be light of a different wavelength band.

[0164] A second light source (522) positioned on the upper part of a support (510) can emit a second inspection light (LT2) toward a display device (1) positioned on the support (510). The second inspection light (LT2) emitted from the second light source (522) is incident on the upper surface of the second display substrate (20), and at a color filter layer (CFL) positioned in a part of the second display substrate (20), light of a color other than the color corresponding to each subpixel (PXS) is blocked, and light of the color corresponding to each subpixel (PXS) can be reflected.

[0165] In one embodiment, the second inspection light (LT2) emitted from the second light source (522) is incident on the color filter layer (CFL) included in the second display substrate (20), so that only the light of the color corresponding to each subpixel (PXS) is reflected. For example, the second inspection light (LT2) emitted from the second light source (522) may be white light. Accordingly, when the second inspection light (LT2) is white light, the light incident from the top of the second display substrate (20) toward the second display substrate (20) is incident on and partially transmitted and reflected by the color filter layer (CFL) of the second display substrate (20), so that only the color corresponding to each subpixel (PXS) is reflected. In an exemplary embodiment, when the second inspection light (LT2) emitted from the second light source (522) toward the second display substrate (20) is incident on the color filter layer (CFL1) of the first subpixel (PXS1), the light of the first color (LS1) may be reflected and proceed toward the camera unit (530). Similarly, when the second inspection light (LT2) emitted from the second light source (522) toward the second display substrate (20) is incident on the color filter layer (CFL2) of the second subpixel (PXS2), the light of the second color (LS2) may be reflected and proceed toward the camera unit (530). Additionally, when the second inspection light (LT2) emitted from the second light source (522) toward the second display substrate (20) is incident on the color filter layer (CFL3) of the first subpixel (PXS3), the light of the third color (LS3) may be reflected and proceed toward the camera unit (530). Accordingly, when the second inspection light (LT2) is emitted, the camera unit (530) can output image data in which a second pattern (PT2_2) is formed that emits light in the first to third colors described later by the color filter layer (CFL).

[0166] Third, the control unit (550_2) determines whether the first display substrate (10) and the second display substrate (20) are misaligned. (S130_2 of FIG. 20)

[0167] Examples of step S130_2 are described in detail in conjunction with FIGS. 20 and FIGS. 22 to 25.

[0168] First, a camera unit (520) positioned on the upper part of the support (1) photographs the first display substrate (10) and the second display substrate (20) positioned on the upper part of the support (510), and calculates a pattern through the captured image data. (S131_2 of FIG. 20)

[0169] Specifically, referring to FIGS. 20, 22, and 23, the camera unit (520) is positioned on the upper part of the support (510) and can capture an image in which the first inspection light (LT1) and the second inspection light (LT2) emitted from the first light source (521) and the second light source (522) are incident toward the display device (1) and are reflected and absorbed. A plurality of patterns (PT1_2, PT2_2) may be formed in the image data captured by the camera unit (520). As described above, the first inspection light (LT1) has a low transmittance to the conductive layers (DL, GL, ELVSL), so the area where the conductive layers (DL, GL, ELVSL) are placed is visible, and a pattern can be formed. Therefore, the area where the conductive layers (DL, GL, ELVSL) are placed can be formed as a pattern. Additionally, a second inspection light (LT2) is incident on the color filter layer (CFL) disposed on the second display substrate (20), so that the color of each subpixel (PXS) can be emitted in the planar shape of the color filter layer (CFL). That is, the shape of the color filter layer (CFL) can be patterned and formed in the color of each subpixel (PXS) by the second inspection light (LT2).

[0170] As described above, a pattern (PT1_2, PT2_2) may be formed in the image data captured by the camera unit (520) of the alignment inspection device (50_2). The pattern (PT1_2, PT2_2) calculated from the image data may include a first pattern (PT1_2) and a second pattern (PT2_2). The first pattern (PT1_2) may be a conductive layer of the first display substrate (10), and the second pattern (PT2_2) may be a color filter layer (CFL) of the second display substrate (20).

[0171] Next, the distance between the first pattern (PT1_2) and the second pattern (PT2_2) is measured. (S133_2 of FIG. 20) Specifically, the distance (w) between the first pattern (PT1_2) and the second pattern (PT2_2) may be the distance between two sides of the first pattern (PT1_2) and the second pattern (PT2_2) that face each other.

[0172] For example, referring to FIGS. 20 and FIGS. 23, the distance (w) between the first pattern (PT1_2) and the second pattern (PT2_2) may be the distance between two sides of the first pattern (PT1_2) and the second pattern (PT2_2) facing each other. The distance (w) between the first pattern (PT1_2) and the second pattern (PT2_2) may be the shortest distance between two sides of the first pattern (PT1_2) and the second pattern (PT2_2) facing each other.

[0173] In an exemplary embodiment, the distance (w) between the first pattern (PT1_2) and the second pattern (PT2_2) may be the distance between the fourth side formed on the fourth side of the second direction (DR2) of the second pattern (PT2_2) corresponding to the first color filter layer (CFL1) of the first subpixel (PXS1), the first side formed on the first side opposite to the first direction (DR1) of the second pattern (PT2_2), and the side of the first pattern (PT1_2) facing the first side and the fourth side of each second pattern (PT2_2).

[0174] The distance between the first pattern (PT1_2) and the second pattern (PT2_2) can be measured as the distance (Wx, Wy) between two opposing sides of the first and fourth sides, respectively. The measured first distance (Wx) between the first pattern (PT1_2) and the second pattern (PT2_2) may be the distance in the first direction (DR1) between the first side of the second pattern (PT2_2) and the side of the first pattern (PT1_2) that is opposite to the first side. Likewise, the measured second distance (Wy) between the first pattern (PT1_2) and the second pattern (PT2_2) may be the distance in the second direction (DR2) between the fourth side of the second pattern (PT2_2) and the side of the first pattern (PT1_2) that is opposite to the fourth side.

[0175] Next, it is determined whether the measured distance (W) is included within the critical region. (S135_2 in FIG. 20)

[0176] The control unit (550) can compare the first and second distances (Wx, Wy) between the measured first pattern (PT1_2) and the second pattern (PT2_2) with a predetermined threshold area. The threshold area may include a first threshold area in the first direction (DR1) and a second threshold area in the second direction (DR2). The first threshold area may be greater than or equal to a first threshold (THx1) and less than or equal to a second threshold (THx2) which is higher than the first threshold. The second threshold area may be greater than or equal to a third threshold (THy1) and less than or equal to a fourth threshold (THy2) which is higher than the third threshold.

[0177] Next, by comparing the measured distance (W) with the critical region, if the measured distance (W) is not included in the critical region, the judgment unit (555) determines that the display device (1) is defective because the alignment of the first display substrate (10) and the second display substrate (20) is poor. (S137 of FIG. 20)

[0178] Specifically, if at least one of the measured first and second distances (Wx, Wy) is not included in the critical region, the judgment unit (555) determines that the display device (1) is defective because the alignment of the first display substrate (10) and the second display substrate (20) is poor. If the measured first distance (Wx) is not included within the first critical region, or if the measured second distance (Wy) is not included in the second critical region, the judgment unit (555) may determine that the display device (1) is defective.

[0179] For example, referring to FIG. 25, the measured first distance (Wx) is greater than the first threshold value (THx1) and less than the second threshold value (THx2), so it is included within the first threshold range, but the measured second distance (Wy) is greater than the fourth threshold value (Thy2), so it is not included within the second threshold range. Therefore, since the measured second distance (Wy) is not included within the second threshold range, the display device (1) can be determined to be defective.

[0180] Next, by comparing the measured distance (W) with the critical region, if the measured distance (W) is included in the critical region, the judgment unit (555) determines that the display device (1) is a good product because the alignment of the first display substrate (10) and the second display substrate (20) is normal. (S139 of FIG. 20)

[0181] Specifically, if both the measured first and second distances (Wx, Wy) fall within the critical region, the judgment unit (555) determines that the display device (1) is a good product because the alignment of the first display substrate (10) and the second display substrate (20) is normal. If the measured first distance (Wx) falls within the first critical region and the measured second distance (Wy) falls within the second critical region, the judgment unit (555) can determine that the display device (1) is a good product.

[0182] For example, referring to FIG. 24, the measured first distance (Wx) is greater than the first threshold value (THx1) and less than the second threshold value (THx2), so it is included within the first threshold range, and the measured second distance (Wy) is greater than the third threshold value (THy1) and less than the fourth threshold value (THy2), so it is included within the second threshold range. Therefore, since the measured first distance (Wx) and second distance (Wy) are each included within the first threshold range and the second threshold range, respectively, the display device (1) can be determined to be a good product.

[0183] Hereinafter, other embodiments regarding an alignment inspection device and an alignment inspection method using the alignment inspection device will be described. In the following embodiments, descriptions of components identical to those in the previously described embodiments will be omitted or simplified, and the explanation will focus on the differences.

[0184] FIG. 26 is a schematic side view of an alignment inspection device according to another embodiment. FIG. 27 is a flowchart showing an alignment inspection method of the alignment inspection device of FIG. 26. FIG. 28 is a plan view showing an example of step S320 of FIG. 27. FIG. 29 is a plan view showing an example of step S330 of FIG. 27. FIG. 30 is a plan view showing an example of step S330 of FIG. 27. FIG. 31 is a plan view showing an example of step S340 of FIG. 27. FIG. 32 through 37 are plan views for explaining step S370 of FIG. 27.

[0185] Referring to FIG. 26, an alignment inspection device (50_3) according to another embodiment may include a support (510), a light source unit (520_3), a camera unit (530), a moving unit (540), and a control unit (550_3). An alignment inspection device (50_3) of a display device according to this embodiment may include a support (510), a light source unit (520_3), a camera unit (530), a moving unit (540), and a control unit (550_3). The alignment inspection device according to this embodiment is different from the embodiment of FIG. 7 in that the light source unit (520_3) includes a plurality of light sources that emit light of different wavelengths, and the plurality of light sources are located on the upper part of the support (510).

[0186] Referring to FIG. 26, the light source unit (520_3) of the alignment inspection device (50_3) according to the present embodiment may include a first light source (521_3) and a second light source (522_3).

[0187] The first light source (521_3) and the second light source (522_3) are positioned on the upper part of the support (510) and can emit the first inspection light (LT1_3) and the second inspection light (LT2_3), respectively, toward the support (510). The first inspection light (LT1_3) and the second inspection light (LT2_3) may be infrared or near-infrared light of different wavelength bands. The first inspection light (LT1_3) and the second inspection light (LT2_3), having different wavelengths, may be light with different transmittances to the light-blocking member (BML) included in the second display substrate (20). For example, the first inspection light (LT1_3) may be light with a high transmittance to the light-blocking member (BML), and the second inspection light (LT2_3) may be light with a relatively low transmittance to the light-blocking member (BML). However, even in this case, since the first inspection light (LT1_3) and the second inspection light (LT2_3) are infrared or near-infrared, they may not emit light in the first to third colors even when incident on the color filter layer (CFL) or wavelength conversion layer (WCL) of the second display substrate (20). In an exemplary embodiment, the first inspection light (LT1) may be infrared having a peak wavelength in the range of about 930 nm to about 970 nm, and the second inspection light (LT2) may be near-infrared having a peak wavelength in the range of about 750 nm to about 780 nm.

[0188] Hereinafter, embodiments according to the alignment inspection method of the first display substrate (10) and the second display substrate (20) of the alignment inspection device (50_3) according to another embodiment will be described in detail in conjunction with FIG. 27 and FIG. 37.

[0189] Referring to FIGS. 27 to 31, the alignment inspection method of a display device of an alignment inspection device (50_3) according to the present embodiment may include the steps of: preparing a display device (1) on a support (510) (S310); emitting a first inspection light (LT1_3) from a first light source (521_3) toward the display device (1) (S320); calculating a first center point (P1) of a first pattern (PT1_3) through image data (S330); emitting a second inspection light (LT2_3) from a second light source (522_3) toward the display device (1) (S340); calculating a second center point (P2) of a second pattern (PT2_3) through image data (S350); measuring the distance between the first center point (P1) and the second center point (P2) (S360); and comparing the measured distance with a threshold value (S370).

[0190] First, a display device (1) is prepared on a support (510). (S310 of FIG. 27) Specifically, a display device (1) is prepared on a support (510) including a first display substrate (10) and a second display substrate (20) disposed on top of the first display substrate (10).

[0191] Next, the first inspection light (LT1_3) is emitted from the first light source (521_3) toward the display device (1). (S320 of FIG. 27)

[0192] Specifically, referring to FIGS. 27 and 28, the first inspection light (LT1_3) emitted from the first light source (521_3) positioned on the upper part of the support (510) may be light with high transmittance to the color filter layer (CFL) and light-blocking member (BML) of the second display substrate (20). Accordingly, the first inspection light (LT1_3) may pass through the second display substrate (20), be incident on the upper surface of the first display substrate (10), and be reflected from the upper surface of the pixel electrode (PXE).

[0193] Next, the first center point (P1) of the first pattern (PT1_3) is calculated using the image data. (S330 of FIG. 27)

[0194] Specifically, referring to FIGS. 27 and 29, the camera unit (530) of the alignment inspection device (50_3) can generate image data by emitting a first inspection light (LT1_3) toward the display device (1) and then photographing the display device (1). After emitting the first inspection light (LT1_3) onto the display device (1), the first image data captured by the camera unit (530) can form a first pattern (PT1_3). The first pattern (TP1_3) may be a pixel electrode layer (PXE) of the first display substrate (10). As described above, the pixel electrode layer (PXE) may include first to fourth sides. In an exemplary embodiment, the first center point (P1) can be calculated by measuring the intersection point of the midline between the first and third sides and the midline between the second and fourth sides of the first pattern (PT1_3).

[0195] Next, the second light source (522_3) emits a second inspection light (LT2_3) toward the display device (1). (S340 of FIG. 27),

[0196] Specifically, referring to FIG. 27 and FIG. 30, the second inspection light (LT1_3) emitted from the second light source (522_3) placed on the upper part of the support (510) may be light that has a high transmittance to the color filter layer (CFL) of the second display substrate (20) but a low transmittance to the light-blocking member (BML). Accordingly, when the second inspection light (LT2_3) is incident on the color filter layer (CFL) included in the second display substrate (20), it is reflected and transmitted, but when it is incident on the light-blocking member (BML) of the second display substrate (20), it may be absorbed.

[0197] Next, the second center point (P2) of the second pattern (PT2_3) is calculated using the image data. (S350 of FIG. 27)

[0198] Specifically, referring to FIG. 27 and FIG. 31, the camera unit (530) of the alignment inspection device (50_3) can generate image data by emitting a second inspection light (LT2_3) onto the display device (1) and then photographing the display device (1). After emitting the second inspection light (LT2_3) toward the display device (1), the second image data photographed by the camera unit (530) can form a first pattern (PT2_3). The second pattern (TP2_3) may be a color filter layer (CFL) placed in an area partitioned by a light-blocking member (BML) of the second display substrate (20). As described above, the color filter layer (CFL) may include first to fourth sides. In an exemplary embodiment, the second center point (P2) may be calculated by measuring the intersection point of the midline between the first and third sides of the second pattern (PT2_3) and the midline between the second and fourth sides.

[0199] Next, the distance between the first center point (P1) and the second center point (P2) is measured using the third image data obtained by superimposing the first image data and the second image data. (S360 of FIG. 27)

[0200] Specifically, the distance between the first center point (P1) and the second center point (P2) is measured by calculating the coordinates of the first direction (DR1) of the first center point (P1) and the coordinates of the first direction (DR1) of the second center point (P2) to measure the first distance (Wx), which is the difference between the two coordinates, and by calculating the coordinates of the second direction (DR2) of the first center point (P1) and the coordinates of the second direction (DR2) of the second center point (P2) to measure the second distance (Wy), which is the difference between the two coordinates.

[0201] Next, the measured distance is compared with the threshold value. (S370 in FIG. 27)

[0202] Specifically, the measured first distance (Wx) and second distance (Wy) can be compared with a predetermined threshold value. The threshold value may include a threshold value (THx) for the first direction (DR1) and a second threshold value (THy) for the second direction (DR2). The first threshold value (THx) for the first direction (DR1) and the second threshold value (THy) for the second direction (DR2) may be different from each other. The measured first distance (Wx) can be compared with the first threshold value (THx), and the measured second distance (Wy) can be compared with the second threshold value (THy).

[0203] Next, the measured distance (W) is compared with the threshold value (TH), and if the measured distance (W) is less than the threshold value, the judgment unit (555) determines that the display device (1) is a good product because the alignment of the first display substrate (10) and the second display substrate (20) is normal. (S381 of FIG. 27)

[0204] Referring to FIGS. 32 to 34, an example of a process for determining the quality of a display device using the alignment inspection device (50_3) of the present embodiment will be explained.

[0205] As shown in FIG. 32, the first center point (P1) of the first pattern (PT1_3) can be calculated from the first image data captured by the camera unit (530) after emitting the first inspection light (LT1_3). As described above, the first center point (P1) can be calculated by measuring the intersection point of the midline between the first and third sides and the midline between the second and fourth sides of the first pattern (PT1_3).

[0206] Next, as shown in FIG. 33, the second center point (P2) of the second pattern (PT2_3) can be calculated from the second image data captured by the camera unit (530) after emitting the second inspection light (LT2_3). As described above, the second center point (P2) can be calculated by measuring the intersection point of the midline between the first and third sides and the midline between the second and fourth sides of the second pattern (PT2_3).

[0207] Next, as shown in FIG. 34, the first image data and the second image data can be superimposed to measure the first distance and the second distance between the first center point (P1) and the second center point (P2). As described above, the first distance (Wx) and the second distance (Wy) between the first center point (P1) and the second center point (P2) can be measured and compared with the predetermined first threshold value (THx) and second threshold value (THy), respectively. Since the first distance (Wx) and the second distance (Wy) are each smaller than the first threshold value (THx) and the second threshold value (THy), the display device can be determined to be a good product.

[0208] Next, the measured distance (W) is compared with the threshold value (TH), and if the measured distance (W) is greater than or equal to the threshold value, the judgment unit (555) determines that the display device (1) is defective because the alignment of the first display substrate (10) and the second display substrate (20) is abnormal. (S383 of FIG. 27)

[0209] Referring to FIGS. 35 to 37, an example of a process for determining a defective product of a display device using the alignment inspection device (50_3) of the present embodiment will be explained.

[0210] As shown in FIG. 35, the first center point (P1) of the first pattern (PT1_3) can be calculated from the first image data captured by the camera unit (530) after emitting the first inspection light (LT1_3). As described above, the first center point (P1) can be calculated by measuring the intersection point of the midline between the first and third sides and the midline between the second and fourth sides of the first pattern (PT1_3).

[0211] Next, as shown in FIG. 36, the second center point (P2) of the second pattern (PT2_3) can be calculated from the second image data captured by the camera unit (530) after emitting the second inspection light (LT2_3). As described above, the second center point (P2) can be calculated by measuring the intersection point of the midline between the first and third sides and the midline between the second and fourth sides of the second pattern (PT2_3).

[0212] Next, as shown in FIG. 37, the first image data and the second image data can be superimposed to measure the first distance and the second distance between the first center point (P1) and the second center point (P2). As described above, the first distance (Wx) and the second distance (Wy) between the first center point (P1) and the second center point (P2) can be measured and compared with the predetermined first threshold value (THx) and second threshold value (THy), respectively. Since the first distance (Wx) is smaller than the first threshold value (THx) but the second distance (Wy) is larger than the second threshold value (THy), the display device can be determined to be defective.

[0213] Although embodiments of the present invention have been described above with reference to the attached drawings, those skilled in the art will understand that the present invention may be implemented in other specific forms without changing the technical concept or essential features thereof. Therefore, the embodiments described above should be understood as illustrative in all respects and not restrictive. Explanation of the symbols

[0214] 1: Display device 10: First display board 20: Second display board CFL: Color filter layer WCL: Wavelength conversion layer BML: Light-blocking member PXSE: Subpixel electrode Pattern 1: PT1 Pattern 2: PT2

Claims

Claim 1 A support on which a display device comprising a first display substrate and a second display substrate disposed above the first display substrate is mounted; a light source unit disposed above the support and emitting inspection light toward the support; and a camera unit disposed above the support to photograph the first display substrate and the second display substrate and generate image data. The alignment inspection device of the display device comprises a control unit that calculates a first pixel pattern of the first display substrate and a second pixel pattern of the second display substrate from the image data, and determines whether there is an alignment defect between the first display substrate and the second display substrate using the first pixel pattern and the second pixel pattern, wherein the display device comprises a plurality of pixels, each pixel comprising a pixel electrode pattern included in the first display substrate, a light-blocking member included in the second display substrate, and a color filter pattern disposed in a space partitioned by the light-blocking member, wherein the pixel electrode pattern has a shape similar to the color filter pattern, the first pixel pattern is the pixel electrode pattern, and the second pixel pattern is the color filter pattern, and the control unit measures the gap between corresponding sides between the first pixel pattern and the second pixel pattern, and determines whether there is an alignment defect between the first display substrate and the second display substrate by comparing the measured gap with a threshold value. Claim 2 In claim 1, the alignment inspection device of a display device in which the inspection light is infrared or near-infrared. Claim 3 delete Claim 4 delete Claim 5 In claim 1, the inspection light is an alignment inspection device of a display device in which the transmittance to the light-blocking member is lower than the transmittance to the color filter pattern and the pixel electrode pattern. Claim 6 In claim 1, the light source unit comprises a first light source emitting a first inspection light and a second light source emitting a second inspection light, wherein the wavelength band of the first inspection light and the wavelength band of the second inspection light are different from each other, an alignment inspection device of a display device. Claim 7 In claim 6, an alignment inspection device of a display device in which the transmittance of the first inspection light to the light-blocking member is higher than the transmittance of the second inspection light to the light-blocking member. Claim 8 A support on which a display device comprising a first display substrate and a second display substrate disposed above the first display substrate is mounted; a first light source disposed above the support and emitting a first inspection light toward the support; a second light source disposed below the support and emitting a second inspection light toward the support; and a camera unit disposed above the support to photograph the first display substrate and the second display substrate and generate image data. A display device alignment inspection device comprising a control unit that calculates a first pattern of a first display substrate and a second pattern of a second display substrate from the image data, and determines whether there is an alignment defect between the first display substrate and the second display substrate using the first pattern and the second pattern, wherein the wavelength band of the first inspection light and the wavelength band of the second inspection light are different from each other, the first display substrate includes a conductive pattern and the second display substrate includes a color filter pattern, wherein the first pattern is the conductive pattern and the second pattern is the color filter pattern, and the control unit measures the distance between two opposing sides between the first pattern and the second pattern and determines whether there is an alignment defect between the first display substrate and the second display substrate by comparing the measured distance with a threshold range. Claim 9 In claim 8, the alignment inspection device of a display device, wherein the first inspection light is light in the short wavelength band and the second inspection light is light in the long wavelength band. Claim 10 In claim 8, the alignment inspection device of a display device wherein the first inspection light is white light and the second inspection light is infrared or near-infrared. Claim 11 delete Claim 12 delete Claim 13 A step of preparing a display device comprising a first display substrate and a second display substrate disposed on top of the first display substrate; a step of emitting inspection light from the top of the display device toward the display device; a step of photographing the display device from the top of the display device to produce a first pattern and a second pattern, and measuring the distance between the first pattern and the second pattern; A method for inspecting alignment of a display device, comprising the step of determining whether there is an alignment defect between the first display substrate and the second display substrate by comparing the measured distance and a threshold value, wherein the display device includes a plurality of pixels, and each pixel includes a pixel electrode pattern included in the first display substrate, a light-blocking member included in the second display substrate, and a color filter pattern included in the second display substrate and disposed in an area partitioned by the light-blocking member, wherein the pixel electrode pattern has a shape similar to the color filter pattern, the first pattern is the pixel electrode pattern, the second pattern is the color filter pattern, and the measurement of the distance between the first pattern and the second pattern is the distance between the sides facing each other. Claim 14 delete Claim 15 delete Claim 16 In claim 13, the method for inspecting alignment of a display device wherein the inspection light has a transmittance to the light-blocking member lower than the transmittance to the color filter pattern and the pixel electrode pattern. Claim 17 In claim 16, the method for inspecting alignment of a display device wherein the inspection light is infrared or near-infrared. Claim 18 In claim 13, the step of determining whether the first display substrate and the second display substrate are misaligned comprises: a step of determining the display device as defective if the measured distance is greater than or equal to the threshold value; and a step of determining the display device as good if the measured distance is less than the threshold value. Claim 19 delete Claim 20 delete Claim 21 delete

Images