Circuit for detecting diode failure in the wake input circuit of the controller and method for diagnosing the failure

Abstract

The present invention relates to a diode fault detection circuit and a fault diagnosis method for a controller's Wake input circuit, and more specifically, to a diode fault detection circuit for a Wake input circuit that performs an Open / Short diagnosis of a diode installed to prevent reverse voltage in the Wake input circuit, and a fault diagnosis method that detects a fault in the Wake circuit using a fault diagnosis logic based on the voltages of the anode side and the cathode side of the diode in the circuit. The diode fault detection circuit of the controller Wake input circuit of the present invention is characterized by performing a Wake up of the power semiconductor by means of three Wake signals in a controller including an MCU and a power semiconductor, mounting diodes on a circuit to which each of the Wake signals is applied to the power semiconductor, transmitting the voltage of the anode side and the voltage of the cathode side of the diodes to the MCU, comparing them with the Wake signals generated or input by the MCU, and comparing them with the Wake signal applied to the power semiconductor to detect a fault in the diodes.

Description

Technology Field

[0001] The present invention relates to a diode fault detection circuit and a fault diagnosis method for a controller's Wake input circuit, and more specifically, to a diode fault detection circuit for a Wake input circuit that performs an Open / Short diagnosis of a diode installed to prevent reverse voltage in the Wake input circuit, and a fault diagnosis method that detects a fault in the Wake circuit using a fault diagnosis logic based on the voltages on the anode and cathode sides of the diode in the circuit. Background Technology

[0003] Fuel Cell Electric Vehicles (FCEVs) are eco-friendly vehicles that power the vehicle by generating electricity using hydrogen as fuel. Unlike Battery Electric Vehicles (BEVs), they are characterized by the fact that the fuel cell system generates electricity in real time.

[0004] The core of a fuel cell vehicle is the fuel cell stack, where hydrogen and oxygen meet to trigger an electrochemical reaction that generates electricity, which powers the motor to operate the vehicle.

[0005] In addition, the fuel cell vehicle is equipped with a Fuel Cell Stack Voltage Monitor (FSVM) to continuously monitor the status of the fuel cell stack. The FSVM performs the function of measuring the cell voltage of the stack, monitoring the total voltage, minimum voltage, and maximum voltage, and detecting leakage current.

[0006] In addition, in the applicant's conventional FSVM controller, as shown in Fig. 1, a Wake signal is applied to the power semiconductor to wake up the controller when the microprocessor is OFF. A certain voltage recognized as a Wake signal is defined in the power semiconductor, and the condition for applying the Wake signal is that if a Wake signal is applied to even one of the three pins, the Wake signal is applied to the power semiconductor and the controller becomes ON.

[0007] Here, the first Wake signal is an MCU Wake output signal generated from a digital port of an MCU mounted on the controller, the second Wake signal is a CAN IC Wake output signal generated when an external signal input via CAN communication is input into a CAN IC within the controller, and the third Wake signal is an ignition key external input signal applied by the operation of the ignition key.

[0008] And the above CAN IC Wake output signal is also input to the digital port of the MCU, and the above ignition key external input signal is also input to the analog port of the MCU.

[0009] In addition, a reverse voltage protection diode may be placed in each of the above-mentioned Wake signal circuits so that a configuration can be sought to prevent reverse voltage from being applied to other Wake circuits when the corresponding external Wake input signal is applied.

[0010] However, if the reverse voltage protection diode is open, the Wake signal is not input, allowing for fault detection; conversely, if it is shorted, diagnosis is not possible. Consequently, although the Wake operates normally initially, the MCU port may be damaged by the reverse voltage, potentially leading to vehicle failure.

[0011] More specifically, as shown in Figure 2, if a short circuit occurs in diode 1, the Wake input voltage of the ignition key is applied to the MCU Wake output signal port at a high voltage (battery voltage), and as a result, the port is burned out, which may cause a failure in the MCU.

[0012] In addition, as shown in Figure 3, if a short circuit occurs in diode 2, the Wake input voltage of the ignition key is applied as a high voltage (battery voltage) to the MCU input terminal of the MCU digital port, and the port may be burned out.

[0013] Conventional technology has a problem in that it is impossible to diagnose a short circuit defect in the reverse voltage protection diode, and reverse voltage is continuously applied to the short-circuited diode, resulting in the inability to prevent damage to the MCU.

[0014] In addition, since failures do not occur immediately even if a short circuit occurs during mass production of the controller, progressive failures occur after the vehicle is shipped, so there is a need for technology to diagnose short circuit failures in reverse voltage protection diodes in such FSVM controllers. Prior art literature

[0016] European Patent Publication EP 4357191 A1 (Publication Date 2024.04.24) The problem to be solved

[0017] The technical problem that the present invention aims to solve is to provide a fault detection circuit that detects open / short failures of each reverse voltage protection diode mounted in response to three Wake signals in a Wake input circuit mounted in a controller circuit mounted in a vehicle, and to provide a fault diagnosis method that performs a fault diagnosis logic according to the input / output level generated in the fault detection circuit. means of solving the problem

[0019] According to one aspect of the present invention as a means of solving the problem, a diode fault detection circuit of a controller Wake input circuit of the present invention is configured in a controller comprising an MCU and a power semiconductor, wherein an MCU Wake signal generated and output from the MCU is a first Wake signal, a CAN IC Wake signal by an external CAN signal is a second Wake signal, and an external ignition key signal is a third Wake signal, and the power semiconductor is woke up by the three Wake signals, wherein a first diode is mounted on the circuit where the first Wake signal is applied to the power semiconductor, a second diode is mounted on the circuit where the second Wake signal is applied to the power semiconductor, and a third diode is mounted on the circuit where the third Wake signal is applied to the power semiconductor, and the voltage on the anode side and the voltage on the cathode side of the diodes are transmitted to the MCU, and the fault of the diodes is detected by comparing them with the Wake signals generated or input from the MCU and with the Wake signal applied to the power semiconductor.

[0020] In addition, the above MCU may include digital ports and analog ports.

[0021] In addition, as a first embodiment of the present invention, the diode fault detection circuit of the controller Wake input circuit of the present invention further comprises a first comparator receiving the voltage on the anode side and the voltage on the cathode side of the first diode, a second comparator receiving the voltage on the anode side and the voltage on the cathode side of the second diode, and a third comparator receiving the voltage on the anode side and the voltage on the cathode side of the third diode, wherein the output signals of the comparators are transmitted to the digital port of the MCU, and the second Wake signal on the anode side of the second diode is input to the digital port of the MCU, and the third Wake signal on the anode side of the third diode is input to the analog port of the MCU, and the MCU receives the output signals of the comparators, and the first Wake signal generated by the MCU, the second Wake signal input to the digital port of the MCU, and the third Wake signal input to the analog port of the MCU and converted into a digital signal The failure of the diodes can be detected by comparing with the Wake signal.

[0022] According to another aspect of the present invention, as a second embodiment of the present invention, the diode fault detection circuit of the controller Wake input circuit of the present invention is such that the first Wake signal is output from a digital port of the MCU and applied to the anode side of the first diode, the second Wake signal is input from a CAN IC outside the controller and applied to the anode side of the second diode, and the third Wake signal is input from an ignition key signal outside the controller and applied to the anode side of the third diode, wherein the anode side voltage and the cathode side voltage of the diodes are respectively input to the MCU, and the MCU detects a fault in the diodes by comparing the voltage difference calculated from the difference between the anode side voltage and the cathode side voltage of the diodes with a stored setting value.

[0023] And the anode side voltage and cathode side voltage of the above diodes are input to the analog port of the MCU, and the anode side voltage and cathode side voltage of the above diodes can be converted into digital signals by the AD converter in the MCU and compared.

[0024] In addition, the diode fault detection circuit of the controller Wake input circuit of the present invention can be applied to an FSVM controller that monitors the state of a fuel cell stack.

[0025] As an embodiment according to another aspect of the present invention, a method for diagnosing a diode fault in a controller Wake input circuit according to a diode fault detection circuit of the controller Wake input circuit of the first embodiment comprises: the controller including a data input unit, a Wake signal determination unit, a comparator signal determination unit, a power semiconductor Wake determination unit, and a fault diagnosis unit; a data input step in which the data input unit receives a first Wake signal, a second Wake signal, and a third Wake signal; a Wake signal determination step in which the Wake signal determination unit determines whether the first Wake signal, the second Wake signal, and the third Wake signal are High; a comparator signal determination step in which, if the comparator signal determination unit determines a Wake signal in the Wake signal determination step, the signal of a comparator corresponding to the corresponding Wake signal is High; and a power semiconductor Wake determination step in which the power semiconductor Wake determination unit determines whether the Wake pin input signal of the power semiconductor is High if the signal of the comparator corresponding to the corresponding Wake signal is High in the comparator signal determination step, wherein the fault diagnosis unit determines whether the corresponding Wake pin input signal of the power semiconductor is High if the signal of the comparator is not High in the comparator signal determination step. The diode corresponding to the signal is diagnosed as short, and in the power semiconductor wake determination step, if the Wake pin input signal is High, the diode corresponding to the Wake signal is diagnosed as normal, and if the Wake pin input signal is not High in the power semiconductor wake determination step, the diode corresponding to the Wake signal is diagnosed as open.

[0026] As an embodiment according to another aspect of the present invention, a diode fault diagnosis method for a controller Wake input circuit according to a diode fault detection circuit of the controller Wake input circuit of the second embodiment comprises: the controller including a data input unit, a data storage unit, a Wake signal determination unit, a voltage difference determination unit, a power semiconductor Wake determination unit, and a fault diagnosis unit; a data input step in which the data input unit receives a first Wake signal, a second Wake signal, and a third Wake signal; a Wake signal determination step in which the Wake signal determination unit determines whether the first Wake signal, the second Wake signal, and the third Wake signal are High; a voltage difference determination step in which, if the voltage difference determination unit determines a Wake signal in the Wake signal determination step, the voltage difference determination unit determines whether the voltage difference between the anode and cathode of the diode corresponding to the Wake signal is greater than a set value stored in the data storage unit; and a power semiconductor Wake determination step in which, if the voltage difference corresponding to the Wake signal in the voltage difference determination step is greater than the set value, the power semiconductor Wake determination unit determines whether the Wake pin input signal of the power semiconductor is High, wherein the fault diagnosis unit In the above voltage difference judgment step, if the voltage difference is not greater than the set value, the diode corresponding to the corresponding Wake signal is diagnosed as short; in the above power semiconductor Wake judgment step, if the Wake pin input signal is High, the diode corresponding to the corresponding Wake signal is diagnosed as normal; and in the above power semiconductor Wake judgment step, if the Wake pin input signal is not High, the diode corresponding to the corresponding Wake signal is diagnosed as open. Effects of the invention

[0028] According to an embodiment of the present invention, an open / short failure of a reverse voltage protection diode constituting a Wake input circuit mounted on a controller can be diagnosed, thereby providing the effect of preventing damage to the MCU port in advance. Brief explanation of the drawing

[0030] FIG. 1 is a configuration diagram of the applicant's prior art controller Wake input circuit. FIG. 2 is an example diagram showing the case where a diode connected to the Wake signal output terminal of an MCU digital port is shorted in the applicant's prior art controller Wake input circuit. FIG. 3 is an example diagram showing the case where a diode connected to the CAN IC Wake signal input terminal of the MCU digital port is shorted in the applicant's prior art controller Wake input circuit. FIG. 4 is a circuit diagram of a diode fault detection circuit of a controller Wake input circuit according to a first embodiment of the present invention. FIG. 5 is a circuit diagram of a diode fault detection circuit of a controller Wake input circuit according to a second embodiment of the present invention. FIG. 6 shows the configuration of a control unit of a controller for a fault diagnosis method according to a first embodiment of the present invention. FIG. 7 is a flowchart of a fault diagnosis method applied to a circuit of the first embodiment of the present invention. FIG. 8 shows the configuration of a control unit of a controller for a fault diagnosis method according to a second embodiment of the present invention. FIG. 9 is a flowchart of a fault diagnosis method applied to a circuit of the second embodiment of the present invention. Specific details for implementing the invention

[0031] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings.

[0032] In describing the present invention, the terms used in the specification below are used merely to describe specific embodiments and are not intended to limit the invention. Singular expressions include plural expressions unless the context clearly indicates otherwise.

[0033] Furthermore, terms such as “comprising” or “having” in this specification are intended to specify the existence of the features, numbers, steps, actions, components, parts, or combinations thereof described in the specification, and should be understood as not precluding the existence or addition of one or more other features, numbers, steps, actions, components, parts, or combinations thereof.

[0034] In describing the invention with reference to the attached drawings, identical components are assigned the same reference numerals, and redundant descriptions of identical components are omitted. Furthermore, in describing the invention, if it is determined that a detailed description of related prior art could unnecessarily obscure the essence of the invention, such detailed description is omitted.

[0035] Figure 4 shows the configuration of a diode fault detection circuit of a controller Wake input circuit according to the present invention.

[0036] As shown in FIG. 4, the diode fault detection circuit of the controller Wake input circuit of the present invention relates to a controller comprising an MCU (100) and a power semiconductor (200). Within the controller (10), an MCU (100) Wake signal generated and output from the MCU (100) is input to the power semiconductor (200) as a first Wake signal, a CAN IC Wake signal from a CAN signal outside the controller (10) is input to the power semiconductor (200) as a second Wake signal, and an ignition key signal from outside the controller (10) is input to the power semiconductor (200) as a third Wake signal, thereby performing a Wake up of the power semiconductor (200) by one of the three Wake signals.

[0037] That is, one of the Wake signals is applied to the power semiconductor (200) to wake up the controller (10), and a certain voltage recognized as a Wake signal is defined in the power semiconductor (200), so that when even one of the Wake signals is applied to the Wake signal input terminal of the power semiconductor (200), the Wake signal is applied to the power semiconductor (200) and the controller (10) becomes ON.

[0038] And, a first diode (301) is connected to the circuit where the first Wake signal is applied to the power semiconductor (200), a second diode (302) is connected to the circuit where the second Wake signal is applied to the power semiconductor (200), and a third diode (303) is installed on the circuit where the third Wake signal is applied to the power semiconductor (200).

[0039] Here, the first diode (301) to the third diode (303) are installed to prevent reverse voltage from occurring in the circuit.

[0040] Additionally, the controller (10) is configured to form a circuit branched from the anode side and the cathode side of the diodes, and to transmit the voltage of the anode side and the voltage of the cathode side to the MCU (100), compare them with the Wake signals generated or input from the MCU (100), and compare them with the Wake signal applied to the power semiconductor (200) to detect a failure of the diodes.

[0041] And at this time, the MCU (100) may include a digital port (110) for receiving a digital signal and an analog port (120) for receiving an analog signal.

[0042] The embodiment shown in FIG. 4 may more specifically include, as a first embodiment of the present invention, a first comparator (401) that receives the voltage on the anode side and the voltage on the cathode side of the first diode (301), a second comparator (402) that receives the voltage on the anode side and the voltage on the cathode side of the second diode (302), and a third comparator (403) that receives the voltage on the anode side and the voltage on the cathode side of the third diode (303).

[0043] And the output signals of the above comparators are transmitted to the digital port (110) of the MCU (100), and the second Wake signal is output from the CAN IC inside the controller (10) by an external CAN communication signal outside the controller (10), and the second Wake signal on the anode side of the second diode (302) is branched and input to the digital port (110) of the MCU (100), and the third Wake signal on the anode side of the third diode (303) is branched and input to the analog port (120) of the MCU (100).

[0044] In addition, the MCU (100) can detect the failure of the diodes by receiving the output signals of the comparators and comparing them with a first Wake signal generated by the MCU (100), a second Wake signal input to the digital port (110) of the MCU (100), and a third Wake signal input to the analog port (120) of the MCU (100) and converted into a digital signal.

[0045] That is, it is checked whether the first Wake signal generated by the MCU (100) is High and whether the output signal of the first comparator (401) is High. If the first diode (301) operates and a voltage drop occurs normally to generate a forward voltage, the output level of the first comparator (401) becomes High, and then if the Wake pin signal of the power semiconductor (200) is also High, the first diode (301) is determined to be in a normal state. However, if the first Wake signal is High but the output signal of the first comparator (401) is not High, this is detected as a short fault of the first diode (301). If the first Wake signal is High and the output signal of the first comparator (401) is also High but the Wake pin signal of the power semiconductor (200) is Low, this is detected as an open fault of the first diode (301).

[0046] Similarly, it is possible to check whether the second Wake signal generated by the MCU (100) is High and whether the output signal of the second comparator (402) is High. If the second diode (302) operates and a voltage drop occurs normally to generate a forward voltage, the output level of the second comparator (402) becomes High, and if the Wake pin signal of the power semiconductor (200) is also High, then the second diode (302) is determined to be in a normal state. However, if the second Wake signal is High but the output signal of the second comparator (402) is not High, this is detected as a short fault of the second diode (302). If the second Wake signal is High and the output signal of the second comparator (402) is also High but the Wake pin signal of the power semiconductor (200) is Low, this is detected as an open fault of the second diode (302).

[0048] The embodiment shown in FIG. 5 is a second embodiment of the present invention, which is another embodiment of the present invention, wherein the first Wake signal is output from the digital port (110) of the MCU (100) and applied to the anode side of the first diode (301), the second Wake signal is input from a CAN IC outside the controller (10) and applied to the anode side of the second diode (302), and the third Wake signal is input from an ignition key signal outside the controller (10) and applied to the anode side of the third diode (303).

[0049] In addition, in the second embodiment, the anode side voltage and the cathode side voltage of the diodes are input to the MCU (100), and the MCU (100) detects a failure of the diodes by comparing the voltage difference calculated from the difference between the anode side voltage and the cathode side voltage of the diodes with a stored setting value.

[0050] For example, it is checked whether the first Wake signal generated by the MCU (100) is High and whether the first voltage difference is greater than the first set value. If the first diode (301) is activated and a voltage drop occurs normally to generate a forward voltage, the first voltage difference becomes greater than the first set value. Next, if the Wake pin signal of the power semiconductor (200) is also High, the first diode (301) is determined to be in a normal state. However, if the first Wake signal is High but the first voltage difference is smaller than the first set value, this is detected as a short fault of the first diode (301). If the first Wake signal is High and the first voltage difference is greater than the first set value but the Wake pin signal of the power semiconductor (200) is Low, this is detected as an open fault of the first diode (301).

[0051] In addition, as shown in FIG. 5, the anode side voltage and cathode side voltage of the diodes are input to the analog port (120) of the MCU (100), and the anode side voltage and cathode side voltage of the diodes can be converted into digital signals by an AD converter within the MCU (100) and compared.

[0052] And the controller (10, 10') having the configuration of the above embodiments may be an FSVM controller that monitors the state of the fuel cell stack.

[0053] Next, FIG. 6 shows the configuration of the control unit of the controller (10) for fault diagnosis according to the circuit of the first embodiment, and FIG. 7 shows a flowchart of a fault diagnosis method applied to the diode fault detection circuit of the controller Wake input circuit of the first embodiment.

[0054] As shown in FIG. 6, the control unit configuration of the controller for fault diagnosis according to the circuit of the first embodiment may include a data input unit, a Wake signal determination unit, a comparator signal determination unit, a power semiconductor Wake determination unit, and a fault diagnosis unit.

[0055] A fault diagnosis method applied to a diode fault detection circuit of a controller Wake input circuit of a first embodiment includes: a monitoring step (s100) in which a data input unit receives a first Wake signal, a second Wake signal, and a third Wake signal and monitors the data; a Wake signal determination step (s200) in which a Wake signal determination unit determines whether the first Wake signal, the second Wake signal, and the third Wake signal are High; a comparator signal determination step (s300) in which a comparator signal determination unit determines whether the signal of a comparator corresponding to the Wake signal is High if it is determined to be a Wake signal in the Wake signal determination step; and a power semiconductor Wake determination step (s400) in which a power semiconductor Wake determination unit determines whether the Wake pin input signal of the power semiconductor (200) is High if the signal of the comparator corresponding to the Wake signal is High in the comparator signal determination step.

[0056] In addition, the fault diagnosis unit diagnoses the diode corresponding to the corresponding Wake signal as short if the comparator signal is not High in the comparator signal judgment step, diagnoses the diode corresponding to the corresponding Wake signal as normal if the Wake pin input signal is High in the power semiconductor Wake judgment step, and diagnoses the diode corresponding to the corresponding Wake signal as open if the Wake pin input signal is not High in the power semiconductor Wake judgment step.

[0057] FIG. 6 shows a specific application flowchart of such a fault diagnosis method, wherein the Wake signal determination step (s200), comparator signal determination step (s300), and power semiconductor Wake determination step (s400) are performed respectively for the first Wake signal, the second Wake signal, and the third Wake signal.

[0058] That is, the control unit monitors each Wake signal and the power semiconductor (200) Wake pin signal, and determines whether the first Wake signal is High as shown in FIG. 6, and if the first Wake signal is not High, then determines whether the second Wake signal is High, and if the second Wake signal is also not High, then determines whether the third Wake signal is High.

[0059] Then, if any of these Wake signals is High, the next step is to perform a comparator signal judgment step (s300), and if the comparator signal is High, the next step is to perform a power semiconductor Wake judgment step (s400), and if the Wake pin input signal is High, the diode corresponding to the Wake signal is diagnosed as normal.

[0060] In addition, if the comparator signal is not High, the diode corresponding to the Wake signal is diagnosed as Short, and if the Wake pin input signal is not High, the diode corresponding to the Wake signal is diagnosed as Open.

[0061] In the embodiment of FIG. 6, diagnosis is performed in the order of the first Wake signal -> second Wake signal -> third Wake signal, but it goes without saying that this order may be changed differently as needed.

[0063] Next, FIG. 8 shows the configuration of the control unit of a controller for fault diagnosis according to the circuit of the second embodiment, and FIG. 9 shows a flowchart of a fault diagnosis method applied to the diode fault detection circuit of the controller Wake input circuit of the first embodiment.

[0064] As shown in FIG. 8, the control unit configuration of the controller for fault diagnosis according to the circuit of the second embodiment may include a data input unit, a data storage unit, a Wake signal determination unit, a voltage difference determination unit, a power semiconductor Wake determination unit, and a fault diagnosis unit.

[0065] A fault diagnosis method applied to a diode fault detection circuit of a controller Wake input circuit of a second embodiment includes: a monitoring step (s100) in which the data input unit receives a first Wake signal, a second Wake signal, and a third Wake signal and monitors the data; a Wake signal determination step (s200) in which the Wake signal determination unit determines whether the first Wake signal, the second Wake signal, and the third Wake signal are High; a voltage difference determination step (s300') in which the voltage difference determination unit determines whether the voltage difference between the anode and cathode of the diode corresponding to the Wake signal is greater than a set value stored in the data storage unit when the voltage difference determination unit determines a Wake signal in the Wake signal determination step; and a power semiconductor Wake determination step in which the power semiconductor Wake determination unit determines whether the Wake pin input signal of the power semiconductor (200) is High when the voltage difference corresponding to the Wake signal in the voltage difference determination step is greater than a set value.

[0066] In addition, the fault diagnosis unit diagnoses the diode corresponding to the corresponding Wake signal as short if the voltage difference is not greater than the set value in the voltage difference judgment step, diagnoses the diode corresponding to the corresponding Wake signal as normal if the Wake pin input signal is High in the power semiconductor Wake judgment step, and diagnoses the diode corresponding to the corresponding Wake signal as open if the Wake pin input signal is not High in the power semiconductor Wake judgment step.

[0067] FIG. 9 shows a specific application flowchart of such a fault diagnosis method, wherein the Wake signal determination step (s200), voltage difference determination step (s300'), and power semiconductor Wake determination step (s400) are performed respectively for the first Wake signal, the second Wake signal, and the third Wake signal.

[0068] That is, the control unit monitors each Wake signal and the power semiconductor (200) Wake pin signal, and determines whether the first Wake signal is High as shown in FIG. 9, and if the first Wake signal is not High, then determines whether the second Wake signal is High, and if the second Wake signal is also not High, then determines whether the third Wake signal is High.

[0069] Then, if any of these Wake signals are High, the next step is a voltage difference determination step (s300'), and if the voltage difference is greater than the set value stored in the data storage unit, the next step is a power semiconductor Wake determination step (s400), and if the Wake pin input signal is High, the diode corresponding to the Wake signal is diagnosed as normal.

[0070] In addition, if the voltage difference is not greater than the set value, the diode corresponding to the Wake signal is diagnosed as Short, and if the Wake pin input signal is not High, the diode corresponding to the Wake signal is diagnosed as Open.

[0071] In the embodiment of FIG. 9, diagnosis is performed in the order of the first Wake signal -> second Wake signal -> third Wake signal, but it goes without saying that this order may be changed differently as needed.

[0072] The above detailed description of the present invention describes only specific embodiments thereof. However, it should be understood that the present invention is not limited to the specific forms mentioned in the detailed description, but rather should be understood to include all variations, equivalents, and substitutions within the spirit and scope of the invention as defined by the appended claims. Explanation of the symbols

[0074] 10: Controller 100: MCU 110: MCU digital port 120: MCU analog port 200: Power semiconductor 301: First diode 302: Second diode 303: Third diode 401: First comparator 402: Second comparator 403: Third comparator 1000, 1000': Control unit

Claims

Claim 1 A diode fault detection circuit of a controller's Wake input circuit, comprising an MCU and a power semiconductor, wherein an MCU Wake signal generated and output from the MCU is a first Wake signal, a CAN IC Wake signal by an external CAN signal is a second Wake signal, and an external ignition key signal is a third Wake signal, wherein the power semiconductor is woke up by the three Wake signals, wherein a first diode is mounted on the circuit where the first Wake signal is applied to the power semiconductor, a second diode is mounted on the circuit where the second Wake signal is applied to the power semiconductor, and a third diode is mounted on the circuit where the third Wake signal is applied to the power semiconductor, and wherein the voltages on the anode and cathode sides of the diodes are transmitted to the MCU, compared with the Wake signals generated or input from the MCU, and compared with the Wake signal applied to the power semiconductor, thereby detecting a fault in the diodes. Claim 2 In claim 1, the diode fault detection circuit of the controller Wake input circuit is characterized in that the MCU includes a digital port and an analog port. Claim 3 In claim 2, the method further comprises a first comparator receiving the voltage on the anode side and the voltage on the cathode side of the first diode, a second comparator receiving the voltage on the anode side and the voltage on the cathode side of the second diode, and a third comparator receiving the voltage on the anode side and the voltage on the cathode side of the third diode, wherein the output signals of the comparators are transmitted to the digital port of the MCU, wherein the second Wake signal is output from a CAN IC inside the controller, the second Wake signal on the anode side of the second diode is input to the digital port of the MCU, and the third Wake signal on the anode side of the third diode is input to the analog port of the MCU, and the MCU receives the output signals of the comparators and detects a failure of the diodes by comparing them with the first Wake signal generated by the MCU, the second Wake signal input to the digital port of the MCU, and the third Wake signal input to the analog port of the MCU and converted into a digital signal. Diode fault detection circuit of controller Wake input circuit Claim 4 In claim 2, the first Wake signal is output from a digital port of the MCU and applied to the anode side of the first diode, the second Wake signal is input from a CAN IC outside the controller and applied to the anode side of the second diode, and the third Wake signal is input from an ignition key signal outside the controller and applied to the anode side of the third diode, wherein the anode side voltage and the cathode side voltage of the diodes are respectively input to the MCU, and the MCU detects a fault in the diodes by comparing the voltage difference calculated from the difference between the anode side voltage and the cathode side voltage of the diodes with a stored setting value. Claim 5 In claim 4, the diode fault detection circuit of a controller Wake input circuit is characterized in that the anode side voltage and the cathode side voltage of the diodes are input to the analog port of the MCU, and the anode side voltage and the cathode side voltage of the diodes are converted into digital signals by an AD converter within the MCU and compared. Claim 6 A diode fault detection circuit of a controller Wake input circuit according to any one of claims 1 to 5, characterized in that the diode fault detection circuit of the controller Wake input circuit is applied to an FSVM controller that monitors the status of a fuel cell stack. Claim 7 A method for diagnosing a diode fault in a controller Wake input circuit according to a diode fault detection circuit of a controller Wake input circuit of claim 3, wherein the controller comprises a data input unit, a Wake signal determination unit, a comparator signal determination unit, a power semiconductor Wake determination unit, and a fault diagnosis unit; a data input step in which the data input unit receives a first Wake signal, a second Wake signal, and a third Wake signal; a Wake signal determination step in which the Wake signal determination unit determines whether the first Wake signal, the second Wake signal, and the third Wake signal are High; a comparator signal determination step in which the comparator signal determination unit determines whether the signal of a comparator corresponding to the Wake signal is High if the comparator signal determination unit determines a Wake signal in the Wake signal determination step; and a power semiconductor Wake determination step in which the power semiconductor Wake determination unit determines whether the Wake pin input signal of the power semiconductor is High if the signal of the comparator corresponding to the Wake signal is High in the comparator signal determination step, wherein the fault diagnosis unit diagnoses the diode corresponding to the Wake signal as a short if the signal of the comparator is not High in the comparator signal determination step, and A method for diagnosing a diode fault in a controller Wake input circuit, characterized by diagnosing the diode corresponding to the Wake signal as normal if the Wake pin input signal is High in the power semiconductor Wake determination step, and diagnosing the diode corresponding to the Wake signal as Open if the Wake pin input signal is not High in the power semiconductor Wake determination step. Claim 8 A method for diagnosing a diode fault in a controller Wake input circuit according to a diode fault detection circuit of a controller Wake input circuit of any one of claims 4 to 5, wherein the controller comprises a data input unit, a data storage unit, a Wake signal determination unit, a voltage difference determination unit, a power semiconductor Wake determination unit, and a fault diagnosis unit; a data input step in which the data input unit receives a first Wake signal, a second Wake signal, and a third Wake signal; a Wake signal determination step in which the Wake signal determination unit determines whether the first Wake signal, the second Wake signal, and the third Wake signal are High; a voltage difference determination step in which, if the voltage difference determination unit determines a Wake signal in the Wake signal determination step, the voltage difference determination unit determines whether the voltage difference between the anode and cathode of the diode corresponding to the Wake signal is greater than a set value stored in the data storage unit; and a power semiconductor Wake determination step in which, if the voltage difference corresponding to the Wake signal in the voltage difference determination step is greater than the set value, the power semiconductor Wake determination unit determines whether the Wake pin input signal of the power semiconductor is High, wherein the fault diagnosis unit [is] the voltage difference A method for diagnosing a diode fault in a controller Wake input circuit, characterized by diagnosing the diode corresponding to the corresponding Wake signal as short if the voltage difference is not greater than a set value in the judgment step, diagnosing the diode corresponding to the corresponding Wake signal as normal if the Wake pin input signal is High in the power semiconductor Wake judgment step, and diagnosing the diode corresponding to the corresponding Wake signal as open if the Wake pin input signal is not High in the power semiconductor Wake judgment step.

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