Electronic device driving apparatus equipped with fault diagnosis function for electronic device

Abstract

An electronic device driving device having a fault diagnosis function for an electronic device according to one embodiment comprises: a signal processing unit that processes an input signal to generate a control signal; a driving unit that receives the control signal and outputs a driving signal to drive the electronic device; a detection unit that detects the driving signal and generates at least one detection signal; and a fault diagnosis unit that receives the at least one detection signal and diagnoses whether the electronic device is faulty.

Description

Technology Field

[0001] The embodiments disclosed in this specification relate to an electronic device driving device having a fault diagnosis function for an electronic device. Background Technology

[0002] Electronic device drivers are fundamental components required to operate electronic devices such as sensors or actuators. These drivers frequently incorporate a function to detect and correct for short circuits in the electronic device. This function is essential because short circuits can cause serious defects in the system.

[0003] On the other hand, since open circuit conditions are often considered not to cause direct system defects, functions to detect or correct open circuits are rarely implemented in conventional drive unit designs. In particular, open circuit detection functions tend to be excluded from the design in applications requiring low power consumption or simple designs.

[0004] In addition, when attempting to detect an open circuit state in a CMOS-based driving circuit, the following technical problems exist.

[0005] (1) Driving Loss: Due to the CMOS circuit structure, additional detection circuits can reduce driving efficiency.

[0006] (2) Distortion: The open circuit detection circuit may affect signal quality.

[0007] (3) ESD (Electrostatic Discharge) Sensitivity: Additional circuitry can weaken electrostatic discharge (ESD) protection performance.

[0008] (4) Implementation complexity: Additional circuitry for open circuit detection complicates the design and increases cost and design time.

[0010] For this reason, technology to detect in real-time or appropriately respond when an electronic device operates in an open-circuit state has not been sufficiently implemented in existing actuators. As a result, there was a possibility that problems such as system performance degradation or inefficient operation could occur due to the open-circuit state.

[0011] In particular, in the era of the Internet of Things (IoT), it is becoming increasingly important to verify not only system issues but also the malfunction of individual electronic devices, such as sensors. Since numerous electronic devices are interconnected in IoT systems, the ability to diagnose the status of individual devices in real time and detect problems is essential. Similarly, in automation and industrial equipment, the malfunction of electronic devices such as sensors can degrade the efficiency and safety of the entire system, thus requiring technology capable of rapidly identifying and responding to such malfunctions. The problem to be solved

[0012] The embodiments disclosed in this specification are embodiments intended to solve the technical problems described above, and the purpose is to provide an electronic device driving device equipped with a fault diagnosis function that detects an open circuit state of an electronic device, thereby improving stability and reliability. means of solving the problem

[0013] An electronic device driving device having a fault diagnosis function according to one embodiment comprises: a signal processing unit that processes an input signal to generate a control signal; a driving unit that receives the control signal and outputs a driving signal to drive the electronic device; a detection unit that detects the driving signal and generates at least one detection signal; and a fault diagnosis unit that receives the at least one detection signal and diagnoses whether the electronic device is in an open circuit state.

[0014] Specifically, the detection unit comprises: a plurality of resistors connected in series between the output node of the driving signal and the first power supply voltage; and a plurality of resistors connected in series between the output node of the driving signal and the second power supply voltage; wherein the first detection signal among the at least one detection signal is detected at a first node which is a node between one resistor and another resistor among the plurality of resistors connected in series between the output node of the driving signal and the first power supply voltage, and the second detection signal among the at least one detection signal is detected at a second node which is a node between one resistor and another resistor among the plurality of resistors connected in series between the output node of the driving signal and the first power supply voltage.

[0016] The fault diagnosis unit outputs a fault signal that is activated based on the at least one detection signal when the electronic device is in an open circuit state.

[0017] Specifically, the fault diagnosis unit can generate the fault signal that is intermittently activated upon input of at least one detection signal corresponding to the open circuit state of the electronic device. Effects of the invention

[0018] According to the electronic device driving device having a fault diagnosis function of the electronic device of the embodiments disclosed in this specification, stability and reliability can be improved by providing a driving device having a fault diagnosis function that detects an open circuit state of the electronic device. Brief explanation of the drawing

[0019] FIG. 1 is a configuration diagram of an electronic device driving device equipped with a fault diagnosis function of an electronic device according to one embodiment. FIG. 2 is a circuit diagram of a detection unit according to one embodiment. FIG. 3 is a state table of a first detection signal and a second detection signal according to the state of an electronic device. FIG. 4 is a configuration diagram of a fault diagnosis unit according to a first embodiment. FIG. 5 is an output waveform of a major node of a fault diagnosis unit according to a first embodiment. FIG. 6 is a configuration diagram of a fault diagnosis unit according to a second embodiment. FIG. 7 is a configuration diagram of a fault diagnosis unit according to a third embodiment. FIG. 8 is a configuration diagram of a fault diagnosis unit according to a fourth embodiment. FIG. 9 is a configuration diagram of a fault diagnosis unit according to a fifth embodiment. Specific details for implementing the invention

[0020] Hereinafter, an electronic device driving device equipped with a fault diagnosis function for an electronic device according to embodiments of the present disclosure will be described in detail with reference to the attached drawings. It should be understood that the following embodiments of the present disclosure are merely for the purpose of embodying the present disclosure and do not limit or restrict the scope of the rights of the present disclosure. Anything that can be easily inferred by a person skilled in the art to which the present disclosure pertains from the detailed description and embodiments of the present disclosure is interpreted as falling within the scope of the rights of the present disclosure.

[0022] An electronic device driving device (100) equipped with a fault diagnosis function for an electronic device according to embodiments of the present disclosure is a device for driving electronic devices such as sensors and transducers. That is, examples of electronic devices include speakers, buzzers, ultrasonic sensors, etc.

[0023] Each component of an electronic device driving device (100) equipped with a fault diagnosis function for an electronic device according to embodiments of the present disclosure may be implemented using at least one of a circuit, a processor, and a combination of a circuit and a processor. That is, terms such as “…part,” “…unit,” etc., as described in this specification refer to a unit that processes at least one function or operation, and this may be implemented as hardware, software, or a combination of hardware and software.

[0025] In this specification, the fault signal (SF) is a signal for indicating whether an electronic device is faulty, and the fault status signal (SS) is a signal indicating whether an electronic device is faulty. Additionally, the enable signal (SE) is a signal for allowing the determination of whether an electronic device is faulty. That is, if the electronic device is faulty, the fault status signal (SS) is activated, and the fault signal (SF) may be activated to indicate the fault. Alternatively, if the enable signal (SE) is activated, the fault signal (SF) may be activated.

[0027] First, FIG. 1 shows a configuration diagram of an electronic device driving device (100) equipped with a fault diagnosis function of an electronic device according to one embodiment.

[0028] As can be seen from FIG. 1, an electronic device driving device (100) having a fault diagnosis function of an electronic device according to one embodiment may be configured to include an input unit (10), a signal processing unit (20), a driving unit (30), a detection unit (40), and fault diagnosis units (50a, 50b, 50c, 50d, 50e).

[0029] The input unit (10) receives an input signal (Vin) from an external device. The input signal (Vin) can be a signal containing a control command. For example, the input unit (10) may be equipped with a signal transmission and reception function to receive the input signal (Vin) wirelessly, or it may receive the input signal (Vin) via a wired connection through a terminal.

[0030] The signal processing unit (20) processes the input signal (Vin) to generate a control signal for controlling the driving unit (30). Specifically, the signal processing unit (20) can remove noise from the input signal (Vin) or amplify it.

[0031] The driving unit (30) receives a control signal and outputs a driving signal to drive an electronic device. For example, the driving unit (30) may include a push-pull transistor circuit and generate a driving signal by switching the transistor according to the control signal. An electronic device may be connected to the driving unit (30) so that the operation of the electronic device may be performed.

[0032] The detection unit (40) detects a driving signal and generates at least one detection signal (S1, S2).

[0033] In addition, the fault diagnosis unit (50a, 50b, 50c, 50d, 50e) receives at least one detection signal (S1, S2) and diagnoses whether the electronic device is faulty, that is, whether it is in an open circuit state. Specifically, the fault diagnosis unit (50a, 50b, 50c, 50d, 50e) can diagnose the electronic device as faulty if the electronic device is in an open circuit state.

[0035] FIG. 2 shows a circuit diagram of a detection unit (40) according to one embodiment.

[0036] A detection unit (40) according to one embodiment detects and outputs at least one detection signal (S1, S2). That is, at least one detection signal (S1, S2) may include a first detection signal (S1) and a second detection signal (S2).

[0037] Specifically, the detector (40) may be configured to include: a first detector (41) comprising a plurality of resistors connected in series between the output node (NO) of the driving signal and the first power supply voltage (V1); and a second detector (42) comprising a plurality of resistors connected in series between the output node (NO) of the driving signal and the second power supply voltage (V2). For reference, in FIG. 2, two resistors are shown connected in series to each of the first detector (41) and the second detector (42), but two or more resistors may be connected in series.

[0038] Here, the first power supply voltage (V1) is a positive power supply voltage, and the second power supply voltage (V2) is a negative power supply voltage or ground voltage.

[0039] In addition, the resistor constituting the detection unit (40) can be implemented using a high-impedance element to prevent loss and maintain linearity. That is, if a high-impedance element is present, it is possible to limit the flow of excessive current caused by ESD into the circuit of the driving unit (30).

[0041] The first detection signal (S1) is detected at the first node (N1), which is a node between a plurality of resistors of the first detector (41). That is, the first detection signal (S1) is detected at the first node (N1), which is a node between one resistor and another resistor among a plurality of resistors connected in series between the output node (NO) of the driving signal and the first power supply voltage (V1).

[0042] In addition, the second detection signal (S2) is detected at the second node (N2), which is a node between a plurality of resistors of the second detector (42). That is, the second detection signal (S2) is detected at the second node (N2), which is a node between one resistor and another resistor among a plurality of resistors connected in series between the output node (NO) of the driving signal and the first power supply voltage (V1).

[0044] Figure 3 shows a state table of the first detection signal (S1) and the second detection signal (S2) according to the state of the electronic device.

[0045] In FIG. 3, the high state is a state in which a voltage of the first power supply voltage (V1) level is output, and the low state is a state in which a voltage of the second power supply voltage (V2) level is output.

[0046] As can be seen from FIG. 3, when the electronic device is in an open circuit state, the first detection signal (S1) is in a high state and the second detection signal (S2) is in a low state.

[0048] The fault diagnosis unit (50a, 50b, 50c, 50d, 50e) outputs a fault signal (SF) that is activated based on at least one detection signal (S1, S2) when the electronic device is in an open circuit state.

[0050] When the electronic device is in an open circuit state, it is not necessary for the fault signal (SF) to be continuously output by the fault diagnosis unit (50a, 50b, 50c, 50d, 50e), and the fault signal (SF) may be output periodically or non-periodically. This is because an open circuit state is not a fatal error, so it would be sufficient to output a fault signal (SF) that is intermittently activated even when the device is in an open circuit state.

[0051] The fault diagnosis unit (50a, 50b, 50c, 50d, 50e) generates a fault signal (SF) that is intermittently activated upon input of at least one detection signal (S1, S2) corresponding to an open circuit state of the electronic device. That is, the fault diagnosis unit (50a, 50b, 50c, 50d, 50e) generates a fault signal (SF) that is periodically or non-periodically activated upon input of at least one detection signal (S1, S2) corresponding to an open circuit state of the electronic device.

[0053] Below, we will specifically describe the configuration of the fault diagnosis unit (50a, 50b, 50c, 50d, 50e) for outputting a fault signal (SF) that is intermittently activated even when the circuit is open.

[0055] FIG. 4 shows a configuration diagram of a fault diagnosis unit (50a) according to the first embodiment. In addition, FIG. 5 shows an output waveform diagram of a major node of the fault diagnosis unit (50a) according to the first embodiment.

[0056] The fault diagnosis unit (50a) according to the first embodiment may be configured to include an enable signal generator (51a) and a fault signal generator (52a).

[0057] The enable signal generator (51a) generates an enable signal (SE) using an input signal (Vin). That is, when the input signal (Vin) is input, the enable signal generator (51a) simply detects an edge by the movement of the input signal (Vin) and generates an enable signal (SE).

[0058] Specifically, the enable signal generator (51a) triggers an input signal (Vin) to generate a triggering signal (ST), and generates an enable signal (SE) that is activated when the number of occurrences of at least one edge among the rising edge and falling edge of the triggering signal (ST) is greater than a certain number.

[0059] Triggering of the input signal (Vin) can be implemented, for example, using a buffer, an inverter, etc.

[0060] In addition, the enable signal generator (51a) can generate an enable signal (SE) that is activated when the number of occurrences exceeds a certain number by counting at least one edge among the rising edge and falling edge of the tringering signal (ST), which is the output of the inverter, by counting it with a counter.

[0061] That is, the enable signal generator (51a) generates an enable signal (SE) when the input signal (Vin) is sustained and an edge is detected repeatedly.

[0062] The fault signal generator (52a) generates a fault signal (SF) that is activated when at least one detection signal (S1, S2) corresponding to the open circuit state of the electronic device is input when the enable signal (SE) is activated. That is, the fault signal (SF) is not activated when the electronic device is not in an open circuit state, and the fault signal (SF) is not activated even if the electronic device is in an open circuit state but the enable signal (SE) is not activated.

[0063] When the electronic device is in an open circuit state, the first detection signal (S1) is in a high state and the second detection signal (S2) is in a low state. Therefore, by using an AND gate that receives the first detection signal (S1), the second detection inverted signal obtained by inverting the second detection signal (S2), and the enable signal (SE), the fault signal generator (52a) can generate a fault signal (SF) that can be intermittently activated. That is, the fault signal generator (52a) can generate a fault signal (SF) that can be activated when the enable signal (SE) is activated.

[0065] FIG. 6 shows a configuration diagram of a fault diagnosis unit (50b) according to a second embodiment.

[0066] The fault diagnosis unit (50b) according to the second embodiment may be configured to include an enable signal generator (51b) and a fault signal generator (52b).

[0067] The enable signal generator (51b) generates an enable signal using a counter that operates based on a periodic data signal (D).

[0068] Specifically, the enable signal generator (51b) generates an enable signal (SE) that is activated when the number of occurrences of at least one edge among the rising edge and falling edge of the data signal (D)) is greater than a certain number. By the enable signal (SE), the fault signal generator (52b) can generate a fault signal (SF) that can be activated intermittently. That is, the fault signal generator (52b) can generate a fault signal (SF) that can be activated when the enable signal (SE) is activated.

[0070] FIG. 7 shows a configuration diagram of a fault diagnosis unit (50c) according to a third embodiment.

[0071] As can be seen from FIG. 7, the fault diagnosis unit (50c) according to the third embodiment may be configured to include a fault status signal generator (51c) and a fault signal generator (52c).

[0072] A fault state signal generator (51c) generates a fault state signal (SS) that is activated upon input of at least one detection signal (S1, S2) corresponding to an open circuit state of an electronic device. A fault signal generator (52c) generates a fault signal (SF) that is activated based on the activated fault state signal (SS).

[0073] The fault signal generator (52c) may be implemented to include the same configuration as the enable signal generator (51a) of the fault diagnosis unit (50a) according to the first embodiment.

[0074] That is, the fault signal generator (52c) generates a triggering signal (ST) by triggering an input signal (Vin), and generates an enable signal (SE) that is activated when the number of occurrences of at least one edge among the rising edge and falling edge of the triggering signal (ST) is greater than a certain number. That is, the enable signal (SE) is activated intermittently.

[0075] Depending on the enable signal (SE), the fault signal generator (52c) can determine whether to intermittently activate the fault status signal (SS) and generate a fault signal (SF).

[0076] Specifically, the fault signal generator (52c) can generate a fault signal (SF) by receiving an enable signal (SE) and a fault status signal (SS) as inputs to an AND gate. Accordingly, even if the fault status signal (SS) is continuously input, the fault signal (SF) can be output only when the enable signal (SE) is activated. That is, even if the fault status signal (SS) is continuously input, the fault signal (SF) can be output intermittently.

[0077] In this case, since the enable signal (SE) is generated using the triggering result of the input signal (Vin), the enable signal (SE) is not generated periodically. Therefore, it can be said that the fault signal generator (52c) determines whether the fault status signal (SS) is activated non-periodically.

[0079] FIG. 8 shows a configuration diagram of a fault diagnosis unit (50d) according to the fourth embodiment.

[0080] As can be seen from FIG. 8, the fault diagnosis unit (50d) according to the fourth embodiment may be configured to include a fault status signal generator (51d) and a fault signal generator (52d).

[0081] The fault state signal generator (51d) generates a fault state signal (SS) that is activated upon input of at least one detection signal (S1, S2) corresponding to an open circuit state of the electronic device. The fault signal generator (52d) generates a fault signal (SF) that is activated based on the activated fault state signal (SS).

[0082] The fault signal generator (52d) can be implemented using a counter that operates based on a periodic data signal (D). That is, when the output of the counter exceeds a certain value, it outputs an enable signal (SE), and receives this enable signal (SE) and the fault status signal (SS) as inputs to an AND gate to generate a fault signal (SF). Depending on the enable signal (SE), the fault signal generator (52c) can intermittently determine whether the fault status signal (SS) is activated and generate a fault signal (SF).

[0083] In other words, even if the fault status signal (SS) is continuously input, the fault signal (SF) can be output only when the enable signal (SE) is activated. That is, even if the fault status signal (SS) is continuously input, the fault signal (SF) can be output intermittently.

[0084] In this case, since the enable signal (SE) is generated using a counter operated by the data signal (D), the enable signal (SE) can be generated periodically. Therefore, it can be said that the fault signal generator (52d) periodically determines whether the fault status signal (SS) is activated.

[0086] FIG. 9 shows a configuration diagram of a fault diagnosis unit (50e) according to the fifth embodiment.

[0087] As can be seen from FIG. 9, the fault diagnosis unit (50e) according to the fifth embodiment may be configured to include a fault status signal generator (51e) and a fault signal generator (52e).

[0088] A fault state signal generator (51e) generates a fault state signal (SS) that is activated upon input of at least one detection signal (S1, S2) corresponding to an open circuit state of an electronic device. A fault signal generator (52e) generates a fault signal (SF) that is activated based on the activated fault state signal (SS).

[0089] The fault signal generator (52e) can be implemented using a counter that operates based on the fault status signal (SS). Specifically, the fault signal generator (52e) can generate an activated fault signal (SF) when the fault status signal (SS) is activated and output for a certain period of time or longer by counting using a counter.

[0090] Based on the counting, the fault signal generator (52e) can determine whether the fault status signal (SS) is activated intermittently and generate a fault signal (SF).

[0091] Specifically, the fault signal generator (52e) can generate an activated fault signal (SF) when the fault status signal (SS) is continuously activated. That is, even if the fault status signal (SS) is continuously input, the fault signal (SF) can be output intermittently.

[0092] For example, if an activated fault state signal (SS) is continuously output in a high state, a counter is used to count the activated fault state signal (SS), and if the output of the counter is above a certain value, an activated fault signal (SF) is generated.

[0094] As described above, according to the electronic device driving device (100) having a fault diagnosis function for an electronic device of the embodiments disclosed in this specification, it can be seen that stability and reliability can be improved by providing a driving device having a fault diagnosis function that detects an open circuit state of an electronic device. Explanation of the symbols

[0095] 100: Electronic device driving device 10 : Input section 20 : Signal processing unit 30 : Drive unit 40 : Detector 50a, 50b, 50c, 50d, 50e: Fault diagnosis unit 41: First detector 42 : 2nd detector 51a, 51b: Enable signal generator 51c, 51d, 52e: Fault status signal generators 52a, 52c, 52d, 52e: Fault signal generators

Claims

Claim 1 An electronic device driving device equipped with a fault diagnosis function for an electronic device comprises: a signal processing unit that processes an input signal to generate a control signal; a driving unit that receives the control signal and outputs a driving signal to drive the electronic device; a detection unit that detects the driving signal and generates at least one detection signal; and a fault diagnosis unit that receives the at least one detection signal and diagnoses whether the electronic device is in an open circuit state; wherein the detection unit comprises a plurality of resistors connected in series between an output node of the driving signal and a first power supply voltage. An electronic device driving device comprising: a plurality of resistors connected in series between the output node of the driving signal and the second power supply voltage; wherein the first detection signal among the at least one detection signal is detected at a first node which is a node between one resistor and another resistor among the plurality of resistors connected in series between the output node of the driving signal and the first power supply voltage, and the second detection signal among the at least one detection signal is detected at a second node which is a node between one resistor and another resistor among the plurality of resistors connected in series between the output node of the driving signal and the first power supply voltage, and the fault diagnosis unit outputs a fault signal that is activated based on the at least one detection signal when the electronic device is in an open circuit state, wherein the fault signal is intermittently activated upon input of the at least one detection signal corresponding to the open circuit state of the electronic device. Claim 2 delete Claim 3 An electronic device driving device according to claim 1, wherein when the electronic device is in an open circuit state, the first detection signal is in a high state and the second detection signal is in a low state. Claim 4 delete Claim 5 delete Claim 6 An electronic device driving device according to claim 1, wherein the fault diagnosis unit comprises: a fault signal generator that generates the fault signal which is activated when the enable signal is activated upon input of the at least one detection signal corresponding to the open circuit state of the electronic device; and an enable signal generator that generates the enable signal using the input signal. Claim 7 An electronic device driving device according to claim 6, wherein the enable signal generator generates the enable signal that is activated when the number of occurrences of at least one edge among the rising edge and falling edge of the triggering signal is greater than a certain number. Claim 8 An electronic device driving device according to claim 1, wherein the fault diagnosis unit comprises: a fault state signal generator that generates a fault state signal that is activated upon input of at least one detection signal corresponding to an open circuit state of the electronic device; and a fault signal generator that generates a fault signal that is activated based on the activated fault state signal. Claim 9 In claim 8, the fault signal generator is an electronic device driving device that determines whether the fault state signal is activated intermittently and generates the fault signal. Claim 10 In claim 8, the fault signal generator is an electronic device driving device that generates the activated fault signal when the activated fault state signal is continuously input.

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