Test socket

Abstract

The present invention relates to a test socket and a method for manufacturing a test socket, and more specifically, to a test socket in which unnecessary contact and collision between a contact member and a device to be tested can be prevented or minimized during the mounting and removal process of the device to be tested, thereby preventing damage to the contact member and the device to be tested.

Description

Technology Field

[0001] The present invention relates to a test socket and a method for manufacturing a test socket, and more specifically, to a test socket in which unnecessary contact and collision between a contact member and a device to be tested can be prevented or minimized during the mounting and removal process of the device to be tested, thereby preventing damage to the contact member and the device to be tested. Background Technology

[0002] After the manufacturing process, semiconductor devices undergo testing to evaluate their electrical performance. Performance testing is performed by inserting a test socket, designed to make electrical contact with the device's terminals, between the semiconductor device and a test circuit board. In addition to testing semiconductor devices, test sockets are also used during the burn-in testing process in the manufacturing process.

[0003] The test socket includes a contact member. The contact member is fixed to the test socket and mediates signal transmission between the semiconductor chip package and the test circuit board.

[0004] In test sockets according to the prior art, unnecessary friction and collision occurred between the contact member and the terminals of the device under test during the process of mounting the device under test in the test socket or removing the device under test from the test socket. Consequently, there was a problem of damage to the device under test and the contact member.

[0005] Therefore, a test socket is needed to solve these problems. Prior art literature

[0006] Registered Utility Model No. 20-0209916 The problem to be solved

[0007] The present invention has been devised to solve the aforementioned problems, and aims to provide a test socket that prevents damage to the contact member and the device under test by preventing or minimizing unnecessary contact and collision between the contact member and the device under test during the mounting and removal process of the device under test. means of solving the problem

[0008] A test socket according to one embodiment of the present invention comprises: a socket base member including a center slot and a contact mounting slot formed on the side of the center slot; a lift guide block including a package mounting slot on which a device to be tested is mounted; a lever module; and a plurality of contact members; wherein at least one part of the lift guide block is inserted into the center slot, and the contact member is mounted in the contact mounting slot; the lift guide block is displaced relative to the base member in an up-and-down direction by operation of the lever module, and as the lift guide block is displaced in the up-and-down direction, an external force is applied to the contact member, thereby changing the shape of the contact member.

[0009] According to one embodiment, the lift guide block includes a bottom block located below the package mounting slot and a side block located on the side of the package mounting slot, wherein the side block has a contact through hole, and the contact through hole and the contact mounting slot communicate with each other in a lateral direction, and at least one part of the contact member can protrude into the package mounting slot through the contact through hole.

[0010] According to one embodiment, the contact member includes a contact tip and a shifting part such that at least one part can face the bottom block; when the lift guide block descends, the contact tip is positioned within the package mounting slot and the shifting part is positioned on the bottom block; and when the lift guide block ascends, at least one part of the bottom block pushes the shifting part, thereby deforming the contact member and causing the contact tip to detach from the package mounting slot.

[0011] According to one embodiment, the contact mounting slot is formed symmetrically on both sides of the center slot, and the side block is positioned symmetrically on both sides of the package mounting slot.

[0012] According to one embodiment, the socket base member includes a first connecting portion having a first connecting hole formed therein extending in the vertical direction, and the lift guide block includes a third connecting portion having a third connecting hole formed therein and connected to the side block, and the lever module includes a first link shaft, and the first connecting portion and the third connecting portion are located in a straight line in the front-rear direction, and the first link shaft connects the first connecting portion and the third connecting portion to each other, and as the first link shaft is displaced in the vertical direction along the first connecting hole, the lift guide block is displaced in the vertical direction.

[0013] According to one embodiment, the socket base member includes a second connection portion provided at the lower part of the first connection portion and having a second connection hole formed therein, and the lever module includes a first link arm including a first-1 link hole and a first-2 link hole, a second link arm including a second-1 link hole and a second-2 link hole, a second link shaft, and a third link shaft, wherein the second link shaft connects the first link arm and the second link arm, and the third link shaft connects the second link arm and the third connection portion.

[0014] According to one embodiment, the lift guide block further includes a top block connecting the side block and the third connecting part. Effects of the invention

[0015] The test socket according to an embodiment of the present invention occurs only when contact between the contact member and the device under test is required, and unnecessary contact and collision between the contact member and the device under test can be prevented or minimized during the mounting and ejection processes of the device under test. Accordingly, damage to the contact member and the device under test can be prevented. Brief explanation of the drawing

[0016] FIG. 1 is a drawing illustrating a test socket according to one embodiment of the present invention. FIG. 2 is a diagram showing the disassembled structure of a test socket according to one embodiment of the present invention. Figure 3 is a drawing showing the DD cross-section of Figure 1. FIG. 4 is a drawing showing a socket base member. FIG. 5 is a drawing showing a cross-section of the socket base member, as a DD cross-section of FIG. 4. FIG. 6 is a drawing showing a lift guide block, and FIG. 7 is a cross-sectional view of DD of FIG. 6. Figure 8 is an exploded view showing each component of the lever module disassembled. Figure 9 shows a lever module. Figure 10 is a drawing showing a contact member. Figure 11 shows the coupling relationship between the socket base member, the lift guide block, and the contact member. FIG. 12 is a diagram showing the coupling relationship between the socket base member, the lift guide block, and the lever module. FIG. 13 is a cross-sectional view showing the state in which the lift guide block is raised before the device under test is inserted into the package mounting slot. FIGS. 14 and 15 are cross-sectional views showing the device under test being inserted into the package mounting slot. Figures 16 and 17 are drawings showing the device under test detaching from the package mounting slot. Specific details for implementing the invention

[0017] Hereinafter, a preferred embodiment according to the present invention will be described with reference to the attached drawings.

[0018] Hereinafter, "left and right," "front and back," and "up and down" indicating directions are based on the directions shown in each drawing. Accordingly, with reference to Fig. 1, the X-axis is the front and back direction, the Y-axis is the left and right direction, and the Z-axis is the up and down direction.

[0020] FIG. 1 is a drawing illustrating a test socket (1) according to an embodiment of the present invention. FIG. 2 is a drawing showing the disassembled structure of a test socket (1) according to an embodiment of the present invention. FIG. 3 is a drawing showing a cross-section of FIG. 1.

[0021] A test socket (1) according to one embodiment of the present invention comprises: a socket base member (100); a lift guide block (200); a lever module (300); and a plurality of contact members (400).

[0023] <Socket base member (100)>

[0024] FIG. 4 is a drawing showing a socket base member (100). FIG. 5 is a drawing showing a cross-section of the socket base member (100), which is a cross-section of FIG. 4.

[0025] The socket base member (100) constitutes the main body of the test socket (1) according to an embodiment of the present invention. The socket base member (100) may be, for example, a member in the shape of a predetermined block, and may be a member injection-molded from a non-conductive material.

[0026] The socket base member (100) includes a base body (110), a center slot (120), a contact mounting slot (130), a first connection part (140), and a second connection part (150).

[0027] The base body (110) constitutes the body of the socket base member (100). The base body (110) includes a center body portion (112) and a side body portion (114). A center slot (120) and a contact mounting slot (130) may be provided in the center body portion (112). The side body portion (114) is provided on the front and rear sides of the center body portion (112) and is a portion that protrudes with a predetermined height.

[0028] The center slot (120) is a groove into which a device to be tested, such as a semiconductor package, can be inserted.

[0029] The center slot (120) may be a predetermined recessed groove formed on the upper surface of the socket base member (100). According to an embodiment, the center slot (120) may be composed of a recessed line that extends horizontally, is recessed downward, and is open upward.

[0030] A contact mounting slot (130) may be formed in the center body portion (112). One end of the contact mounting slot (130) may be open toward the center slot (120), and the other end of the contact mounting slot (130) may be open toward the downward direction. A plurality of contact mounting slots (130) may be formed. A plurality of contact mounting slots (130) may be arranged in the front-rear direction. According to an embodiment, the contact mounting slots (130) may be formed on both the left and right sides of the center slot (120) with the center slot (120) in between.

[0031] The first connecting portion (140) may be provided on both upper sides of the side body portion (114). The first connecting portion (140) may have a first connecting hole (142). The first connecting hole (142) may be a hole line that penetrates the first connecting portion (140) in the front-rear direction and extends in the vertical direction with a predetermined length.

[0032] The second connecting part (150) may be provided on both lower sides of the side body part (114). The second connecting part (150) may be provided with a second connecting hole (152). The second connecting hole (152) may be a hole that penetrates the second connecting part (150) in the front-rear direction.

[0034] Lift guide block (200)

[0035] FIG. 6 is a drawing showing a lift guide block (200), and FIG. 7 is a cross-sectional view of DD of FIG. 6.

[0036] The lift guide block (200) includes a bottom block (210), a side block (220), a package mounting slot (230), a top block (240), and a third connecting part (250).

[0037] The bottom block (210) forms the bottom of the lift guide block (200). The bottom block (210) may be a predetermined block having a predetermined width in the left-right direction and extending long in the front-back direction.

[0038] The side block (220) is provided on the bottom block (210) and is a portion extending upward from the bottom block (210). The side block (220) is provided with a contact through hole (222). The contact through hole (222) is configured as a hole penetrating the side block (220) in the left-right direction. Multiple contact through holes (222) are provided, and multiple contact through holes (222) can be arranged side by side in the front-back direction.

[0039] Side blocks (220) may be provided on each side of the bottom block (210). The two side blocks (220-1, 220-2) may be spaced apart from each other with a predetermined distance in the left and right directions.

[0040] A package mounting slot (230) is formed between the two side blocks (220). The package mounting slot (230) is a space formed between the side blocks (220), has a predetermined depth, extends in the front-rear direction, and is open in the upward direction. The package mounting slot (230) is a groove into which a device to be tested, such as a semiconductor package, can be inserted.

[0041] The top block (240) is provided on each of the side blocks (220) and is a part connected to the side block (220). The top block (240) may extend outwardly on the side block (220).

[0042] A third connecting part (250) may be provided on the outer side of each of the top blocks (240). The third connecting part (250) may be provided with a third connecting hole (252). The third connecting hole (252) may be a hole that penetrates the third connecting part (250) in the front-rear direction. For each of the top blocks (240), a plurality of third connecting parts (250) may be provided, and the third connecting hole (252) provided in the third connecting part (250) connected to one of the top blocks (240) may be located on a straight line in the front-rear direction.

[0044] <Lever Module (300)>

[0045] The lever module (300) may include a first lever module (300-1) and a second lever module (300-2). The first lever module (300-1) and the second lever module (300-2) may be positioned on the left and right sides, respectively, of the lift guide block (200) and the socket base member (100). Since the first lever module (300-1) and the second lever module (300-2) are symmetrical to each other and have corresponding configurations, the following description will be based on the first lever module (300-1).

[0046] FIG. 8 is an exploded view showing each component of the lever module (300) disassembled.

[0047] The lever module (300) may include a first link arm (310), a second link arm (320), a first link shaft (330), a second link shaft (340), and a third link shaft (350).

[0048] The first link arm (310) is a bar-shaped member that has a predetermined length and extends. The first link arm (310) is provided with a first-1 link hole (312) and a first-2 link hole (314) at each of its longitudinal ends. A plurality of first link arms (310) are provided, and the plurality of first link arms (310) can be arranged side by side in the front-rear direction.

[0049] The second link arm (320) is a bar-shaped member that has a predetermined length and extends. The second link arm (320) is provided with a second-1 link hole (322) and a second-2 link hole (324) at each of its longitudinal ends. A plurality of second link arms (320) are provided, and the plurality of second link arms (320) can be arranged side by side in the front-rear direction.

[0050] The first link shaft (330) may be a shaft that extends with a predetermined length in the front-rear direction. The second link shaft (340) may be a shaft that extends with a predetermined length in the front-rear direction. The third link shaft (350) may be a shaft that extends with a predetermined length in the front-rear direction.

[0051] Figure 9 shows the combined form of the lever module (300).

[0052] In the lever module (300), the connection relationship of each member is as follows.

[0053] The first link shaft (330) connects a plurality of first link arms (310) in the forward and backward directions. That is, the first link shaft (330) connects a plurality of first link arms (310) to each other while passing through the first-1 link holes (312) of the plurality of first link arms (310). In addition, as described below, the first link shaft (330) connects the first link arms (310) to the first connecting part (140) and the third connecting part (250).

[0054] The second link shaft (340) connects the first link arm (310) and the second link arm (320). Additionally, it connects the multiple first link arms (310) and the multiple second link arms (320) in the forward and backward directions. That is, the second link shaft (340) connects the multiple first link arms (310) to each other by passing through the first-second link holes (314) of the multiple first link arms (310). At the same time, the second link shaft (340) connects the multiple second link arms (320) to each other by passing through the second-first link holes (322) of the multiple second link arms (320). Accordingly, the first link arm (310) and the second link arm (320) are connected to each other via the second link shaft (340).

[0055] The third link shaft (350) connects the second link arm (320) and the second connecting part (150) to each other, as described below.

[0057] <Contact Absence (400)>

[0058] FIG. 10 is a drawing showing a contact member (400).

[0059] The above contact member (400) is composed of a material having electrical conductivity and is a member having a substantially signal transmission function.

[0060] The above contact member (400) may include a top line (410), a middle line (420), and a bottom line (430).

[0061] The contact member (400) may have an overall 'L' shape. The contact member (400) may include a top line (410) that forms an upper portion and extends in an upward and downward direction, a middle line (420) that is located below the top line (410) and extends in an upward and downward direction, and a bottom line (430) that is connected to the lower end of the middle line (420) and extends in a horizontal direction.

[0062] The top line (410) may be provided with a contact tip (412) that protrudes horizontally from the top. The contact tip (412) is a part that can contact the terminal of the device to be tested mounted on the test socket (1). In addition, the top line (410) may be provided with a shifting part (414). The shifting part (414) may be a part that is located below the contact tip (412) and extends at an angle.

[0063] The middle line (420) may be provided with a fixed projection (422). The fixed projection (422) may be a projection that protrudes in the forward and backward directions of the middle line (420).

[0064] The bottom line (430) may be provided with a bottom tip (432). The bottom line (430) is a part that can contact the terminal of the test board on which the test socket (1) is mounted.

[0066] <Connection relationships and operation between each component>

[0067] The connection relationships of each member will be explained below with reference to the drawings.

[0068] FIG. 11 is a diagram showing the connection relationship between a socket base member (100), a lift guide block (200), and a contact member (400).

[0069] The coupling relationship between the socket base member (100), the lift guide block (200), and the contact member (400) is described as follows.

[0070] The contact member (400) may be located within the contact mounting slot (130) of the socket base member (100). At least a portion of the contact tip (412) and the shifting portion (414) of the top line (410) of the contact member (400) may protrude from the contact mounting slot (130) and protrude into the center slot (120).

[0071] A lift guide block (200) may be disposed on a socket base member (100). At this time, the bottom block (210) and side block (220) of the lift guide block (200) may be inserted into the center slot (120) of the socket base member (100). Additionally, the top block (240) of the lift guide block (200) may be positioned on the center body portion (112) of the socket base member (100).

[0072] The contact through hole (222) formed in the side block (220) and the contact mounting slot (130) formed in the socket base member (100) may have a corresponding arrangement. That is, one contact through hole (222) and one contact mounting slot (130) are located on a straight line in the left-right direction and can communicate with each other.

[0073] At least a portion of the contact tip (412) and the shifting portion (414) of the top line (410) of the contact member (400) protrudes from the contact mounting slot (130) and into the center slot (120). At least a portion of the shifting portion (414) may be located on the bottom block (210). Additionally, at least a portion of the contact tip (412) may protrude into the package mounting slot (230).

[0074] FIG. 12 is a diagram showing the connection relationship between the socket base member (100), the lift guide block (200), and the lever module (300).

[0075] The coupling relationship between the socket base member (100), the lift guide block (200), and the lever module (300) is described as follows. Below, the first lever module (300) is described, but the same description can be applied to the second lever module (300).

[0076] As previously described, the first link shaft (330) connects the plurality of first link arms (310) to one another by passing through the first-1 link holes (312) of the plurality of first link arms (310). At the same time, the first link shaft (330) passes through the first link arm (310), the first connection hole (142) of the first connecting part (140), and the third connection hole (252) of the third connecting part (250). Accordingly, the first link arm (310), the first connecting part (140) of the socket base member (100), and the second connecting part (150) of the lift guide block (200) are connected to one another through the first link shaft (330). At this time, since the first connecting hole (142) is extended with a predetermined length in the vertical direction, the first link shaft (330) within the first connecting hole (142) can be displaced in the vertical direction along the extension direction of the first connecting hole (142) within the first connecting hole (142).

[0077] Additionally, the second link shaft (340) rotatably connects the first link arm (310) and the second link arm (320) to each other. Thus, the first link arm (310) and the second link arm (320) are connected to each other via the second link shaft (340).

[0078] The third link shaft (350) rotatably connects the second link arm (320) and the second connecting part (150) to each other. The third link shaft (350) passes through the second-second link hole (324) of the second link arm (320) and the second connecting hole (152) of the second connecting part (150). Multiple third link shafts (350) may be provided, and each second link arm (320) and each second connecting part (150) may rotatably connect to each other.

[0080] <Operation of test socket (1) according to the example>

[0081] Below, the operation of the test socket (1) according to the embodiment is described with reference to the drawings.

[0082] FIG. 13 is a cross-sectional view showing the state in which the lift guide block (200) is raised before the device under test is inserted into the package mounting slot (230). This state may be referred to as the first state.

[0083] In this first state, the lift guide block (200) is in a raised position, causing interference between the bottom block (210) and the contact member (400). Accordingly, the bottom block (210) pushes the shifting portion (414) of the contact member (400). As the contact member (400) is pushed by the bottom block (210), the contact tip (412) may not protrude into the package mounting slot (230). This state may be referred to as the pushing state of the contact member (400).

[0084] FIGS. 14 and 15 are cross-sectional views showing the device under test (P) being inserted into the package mounting slot (230).

[0085] As indicated by arrow A1 in FIG. 14, when the device under test (P) is inserted into the package mounting slot (230) and the bottom block (210) is pressed through the device under test (P), the bottom block (210) and the lift guide block (200) are displaced downward as indicated by arrow A2. As the lift guide block (200) descends, the first link shaft (330) descends along the lift guide block (200), and the descent of the first link shaft (330) is guided along the first connection hole (142). Accordingly, the lever module (300) operates in a pivoting manner into the test socket (1) as indicated by arrow A3.

[0086] Additionally, as the bottom block (210) descends, interference between the bottom block (210) and the contact member (400) is released. Accordingly, the contact member (400) is restored to its shape as indicated by arrow A4, and the contact tip (412) of the contact member (400) protrudes into the package mounting slot (230) through the contact through hole (222). This state can be referred to as the contact state of the contact member (400). In this contact state, contact between the contact tip (412) and the terminal of the device under test (P) can be achieved.

[0087] The deformation process of the contact member (400) according to the above process is as shown in (a), (b), and (c) of FIG. 15. At this time, the state in which the lift guide block (200) is displaced downward as shown in (c) of FIG. 15 can be referred to as the second state.

[0088] As described above, during the mounting process of the device to be tested (P), when the device to be tested (P) is first positioned within the package mounting slot (230), the contact member (400) is in a pushing state, so no contact occurs between the device to be tested (P) and the contact tip (412). Subsequently, the device to be tested (P) is lowered and the lift guide block (200) is lowered, after which the contact member (400) is switched to a contact state and contact is achieved between the device to be tested (P) and the contact tip (412). Therefore, during the process of mounting the device to be tested (P) into the test socket (1), friction or collision between the contact member (400) and the terminal of the device to be tested (P) can be prevented or reduced.

[0089] FIGS. 16 and 17 are drawings showing the device under test (P) being removed from the package mounting slot (230).

[0090] When the lift guide block (200) rises and switches to the first state, the device under inspection (P) can be ejected from the package mounting slot (230).

[0091] For example, when the first link shaft (330) is operated, the lever module (300) rotates as shown by arrow B1, and the first link shaft (330) rises. At this time, the rise of the first link shaft (330) is guided along the first connecting hole (142). As the first link shaft (330) rises, the lift guide block (200) can be displaced upward as shown by arrow B2. As the lift guide block (200) is displaced upward, the device to be inspected (P) placed on the bottom block (210) is also supported by the bottom block (210) and can rise as shown by arrow B4.

[0092] The deformation process of the contact member (400) according to the above process is as shown in (a), (b), and (c) of FIG. 17.

[0093] During this process, interference occurs again between the bottom block (210) and the contact member (400), and the bottom block (210) pushes the shifting portion (414) of the contact member (400). Accordingly, as indicated by arrow B3, the contact tip (412) of the contact member (400) is again switched to a state of being disengaged from within the package mounting slot (230). That is, the distance between the contact tips (412) of the contact member (400) positioned on both sides of the package mounting slot (230) is extended.

[0094] During the upward movement of the device under test (P), as the contact member (400) is deformed as described above, the contact between the device under test (P) and the contact tip (412) can be released. Therefore, when the device under test (P) is removed from the test socket (1), friction or collision between the contact member (400) and the terminal of the device under test (P) can be prevented or reduced.

[0095] As described above, the test socket (1) according to the embodiment of the present invention occurs only when contact between the contact member (400) and the device to be tested (P) is required, and unnecessary contact and collision between the contact member (400) and the device to be tested (P) can be prevented or minimized during the process of mounting and removing the device to be tested (P). Accordingly, damage to the contact member (400) and the device to be tested (P) can be prevented.

[0097] Although preferred embodiments have been illustrated and described above, the present invention is not limited to the specific embodiments described above. Various modifications are possible by those skilled in the art without departing from the essence of the invention as claimed in the claims, and such modifications should not be understood individually from the technical spirit or perspective of the present invention. Explanation of the symbols

[0098] 1: Test socket 100: Socket base missing 110: Base body 112: Center body 114: Side body section 120: Center slot 130: Contact mounting slot 140: First connection 142: First connecting hole 150: Second connection 152: Second connecting hole 200: Lift guide block 210: Bottom Block 220: Side Block 222: Contact-through hole 230: Package mounting slot 240: Top Block 250: Third connection 252: 3rd connecting hole 300: Lever Module 310: 1st Link Arm 312: 1-1 Link Hall 314: 1st-2nd Link Hall 320: 2nd Link Arm 322: 2-1 Link Hall 324: 2-2 Link Hall 330: 1st link shaft 340: Second link shaft 350: Third link shaft 400: No contact 410: Top lane 412: Contact Tip 414: Shifting Department 420: Middle line 422: Fixed protrusion 430: Bottom line 432: Bottom Tip

Claims

Claim 1 A test socket comprising: a socket base member including a center slot and a contact mounting slot formed on the side of the center slot; a lift guide block including a package mounting slot for mounting a device to be tested; a lever module; and a plurality of contact members; wherein at least one part of the lift guide block is inserted into the center slot, and the contact member is mounted in the contact mounting slot, and the lift guide block is displaced relative to the base member in the up-and-down direction by operation of the lever module, and as the lift guide block is displaced in the up-and-down direction, an external force is applied to the contact member, thereby changing the shape of the contact member. Claim 2 In claim 1, the lift guide block comprises a bottom block located below the package mounting slot and a side block located on the side of the package mounting slot, wherein the side block has a contact through hole, and the contact through hole and the contact mounting slot communicate with each other in a lateral direction, and the contact member is a test socket in which at least one part can protrude into the package mounting slot through the contact through hole. Claim 3 In paragraph 2, the contact member comprises a contact tip and a shifting part such that at least one part of the contact member may face the bottom block, and when the lift guide block descends, the contact tip is positioned within the package mounting slot and the shifting part is positioned on the bottom block, and when the lift guide block ascends, at least one part of the bottom block pushes the shifting part so that the contact member is deformed and the contact tip is disengaged from the package mounting slot. Claim 4 In paragraph 3, the contact mounting slot is formed symmetrically on both sides of the center slot, and the side block is a test socket positioned symmetrically on both sides of the package mounting slot. Claim 5 In paragraph 2, the socket base member includes a first connecting portion having a first connecting hole formed therein extending in the vertical direction, the lift guide block includes a third connecting portion having a third connecting hole formed therein and connected to the side block, the lever module includes a first link shaft, the first connecting portion and the third connecting portion are located in a straight line in the front-rear direction, the first link shaft connects the first connecting portion and the third connecting portion to each other, and as the first link shaft is displaced in the vertical direction along the first connecting hole, the lift guide block is displaced in the vertical direction, thereby forming a test socket. Claim 6 In claim 5, the socket base member comprises a second connecting member provided at the lower part of the first connecting member and having a second connecting hole formed therein, and the lever module comprises a first link arm including a first-1 link hole and a first-2 link hole, a second link arm including a second-1 link hole and a second-2 link hole, a second link shaft, and a third link shaft, wherein the second link shaft connects the first link arm and the second link arm, and the third link shaft connects the second link arm and the third connecting member, forming a test socket. Claim 7 In claim 6, the lift guide block further comprises a test socket including a top block connecting the side block and the third connecting part.

Images