Display device and inspecting method thereof

Abstract

A display device according to one embodiment comprises: a display area having a plurality of pixels and a plurality of data lines connected to the plurality of pixels; a hole area located within the display area; a sensing line surrounding the hole area, with one end and the other end separated; a first wiring connected to the one end of the sensing line; and a second wiring connected to the other end of the sensing line. It includes a third wiring connected to one end of the above-mentioned detection line; a fourth wiring connected to the other end of the above-mentioned detection line; and a circuit portion that connects the second wiring to one of the plurality of data lines and connects the fourth wiring to another of the plurality of data lines.

Description

Technology Field

[0001] The present invention relates to a display device and a method for inspecting the same, and more specifically, to a display device including a display panel having a hole formed therein and a method for inspecting the same. Background Technology

[0002] Display devices, such as liquid crystal displays (LCDs) and organic light emitting diode displays (OLEDs), include a display panel comprising a plurality of pixels and a plurality of signal lines capable of displaying an image. Each pixel includes a pixel electrode that receives a data signal, and the pixel electrode can receive a data signal by being connected to at least one transistor. The display panel may include a plurality of stacked layers.

[0003] When a display panel is subjected to impact, cracks may occur in the substrate or the layers laminated thereon. Over time, these cracks may grow larger or spread to other layers or areas, potentially causing defects in the display panel. For example, signal lines, such as data or scan lines, may be severed or experience increased resistance due to the cracks, and moisture may penetrate into the interior of the display panel through the cracks, leading to reduced device reliability. Consequently, various problems may arise, such as pixels on the display panel failing to emit light or emitting light incorrectly.

[0004] In particular, flexible displays that are being developed recently can be bent or warped during manufacturing or use. If even a fine crack exists in the substrate or laminated layer of the display panel, even if there is no problem initially, the fine crack can develop into a larger crack over time due to the bending or warping of the display panel. The problem to be solved

[0005] In order to minimize the non-display area on the front of the display device and maximize the display area across the entire front surface, devices such as cameras, flashes, speakers, and light sensors that were previously located in the non-display area can be placed within the display area. For example, a hole can be formed in the display panel by punching, and a camera, flash, speaker, or light sensor can be mounted in the hole. Cracks may occur during the process of forming the hole in the display panel, or cracks may occur in the part exposed by the hole.

[0006] The technical problem that the present invention aims to solve is to provide a display device capable of inspecting cracks in a display panel having holes formed therein, and a method for inspecting the same. means of solving the problem

[0007] A display device according to one embodiment of the present invention comprises: a display area including a plurality of pixels and a plurality of data lines connected to the plurality of pixels; a hole area located within the display area; a hole crack detection line disposed adjacent to the hole area in a shape that surrounds the hole area, with one end and the other end separated; a first detection line including a first detection transmission line connected to one end of the hole crack detection line and a first detection reception line connected to the other end of the hole crack detection line; a second detection line including a second detection transmission line connected to one end of the hole crack detection line and a second detection reception line connected to the other end of the hole crack detection line; and an inspection control unit that electrically connects the first detection reception line to one of the plurality of data lines and electrically connects the second detection reception line to another of the plurality of data lines.

[0008] It may further include a test voltage wiring comprising one end connected to the first detection transmission wiring and the other end connected to the second detection transmission wiring.

[0009] The above inspection control unit includes a plurality of inspection transistors connected to the plurality of data lines, and the first electrode of each of the plurality of inspection transistors is connected to the plurality of data lines, the second electrode of the first line transistor included in the plurality of inspection transistors is connected to the first detection receiving wiring, and the second electrode of the second line transistor included in the plurality of inspection transistors can be connected to the second detection receiving wiring.

[0010] Among the plurality of test transistors above, the second electrode of the remaining test transistor, excluding the first line transistor and the second line transistor, can be connected to the test voltage wiring.

[0011] When a crack occurs in the hole crack detection line, the pixel connected to the data line connected to the first light line transistor and the pixel connected to the data line connected to the second light line transistor can emit light.

[0012] A first line including a pixel connected to a data line connected to the first line transistor and a second line including a pixel connected to a data line connected to the second line transistor may be located near the center of the display area.

[0013] The first detection transmission wiring can be connected to a first inspection pad to which a first inspection voltage is applied, and the second detection transmission wiring can be connected to a second inspection pad to which a second inspection voltage is applied.

[0014] The above display device may further include a sensing control wiring connected at one end to a third inspection pad and connected to the gate electrode of each of the plurality of inspection transistors.

[0015] The above display device may further include a third sensing wire, one end of which is connected to a fourth inspection pad, extends along one edge of the display area and then returns in the opposite direction to be connected to the second electrode of a third line transistor included in the plurality of inspection transistors, and a fourth sensing wire, one end of which is connected to a fifth inspection pad, extends along the other edge of the display area and then returns in the opposite direction to be connected to the second electrode of a fourth line transistor included in the plurality of inspection transistors.

[0016] The above display device may further include a bendable area around the display area, a fifth sensing wire having one end connected to a sixth inspection pad, extending into the bendable area and then returning in the opposite direction to be connected to the second electrode of a fifth line transistor included in the plurality of inspection transistors, and a sixth sensing wire having one end connected to a seventh inspection pad, extending into the bendable area and then returning in the opposite direction to be connected to the second electrode of a sixth line transistor included in the plurality of inspection transistors.

[0017] The first inspection pad may be a first common inspection pad to which the fourth inspection pad and the sixth inspection pad are connected, and the second inspection pad may be a second common inspection pad to which the fifth inspection pad and the seventh inspection pad are connected.

[0018] The first detection transmission wiring may extend between the fourth inspection pad and the sixth inspection pad, and the second detection transmission wiring may extend between the fifth inspection pad and the seventh inspection pad.

[0019] When a test voltage is applied to the first test pad and the second test pad, at least one of the pixels connected to the data line connected to the third line transistor, the pixels connected to the data line connected to the fourth line transistor, the pixels connected to the data line connected to the fifth line transistor, and the pixels connected to the data line connected to the sixth line transistor may emit light.

[0020] A method for inspecting a display device according to another embodiment of the present invention, comprising a plurality of pixels and a plurality of data lines connected to the plurality of pixels, a hole area located within the display area, and a hole crack detection line arranged adjacent to the hole area in a shape surrounding the hole area, comprises the steps of: applying a first inspection voltage to a first detection wire connected to the hole crack detection line; applying a second inspection voltage to a second detection wire connected to the hole crack detection line; and electrically connecting the first detection wire to one of the plurality of data lines through a first detection wire transistor and electrically connecting the second detection wire to another of the plurality of data lines through a second detection wire transistor.

[0021] The method may further include a step in which at least one of the pixel connected to the data line connected to the first light line transistor and the pixel connected to the data line connected to the second light line transistor emits light.

[0022] When a crack occurs in the hole crack detection line, the pixel connected to the data line connected to the first light line transistor and the pixel connected to the data line connected to the second light line transistor can emit light.

[0023] A first line including a pixel connected to a data line connected to the first line transistor and a second line including a pixel connected to a data line connected to the second line transistor may be located near the center of the display area.

[0024] The first detection wiring may include a first detection transmission wiring connected to one end of the hole crack detection line and a first detection receiving wiring connected to the other end of the hole crack detection line, and the second detection wiring may include a second detection transmission wiring connected to one end of the hole crack detection line and a second detection receiving wiring connected to the other end of the hole crack detection line.

[0025] A method for inspecting a display device including a display area comprising a plurality of pixels and a hole area located within the display area according to another embodiment of the present invention comprises the step of emitting light from a plurality of pixels included in a first light line and a second light line electrically connected to a hole crack detection line arranged adjacent to the hole area in a shape surrounding the hole area, wherein the first light line and the second light line are located near the center of the display area.

[0026] The method further includes the step of a pixel included in either a third line or a fourth line electrically connected to a sensing wire arranged along both edges of the display area emitting light, wherein the third line and the fourth line may be located on the left and right sides within the display area. Effects of the invention

[0027] Cracks in the hole area can be inspected on the display panel where the hole is formed. Brief explanation of the drawing

[0028] FIG. 1 is a plan view showing a display device according to one embodiment of the present invention. FIG. 2 is a cross-sectional view of the display device of FIG. 1 cut along the line II-II'. Figure 3 is a circuit diagram showing an inspection control unit included in the display device of Figure 1. FIG. 4 is a timing diagram showing a method for inspecting a display device according to one embodiment of the present invention. FIGS. 5a to 5c show examples of test results displayed in a display area when a test voltage is applied to the display device of FIG. 1. FIG. 6 is a plan view showing a display device according to another embodiment of the present invention. FIG. 7 is a cross-sectional view of the display device of FIG. 6 cut along the line VII-VII'. FIG. 8 is a circuit diagram showing an inspection control unit included in the display device of FIG. 6. FIG. 9 shows an example of a test result displayed in a display area when a test voltage is applied to the display device of FIG. 6. FIG. 10 is a plan view showing a display panel cut along a dotted line in the display device of FIG. 6. Specific details for implementing the invention

[0029] Hereinafter, embodiments of the present invention will be described in detail with reference to the attached drawings so that those skilled in the art can easily implement the present invention. The present invention may be embodied in various different forms and is not limited to the embodiments described herein.

[0030] To clearly explain the present invention, parts unrelated to the explanation have been omitted, and the same reference numerals are used for identical or similar components throughout the specification.

[0031] Furthermore, the size and thickness of each component shown in the drawings are depicted arbitrarily for convenience of explanation, and thus the present invention is not necessarily limited to what is illustrated. Thicknesses have been enlarged in the drawings to clearly represent various layers and regions. Additionally, for convenience of explanation, the thickness of some layers and regions has been exaggerated in the drawings.

[0032] When a part such as a layer, membrane, region, or plate is said to be "on" or "on" another part, this includes not only the case where it is "directly above" the other part, but also the case where there is another part in between. Conversely, when a part is said to be "directly above" another part, it means that there is no other part in between. Furthermore, being "on" or "on" a reference part means being located above or below the reference part, and does not necessarily mean being located "on" or "on" in the direction opposite to gravity.

[0033] Furthermore, throughout the specification, when a part is described as "including" a certain component, this means that, unless specifically stated otherwise, it does not exclude other components but may include additional components.

[0034] Hereinafter, a display device according to one embodiment will be described with reference to FIGS. 1 to 3, and a method for inspecting a display device according to one embodiment will be described with reference to FIGS. 4 and 5.

[0035] FIG. 1 is a plan view showing a display device according to one embodiment of the present invention.

[0036] Referring to FIG. 1, the display device includes a display panel (100A) comprising a display area (DA), a peripheral area (PA), and a hole area (HA). The display panel (100A) includes a substrate (110), and the substrate (110) can be divided into a display area (DA) and a peripheral area (PA).

[0037] The display area (DA) is an area where an image is displayed. The display area (DA) includes a plurality of pixels (PX) and a plurality of signal lines arranged on a plane parallel to the first direction (D1) and the second direction (D2). The structure observed when viewed from a direction perpendicular to the first direction (D1) and the second direction (D2) is called a planar structure, and the structure visible when cut in a direction perpendicular to the first direction (D1) and the second direction (D2) is called a cross-sectional structure. The first direction (D1) may be perpendicular to the second direction (D2).

[0038] A plurality of signal lines includes a plurality of gate lines (121) that transmit gate signals and a plurality of data lines (171) that transmit data signals. The plurality of gate lines (121) may extend mainly in a first direction (D1) and may be parallel to each other. The plurality of data lines (171) may extend mainly in a second direction (D2) and may be parallel to each other. The plurality of gate lines (121) and the plurality of data lines (171) may intersect each other in a display area (DA).

[0039] Each of the plurality of pixels (PX) may include at least one switching element (see TRa in FIG. 2) and a pixel electrode connected thereto (see 191 in FIG. 2). The switching element may be a three-terminal element, such as a transistor integrated in the display panel (100A), and may be connected to at least one gate line (121) and at least one data line (171). The switching element may be turned on or turned off according to a gate signal transmitted by the gate line (121) to selectively transmit a data signal to the pixel electrode.

[0040] Each of the multiple pixels (PX) can emit light of one of the primary colors or white light. Examples of primary colors include the three primary colors of red, green, and blue. Other examples of primary colors include yellow, cyan, and magenta.

[0041] The substrate (110) may include glass, plastic, etc., and may have flexibility. For example, the substrate (110) may include various plastics such as polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polycarbonate (PC), polyarylate (PAR), polyetherimide (PEI), polyethersulfone (PES), or polyimide (PI), metal thin film, or glass, etc.

[0042] The hole area (HA) is located within the display area (DA). The hole area (HA) may be an area where a hole formed by punching the substrate (110) and the element stacked on the substrate (110) is located. That is, the hole may be formed by punching the display panel (100A). The hole area (HA) may be an area for placing devices such as a camera, flash, speaker, or light sensor within the display area (DA).

[0043] The display area (DA) includes a hole crack detection line (HCD) positioned adjacent to the hole area (HA). The hole crack detection line (HCD) may be positioned adjacent to the hole area (HA) in a shape that surrounds the hole area (HA) with one end (N1) and the other end (N2) separated. For example, the hole crack detection line (HCD) may surround the hole area (HA) in the shape of a capital letter Omega (Ω). The hole crack detection line (HCD) is wiring for detecting cracks near the hole area (HA).

[0044] The peripheral area (PA) is an area located outside the display area (DA) and can surround the display area (DA). The peripheral area (PA) may include a first sensing wire (M1), a second sensing wire (M2), a test voltage wire (TVL), a sensing control wire (DCL), a test control unit (700), and a plurality of test pads (P1, P2, P3). Additionally, the peripheral area (PA) may include a gate driving unit (not shown) connected to a plurality of gate lines (121) to output a gate signal.

[0045] The first detection wiring (M1) includes a first detection transmission wiring (DT1) and a first detection receiving wiring (DR1). The first detection transmission wiring (DT1) includes one end connected to the first inspection pad (P1) and the other end connected to one end (N1) of the hole crack detection line (HCD). The first detection receiving wiring (DR1) includes one end connected to the inspection control unit (700) and the other end connected to the other end (N2) of the hole crack detection line (HCD).

[0046] The first detection transmission wire (DT1) and the first detection reception wire (DR1) are located in the surrounding areas (PA) to the left and above the display area (DA), and can be connected to the hole crack detection line (HCD) in the surrounding area (PA) to the above. That is, the first detection transmission wire (DT1) and the first detection reception wire (DR1) may include a portion extending along the left edge of the display area (DA) and a portion extending along the upper edge of the display area (DA). The first detection transmission wire (DT1) and the first detection reception wire (DR1) may extend parallel to each other along the edges of the display area (DA).

[0047] The second detection wiring (M2) includes a second detection transmission wiring (DT2) and a second detection receiving wiring (DR2). The second detection transmission wiring (DT2) includes one end connected to the second inspection pad (P2) and the other end connected to one end (N1) of the hole crack detection line (HCD). The second detection receiving wiring (DR2) includes one end connected to the inspection control unit (700) and the other end connected to the other end (N2) of the hole crack detection line (HCD).

[0048] The second detection transmission wiring (DT2) and the second detection reception wiring (DR2) are located in the surrounding areas (PA) to the right and above the display area (DA), and can be connected to the hole crack detection line (HCD) in the surrounding area (PA) above. That is, the second detection transmission wiring (DT2) and the second detection reception wiring (DR2) may include a portion extending along the right edge of the display area (DA) and a portion extending along the upper edge of the display area (DA). The second detection transmission wiring (DT2) and the second detection reception wiring (DR2) may extend parallel to each other along the edge of the display area (DA).

[0049] The inspection voltage wiring (TVL) includes one end connected to the first detection transmission wiring (DT1) and the other end connected to the second detection transmission wiring (DT2), and connects the first detection transmission wiring (DT1) and the second detection transmission wiring (DT2) to each other through the inspection control unit (700). The inspection voltage wiring (TVL) can transmit the detection voltage applied to the first detection transmission wiring (DT1) and the second detection transmission wiring (DT2) to the inspection control unit (700) through the first inspection pad (P1) and the second inspection pad (P2).

[0050] The detection control wiring (DCL) includes one end connected to the third inspection pad (P3) and the other end connected to the inspection control unit (700).

[0051] The first to third inspection pads (P1, P2, P3) can be arranged along the lower edge of the substrate (110) in the surrounding area (PA).

[0052] The inspection control unit (700) may be located in the peripheral area (PA) of the display panel (100A) and connected to a plurality of data lines (171). The inspection control unit (700) may electrically connect a first detection receiving wire (DR1) to one of the plurality of data lines (171) and electrically connect a second detection receiving wire (DR2) to another of the plurality of data lines (171). The inspection control unit (700) may be formed directly on the substrate (110) together with components such as a transistor of a pixel (PX). A data driving unit (not shown) connected to the plurality of data lines (171) may be located in the peripheral area (PA) or on a printed circuit board connected to the peripheral area (PA), and the inspection control unit (700) may be located between the display area (DA) and the data driving unit. At this time, the plurality of data lines (171) may be further extended in the direction of the data driving unit, passing through the inspection control unit (700).

[0053] When an inspection voltage is applied to the first to third inspection pads (P1, P2, P3), the inspection control unit (700) can cause a plurality of pixels (PX) connected to one of the plurality of data lines (171) to emit light in response to the voltage transmitted through the first detection transmission line (DT1), the hole crack detection line (HCD), and the first detection reception line (DR1), and can cause a plurality of pixels (PX) connected to the other of the plurality of data lines (171) to emit light in response to the voltage transmitted through the second detection transmission line (DT2), the hole crack detection line (HCD), and the second detection reception line (DR2). A first bright line can be visible by the emission of a plurality of pixels (PX) connected to one of the plurality of data lines (171). A second bright line can be visible by the emission of a plurality of pixels (PX) connected to the other of the plurality of data lines (171). Depending on whether the first line and / or second line is visible, a hole crack defect, a first detection wiring defect, a second detection wiring defect, etc., can be determined. A detailed description of the inspection method of such a display device will be provided later with reference to FIGS. 4 and FIGS. 5.

[0054] Hereinafter, the cross-sectional structure of the display device will be described with reference to FIG. 2 in conjunction with FIG. 1.

[0055] FIG. 2 is a cross-sectional view of the display device of FIG. 1 cut along the line II-II'.

[0056] Referring to FIG. 2, a barrier layer (120) may be positioned on a substrate (110). The barrier layer (120) may include a plurality of layers as illustrated. Alternatively, the barrier layer (120) may be composed of a single layer.

[0057] An active pattern (130, 130d) is located on the barrier layer (120). The active pattern (130, 130d) may include an active pattern (130) located in a display area (DA) and an active pattern (130d) located in a peripheral area (PA). Each of the active patterns (130, 130d) may include a source area and a drain area and a channel area located between them. The active pattern may include amorphous silicon, polycrystalline silicon, or an oxide semiconductor, etc.

[0058] A first insulating layer (141) may be positioned on the active pattern (130, 130d), and a first conductive layer may be positioned on the first insulating layer (141). The first conductive layer may include a conductor (155) overlapping with the active pattern (130) located in the display area (DA), a conductor (150d) overlapping with the active pattern (130d) located in the surrounding area (PA), and a plurality of gate lines (121) as described above.

[0059] The active pattern (130) of the display area (DA) and the conductor (155) overlapping therewith can form a transistor (TRa) that functions as a switching element included in the pixel (PX). The active pattern (130d) of the peripheral area (PA) and the conductor (150d) overlapping therewith can form a transistor (TRd) that functions as a switching element included in the gate driver.

[0060] A second insulating layer (142) may be located on the first conductive layer and the first insulating layer (141), and a second conductive layer may be located on the second insulating layer (142). The second conductive layer may include a first sensing wire (M1), a second sensing wire (M2), and a hole crack detection line (HCD). According to an embodiment, at least one of the first sensing wire (M1), the second sensing wire (M2), and the hole crack detection line (HCD) may be located on a conductive layer other than the second conductive layer. For example, the hole crack detection line (HCD) may be located on a fourth conductive layer or a fifth conductive layer described later.

[0061] A third insulating layer (160) may be located on the second conductive layer and the second insulating layer (142).

[0062] At least one of the first insulating layer (141), the second insulating layer (142), and the third insulating layer (160) may include an inorganic insulating material such as silicon nitride (SiNx) and silicon oxide (SiOx) and / or an organic insulating material.

[0063] The first insulating layer (141), the second insulating layer (142), and the third insulating layer (160) may include a contact hole (165) located over the source region and / or drain region of the transistor (TRa, TRd).

[0064] A third conductive layer may be located on the third insulating layer (160). The third conductive layer may include a conductor (170) connected to the source or drain region of a transistor (TRa, TRd) through a contact hole (165), a voltage transfer line (177), and the data line (171) described above. The voltage transfer line (177) may be located in the peripheral region (PA) and may transmit a common voltage.

[0065] At least one of the first conductive layer, the second conductive layer, and the third conductive layer may include a conductive material such as copper (Cu), aluminum (Al), molybdenum (Mo), titanium (Ti), tantalum (Ta), or an alloy of at least two of these.

[0066] A protective film (180) is positioned over the third conductive layer and the third insulating layer (160). The protective film (180) may include an inorganic insulating material and / or an organic insulating material. The organic insulating material may include polyacrylic resin, polyimide resin, etc. The upper surface of the protective film (180) may be flat. The protective film (180) may include a contact hole positioned over a voltage transmission line (177) located in a peripheral area (PA).

[0067] A pixel electrode layer is positioned on the protective film (180). The pixel electrode layer may include a pixel electrode (191) corresponding to each pixel (PX) of the display area (DA), and a voltage transfer electrode (197) located in the surrounding area (PA). The voltage transfer electrode (197) may be physically and electrically connected to a voltage transfer line (177) through a contact hole in the protective film (180) to receive a common voltage. The pixel electrode layer may include a semi-transparent conductive material or a reflective conductive material.

[0068] A pixel defining layer (350) is positioned on the protective film (180) and the pixel electrode layer. The pixel defining layer (350) may include an opening (351) positioned on the pixel electrode (191) and at least one dam portion (350d) positioned in the surrounding area (PA). The dam portion (350d) may extend parallel to the edge of the planar substrate (110). A spacer (360d) may be further positioned on the dam portion (350d). The pixel defining layer (350) may include a photosensitive material such as a polyacrylic resin or a polyimide resin.

[0069] As illustrated in FIG. 2, the first sensing wire (M1) may be located outside (opposite side of the display area (DA)) relative to the dam portion (350d). Likewise, the second sensing wire (M2) may also be located outside relative to the dam portion (350d). According to an embodiment, the first sensing wire (M1) and the second sensing wire (M2) may be located inside (between the display area (DA) and the dam portion (350d)) relative to the dam portion (350d).

[0070] The voltage transfer electrode (197) includes a portion not covered by the pixel definition layer (350).

[0071] A light-emitting layer (370) is located on the pixel electrode (191). The light-emitting layer (370) may include a portion located within the opening (351) of the pixel defining layer (350). The light-emitting layer (370) may further include at least one dummy light-emitting layer (370d) located in the peripheral region (PA) and on the pixel defining layer (350). The light-emitting layer (370) may include an organic light-emitting material or an inorganic light-emitting material.

[0072] A common electrode (270) is positioned on the light-emitting layer (370). The common electrode (270) may also be formed on the pixel defining layer (350) and may be formed continuously across a plurality of pixels (PX). The common electrode (270) may be physically and electrically connected to the voltage transfer electrode (197) in the surrounding area (PA) to receive a common voltage. The common electrode (270) may include a conductive transparent material.

[0073] The pixel electrode (191), light-emitting layer (370), and common electrode (270) of each pixel (PX) form a light-emitting diode (ED), and one of the pixel electrode (191) and the common electrode (270) becomes the anode electrode and the other becomes the cathode electrode.

[0074] A sealing portion (380) that protects and seals the light-emitting diode (ED) may be located on the common electrode (270). The sealing portion (380) may include at least one inorganic layer (381, 383) and at least one organic layer (382). At least one inorganic layer (381, 383) and at least one organic layer (382) may be stacked alternately. The organic layer (382) may include an organic material and may have flattening properties. The inorganic layer (381, 383) may include an inorganic material such as aluminum oxide (AlOx), silicon oxide (SiOx), silicon nitride (SiNx), or silicon nitrate (SiON).

[0075] The planar area of ​​the inorganic layers (381, 383) is larger than the planar area of ​​the organic layer (382), so that the two inorganic layers (381, 383) can come into contact with each other in the surrounding area (PA). The inorganic layer (381) located at the bottom among the inorganic layers (381, 383) can come into contact with the upper surface of the third insulating layer (160) in the surrounding area (PA), but is not limited thereto.

[0076] The edge of the organic layer (382) included in the bag portion (380) may be located between the dam portion (350d) and the marking area (DA). The dam portion (350d) may function to prevent organic material from overflowing outward when forming the organic layer (382) of the bag portion (380).

[0077] A buffer layer (389) comprising an inorganic insulating material or / and an organic insulating material may be located on the encapsulation portion (380). The buffer layer (389) may be omitted.

[0078] A fourth conductive layer may be located on the buffer layer (389). The fourth conductive layer may include a first touch conductor (TEa). A first touch insulating layer (391) may be located on the fourth conductive layer, and a fifth conductive layer may be located on the first touch insulating layer (391). The fifth conductive layer may include a second touch conductor (TEb). A second touch insulating layer (392) may be located on the fifth conductive layer. The first touch conductor (TEa) and the second touch conductor (TEb) form a capacitive touch sensor so that when an external object is touched, touch information such as whether a touch has occurred and the location of the touch can be detected.

[0079] Hereinafter, the inspection control unit will be described in more detail with reference to FIG. 3 together with FIG. 1. FIG. 3 is described as an example in which a plurality of data lines (171) of FIG. 1 include m data lines (DL1-DLm).

[0080] Figure 3 is a circuit diagram showing an inspection control unit included in the display device of Figure 1.

[0081] Referring to FIG. 3, the inspection control unit (700) includes a plurality of inspection transistors (T1-Tm). The inspection control unit (700) may include a plurality of inspection transistors (T1-Tm) corresponding to the number (m) of a plurality of data lines (DL1-DLm), and each of the plurality of inspection transistors (T1-Tm) may be connected to a plurality of data lines (DL1-DLm). The plurality of inspection transistors (T1-Tm) may be formed on a substrate (110) together with the transistors (TRa, TRd) described in FIG. 2.

[0082] The gate electrode of each of the plurality of test transistors (T1-Tm) is connected to the sensing control wiring (DCL). The first electrode of each of the plurality of test transistors (T1-Tm) is connected to each of the plurality of data lines (DL1-DLm). Among the plurality of test transistors (T1-Tm), the second electrode of the (k-1)th test transistor (T(k-1)) is connected to the first sensing receiving wiring (DR1), the second electrode of the (k+1)th test transistor (T(k+1)) is connected to the second sensing receiving wiring (DR2), and the second electrodes of the remaining test transistors are connected to the test voltage wiring (TVL). Here, k may be approximately m / 2. That is, among the multiple data lines (DL1-DLm), the first detection receiving wire (DR1) and the second detection receiving wire (DR2) are connected to each of the two test transistors (examples T(k-1) and T(k+1)) connected to the data line located approximately in the center of the display area (DA) (e.g., DL(k-1) and DL(k+1)).

[0083] Hereinafter, among the plurality of test transistors (T1-Tm), the test transistor (T(k-1)) connected to the first detection receiving wire (DR1) is referred to as the first detection line transistor, and the detection transistor (T(k+1)) connected to the second detection receiving wire (DR2) is referred to as the second detection line transistor. The data line (DL(k-1)) connected to the first detection line transistor is referred to as the first test data line, and the data line (DL(k+1)) connected to the second detection line transistor is referred to as the second test data line.

[0084] In FIG. 3, the data line (DL(k-1)) connected to the first name line transistor and the data line (DL(k+1)) connected to the second name line transistor are spaced apart with one data line (DLk) in between, but the first name line transistor and the second name line transistor can each be connected to a data line spaced apart with multiple data lines in between. At this time, the spacing between the first test data line connected to the first name line transistor and the second test data line connected to the second name line transistor is sufficient if it is such that the first name line and the second name line can be distinguished visually from the center of the display area (DA).

[0085] A plurality of test transistors (T1-Tm) may be p-channel field-effect transistors. The gate-on voltage for turning on the p-channel field-effect transistors is a low-level voltage, and the gate-off voltage for turning them off is a high-level voltage. According to an embodiment, a plurality of test transistors (T1-Tm) may be n-channel field-effect transistors. The gate-on voltage for turning on the n-channel field-effect transistors is a high-level voltage, and the gate-off voltage for turning them off is a low-level voltage. Hereinafter, a plurality of test transistors (T1-Tm) are described as p-channel field-effect transistors. Additionally, a transistor (TRa) included in a plurality of pixels (PX) is described as a p-channel field-effect transistor.

[0086] Hereinafter, a method for inspecting a display device according to an embodiment of the present invention will be described with reference to FIGS. 4, 5a to 5c, together with FIGS. 1 and 3.

[0087] FIG. 4 is a timing diagram illustrating a method for inspecting a display device according to an embodiment of the present invention. FIG. 5a to 5c show examples of inspection results displayed in a display area when an inspection voltage is applied to the display device of FIG. 1.

[0088] Referring to FIGS. 4 and FIGS. 5a to 5c, during the inspection period (t1-t2) of the display device, a high-level first inspection voltage (P1(V)) is applied to a first inspection pad (P1), a high-level second inspection voltage (P2(V)) is applied to a second inspection pad (P2), and a gate-on voltage third inspection voltage (P3(V)) is applied to a third inspection pad (P3). The first inspection voltage (P1(V)) and the second inspection voltage (P2(V)) may be voltages of the same level. The third inspection voltage (P3(V)) may be a voltage of a different level from the first inspection voltage (P1(V)) and the second inspection voltage (P2(V)).

[0089] The third test voltage (P3(V)) applied to the third test pad (P3) is applied to the gate electrodes of a plurality of test transistors (T1-Tm) included in the test control unit (700) through the sensing control wiring (DCL). Since the plurality of test transistors (T1-Tm) are p-channel field-effect transistors, the third test voltage (P3(V)) of the gate-on voltage is a low-level voltage. The plurality of test transistors (T1-Tm) can be turned on by the third test voltage (P3(V)) of the gate-on voltage.

[0090] Then, during the inspection period (t1-t2), the gate driver applies a gate signal of gate-on voltage to a plurality of gate lines (121). As the gate signal of gate-on voltage is applied to a plurality of pixels (PX), a first and second inspection voltage (P1(V), P2(V)) of high level voltage, which is transmitted to a plurality of data lines (DL1-DLm) through a plurality of turned-on inspection transistors (T1-Tm), can be written to the plurality of pixels (PX). The first and second inspection voltages (P1(V), P2(V)) of high level voltage turn off the transistor (TRa) (e.g., a driving transistor connected to the pixel electrode (191)) included in each of the plurality of pixels (PX), and the plurality of pixels (PX) express black (do not emit light).

[0091] However, if a crack occurs in at least one of the first detection wiring (M1), the second detection wiring (M2), and the hole crack detection line (HCD), a low-level voltage may be applied to at least one of the first inspection data line and the second inspection data line due to a voltage drop resulting from an increase in wiring resistance. Accordingly, a plurality of pixels (PX) connected to the first inspection data line or a plurality of pixels (PX) connected to the second inspection data line may emit light in white to gray.

[0092] For example, a first test voltage (P1(V)) of a high level voltage applied to a first test pad (P1) is transmitted to the second electrode of a first line transistor through the first detection transmission wiring (DT1), the hole crack detection line (HCD), and the first detection receiving wiring (DR1), and is transmitted to a first test data line through the turned-on first line transistor. If a crack occurs in at least one of the first detection wiring (M1) and the hole crack detection line (HCD), a low level voltage lower than the first test voltage (P1(V)) may be applied to the first test data line due to a voltage drop caused by an increase in wiring resistance. That is, the first test voltage (P1(V)) of a high level voltage fluctuates to a low level voltage due to a crack in at least one of the first detection wiring (M1) and the hole crack detection line (HCD). A plurality of pixels (PX) connected to the first test data line emit light in white to gray corresponding to the low level voltage. As illustrated in FIGS. 5a and 5b, a pixel sequence (PC(k-1)) containing a plurality of pixels (PX) connected to a first inspection data line can be recognized as a first line.

[0093] Additionally, the second test voltage (P2(V)), which is a high-level voltage applied to the second test pad (P2), is transmitted to the second electrode of the second line transistor through the second detection transmission wiring (DT2), the hole crack detection line (HCD), and the second detection receiving wiring (DR2), and is transmitted to the second test data line through the turned-on second line transistor. If a crack occurs in at least one of the second detection wiring (M2) and the hole crack detection line (HCD), a low-level voltage lower than the second test voltage (P2(V)) may be applied to the second test data line due to a voltage drop caused by an increase in wiring resistance. That is, the second test voltage (P2(V)), which is a high-level voltage, fluctuates to a low-level voltage due to a crack in at least one of the second detection wiring (M2) and the hole crack detection line (HCD). A plurality of pixels (PX) connected to the second test data line emit light in white or gray corresponding to the low-level voltage. As illustrated in FIGS. 5a and 5c, a pixel sequence (PC(k+1)) containing a plurality of pixels (PX) connected to a second inspection data line can be recognized as a second line.

[0094] As shown in FIG. 5a, when both the first and second lines are visible, it is assumed that a crack has occurred in the hole crack detection line (HCD), and a hole crack defect can be determined. Although there may be cases where cracks occur in both the first detection line (M1) and the second detection line (M2), in practice, cases where cracks occur in both the first detection line (M1) and the second detection line (M2) during the manufacturing process of the display panel (100A) are extremely rare. Therefore, when both the first and second lines are visible, a hole crack defect can be determined where a crack has occurred near the hole area (HA).

[0095] As shown in FIG. 5b, when only the first line is visible and the second line is not visible, there is no crack in the second detection line (M2) and the second hole crack detection line (HCD). Therefore, a defect in the first detection line (M1) can be determined. That is, it can be determined that a crack has occurred near the edge of the display panel (100A) to which the first detection line (M1) is extended.

[0096] As shown in FIG. 5c, when the first line is not visible and only the second line is visible, there is no crack in the first detection line (M1) and the second hole crack detection line (HCD). Therefore, a defect in the second detection line (M2) can be determined. That is, it can be determined that a crack has occurred near the edge of the display panel (100A) to which the second detection line (M2) is extended.

[0097] Hereinafter, a display device according to another embodiment will be described with reference to FIGS. 6 to 8 and FIG. 10, and a method for inspecting a display device according to another embodiment will be described with reference to FIG. 9. The description will focus on the differences compared with FIGS. 1 to 5 described above.

[0098] FIG. 6 is a plan view showing a display device according to another embodiment of the present invention. FIG. 7 is a cross-sectional view of the display device of FIG. 6 cut along the line VII-VII'. FIG. 8 is a circuit diagram showing an inspection control unit included in the display device of FIG. 6. FIG. 9 shows an example of an inspection result displayed in a display area when an inspection voltage is applied to the display device of FIG. 6. FIG. 10 is a plan view showing a display panel cut along a dotted line in the display device of FIG. 6.

[0099] Referring to FIG. 6, in a display panel (100B) according to another embodiment, the peripheral area (PA) includes a bendable area (BA) that can be bent. The bendable area (BA) may be an area where the display panel (100B) can be bent toward the rear or front. Although FIG. 6 illustrates the bendable area (BA) being located below the display area (DA) in the peripheral area (PA), the location and number of bendable areas (BA) are not limited.

[0100] And the surrounding area (PA) may further include a third detection wire (M3), a fourth detection wire (M4), a fifth detection wire (M5), and a sixth detection wire (M6) that are not connected to the hole crack detection line (HCD).

[0101] The third detection wiring (M3) includes one end connected to the fourth inspection pad (P4) and the other end connected to the inspection control unit (700'). The third detection wiring (M3) may be located in the surrounding area (PA) to the left and upper side of the display area (DA). That is, the third detection wiring (M3) may extend from the fourth inspection pad (P4) in a second direction (D2) along the left edge of the display area (DA), then turn near the corner of the display panel (100B) and extend in a first direction (D1) along the upper edge of the display area (DA), and then turn in the center of the upper edge of the display area (DA) and return in the opposite direction to be connected to the inspection control unit (700'). The third detection wiring (M3) may be located outside the first detection wiring (M1). That is, the first sensing wire (M1) is located between the third sensing wire (M3) and the display area (DA), and the third sensing wire (M3) may be located closer to the edge of the substrate (110) than the first sensing wire (M1).

[0102] The fourth detection wiring (M4) includes one end connected to the fifth inspection pad (P5) and the other end connected to the inspection control unit (700'). The fourth detection wiring (M4) may be located in the surrounding area (PA) to the right and upper side of the display area (DA). That is, the fourth detection wiring (M4) may extend from the fifth inspection pad (P5) along the right edge of the display area (DA) in the second direction (D2), then turn near the corner of the display panel (100B) and extend along the upper edge of the display area (DA) in the opposite direction of the first direction (D1), and then turn at the central part of the upper edge of the display area (DA) and return in the opposite direction to be connected to the inspection control unit (700'). The fourth detection wiring (M4) may be located outside the second detection wiring (M2). That is, the second sensing wire (M2) is located between the fourth sensing wire (M4) and the display area (DA), and the fourth sensing wire (M4) may be located closer to the edge of the substrate (110) than the second sensing wire (M2).

[0103] The fifth sensing wire (M5) includes one end connected to the sixth inspection pad (P6) and the other end connected to the inspection control unit (700'). The sixth sensing wire (M6) may include one end connected to the seventh inspection pad (P7) and the other end connected to the inspection control unit (700'). The fifth sensing wire (M5) and the sixth sensing wire (M6) may be located in the bendable area (BA). For example, the fifth sensing wire (M5) may be located in the bendable area (BA) at the left edge relative to the display area (DA), and the sixth sensing wire (M6) may be located in the bendable area (BA) at the right edge relative to the display area (DA). The fifth sensing wire (M5) may extend from the sixth inspection pad (P6) to the bendable area (BA) at the left edge of the substrate (110), return, and be connected to the inspection control unit (700'). The sixth sensing wire (M6) can be extended from the right edge of the substrate (110) to the bendable area (BA) from the seventh inspection pad (P7), then return and be connected to the inspection control unit (700').

[0104] The third inspection pad (P3), the fourth inspection pad (P4), the fifth inspection pad (P5), the sixth inspection pad (P6), and the seventh inspection pad (P7) can be arranged in a first direction (D1) along the lower edge of the substrate (110) in the peripheral area (PA).

[0105] Meanwhile, a portion of the peripheral area (PA) of the substrate (110) may be cut along the cut line (CL) after the inspection process of the display device. FIG. 6 shows the portion of the peripheral area (PA) of the substrate (110) before it is cut along the cut line (CL), and FIG. 10 shows the portion of the peripheral area (PA) of the substrate (110) after it has been cut along the cut line (CL). As illustrated in FIG. 6, the cut line (CL) may extend in the first direction (D1) closer to the lower edge of the substrate (110) than the third to seventh inspection pads (P3, P4, P5, P6, P7) in the peripheral area (PA).

[0106] The first inspection pad (P1) and the second inspection pad (P2) may be located in the portion that is cut and removed along the cut line (CL). The first inspection pad (P1) and the second inspection pad (P2) may be located closer to the lower edge of the substrate (110) than the cut line (CL).

[0107] A fourth inspection pad (P4) and a sixth inspection pad (P6) are connected to a first inspection pad (P1), and a first detection transmission wire (DT1) connected to the first inspection pad (P1) can extend from the first inspection pad (P1) to between the fourth inspection pad (P4) and the sixth inspection pad (P6). A fifth inspection pad (P5) and a seventh inspection pad (P7) are connected to a second inspection pad (P2), and a second detection transmission wire (DT2) connected to the second inspection pad (P2) can extend from the second inspection pad (P2) to between the fifth inspection pad (P5) and the seventh inspection pad (P7).

[0108] As exemplified in FIG. 4, a first inspection voltage (P1(V)) is applied to the first inspection pad (P1), a second inspection voltage (P2(V)) is applied to the second inspection pad (P2), and a third inspection voltage (P3(V)) is applied to the third inspection pad (P3) to inspect the display device. That is, the first inspection pad (P1) can function as a first common inspection pad capable of applying the first inspection voltage (P1(V)) to the first sensing wire (M1), the third sensing wire (M3), and the fifth sensing wire (M5). And the second inspection pad (P2) can function as a second common inspection pad capable of applying the second inspection voltage (P2(V)) to the second sensing wire (M2), the fourth sensing wire (M4), and the sixth sensing wire (M6).

[0109] Additionally, the first inspection pad (P1) and the second inspection pad (P2) are removed after the inspection process of the display device, and the first sensing transmission wiring (DT1) is configured to extend between the fourth inspection pad (P4) and the sixth inspection pad (P6), and the second sensing transmission wiring (DT2) is configured to extend between the fifth inspection pad (P5) and the seventh inspection pad (P7), thereby reducing the area for inspection pads and wiring required for the inspection process of the display device.

[0110] Meanwhile, the first sensing wire (M1) and the second sensing wire (M2) may be located on different conductive layers from the third sensing wire (M3) and the fourth sensing wire (M4). As illustrated in FIG. 7, the third sensing wire (M3) may be located on the second conductive layer. Likewise, the fourth sensing wire (M4) may also be located on the second conductive layer. At this time, the first sensing wire (M1) may be located on the fourth conductive layer. Likewise, the second sensing wire (M2) may also be located on the fourth conductive layer. The first sensing wire (M1) and the second sensing wire (M2) may be located inside (between the display area (DA) and the dam portion (350d)) relative to the dam portion (350d).

[0111] Alternatively, the first sensing wire (M1) and the second sensing wire (M2) may be located in the same second conductive layer as the third sensing wire (M3) and the fourth sensing wire (M4). In this case, the first sensing wire (M1) and the second sensing wire (M2) may be located parallel to the third sensing wire (M3) and the fourth sensing wire (M4) either inside or outside of the dam portion (350d).

[0112] Referring to FIG. 8, among the plurality of inspection transistors (T1-Tm) included in the inspection control unit (700'), the second electrode of the (ka)-th inspection transistor (T(ka)) is connected to the third sensing wire (M3), the second electrode of the (k+a)-th inspection transistor (T(k+a)) is connected to the fourth sensing wire (M4), the second electrode of the 2nd inspection transistor (T2) is connected to the fifth sensing wire (M5), and the second electrode of the (m-1)-th inspection transistor (T(m-1)) is connected to the sixth sensing wire (M6). Here, (ka) is greater than 3 and less than (k-1), and (k+a) is greater than (k+1) and less than (m-2).

[0113] Hereinafter, among the plurality of test transistors (T1-Tm), the test transistor (T(ka)) connected to the third sensing wire (M3) is referred to as the third test line transistor, the test transistor (T(k+a)) connected to the fourth sensing wire (M4) is referred to as the fourth test line transistor, the test transistor (T2) connected to the fifth sensing wire (M5) is referred to as the fifth test line transistor, and the test transistor (T(m-1)) connected to the sixth sensing wire (M6) is referred to as the sixth test line transistor. Additionally, the data line (DL(ka)) connected to the third test line transistor is referred to as the third test data line, the data line (DL(k+a)) connected to the fourth test line transistor is referred to as the fourth test data line, the data line (DL2) connected to the fifth test line transistor is referred to as the fifth test data line, and the data line (DL(m-1)) connected to the sixth test line transistor is referred to as the sixth test data line.

[0114] For inspection of the display device, a first inspection voltage (P1(V)) can be applied to a first inspection pad (P1), a second inspection voltage (P2(V)) can be applied to a second inspection pad (P2), and a third inspection voltage (P3(V)) can be applied to a third inspection pad (P3). At this time, the first inspection voltage (P1(V)) can be written to a plurality of pixels (PX) connected to the third inspection data line through the third sensing wire (M3) and the third name line transistor. The second inspection voltage (P2(V)) can be written to a plurality of pixels (PX) connected to the fourth inspection data line through the fourth sensing wire (M4) and the fourth name line transistor. The first inspection voltage (P1(V)) can be written to a plurality of pixels (PX) connected to the fifth inspection data line through the fifth sensing wire (M5) and the fifth name line transistor. Through the sixth sensing wire (M6) and the sixth line transistor, the second test voltage (P2(V)) can be written to a plurality of pixels (PX) connected to the sixth test data line.

[0115] If a crack occurs in the third detection wiring (M3), a pixel sequence (PC(ka)) containing a plurality of pixels (PX) connected to the third inspection data line, as exemplified in FIG. 9, can be recognized as the third line. When the third line is recognized, a crack defect on the left edge or upper edge of the display panel (100B) can be determined.

[0116] If a crack occurs in the fourth detection wiring (M4), a pixel row (PC(k+a)) containing a plurality of pixels (PX) connected to the fourth inspection data line, as exemplified in FIG. 9, can be recognized as the fourth line. When the fourth line is recognized, a crack defect on the right edge or upper edge of the display panel (100B) can be determined.

[0117] If a crack occurs in the fifth detection wiring (M5), a pixel row (PC2) containing a plurality of pixels (PX) connected to the fifth inspection data line, as exemplified in FIG. 9, can be recognized as the fifth line. When the fifth line is recognized, a crack defect in the left portion of the bendable area (BA) of the display panel (100B) can be determined.

[0118] If a crack occurs in the sixth detection wiring (M6), a pixel row (PC(m-1)) containing a plurality of pixels (PX) connected to the sixth inspection data line, as exemplified in FIG. 9, can be identified as the sixth line. When the sixth line is identified, a crack defect in the right portion of the bendable area (BA) of the display panel (100B) can be determined.

[0119] As the first and second lines are located near the center of the display area (DA), the fifth and sixth lines are located at the left and right edges within the display area (DA), and the third and fourth lines are located at the left center and right center within the display area (DA), it is easy to identify which part of the display panel (100B) has a crack when visually inspecting the display device.

[0120] Except for these differences, the features of the embodiments described above with reference to FIGS. 1 to 5 can all be applied to the embodiments described with reference to FIGS. 6 to 10, so descriptions that overlap between the embodiments are omitted.

[0121] The drawings and detailed description of the invention referenced so far are merely exemplary of the invention and are used only for the purpose of explaining the invention, not to limit the meaning or the scope of the invention as defined in the claims. Therefore, those skilled in the art will understand that various modifications and equivalent alternative embodiments are possible therefrom. Accordingly, the true technical scope of protection of the invention should be determined by the technical spirit of the appended claims. Explanation of the symbols

[0122] 100A, 100B: Display panel 110: Substrate 700: Detection control unit M1: 1st detection wiring M2: Second detection wiring HCD: Hole Crack Detection Wiring

Claims

Claim 1 A display device comprising: a display area in which a pixel and a data line connected to the pixel are located; a first area located within the display area; a crack detection line including a first terminal and a second terminal, disposed adjacent to the first area and located within the display area; a first detection transmission wire and a second detection transmission wire electrically connected to the first terminal of the crack detection line; a first detection receiving wire and a second detection receiving wire electrically connected to the second terminal of the crack detection line; and an inspection control unit electrically connecting the first detection receiving wire and the second detection receiving wire to the data line. Claim 2 A display device according to claim 1, wherein the display area is included in a display panel, and the first area is an area where the display panel is perforated and a hole is located. Claim 3 In paragraph 2, the display device wherein the first area is a non-display area in which an image is not displayed. Claim 4 In claim 1, the crack detection line is a display device surrounding the first region. Claim 5 A display device according to claim 1, wherein the first stage and the second stage are separated and spaced apart from each other. Claim 6 A display device according to claim 1, wherein the first sensing receiving wiring and the second sensing receiving wiring are electrically connected to different data lines. Claim 7 A display device according to claim 1, further comprising a test voltage wiring including a first terminal electrically connected to the first detection transmission wiring and a second terminal electrically connected to the second detection transmission wiring. Claim 8 In claim 7, the inspection control unit comprises an inspection transistor in which a first electrode is electrically connected to the data line, and the inspection transistor comprises a first line transistor in which a second electrode is electrically connected to the first detection receiving line, and a second line transistor in which a second electrode is electrically connected to the second detection receiving line. Claim 9 A display device according to claim 8, wherein the second electrode of a test transistor, excluding the first line transistor and the second line transistor in the test transistor, is electrically connected to the test voltage wiring. Claim 10 A display device according to claim 8, wherein when a crack occurs in the crack detection line, a pixel electrically connected to a data line electrically connected to the first line transistor emits light to display the first line, and a pixel electrically connected to a data line electrically connected to the second line transistor emits light to display the second line. Claim 11 In item 10, the first name line and the second name line are a display device located in the central part of the display area. Claim 12 A display device according to claim 8, wherein the first sensing transmission wiring is electrically connected to a first inspection pad to which a first inspection voltage is applied, and the second sensing transmission wiring is electrically connected to a second inspection pad to which a second inspection voltage is applied. Claim 13 A display device according to claim 12, further comprising a sensing control wiring electrically connected to a first terminal of a third inspection pad, wherein the sensing control wiring is electrically connected to the gate electrode of the inspection transistor. Claim 14 A display device according to claim 13, further comprising: a third sensing wire electrically connected to a first terminal of a fourth inspection pad; and a fourth sensing wire electrically connected to a first terminal of a fifth inspection pad, wherein the inspection transistor further comprises a third sensing wire transistor and a fourth sensing wire transistor, wherein the third sensing wire extends along the first side edge of the display area and then returns in the opposite direction to be electrically connected to the second electrode of the third sensing wire transistor, and the fourth sensing wire extends along the second side edge of the display area and then returns in the opposite direction to be electrically connected to the second electrode of the fourth sensing wire transistor. Claim 15 A display device according to claim 14, further comprising: a bendable area; a fifth sensing wire with a first terminal electrically connected to a sixth inspection pad; and a sixth sensing wire with a first terminal electrically connected to a seventh inspection pad, wherein the inspection transistor further comprises a fifth wire transistor and a sixth wire transistor, wherein the fifth sensing wire extends to the bendable area and then returns in the opposite direction to be electrically connected to the second electrode of the fifth wire transistor, and the sixth sensing wire extends to the bendable area and then returns in the opposite direction to be electrically connected to the second electrode of the sixth wire transistor. Claim 16 A display device according to claim 15, wherein the first inspection pad is a first common inspection pad electrically connected to the fourth inspection pad and the sixth inspection pad, and the second inspection pad is a second common inspection pad electrically connected to the fifth inspection pad and the seventh inspection pad. Claim 17 A display device according to claim 16, wherein the first sensing transmission wiring extends between the fourth inspection pad and the sixth inspection pad, and the second sensing transmission wiring extends between the fifth inspection pad and the seventh inspection pad. Claim 18 A display device according to claim 16, wherein when voltage is applied to the first test pad and the second test pad, at least one of a pixel electrically connected to a data line electrically connected to the third line transistor, a pixel electrically connected to a data line electrically connected to the fourth line transistor, a pixel electrically connected to a data line electrically connected to the fifth line transistor, and a pixel electrically connected to a data line electrically connected to the sixth line transistor emits light. Claim 19 An electronic device comprising: a display device, wherein the display device comprises: a display area in which a pixel and a data line connected to the pixel are located; a first area located within the display area; a crack detection line including a first terminal and a second terminal, disposed adjacent to the first area and located within the display area; a first detection transmission wire and a second detection transmission wire electrically connected to the first terminal of the crack detection line; a first detection receiving wire and a second detection receiving wire electrically connected to the second terminal of the crack detection line; and an inspection control unit electrically connecting the first detection receiving wire and the second detection receiving wire to the data line.

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