Equipment for testing thermal-shock

Abstract

The thermal shock testing device of the present invention may include: a chamber having an openable and closable chamber door; a plurality of specimen mounting shelves arranged at a certain vertical interval inside the chamber, each having a plurality of specimens for thermal shock testing placed thereon; a low-temperature medium supply unit for supplying a low-temperature medium into the chamber; a ventilation device for forcibly discharging the low-temperature medium inside the chamber and circulating heated air inside the chamber; and a temperature control unit for controlling the internal temperature of the chamber or the temperature of the specimens.

Description

Technology Field

[0001] The present invention relates to a thermal shock test device. Background Technology

[0002] Generally, when a shock such as sudden heating or cooling is applied to a specific object, the object maintains an abnormal temperature distribution, and as a result, large thermal stress or thermal strain occurs inside the object, which is called thermal shock. In this case, thermal stress or thermal strain may refer to stress or deformation that occurs as an object expands or contracts due to a change in temperature.

[0003] In particular, in the case of brittle materials, since the thermal deformation they can absorb is small, they often fail due to repeated thermal stress one or several times, which is called thermal shock fracture.

[0004] As such, the thermal shock test device for testing the thermal shock performance of an object is a test device capable of investigating changes in the material caused by rapid heating and rapid cooling as described above.

[0005] However, conventional thermal shock testing devices involve a process of cooling the specimen and then exposing it to the atmosphere to raise its temperature, so a considerable amount of time may be required for the heating process. In addition, since thermal shock testing involves repeated cooling and heating, if the time required for heating increases, the total thermal shock test time may increase significantly. The problem to be solved

[0006] The present invention was created to solve the problems of the prior art as described above. One objective of the present invention is to provide a thermal shock test device capable of automatically performing repetitive cooling and heating, while reducing the time required for heating through forced exhaust and ventilation. means of solving the problem

[0007] A thermal shock test apparatus according to one aspect of the present invention may include: a chamber having a chamber door that can be opened and closed; a plurality of specimen mounting shelves arranged at a certain vertical interval inside the chamber, each having a plurality of specimens for thermal shock testing placed thereon; a low-temperature medium supply unit for supplying a low-temperature medium into the chamber; a ventilation device for forcibly discharging the low-temperature medium inside the chamber and circulating heated air inside the chamber; and a temperature control unit for controlling the internal temperature of the chamber or the temperature of the specimens.

[0008] Specifically, a sliding device for sliding the shelf for mounting the specimen may be provided inside the chamber.

[0009] Specifically, the ventilation device may include a heater device to supply heated air into the interior of the chamber.

[0010] Specifically, the apparatus further includes a plurality of low-temperature medium guide tubes connected to the low-temperature medium supply unit and provided on the upper sides of each specimen mounting shelf inside the chamber, and the low-temperature medium guide tubes may include a plurality of spray nozzles that evenly and directly spray the low-temperature medium onto all surfaces of the specimen.

[0011] Specifically, the temperature control unit checks the internal temperature of the chamber or the temperature of the specimen and repeatedly performs cooling and heating of the chamber or the specimen, thereby enabling the thermal shock test of the specimen to be performed multiple times. Effects of the invention

[0012] The thermal shock test device according to the present invention can reduce the time required for heating through forced exhaust and ventilation. Therefore, the time for the thermal shock test can be reduced. In addition, the thermal shock test device according to the present invention can automatically perform repetitive cooling and heating. Brief explanation of the drawing

[0013] FIG. 1 is a perspective view of a thermal shock test device according to one embodiment of the present invention. Figure 2 is a plan view of the thermal shock test apparatus shown in Figure 1. Figure 3 is a front view of the thermal shock test apparatus shown in Figure 1. Figure 4 is a side cross-sectional view of the thermal shock test apparatus shown in Figure 1. Specific details for implementing the invention

[0014] The objects, specific advantages, and novel features of the present invention will become more apparent from the following detailed description and preferred embodiments in conjunction with the accompanying drawings. It should be noted that in assigning reference numerals to the components of each drawing in this specification, identical components are assigned the same number whenever possible, even if they are shown in different drawings. Furthermore, in describing the present invention, detailed descriptions of related prior art are omitted if it is determined that such detailed descriptions would unnecessarily obscure the essence of the invention.

[0015] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the attached drawings.

[0017] FIG. 1 is a perspective view of a thermal shock test device according to one embodiment of the present invention, FIG. 2 is a plan view of the thermal shock test device shown in FIG. 1, FIG. 3 is a front view of the thermal shock test device shown in FIG. 1, and FIG. 4 is a side cross-sectional view of the thermal shock test device shown in FIG. 1.

[0018] Referring to FIGS. 1 to 4, a thermal shock test apparatus according to one embodiment of the present invention may be for repeatedly performing a thermal shock test on a specimen (SP). Here, the specimen (SP) may be an insulation panel or a secondary barrier for forming an insulation structure of a liquefied gas storage tank. In particular, the thermal shock test apparatus according to one embodiment of the present invention may be a specimen (SP) in which a secondary barrier is formed when manufacturing an insulation panel. That is, the specimen (SP) may be a laminate of a secondary insulation wall and a secondary barrier of a liquefied gas storage tank.

[0019] The thermal shock test device may include a chamber (100), a shelf for mounting specimens (200), a low-temperature medium supply unit (300), a temperature control unit (400), and a ventilation device (500).

[0020] The chamber (100) has the shape of an insulated box and may be provided with a chamber door (110) that can be opened and closed on one side. The chamber door (110) may be connected to the body of the chamber (100) via a hinge so as to be rotatable.

[0021] An insulating wall (not shown) for thermal insulation and a barrier (not shown) for cryogenic stability may be provided inside the chamber (100). The insulating wall may be made of polyurethane foam or phenolic foam. In some cases, the insulating wall may be omitted, in which case the space between the body of the chamber (100) and the barrier may be kept under vacuum.

[0022] For cryogenic stability, the barrier may be composed of materials such as SUS, Invar, 9% Ni steel, or high-manganese steel.

[0023] Meanwhile, a plurality of wheels (600) are provided on the lower part of the chamber (100) so that the chamber (100) can be moved. Additionally, wheels (600) are also provided on the chamber door (110) so that the chamber door (110) can be opened and closed easily and the separation of the opening and closing part due to the weight of the chamber door (110) can be prevented.

[0025] The specimen mounting shelf (200) can mount a specimen (SP) for thermal shock testing. The specimen mounting shelf (200) is provided in multiple numbers and can be arranged at a certain distance apart vertically inside the chamber (100). Accordingly, the thermal shock testing device according to the present embodiment can perform thermal shock tests on multiple specimens (SP) simultaneously.

[0026] The specimen mounting shelf (200) may be slidable and retractable. For example, to enable sliding of the specimen mounting shelf (200), a sliding guide device (not shown), such as a sliding guide rail or a guide groove, may be provided inside the chamber (100), and the specimen mounting shelf (200) may be positioned on the sliding guide rail or inserted into the guide groove. The sliding guide rail or guide groove may be extended between the chamber door (110) and the surface facing the chamber door (110).

[0027] A plurality of specimen fixing joints (210) may be provided on the specimen mounting shelf (200). The specimen fixing joints (210) are provided on the upper surface of the specimen mounting shelf (200) to fix or support the specimen (SP).

[0028] A shelf handle (220) may be provided on one side of the specimen mounting shelf (200), for example, in an area adjacent to the chamber door (110). The shelf handle (220) may facilitate the operator from ejecting the specimen mounting shelf (200) out of the chamber (100) or inserting it into the chamber (100). The shelf handle (220) may be omitted depending on the circumstances.

[0030] The low-temperature medium supply unit (300) may be a conduit device for supplying a low-temperature medium for cooling a specimen (SP) into the interior of the chamber (100). Here, the low-temperature medium may be a cryogenic medium capable of rapidly cooling the specimen (SP), for example, liquid nitrogen.

[0031] The low-temperature medium supply unit (300) can be connected to a low-temperature medium guide tube (310) provided inside the chamber (100).

[0032] The low-temperature medium guide tubes (310) are provided in multiple numbers inside the chamber (100) and may have a shape that extends in one direction. The low-temperature medium guide tubes (310) may be provided spaced apart from each other at a certain distance. In particular, the low-temperature medium guide tubes (310) may be provided on the upper sides of each specimen mounting shelf (200).

[0033] Each low-temperature medium induction tube (310) may be provided with a plurality of spray nozzles (320) capable of spraying a low-temperature medium, and the spray nozzles (320) may be spaced apart from each other at a certain distance. The spray nozzles (320) may be omitted depending on the case.

[0035] A temperature control unit (400) may be provided on a portion of the outer side of the chamber (100). For example, the temperature control unit (400) may be provided on the upper outer side of the chamber (100). The temperature control unit (400) checks the internal temperature of the chamber (100) or the temperature of each of the plurality of specimens (SP), and can control the injection of a low-temperature medium into the chamber (100) or the increase in temperature inside the chamber (100). For example, the temperature control unit (400) may control the low-temperature medium supply unit (300) to inject the low-temperature medium into the chamber (100). Alternatively, the temperature control unit (400) may control the ventilation device (500) to discharge the low-temperature medium inside the chamber (100) to the outside and circulate heated air inside the chamber (100) to raise the temperature inside the chamber (100). In particular, the temperature control unit (400) can rapidly increase the temperature of the specimen (SP) by allowing heated air to circulate inside the chamber (100).

[0037] The ventilation device (500) is provided on one side of the chamber (100) and may be equipped with a ventilation fan (510) that communicates with the inside of the chamber (100).

[0038] The ventilation device (500) can discharge the low-temperature medium inside the chamber (100) to the outside. Additionally, the ventilation device (500) is configured to include a heater device (not shown) so that heated air can circulate inside the chamber (100) to raise the temperature inside the chamber (100) and the specimen (SP).

[0040] The operation of the thermal shock test device described above is explained below.

[0041] First, the chamber door (110) is opened, and the specimen mounting shelf (200) is removed from inside the chamber (100) using a sliding guide device, and then the specimen (SP) can be placed on the specimen mounting shelf (200) using a specimen fixing joint (210).

[0042] Multiple specimens (SP) can be placed inside the chamber (100) by moving the specimen mounting shelf (200) as described above.

[0043] Then, the chamber door (110) can be closed so that the internal space of the chamber (100) is isolated from the external space.

[0044] When the chamber door (110) is closed, a low-temperature medium can be supplied into the interior of the chamber (100) using the low-temperature medium supply unit (300).

[0045] The low-temperature medium supplied through the low-temperature medium supply unit (300) can be supplied onto each specimen (SP) through the spray nozzle (320) of the low-temperature medium guide tube (310). Since the low-temperature medium is supplied onto all surfaces of each specimen (SP) through the plurality of low-temperature medium guide tubes (310), uniform cooling of the specimen (SP) can be achieved.

[0046] While the low-temperature medium is being supplied to each specimen (SP), the temperature control unit (400) can check the internal temperature of the chamber (100) or the temperature of each specimen (SP). The temperature control unit (400) can control the low-temperature medium supply unit (300) to supply the low-temperature medium into the chamber (100) until the internal temperature of the chamber (100) or the temperature of the specimen (SP) is cooled to a preset temperature.

[0047] When the internal temperature of the chamber (100) or the temperature of the specimen (SP) cools to a preset temperature, the temperature control unit (400) can control the low-temperature medium supply unit (300) to stop the supply of the low-temperature medium.

[0048] Then, the temperature control unit (400) can control the ventilation device (500) to forcibly exhaust the low-temperature medium inside the chamber (100). When the low-temperature medium is discharged outside the chamber (100), the temperature control unit (400) can cause heated air to circulate inside the chamber (100) through the ventilation device (500). In particular, to supply heated air into the chamber (100), the temperature control unit (400) can control a heater device together with the ventilation device (500).

[0049] When the internal temperature of the chamber (100) or the temperature of the specimen (SP) rises to a preset temperature, the temperature control unit (400) can stop the heated air from circulating inside the chamber (100).

[0051] As described above, the thermal shock test apparatus according to the present invention can cool and raise the temperature of the chamber (100) or the specimen (SP) by controlling the supply of a low-temperature medium through a low-temperature medium supply unit (300) and controlling the discharge of a low-temperature medium through a ventilation device (500), and controlling the circulation of heated air inside the chamber (100) through the ventilation device (500). In particular, the thermal shock test apparatus according to the present invention can rapidly raise the temperature of the chamber (100) or the specimen (SP) by supplying heated air into the chamber (100). Accordingly, the time required to raise the temperature of the chamber (100) or the specimen (SP) can be shortened.

[0052] In addition, since the supply of a low-temperature medium, the discharge of a low-temperature medium, and the circulation of heated air for heating are automatically performed through the temperature control unit (400), repeated cooling and heating of the specimen (SP) can be performed. That is, the thermal shock test device according to the present embodiment can automatically perform repeated thermal shock tests.

[0053] In addition, by using an insulation panel of a liquefied gas storage tank as a specimen (SP), it is possible to simulate and evaluate conditions similar to those during the operation of a vessel containing a liquefied gas storage tank.

[0055] The present invention is not limited to the embodiments described above, and it is obvious that new embodiments may include a combination of at least two of the above embodiments or a combination of at least one of the above embodiments and known technology.

[0056] Although the present invention has been described in detail through specific embodiments, this is for the purpose of specifically explaining the invention, and the invention is not limited thereto. It will be apparent that modifications or improvements can be made by those skilled in the art within the technical scope of the invention.

[0057] All simple variations or modifications of the present invention fall within the scope of the present invention, and the specific scope of protection of the present invention will be clarified by the appended claims. Explanation of the symbols

[0058] 100: Chamber 110: Chamber door 200: Shelf for placing the Psalms 210: Specimen fixing joint 220: Shelf handle 300: Low-temperature medium supply unit 310: Low-temperature media guide tube 320: Spray nozzle 400: Temperature control unit 500: Ventilation device 510; ventilation fan 600: Wheels SP: Psalms

Claims

Claim 1 A chamber having an openable and closable chamber door; a plurality of specimen mounting shelves arranged vertically at a certain distance from each other and each having a plurality of specimens for a thermal shock test; a low-temperature medium supply unit for supplying a low-temperature medium into the chamber; a ventilation device provided on the rear side of the plurality of specimen mounting shelves for forcibly discharging the low-temperature medium inside the chamber and circulating heated air inside the chamber; and a temperature control unit for controlling the low-temperature medium supply unit and the ventilation device. A thermal shock test device comprising a plurality of low-temperature medium guide tubes connected to the low-temperature medium supply unit and provided on the upper sides of each specimen mounting shelf inside the chamber, wherein the low-temperature medium guide tubes include a plurality of spray nozzles spaced apart at a certain interval in the longitudinal direction of the low-temperature medium guide tubes, wherein the supply direction of the low-temperature medium by the plurality of spray nozzles and the circulation direction of heated air circulated by the ventilation device intersect each other, wherein the ventilation device includes a ventilation fan disposed on one side of the chamber and communicating with the interior of the chamber to forcibly discharge the low-temperature medium inside the chamber to the outside of the chamber, wherein the specimen is an insulating panel of a liquefied gas storage tank, wherein the ventilation fan includes a heater device to supply heated air into the interior of the chamber, wherein the spray nozzle is disposed directly above the specimen and the ventilation fan is disposed to the side of the specimen, and wherein the shortest distance between the spray nozzle and the specimen is formed to be shorter than the shortest distance between the ventilation fan and the specimen, so that the cold air supply position is disposed closer to the specimen than the warm air supply position. Claim 2 A thermal shock test apparatus according to claim 1, wherein a sliding device for sliding the loading and unloading of the specimen mounting shelf is provided inside the chamber. Claim 3 delete Claim 4 delete Claim 5 A thermal shock testing device according to claim 2, wherein the temperature control unit checks the internal temperature of the chamber or the temperature of the specimen and repeatedly performs cooling and heating of the chamber or the specimen to perform multiple thermal shock tests of the specimen.

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