Apparatus for measuring alignment state of satellite thruster, system for measuring alignment state of satellite thruster and method for measuring alignment state of satellite thruster

Abstract

A device for measuring the precision alignment state of an artificial satellite thruster may include a base, a first plate positioned on the base and supporting the thruster, a second plate positioned below the first plate parallel to the first plate and supporting a target cube, a fixed disk positioned on the first plate and supporting the thruster, one or more supports connecting the base, the first plate and the fixed disk and elastically supporting the first plate, and one or more adjustment assemblies for adjusting the position of the first plate.

Description

Technology Field

[0001] The present invention relates to an apparatus for measuring the precision alignment state of a satellite thruster, a system for measuring the precision alignment state of a satellite thruster, and a method for measuring the precision alignment state of a satellite thruster. Background Technology

[0002] An artificial satellite is loaded onto a launch vehicle and launched; once the vehicle reaches a specific altitude, it separates from the launch vehicle. After separating, the satellite enters orbit and includes thrusters for orbit adjustment and attitude control during the mission. Since the thrusters must be precisely aligned with the satellite body to move the satellite in the desired direction, it is necessary to verify that the thrusters are accurately aligned with the satellite's reference axis before launch. This verification process involves measuring the thrust vector of the thrusters relative to the satellite's reference axis and is referred to as thruster precision alignment. Prior art literature

[0003] Japanese Patent Publication JP 1997-264711 A The problem to be solved

[0004] The present invention provides various embodiments of an apparatus for measuring the precision alignment state of a satellite thruster, a system for measuring the precision alignment state of a satellite thruster, and a method for measuring the precision alignment state of a satellite thruster. means of solving the problem

[0005] A device for measuring the precision alignment state of an artificial satellite thruster may include a base, a first plate positioned on the base and supporting the thruster, a second plate positioned below the first plate parallel to the first plate and supporting a target cube, a fixed disk positioned on the first plate and supporting the thruster, one or more supports connecting the base, the first plate and the fixed disk and elastically supporting the first plate, and one or more adjustment assemblies for adjusting the position of the first plate.

[0006] The above target cube is located in the space partitioned between the base, the second plate, and the one or more supports, and can be connected to the second plate.

[0007] The second plate includes a receiving groove on its bottom surface for receiving an adhesive, and the target cube can be attached to the bottom surface of the second plate with one side in contact with the receiving groove while the adhesive is received in the receiving groove.

[0008] The above receiving groove may include a first groove formed concavely inward to form a step with the bottom surface of the second plate, and a second groove extending radially from the center of the first groove and formed deeper than the first groove.

[0009] The first plate includes a seating groove in the center into which one end of the thruster is inserted, and the fixed disk may include one or more inclined surfaces corresponding to the throat shape of the thruster.

[0010] The fixed disk may include a first surface and a second surface having different inclinations, a support surface that contacts the neck of the thruster and includes an opening in the center, and an insertion path that communicates with the opening of the support surface and extends to the outer surface of the fixed disk.

[0011] The above one or more supports may include a shaft, one end of which is connected to the base and the other end of which is connected to the fixed disk, and the first plate inserted between the one end and the other end, and a spring wound around the outer surface of the shaft and positioned between the base and the first plate.

[0012] The above one or more supports can elastically support the first plate by having the spring in contact with the bottom surface of the first plate.

[0013] It may further include one or more adjustment assemblies connected to the first plate and adjusting the position of the first plate to adjust the position of the thruster.

[0014] The above one or more adjustment assemblies may include a head located on the upper surface of the first plate, a screw connected to the head and passing through the first plate and the second plate, and a nut fastened to the screw and in contact with the lower surface of the second plate.

[0015] As the head rotates, the position of the first plate relative to the second plate changes, and the one or more supports can support the first plate in a direction opposite to the direction of movement of the first plate due to the rotation of the head.

[0016] When the head rotates in one direction, the head presses the first plate downward while the first plate moves, and the one or more supports elastically support the first plate upward, and when the head rotates in the other direction, the head moves away from the first plate while the first plate moves, and the one or more supports elastically support the first plate downward.

[0017] The fixed disk may include a slit at a position where the head can be rotated at a position corresponding to each head of the one or more adjustment assemblies.

[0018] It may further include one or more ball springs inserted into the first plate and in contact with the second plate.

[0019] The above one or more ball springs allow a ball located at one end to roll on the upper surface of the second plate, and the spring can elastically support the ball.

[0020] A system for measuring the precision alignment state of a satellite thruster is a measuring system comprising a device for measuring the precision alignment state of the satellite thruster described above, wherein the system may include a support device on which a reference cube is located and to which the device for measuring the precision alignment state of the satellite thruster is rotatably connected, and a plurality of theodolites for measuring the reference coordinate axes of the satellite from the reference cube and measuring the thrust vector of the thruster from the target cube.

[0021] Two of the plurality of theodolites can measure the reference coordinate axes of the satellite from the reference cube, and the other two of the plurality of theodolites can measure the normal vector of the thruster from the target cube.

[0022] The above system measures the thrust vector of the thruster at an initial position where a device for measuring the precision alignment state of the satellite thruster is connected to the support device, and then measures the thrust vector of the thruster again by reversing the device for measuring the precision alignment state of the satellite thruster at the initial position by 180 degrees, and then terminates the measurement if the angle difference between the two measured thrust vectors satisfies a predetermined range, and if the angle difference between the two measured thrust vectors deviates from the predetermined range, the position of the thruster can be adjusted using the device for measuring the precision alignment state of the satellite thruster.

[0023] If the angle difference between two measured thrust vectors exceeds 0.1 degrees, the system can adjust the position of the first plate using one or more adjustment assemblies to adjust the position of the thruster, then measure the thrust vector of the thruster again at the initial position, and then reverse the device for measuring the precision alignment state of the satellite thruster at the initial position by 180 degrees to measure the thrust vector of the thruster again, and repeat the operation so that the angle difference between the two measured thrust vectors is within 0.1 degrees.

[0024] A method for measuring the precision alignment state of a satellite thruster comprises the steps of: positioning a reference cube on a support device; measuring the normal vector of the reference cube using two or more theodolites among a plurality of theodolites; connecting a target cube and the thruster to a device for measuring the precision alignment state of the satellite thruster; connecting the device for measuring the precision alignment state of the satellite thruster to the support device; measuring the normal vector of the target cube using two or more theodolites among the plurality of theodolites at the initial connected position to measure a first thrust vector of the thruster; rotating the device for measuring the precision alignment state of the satellite thruster 180 degrees at the initial position; measuring the normal vector of the target cube using two or more theodolites among the plurality of theodolites at the rotated position to measure a second thrust vector of the thruster; determining whether the difference between the first thrust vector and the second thrust vector satisfies a predetermined range; and the first thrust vector and the second thrust vector If the difference deviates from a predetermined range, the method may include a step of adjusting the position of the thruster using a device for measuring the precise alignment state of the satellite thruster. Effects of the invention

[0025] The apparatus for measuring the precise alignment state of a satellite thruster, the system for measuring the precise alignment state of a satellite thruster, and the method for measuring the precise alignment state of a satellite thruster according to one or more embodiments of the present invention can accurately align the thruster and the target cube simply by mounting the thruster and the target cube on the measuring device. The apparatus for measuring the precise alignment state of a satellite thruster, the system for measuring the precise alignment state of a satellite thruster, and the method for measuring the precise alignment state of a satellite thruster according to one or more embodiments of the present invention can perform detailed calibration even if misalignment occurs in the thruster during the measurement process. Brief explanation of the drawing

[0026] Figure 1 schematically shows an artificial satellite and a thruster. Figure 2 schematically shows a measurement system. Figures 3 and 4 schematically illustrate the operation of the measurement system. Figure 5 shows a perspective view of a measuring device. Figure 6 shows an exploded perspective view of a measuring device. Figure 7 shows a front view of a measuring device. Figure 8 shows the third plate. FIGS. 9A, FIGS. 9B, FIGS. 9C, FIGS. 9D, FIGS. 9E, and FIGS. 9F illustrate the operation of a measuring device. Specific details for implementing the invention

[0027] Some embodiments of the present disclosure and methods thereof may be understood by referring to the detailed description of the embodiments and the drawings. The described embodiments may have various variations and may be implemented in other forms and are not limited to the embodiments described herein. Furthermore, the features of each of the various embodiments of the present disclosure may be combined with one another in whole or in part. Each embodiment may be implemented independently of one another or in relation to one another. The described embodiments are provided as examples to ensure that the present disclosure is complete and complete, and are also intended to fully convey the spirit of the present disclosure to those skilled in the art to which the present disclosure pertains. The present disclosure is subject to all variations, equivalents, and substitutions within the spirit and technical scope of the present invention. Accordingly, processes, elements, and technologies that are not necessary to a person skilled in the art for a complete understanding of the embodiments of the present disclosure may not be described.

[0028] Throughout the attached drawings and specifications, unless otherwise noted, the same reference numerals, letters, or combinations thereof denote the same components, so redundant descriptions are omitted. Additionally, to clearly explain the present invention, parts unrelated to the description or parts unrelated to the description have been omitted.

[0029] In the drawings, the relative sizes of elements, layers, and regions may be exaggerated for clarity. The use of hatching and / or shading in the attached drawings is generally provided to clarify the boundaries between adjacent elements. Therefore, the presence or absence of hatching or shading does not indicate the preferred form or requirements for specific materials, material properties, dimensions, proportions, commonalities between figure elements, and / or other characteristics, attributes, properties, etc., of the elements unless otherwise specified.

[0030] Various embodiments are described herein with reference to cross-sectional examples, which are schematic examples of embodiments and / or intermediate structures. Accordingly, the shapes in the drawings may vary, for example, as a result of manufacturing techniques and / or tolerances. Furthermore, specific structural or functional descriptions disclosed herein are merely examples to illustrate embodiments according to the concept of the invention. Accordingly, the embodiments disclosed herein should not be interpreted as being limited to the shapes of the illustrated areas and include, for example, variations in shape due to manufacturing.

[0031] The areas depicted in the drawings are by nature schematic and their shapes are not intended to exemplify or limit the actual shapes of the device areas. Furthermore, as recognized by a person skilled in the art, the described embodiments may be modified in various ways without departing from the spirit or scope of the present disclosure.

[0032] Numerous specific details are presented in the specification to provide a complete understanding of the various embodiments. However, the various embodiments may be implemented without these specific details or including one or more of them. In other cases, well-known structures and devices are illustrated in block diagram form to avoid unnecessarily obscuring the various embodiments.

[0033] To facilitate explanation and to describe the relationship between one element or feature and another element or feature as illustrated in the drawings, spatially relative terms such as "below," "above," "lower," and "upper" may be used. Spatially relative terms are intended to include various directions of the device in use or operation in addition to the directions depicted in the drawings. For example, if the device in the drawings is inverted, another element or feature described as "below" or "lower" will face "above" the other element or feature. Thus, as exemplary terms, "below" and "lower" may include both upper and lower directions. The device may face other directions (e.g., rotated 90 degrees or in other directions), and spatially relative descriptions used herein should be interpreted accordingly. Likewise, if it is stated that the first part is positioned "above" the second part, this means that the first part is positioned on the upper or lower side of the second part.

[0034] Additionally, the expression “viewed in plan” means the case where the object part is viewed from above, and the expression “in a schematic section” means the case where a schematic section is taken by cutting the object part vertically. The term “viewed in side” means that the first object may be above, below, or to the side of the second object, and vice versa. Furthermore, the terms “overlap” or “superimposition” may include layer, stack, plane, extension, cover, or partial cover, or any other suitable term that a person skilled in the art understands and can understand. The expression “not overlapping” may include meanings such as “away from” or “separated from” and any other suitable equivalents recognized and understood by a person skilled in the art. The terms “plane” and “surface” may mean that the first object may face the second object directly or indirectly. Where a third object is present between the first object and the second object, the first object and the second object may be understood as facing each other but indirectly opposing each other.

[0035] When an element, layer, region, or component is referred to as being "formed," "connected," or "coupled" to another element, it may be formed directly on the layer, region, or component, formed on another component, layer, region, or component, or formed indirectly on another component, connected, or coupled. Additionally, direct or indirect coupling or connection of elements, layers, regions, or components, and integral or non-integral coupling or connection may be collectively referred to so that one or more elements, layers, regions, or components may exist. For example, when an element, layer, region, or component is referred to as being "electrically connected" or "electrically coupled" to another element, layer, region, or component, it may be directly electrically connected or coupled to the other element, layer, region, or component, or another element, layer, region, or component may exist. However, "direct connection" or "direct coupling" means that one component is directly connected or coupled to another component without an intermediate component, or is on another component. In addition, in this specification, when a part of a layer, film, region, plate, etc. is formed on another part, the direction of formation is not limited to the upward direction and includes cases where the part is formed on the side or bottom. Conversely, when a part of a layer, film, region, plate, etc. is formed "below" another part, it includes not only cases where the part is "immediately below" the other part, but also cases where there is another part between the part and the other part. Meanwhile, other expressions describing the relationship between components, such as "between," "immediately between," "adjacent to," and "immediately adjacent to," may be interpreted similarly. Furthermore, when an element or layer is referred to as being "between" two elements or layers, it may be the only element between the two elements or layers, or there may be another element between them.

[0036] For the purposes of this specification, expressions such as “at least one” or “any one” do not limit the order of individual elements. For example, “at least one of X, Y, and Z”, “at least one of X, Y, or Z”, and “at least one selected from the group consisting of X, Y, and Z” may include X alone, Y alone, Z alone, or any combination of two or more of X, Y, and Z. Similarly, expressions such as “at least one of A and B” and “at least one of A or B” may include A, B, or A and B. In this specification, “or” generally means “and / or,” and the term “and / or” includes any combination of one or more related list items. For example, expressions such as “A and / or B” may include A, B, or A and B.

[0037] Terms such as "first," "second," "third," etc. may be used herein to describe various elements, components, regions, layers, and / or sections, but such elements, components, regions, layers, and / or sections are not limited by these terms. These terms are used to distinguish one element, component, region, layer, or section from another element, component, region, layer, or section. Accordingly, the first element, component, region, layer, or section described below may be referred to as the second element, component, region, layer, or section without departing from the spirit and scope of the invention. Describing an element as the "first" element does not require or imply the existence of the second element or other elements. Terms such as "first," "second," etc. may also be used herein to distinguish different categories or sets of elements. For clarity, terms such as "first," "second," etc. may each denote "first category (or first set)," "second category (or second set)," etc.

[0038] The terms used in this application are used merely to describe specific embodiments and are not intended to limit the invention. As used herein, singular expressions are intended to include plural expressions, and plural expressions are intended to include the singular form unless the context clearly indicates otherwise. The terms “include,” “comprising,” and “have” mean to specify the presence of the features, integers, and steps specified herein. These expressions do not exclude the presence or addition of one or more other functions, steps, operations, components, and / or groups thereof.

[0039] Where one or more embodiments may be implemented differently, a specific process sequence may be performed differently from the described order. For example, two processes described consecutively may be performed substantially simultaneously or in the reverse order of the described order.

[0040] The terms “substantially,” “about,” “approximately,” and similar terms are used as terms of approximation rather than terms of degree, and are intended to describe the inherent deviation of a measured or calculated value that is perceptible to a person skilled in the art. As used herein, “about” or “approximately” includes the mentioned value and means within an acceptable range of deviation from a specific value determined by a person skilled in the art, taking into account the measurement and associated errors (e.g., a range of deviation due to the limitations of the measurement system). For example, “about” may mean within one or more standard deviations or within ±30%, 20%, 10%, or 5% of the specified value. Additionally, when describing embodiments of the present disclosure, the use of “may” means “one or more embodiments of the present disclosure.”

[0041] Unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as generally understood by those skilled in the art to which the present invention pertains. Terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with that meaning in the context of the relevant technology and / or this specification, and should not be interpreted in an idealized or overly formal sense unless explicitly defined herein.

[0042] FIG. 1 schematically shows an artificial satellite (S) and a thruster (T), FIG. 2 schematically shows a measurement system (1), FIG. 3 and FIG. 4 schematically show the operation of the measurement system (1), FIG. 5 shows a perspective view of a measuring device (10), FIG. 6 shows an exploded perspective view of a measuring device (10), FIG. 7 shows a front view of a measuring device (10), and FIG. 8 shows a second plate (400).

[0043] The satellite (S), after being launched while loaded onto a launch vehicle and reaching an appropriate altitude, may include a thruster (T) that assists the satellite (S) in entering a target orbit and, once in orbit, maintains its position and controls its attitude. Additionally, the thruster (T) may implement various velocity increment operations to enable the satellite (S) to enter a decommissioned orbit once it has completed its mission. The thruster (T) may be a chemical thruster utilizing fuel or an electric thruster that obtains thrust by heating and injecting fuel using electrical energy. Although only the shape of the nozzle of the thruster (T) is shown in the drawing, the satellite (S) or the thruster (T) may include various devices for supplying fuel to the nozzle and controlling combustion. For convenience of explanation, the thruster (T) will be represented as a nozzle shape below.

[0044] The thruster (T) is a thrust vector V passing through the central axis of the nozzle. T It has thrust vector VT is a reference vector V representing the reference coordinate axes of the satellite (S). S It can form an angle θ (between 0 and 180 degrees). Reference vector V S The angle θ can have a unique value for each satellite (S), and the measurement system (1) and the measurement device (10) obtain the thrust vector V from the normal vector of the target cube (C1). T It can measure.

[0045] A system for measuring the precision alignment state of a satellite thruster (1, hereinafter also referred to as the ‘measurement system’) may include a device for measuring the precision alignment state of a satellite thruster (10, hereinafter also referred to as the ‘measurement device’), a support device (20), and a theodolite (30).

[0046] The measuring device (10) measures the thrust vector V of the thruster (T). T It can be used to measure. For example, the measuring device (10) supports the thruster (T) and the target cube (C1) and may be detachable from the support device (20). The measuring device (10) is designed so that the thruster (T) is perpendicular to the target cube (C1), and thus the theodolite (30) automatically measures the thrust vector V of the thruster (T) by measuring the normal vector of the target cube (C1). T It can measure. In addition, the measuring device (10) can calibrate errors that occur during the process of assembly, disassembly, and measurement. The target cube (C1) has a cubic or rectangular shape and may be equipped with mirrors or other reflectors on multiple sides.

[0047] The support device (20) can be rotatably connected to the measuring device (10) and the measuring device (10) can be detached. The support device (20) is a device that simulates a satellite (S) equipped with a thruster (T), and when performing measurement and calibration, it can measure the reference coordinate axes of the reference cube (C2) and support and rotate the measuring device (10). For example, the support device (20) can be firmly supported on the ground and support the reference cube (C2), and the measuring device (10) can be rotatably connected to it. In this state, the theodolite (30) measures the reference coordinate axes of the reference cube (C2) and measures the normal vector of the target cube (C1) connected to the measuring device (10), from which the thrust vector V of the thruster (T) T It can measure the normal vector of the target cube (C1) again by rotating the measuring device (10) (e.g., rotating 180 degrees around the horizontal axis), and from this, the thrust vector V of the thruster (T) T It can measure.

[0048] The support device (20) may include a pipe (21) and a support plate (22).

[0049] The pipe (21) is a rod in the shape of a square or circular tube, with one end supported on the ground and the other end connected to a measuring device (10). As shown in FIG. 2, the other end of the pipe (21) (e.g., the end connected to the measuring device (10)) may include a rotatable link structure. Through the link structure, measurement and calibration can be performed while the measuring device (10) is tilted at a desired angle relative to a horizontal or vertical line, and measurement and calibration can be performed again while the measuring device (10) is tilted at a different angle.

[0050] The support plate (22) is connected to the pipe (21), and a reference cube (C2) may be positioned on one side. For example, the support plate (22) may be tilted at a predetermined angle relative to a horizontal or vertical line, and the pipe (21) may pass through the center of the support plate (22). The support plate (22) may be circular, elliptical, or polygonal, such as a triangle or a square. A reference cube (C2) may be mounted on the upper surface of the support plate (22). The reference cube (C2) is an optical body for measuring the reference coordinate axes of the satellite (S) and may have a cube shape equipped with mirrors or other reflectors on multiple sides. A theodolite (30) may measure the reference coordinate axes of the satellite (S) by irradiating light onto the reference cube (C2) mounted on the support plate (22). The tilt of the support plate (22) may be adjustable.

[0051] The theodolite (30) is the reference coordinate axis of the satellite (S) and the thrust vector V of the thruster (T). T It may be a device for measuring. For example, the theodolite (30) is a reference vector V of the satellite (S) from the reference cube (C2) of the support device (20). S Measure the thrust vector V of the thruster (T) from the target cube (C1) of the measuring device (10). T It can measure. The theodolite (30) may include four theodolites (31, 32, 33, 34). For example, the first theodolite (31) and the second theodolite (32) can measure the reference vector V of the satellite (S) from the reference cube (C2). S The third deodolite (33) and the fourth deodolite (34) measure the thrust vector V of the thruster (T) from the target cube (C1) of the measuring device (10). T It can be measured. The preparation for measurement, measurement method, and calibration operation of the theodolite (30) can be used in a known way.

[0052] The operation of the measurement system (1) is explained with reference to FIGS. 2 to 4.

[0053] First, the reference coordinate axes of the satellite (S) are measured using one or more of the plurality of theodolites (30). For example, as shown in FIG. 3, the normal vector of the reference cube (C2) mounted on the support device (20) is measured using the first theodolite (31) and the second theodolite (32), and from this, the reference vector V of the satellite (S) S It can be measured. For example, the normal vector of the reference cube (C2) is calculated by taking the cross product of the horizontal vectors (V1, V2) measured by the first deodolite (31) and the second deodolite (32), respectively, to obtain the reference vector V of the satellite (S). S The position and distance from the reference cube (C2) of the first deodolite (31) and the second deodolite (32) shown in FIG. 3 are examples and can be appropriately modified.

[0054] Next, the target cube (C1) and the thruster (T) are connected to the measuring device (10) and connected to the support device (20). Here, the inclination of the measuring device (10) may not be limited. Then, using one or more of the plurality of theodolites (30), the thrust vector V of the thruster (T) T Measures. For example, as shown in FIG. 4, the normal vector of the target cube (C1) is calculated by taking the cross product of the horizontal vectors (V3, V4) measured by the third deodolite (33) and the fourth deodolite (34), respectively, to obtain the thrust vector V of the thruster (T). TIt can be measured. The positions of the third deodolite (33) and the fourth deodolite (34) shown in FIG. 4 and their distances from the target cube (C1) are examples and can be appropriately modified. The measuring device (10) is configured so that the target cube (C1) and the thruster (T) are perpendicular. Therefore, by simply calculating the normal vector of the target cube (C1) while the target cube (C1) and the thruster (T) are connected to the measuring device (10), the thrust vector V of the thruster (T) T It can measure.

[0055] Next, rotate the measuring device (10) to obtain the thrust vector V of the thruster (T) in the same manner. T The thrust vector V of the thruster (T) is measured again. For example, the measuring device (10) is rotated 180 degrees about the horizontal axis, and then the thrust vector V of the thruster (T) is measured again. T It can measure the thrust vector. Then, the angle between the first measured thrust vector and the later measured thrust vector is checked, and it is determined whether the difference between the two angles satisfies a value less than a predetermined range. If the angle difference exceeds the range, the measurement device (10) is calibrated, and then the reference vector V of the satellite (S) is again S and thrust vector V of the thruster (T) T The action of measuring can be repeated.

[0056] A measuring device (10) is described with reference to FIGS. 5 to 8.

[0057] The measuring device (10) measures the thrust vector V of the thruster (T). T Measure , and the measured thrust vector V T A calibration operation can be performed so that the difference between them is within an appropriate range. The measuring device (10) may include a base (100), a first plate (200), a fixed disk (300), a second plate (400), a support (500), an adjustment assembly (600), and a ball spring (700).

[0058] The base (100) can support other components of the measuring device (10) (e.g., a first plate (200), a fixed disk (300), a second plate (400), a support (500), a control assembly (600), and a ball spring (700)). For example, as shown in FIG. 5, the base (100) may be located at one end in the height direction (e.g., the Z-axis direction in FIG. 5) of the measuring device (10), and a support (500) may be located on one surface. The base (100) may be spaced apart from the first plate (200) and the second plate (400) in the height direction. A target cube (C1) may be located in the internal space partitioned by the base (100), the second plate (400), and the support (500). The base (100) may include an opening on the inside to allow the target cube (C1) to be smoothly attached and detached. For example, as shown in FIG. 5, the base (100) has a ring or donut shape and can be connected to the second plate (400) by inserting the target cube (C1) into the internal space through an opening formed on the inside.

[0059] The first plate (200) is a component for supporting a thruster (T), and a thruster (T) may be mounted on one side. For example, as shown in FIGS. 5 and 6, the first plate (200) may have a disc shape and may be spaced apart from the base (100) in the height direction. The first plate (200) is connected to the base (100) by a support (500), and a fixed disk (300) may be positioned on the first plate (200). Additionally, a second plate (400) may be positioned below the first plate (200).

[0060] The first plate (200) may include a seating groove (210). For example, as shown in FIG. 6, the seating groove (210) is a groove formed concavely on the upper surface of the first plate (200) so that a thruster (T) can be seated thereon. For example, the seating groove (210) may be a groove that forms a step with the upper surface of the first plate (200) and is seated on the end of the thruster (T) (for example, the discharge surface where fuel is injected from the thruster (T)). The seating groove (210) has a size and shape corresponding to the end of the thruster (T) and may be located coaxial with the central axis of the first plate (200). Thus, by seating the thruster (T) in the seating groove (210), the thruster (T) can be positioned vertically on the first plate (200). That is, the thruster (T) and the first plate (200) can be arranged vertically simply by mounting the thruster (T) on the first plate (200).

[0061] The first plate (200) can maintain a constant distance and angle relative to the base (100) by being connected to the base (100) by a support (500). For example, the support (500) includes a plurality of springs (520) having a predetermined same elastic modulus and same length, and the bottom surface of the first plate (200) can be supported by the plurality of springs (520). Therefore, even if the operation of mounting or rotating the target cube (C1) and the thruster (T) on the measuring device (10) is repeated, the distance and angle between the base (100) and the first plate (200) can be maintained constant by the support (500). And the inclination of the thruster (T) mounted on the first plate (200) (thrust vector V of the thruster (T) T ) can also be maintained constant with respect to the target cube (C1).

[0062] One or more ball springs (700) may be positioned on the first plate (200). For example, as shown in FIGS. 6 and 7, one or more ball springs (700) may be positioned on the first plate (200) and may protrude below the bottom surface of the first plate (200) so that the ball can roll with the second plate (400). When the adjustment assembly (600) moves, the ball springs (700) roll with the second plate (400), and the position of the first plate (200) can be adjusted more finely.

[0063] The fixed disk (300) is positioned on the first plate (200) and can support the thruster (T) (the nozzle of the thruster (T)). For example, as shown in FIGS. 5 to 7, the fixed disk (300) is spaced apart in the height direction from the first plate (200) and can be connected to the first plate (200) by a support body (500). The fixed disk (300) is a component for supporting the thruster (T) and can prevent the thruster (T) from moving during the process of mounting or rotating the target cube (C1) and the thruster (T) on the measuring device (10). For example, the fixed disk (300) may include a hole and an inclined surface into which the thruster (T) is inserted and fixed.

[0064] The fixed disk (300) may include a support surface (310), an insertion passage (320), and a slit (330).

[0065] The support surface (310) is located at the center of the fixed disk (300) and may protrude in the height direction from one side of the fixed disk (300). For example, as shown in FIG. 5, the support surface (310) may extend downward from the bottom surface of the fixed disk (300) by a predetermined height and may include an opening on the inside. The support surface (310) may include one or more surfaces having an inclination toward the opening and may protrude further downward from the bottom surface of the fixed disk (300). The support surface (310) may have the shape of a thruster (T) (for example, a shape corresponding to the throat of the thruster (T)) and may support the thruster (T) inserted into the opening.

[0066] The support surface (310) may include a first surface (311) and a second surface (312). For example, as shown in FIG. 7, the support surface (310) may include a first surface (311) and a second surface (312) on the side facing the opening. The first surface (311) and the second surface (312) have different inclinations and have a shape corresponding to the neck of the thruster (T), so that when the thruster (T) is inserted into the fixed disk (300), the neck of the thruster (T) can be supported while in contact with the first surface (311) and the second surface (312). The first surface (311) may extend obliquely toward the inside of the opening from one side of the support surface (310) (for example, the upper surface in FIG. 7). Additionally, the second surface (312) may extend at an angle toward the outside of the opening from the end of the first surface (311) (e.g., the bottom of FIG. 7). The first surface (311) and the second surface (312) may have the same or different slopes, for example, the first surface (311) may have a greater slope relative to a vertical line. The slopes of the first surface (311) and the second surface (312) may vary depending on the shape of the thruster (T). In this way, the support surface (310) has a shape corresponding to the thruster (T) and contacts and supports the thruster (T) inserted into the opening, thereby preventing the thruster (T) from shifting or tilting during use of the measuring device (10).

[0067] The insertion passage (320) is a passage for inserting a thruster (T) into the support surface (310), and may be formed by cutting a portion connecting from the outer side of the fixed disk (300) to the support surface (310). For example, the insertion passage (320) may extend radially along the fixed disk (300) and may have a width greater than the neck of the thruster (T). The insertion passage (320) is connected to an opening in the support surface (310), and the thruster (T) can be inserted into the insertion passage (320) and seated on the support surface (310). For example, the insertion passage (320) may be located between two adjacent slits (330). Additionally, the insertion passage (320) may be formed in a position that does not overlap with the control assembly (600).

[0068] One or more slits (330) are formed in the fixed disk (300) and can be used to adjust the adjustment assembly (600). For example, as shown in FIG. 5, the slits (330) may be formed at positions corresponding to the adjustment assembly (600) and in the same number as the adjustment assembly (600) (e.g., three). The slits (330) may have a width such that a means (e.g., a wrench) for rotating the head (610) of the adjustment assembly (600) can be inserted. After inserting the means into the slits, the head (610) is fitted into the grooves of the head (610) and the head (610) is rotated to operate the adjustment assembly (600). The slits (330) may extend radially inward from the adjustment assembly (600) and may be spaced apart from the support surface (310).

[0069] The second plate (400) is located between the base (100) and the first plate (200) and can be connected to the target cube (C1). For example, as shown in FIGS. 5 to 7, the second plate (400) is located below the first plate (200) and can be connected to the control assembly (600). The second plate (400) forms a space where the target cube (C1) is located inside together with the base (100) and the support (500), and can be directly connected to the target cube (C1). For example, the position of the target cube (C1) can be fixed by mechanically attaching the target cube (C1) to the bottom surface of the second plate (400) or by adhesive. The second plate (400) has a smaller area than the first plate (200) and may have a different shape from the first plate (200). For example, the second plate (400) may have a triangular shape with curved corners and may have a smaller area than the first plate (200). Additionally, the second plate (400) is not connected to the support (500), so that the second plate (400) does not interfere with the support (500) during the process of adjusting the first plate (200) with the adjustment assembly (600). For example, the second plate (400) may be located inside the respective profiles formed by the outer diameters of the base (100) and the first plate (200).

[0070] The second plate (400) can be positioned parallel to the first plate (200). Thus, when the target cube (C1) is connected to the second plate (400) and the thruster (T) is connected to the first plate (200), the thruster (T) can be arranged perpendicularly to the target cube (C1).

[0071] The second plate (400) may include a receiving groove (410) and a protruding surface (420).

[0072] For example, as shown in FIG. 8, the receiving groove (410) may be formed on one side (e.g., the bottom surface) of the second plate (400). The receiving groove (410) may be located at the center of the second plate (400) and may be formed inwardly concave to form a step with the bottom surface of the second plate (400). The receiving groove (410) may connect the target cube (C1) and the second plate (400). For example, a connecting projection of the target cube (C1) may be inserted into the receiving groove (410). Alternatively, the receiving groove (410) may be a portion that receives an adhesive (e.g., EE2216), and the adhesive received in the receiving groove (410) may be applied to one side of the target cube (C1) to connect the target cube (C1) and the second plate (400). The receiving groove (410) may include a first groove (411) and a second groove (412). The first groove (411) is a circular groove formed in the center of the second plate (400), and the second groove (412) may be a groove located inside the first groove (411) and extending radially from the center of the first groove (411). The first groove (411) may have a larger area than the second groove (412), and the second groove (412) may be formed deeper than the first groove (411). The second groove (412) allows the adhesive contained in the receiving groove (410) to spread quickly, and the first groove (411) can increase the contact area between the second plate (400) and the target cube (C1).

[0073] One or more protruding surfaces (420) are formed on the second plate (400) and may be the part to which the adjustment assembly (600) is connected. For example, the protruding surface (420) may be located on the same surface as the second plate (400) where the receiving groove (410) is formed. For example, as shown in FIG. 8, the protruding surfaces (420) may be located at the corner portions of the bottom surface of the second plate (400) and there may be a total of three. The protruding surface (420) may be the part into which the adjustment assembly (600) is inserted. The protruding surface (420) may protrude more than other surfaces of the second plate (400) to increase the rigidity of the area, thereby preventing damage to the second plate (400) from the operation of the adjustment assembly (600).

[0074] The support body (500) can support other components of the measuring device (10) (e.g., base (100), first plate (200), and fixed disk (300)). For example, as shown in FIGS. 5 and 6, the support body (500) extends in the height direction overall and can connect the base (100), the first plate (200), and the fixed disk (300). One end of the support body (500) can be connected to the base (100), and the other end can be connected to the fixed disk (300). Additionally, the first plate (200) can be inserted between one end and the other end of the support body (500). The support body (500) can fix the base (100), the first plate (200), and the fixed disk (300) so that their positions do not shift during the operation of the measuring device (10), thereby allowing the target cube (C1) and the thruster (T) to maintain a constant angle. Additionally, the support (500) can precisely maintain the position of the first plate (200) when calibrating the measuring device (10) with the adjustment assembly (600). The support (500) may be multiple (e.g., three). The three support (500) may be arranged at equal angles (e.g., 120 degrees).

[0075] The support body (500) may include a shaft (510), a spring (520), and a cap (530).

[0076] The shaft (510) has a rod shape extending in the height direction (e.g., the Z-axis direction in FIGS. 5 to 7) and can be connected to other components of the measuring device (10) (e.g., base (100), first plate (200) and fixed disk (300)). For example, one end (e.g., bottom) of the shaft (510) can be connected to the base (100) and the other end (e.g., top) can be connected to the fixed disk (300). Additionally, the first plate (200) can be inserted between one end and the other end of the shaft (510).

[0077] The spring (520) can be wound around the shaft (510) to support the first plate (200). For example, the spring (520) can be wound around the outer surface of the shaft (510) between the first plate (200) and the base (100). The spring (520) can elastically support the first plate (200) by having one end and the other end in contact with the base (100) and the first plate (200), respectively. The spring (520) supports the first plate (200) during the operation of the measuring device (10) to maintain the position of the first plate (200), thereby maintaining a constant angle with respect to the target cube (C1) of the thruster (T). Additionally, when the first plate (200) is pressed downward to mount a thruster (T) on the measuring device (10), the spring (520) contracts, and when the force pressing the first plate (200) disappears, the first plate (200) can return to its original position by the restoring force of the spring (520). Also, when the first plate (200) is moved by the adjustment assembly (600), the spring (520) elastically supports the first plate (200) to prevent the first plate (200) from moving excessively. For example, the spring (520) included in each support (500) may be in an extended or contracted state by the adjustment assembly (600). In this state, as the head (610) of the adjustment assembly (600) rotates, the spring (520) pushes up or pulls the first plate (200), allowing the position of the first plate (200) to be finely adjusted.

[0078] The cap (530) can connect the shaft (510) and the first plate (200). For example, as shown in FIGS. 6 and 7, the cap (530) is inserted into the first plate (200), with a portion protruding above the upper surface of the first plate (200) and one end of the shaft (510) inserted into the inside to support the shaft (510).

[0079] The control assembly (600) can adjust the position of the thruster (T). For example, the thrust vector V of the thruster (T) at the initial position and later position (e.g., a position rotated 180 degrees) of the measuring device (10) with respect to the measuring system (1). T After measuring each, if the difference between the two values ​​exceeds a predetermined range, the control assembly (600) adjusts the position of the thruster (T) to the thrust vector V of the thruster (T). T The position of the thruster (T) connected to the first plate (200) can be adjusted. For example, the adjustment assembly (600) is connected to the first plate (200) and can adjust the position of the first plate (200) to adjust the position of the thruster (T) connected to the first plate (200). The adjustment assembly (600) is inserted into the first plate (200) and the second plate (400), and can move the first plate (200) relative to the fixed second plate (400).

[0080] The adjustment assembly (600) may include a head (610), a screw (620), and a nut (630).

[0081] The screw (620) is inserted into the first plate (200) and the second plate (400), and a head (610) may be attached to one end (e.g., the top) and a nut (630) may be attached to the outer surface. The screw (620) may include screw threads on the outer surface. The head (610) and the screw (620) may be formed as a single unit. The head (610) contacts the upper surface of the first plate (200) and may include a groove on its upper surface. After inserting a means capable of rotating the head (610), such as a wrench, into the groove and rotating the head (610), the head (610) presses the first plate (200) downward, thereby allowing the position of the first plate (200) and the thruster (T) to be adjusted. Alternatively, if the head (610) is rotated in the opposite direction, the contracted spring (520) presses the first plate (200) upward, thereby adjusting the position of the first plate (200) and the thruster (T).

[0082] In this way, multiple (e.g., three) control assemblies (600) can be individually controlled to adjust the position of the first plate (200) and the position of the thruster (T) mounted on the first plate (200).

[0083] A ball spring (700) is mounted on a first plate (200) and can come into contact with a second plate (400). The ball spring (700) may include a ball inserted into the first plate (200) and in contact with the upper surface of the second plate (400), and a spring that elastically supports the ball. The ball rolls on the upper surface of the second plate (400), and the spring is located inside the ball spring (700) in a contracted or extended state and can elastically support the ball so that the ball does not deviate from the upper surface of the second plate (400). There may be multiple ball springs (700). For example, there may be a total of three ball springs (700) and they may be arranged at equal angles (e.g., 120 degrees). For example, as shown in FIGS. 6 and 7, three ball springs (700) may be arranged at 120 degrees with respect to the central axis of the first plate (200). In addition, the three ball springs (700) can be spaced apart by the same distance from the center axis of the first plate (200).

[0084] At least a portion of the ball spring (700) is inserted into the first plate (200) and can come into contact with the second plate (400). The ball spring (700) can prevent the position of the first plate (200) from changing abruptly when the position of the first plate (200) is adjusted by the adjustment assembly (600), together with the support (500). For example, when the head (610) of the adjustment assembly (600) is rotated to move the first plate (200), the restoring force of the spring (520) of the support (500) acts to move the first plate (200) in a direction opposite to the direction of movement of the first plate (200). At the same time, as the ball spring (700) mounted on the first plate (200) moves due to the displacement of the first plate (200), the restoring force of the ball spring (700) also acts to move the first plate (200) in a direction opposite to the direction of movement of the first plate (200). Therefore, the first plate (200) is prevented from moving rapidly or with excessively large displacement due to the movement of the head (610), thereby allowing the position of the first plate (200) and the thruster (T) mounted on the first plate (200) to be precisely adjusted.

[0085] The ball spring (700) may include a ball at one end. For example, the ball spring (700) includes a ball at the bottom and, while mounted on the first plate (200), the ball may roll while in contact with the upper surface of the second plate (400). The first plate (200) may be smoothly displaced by the rolling motion of the ball.

[0086] The ball spring (700) may include a spring that supports the ball. For example, the spring may be located inside the ball spring (700) and one end may be connected to the ball. For example, when the first plate (200) receives a downward force, the ball presses against the spring, and the spring's restoring force may act in the opposite direction to the direction of movement of the first plate (200).

[0087] There may be multiple ball springs (700). For example, as shown in FIG. 6, there may be three ball springs (700). The three ball springs (700) may be arranged at equal angles (e.g., 120 degrees) with respect to the center of the first plate (200). The multiple ball springs (700) may be spaced apart radially from the mounting groove (210) by a certain distance or more so as not to interfere with the thruster (T) mounted in the mounting groove (210).

[0088] Additionally, the ball springs (700) can maintain the first plate (200) and the second plate (400) in a parallel arrangement. That is, by elastically supporting the second plate (400) while the multiple ball springs (700) are mounted on the first plate (200), the gap and angle between the first plate (200) and the second plate (400) can be maintained so that they do not change due to external shocks or vibrations.

[0089] FIGS. 9A, FIGS. 9B, FIGS. 9C, FIGS. 9D, FIGS. 9E, and FIGS. 9F illustrate the operation of a measuring device (10).

[0090] First, as shown in FIG. 9a, a measuring device (10) is prepared. The measuring device (10) may be in a state where the base (100), the first plate (200), the fixed disk (300), the second plate (400), the support (500), the adjustment assembly (600), and the ball spring (700) are all assembled.

[0091] Next, as shown in FIG. 9b, the target cube (C1) is connected to the measuring device (10). First, an adhesive may be applied to the second plate (400). For example, the adhesive is applied to the receiving groove (410) of the second plate (400) while the measuring device (10) is inverted 180 degrees. Once the adhesive is received in the first groove (411) and the second groove (412) of the receiving groove (410), the target cube (C1) is positioned on the bottom surface of the second plate (400). For example, the target cube (C1) may be positioned in the space between the base (100), the second plate (400), and the support (500) through the opening of the base (100). Alternatively, the target cube (C1) may be positioned in the space between the base (100), the second plate (400), and the support (500) through the gap between two adjacent support (500). The upper surface of the target cube (C1) is brought into contact with the receiving groove (410) so that the adhesive contained in the receiving groove (410) is applied to the target cube (C1).

[0092] As shown in FIG. 9c, the position of the first plate (200) is adjusted. For example, the first plate (200) can be pressed downward to increase the distance between the first plate (200) and the fixed disk (300).

[0093] As shown in FIG. 9d, the thruster (T) is connected to the first plate (200). That is, with the gap between the first plate (200) and the fixed disk (300) widened, the thruster (T) is inserted into the insertion passage (320) of the fixed disk (300), and the neck of the thruster (T) can be inserted into the support surface (310) of the fixed disk (300). Then, when the force pressing the first plate (200) is released, the first plate (200) rises again, and the lower surface of the thruster (T) can be seated in the seating groove (210) of the first plate (200).

[0094] In this state, the measuring device (10) is connected to the support device (20), and the thrust vector V of the thruster (T) is measured using the measuring system (1). T A measurement is performed. The thrust vector V of the thruster (T) measured at the initial position. T and the thrust vector V of the thruster (T) measured at a position inverted 180 degrees from the initial position T The two values ​​are compared, and if the difference between the two values ​​satisfies a predetermined range (e.g., within 0.1 degree), the measurement is terminated. If the difference between the two values ​​exceeds the predetermined range, a calibration operation of the measuring device (10) is performed.

[0095] The calibration operation of the measuring device (10) can be performed by operating one of the multiple control assemblies (600) to move the first plate (200) and adjust the position of the thruster (T) mounted on the first plate (200). For example, as shown in FIG. 9e, the head (610) of one of the three control assemblies (600) (for example, the left side of FIG. 9e) is rotated. As the head (610) rotates along the screw (620) and moves downward, the corresponding part of the first plate (200) is pressed downward, causing the first plate (200) to tilt to the left as shown in FIG. 9e. Accordingly, the position of the thruster (T) connected to the first plate (200) can also be adjusted.

[0096] Alternatively, as shown in FIG. 9f, the head (610) of one of the three control assemblies (600) (e.g., the right side of FIG. 9f) is rotated. As the head (610) moves downward while rotating along the screw (620), the corresponding part of the first plate (200) is pressed downward, causing the first plate (200) to tilt to the right as shown in FIG. 9f. Thus, the position of the thruster (T) connected to the first plate (200) can also be adjusted.

[0097] The calibration operation of the measuring device (10) can be performed with the measuring device (10) separated from the support device (20) or with the measuring device (10) connected to the support device (20).

[0098] With the position of the thruster (T) adjusted in this manner, the measuring device (10) is connected to the support device (20) again, and the thrust vector V of the thruster (T) is measured using the measuring system (1). T Measurement is performed. Measurement and calibration are performed on the thrust vector V of the thruster (T) measured at the initial position. T and the thrust vector V of the thruster (T) measured at a position inverted 180 degrees from the initial position T The two values ​​can be compared, and the process can continue until the difference between the two values ​​satisfies a predetermined range (e.g., within 0.1 degrees).

[0099] The following describes a method for measuring the precise alignment state of a thruster (T) using a measuring system (1) and a measuring device (10).

[0100] A method for measuring the precise alignment state of an artificial satellite thruster (T) comprises the steps of: positioning a reference cube (S2) on a support device (20); measuring the normal vector of the reference cube (S2) using two or more theodolites (30) among a plurality of theodolites (30); connecting a target cube (S1) and a thruster (T) to a measuring device (10); connecting the measuring device (10) to the support device (20); and measuring the normal vector of the target cube (S1) using two or more theodolites (30) among the plurality of theodolites (30) at the initial connected position to obtain the first thrust vector V of the thruster (T). T A step of measuring ), a step of rotating the measuring device (10) 180 degrees from the initial position, and a step of measuring the normal vector of the target cube (S1) with two or more other theodolites (30) among the plurality of theodolites (30) at the rotated position to obtain the second thrust vector V of the thruster (T). T Step of measuring ), first thrust vector VT ) and the second thrust vector V T A step of determining whether the difference of ) satisfies within a predetermined range and the first thrust vector V T ) and the second thrust vector V T If the difference of ) deviates from a predetermined range, the step of adjusting the position of the thruster (T) with a measuring device (10) may be included.

[0101] First, a reference cube (S2) is positioned on a support device (20). For example, as shown in FIG. 2, a reference cube (C2) can be fixed to the upper surface of a support plate (22) that is tilted at a predetermined angle with respect to the pipe (21) while the pipe (21) is positioned on the ground or the bottom of another device. Here, the reference cube (C2) can simulate a satellite.

[0102] Next, the normal vector of the reference cube (S2) is measured using two or more of the theodolites (30) among the plurality of theodolites (30). For example, as shown in FIG. 3, the normal vector of the reference cube (S2) is measured using the first theodolite (31) and the second theodolite (32) as two of the plurality (e.g., four) of the theodolites (30). The reference cube (S2) is an optical body that simulates an artificial satellite, and the normal vector of the reference cube (S2) can be the reference coordinate axis of the artificial satellite. A known method can be used to measure the normal vector using the theodolites (30).

[0103] Next, a target cube (S1) and a thruster (T) are connected to the measuring device (10). For example, as shown in FIGS. 9a to 9d, the target cube (S1) can be connected to the bottom surface of the second plate (400), and the thruster (T) can be connected to the first plate (200) and the fixed disk (300). As previously described, the measuring device (10) has the first plate (200) and the second plate (400) arranged in parallel, and one or more support bodies (500) and one or more ball springs (700) elastically support the first plate (200) and the second plate (400), thereby maintaining a constant gap and angle between the first plate (200) and the second plate (400).

[0104] Next, the measuring device (10) is connected to the support device (20). For example, as shown in FIG. 4, the end of the support device (20) can be rotatably connected to the measuring device (10).

[0105] At the next connected initial position, the normal vector of the target cube (S1) is measured using two or more other theodolites (30) among the plurality of theodolites (30) to obtain the first thrust vector V of the thruster (T). T ) is measured. For example, as shown in FIG. 4, the normal vector of the target cube (S1) is measured using the third deodolite (33) and the fourth deodolite (34) as two of the multiple (e.g., four) deodolites (30). Since the target cube (S1) and the thruster (T) are arranged vertically in the measuring device (10), the normal vector of the target cube (S1) is the thrust vector V of the thruster (T). T It can be considered as.

[0106] Next, the measuring device (10) is rotated 180 degrees from the initial position. Since the measuring device (10) is rotatably connected to the support device (20), the measuring device (10) can be rotated 180 degrees around the horizontal axis (the axis connecting the measuring device (10) and the support device (20).

[0107] At the next rotated position, the normal vector of the target cube (S1) is measured using two or more other theodolites (30) among the plurality of theodolites (30) to obtain the second thrust vector V of the thruster (T). T ) can be measured. For example, as shown in FIG. 4, the normal vector of the target cube (S1) is measured using the third deodolite (33) and the fourth deodolite (34) as two of the multiple (e.g., four) deodolites (30). Likewise, since the target cube (S1) and the thruster (T) are arranged vertically in the measuring device (10), the normal vector of the target cube (S1) is the thrust vector V of the thruster (T). T It can be considered as.

[0108] Next, the first thrust vector V T and the second thrust vector V T It is determined whether the difference satisfies a predetermined range. For example, the first thrust vector V measured at the initial position T and the second thrust vector V measured at the later position T If the difference is within 0.1 degrees, the measurement step can be terminated.

[0109] Next, the first thrust vector V T and the second thrust vector V T If the difference deviates from a predetermined range, the position of the thruster (T) can be adjusted using a measuring device (10). For example, the first thrust vector V measured at the initial position T and the second thrust vector V measured at the later position TIf the difference exceeds 0.1 degrees, the position of the thruster (T) is adjusted using a measuring device (10). For example, the position of the thruster (T) can be adjusted by rotating one or more of the one or more adjustment assemblies (600) to adjust the position of the first plate (200). The adjustment assembly (600) to be adjusted is the first thrust vector V T and the second thrust vector V T It can be set based on the difference.

[0110] And again, the first thrust vector V from the initial position T Measure and the second thrust vector V at the later position T Step of measuring, first thrust vector V T and the second thrust vector V T A step of determining whether the difference satisfies within a predetermined range, the first thrust vector V T and the second thrust vector V T If the difference deviates from a predetermined range, the step of adjusting the position of the thruster (T) with the measuring device (10) can be repeated. These steps include the first thrust vector V T and the second thrust vector V T It can be repeated until the difference satisfies a predetermined range.

[0111] Although the present invention has been described with reference to the embodiments illustrated in the drawings, this is merely illustrative. Those skilled in the art will fully understand that various modifications and equivalent alternative embodiments are possible from the embodiments. Accordingly, the true technical scope of protection of the present invention should be determined based on the appended claims. Explanation of the symbols

[0112] S: Satellite T: Thruster C1: Target Cube C2: Reference Cube 1: Measurement system 10: Measuring device 20: Support device 100: Base 200: 1st plate 300: Fixed disk 400: Second plate 500: Support 600: Adjustment assembly 700: Ball spring

Claims

Claim 1 A device for measuring the precision alignment state of a satellite thruster, comprising: a base; a first plate positioned above the base and supporting a thruster; a second plate positioned below the first plate parallel to the first plate and supporting a target cube; a fixed disk positioned above the first plate and supporting the thruster; one or more supports connecting the base, the first plate and the fixed disk and elastically supporting the first plate; and one or more adjustment assemblies for adjusting the position of the first plate; wherein the target cube is positioned in a space partitioned between the base, the second plate and the one or more supports and is connected to the second plate, the second plate includes a receiving groove in which an adhesive is received on its bottom surface, and the target cube is attached to the bottom surface of the second plate with one side in contact with the receiving groove while the adhesive is received in the receiving groove. Claim 2 delete Claim 3 delete Claim 4 A device for measuring the precision alignment state of a satellite thruster according to claim 1, wherein the receiving groove comprises: a first groove formed inwardly concave to form a step with the bottom surface of the second plate; and a second groove extending radially from the center of the first groove and formed deeper than the first groove. Claim 5 A device for measuring the precision alignment state of a satellite thruster, comprising: a base; a first plate positioned above the base and supporting a thruster; a second plate positioned below the first plate parallel to the first plate and supporting a target cube; a fixed disk positioned above the first plate and supporting the thruster; one or more supports connecting the base, the first plate and the fixed disk and elastically supporting the first plate; and one or more adjustment assemblies for adjusting the position of the first plate; wherein the first plate includes a seating groove in the center into which one end of the thruster is inserted, and the fixed disk includes one or more inclined surfaces corresponding to the throat shape of the thruster. Claim 6 A device for measuring the precision alignment state of a satellite thruster according to claim 5, wherein the fixed disk comprises a first surface and a second surface having different inclinations, a supporting surface that contacts the neck of the thruster and includes an opening in the center, and an insertion path that communicates with the opening of the supporting surface and extends to the outer surface of the fixed disk. Claim 7 An apparatus for measuring the precision alignment state of a satellite thruster according to claim 1, wherein the one or more supports comprise: a shaft having one end connected to the base and the other end connected to the fixed disk, with the first plate inserted between the one end and the other end; and a spring wound around the outer surface of the shaft and positioned between the base and the first plate. Claim 8 In claim 7, the above one or more supports are a device for measuring the precision alignment state of a satellite thruster, wherein the spring contacts the bottom surface of the first plate and elastically supports the first plate. Claim 9 A device for measuring the precision alignment state of a satellite thruster according to claim 1, further comprising one or more adjustment assemblies connected to the first plate and adjusting the position of the first plate to adjust the position of the thruster. Claim 10 A device for measuring the precision alignment state of a satellite thruster, comprising: a base; a first plate positioned on the base and supporting a thruster; a second plate positioned below the first plate parallel to the first plate and supporting a target cube; a fixed disk positioned on the first plate and supporting the thruster; one or more supports connecting the base, the first plate and the fixed disk and elastically supporting the first plate; and one or more adjustment assemblies for adjusting the position of the first plate; and further comprising one or more adjustment assemblies connected to the first plate and adjusting the position of the first plate to adjust the position of the thruster, wherein the one or more adjustment assemblies comprise: a head positioned on the upper surface of the first plate; a screw connected to the head and passing through the first plate and the second plate; and a nut fastened to the screw and in contact with the lower surface of the second plate. Claim 11 A device for measuring the precision alignment state of an artificial satellite thruster, wherein, in claim 10, the position of the first plate relative to the second plate changes as the head rotates, and the one or more supports support the first plate in a direction opposite to the direction of movement of the first plate according to the rotation of the head. Claim 12 A device for measuring the precision alignment state of a satellite thruster according to claim 11, wherein when the head rotates in one direction, the head presses the first plate downward while the first plate moves, and the one or more supports elastically support the first plate upward, and when the head rotates in the other direction, the head moves away from the first plate while the first plate moves, and the one or more supports elastically support the first plate downward. Claim 13 In claim 10, the fixed disk comprises a slit at a position where the head can be rotated at a position corresponding to each head of the one or more adjustment assemblies, for measuring the precision alignment state of a satellite thruster. Claim 14 A device for measuring the precision alignment state of a satellite thruster, comprising: a base; a first plate positioned above the base and supporting a thruster; a second plate positioned below the first plate parallel to the first plate and supporting a target cube; a fixed disk positioned above the first plate and supporting the thruster; one or more supports connecting the base, the first plate and the fixed disk and elastically supporting the first plate; and one or more adjustment assemblies for adjusting the position of the first plate; and further comprising one or more ball springs inserted into the first plate and in contact with the second plate. Claim 15 In claim 14, the device for measuring the precision alignment state of a satellite thruster, wherein one or more ball springs allow a ball located at one end to roll on the upper surface of the second plate and the spring elastically supports the ball. Claim 16 A system for measuring the precision alignment state of a satellite thruster, comprising a device for measuring the precision alignment state of a satellite thruster according to any one of claims 1, 4 to 15, wherein the system comprises: a support device on which a reference cube is located and to which the device for measuring the precision alignment state of the satellite thruster is rotatably connected; and a plurality of theodolites for measuring the reference coordinate axes of the satellite from the reference cube and measuring the thrust vector of the thruster from the target cube. Claim 17 A system for measuring the precise alignment state of a satellite thruster according to claim 16, wherein two of the plurality of theodolites measure the reference coordinate axes of the satellite from the reference cube, and the other two of the plurality of theodolites measure the normal vector of the thruster from the target cube. Claim 18 In claim 16, the system measures the thrust vector of the satellite thruster at an initial position where a device for measuring the precision alignment state of the satellite thruster is connected to the support device, and measures the thrust vector of the satellite thruster again by inverting the device for measuring the precision alignment state of the satellite thruster at the initial position by 180 degrees, and then terminates the measurement if the angle difference between the two measured thrust vectors satisfies a predetermined range, and adjusts the position of the thruster with the device for measuring the precision alignment state of the satellite thruster if the angle difference between the two measured thrust vectors deviates from the predetermined range. Claim 19 A system for measuring the precision alignment state of a satellite thruster according to claim 18, wherein if the angle difference between two measured thrust vectors exceeds 0.1 degrees, the system adjusts the position of the first plate using one or more adjustment assemblies to adjust the position of the thruster, then measures the thrust vector of the thruster again at the initial position, reverses the device for measuring the precision alignment state of the satellite thruster at the initial position by 180 degrees to measure the thrust vector of the thruster again, and repeats the operation so that the angle difference between two measured thrust vectors is within 0.1 degrees. Claim 20 A step of positioning a reference cube on a support device; a step of measuring the normal vector of the reference cube using two or more theodolites among a plurality of theodolites; a step of connecting a target cube and the thruster to a device for measuring the precision alignment state of the satellite thruster; a step of connecting the device for measuring the precision alignment state of the satellite thruster to the support device; a step of measuring the normal vector of the target cube using two or more theodolites among the plurality of theodolites at the connected initial position to measure the first thrust vector of the thruster; a step of rotating the device for measuring the precision alignment state of the satellite thruster 180 degrees at the initial position; a step of measuring the normal vector of the target cube using two or more theodolites among the plurality of theodolites at the rotated position to measure the second thrust vector of the thruster; a step of determining whether the difference between the first thrust vector and the second thrust vector satisfies a predetermined range. A method for measuring the precision alignment state of a satellite thruster, comprising the step of adjusting the position of the thruster with a device for measuring the precision alignment state of the satellite thruster when the difference between the first thrust vector and the second thrust vector deviates from a predetermined range.

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