Operating method of electronic device for performing material-component linked inventory management and production mode determination based on residual shelf life of epoxy raw material
The electronic device accurately estimates epoxy resin shelf life based on temperature and time, optimizing inventory and production to prevent defects and waste, balancing obsolescence and delivery risks.
Patent Information
- Application Number
- KR1020260154451
- Authority / Receiving Office
- KR · KR
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2026-08-18
- Publication Date
- 2026-11-03
- Estimated Expiration
- 2046-08-18
AI Technical Summary
Conventional inventory management systems fail to accurately reflect the dynamic change in the remaining shelf life of uncured epoxy resins due to temperature dependence, leading to potential defects in semiconductor components and a trade-off between pre-production and build-to-order methods, which can result in material obsolescence or delivery delays.
An electronic device that quantitatively estimates the remaining storage life of epoxy raw materials based on time and storage temperature, linking it to inventory levels, production method selection, and part quality prediction, using near-infrared spectroscopy and wireless sensors to monitor conditions, and adjusting production strategies accordingly.
This approach reduces material waste and defects by optimizing inventory management and production methods, ensuring parts meet quality standards, and balancing the risks of obsolescence and delivery delays.
Smart Images

Figure 112026100903768-PAT00009_ABST
Abstract
Description
Technology Field
[0001] The present invention relates to a technology for managing inventory, and more specifically, to a technology for managing inventory based on the remaining storage life of raw materials. Background Technology
[0002] Since heat-resistant components used in semiconductor inspection equipment must withstand repeated thermal history in high-temperature environments, thermosetting polymers based on epoxy resins are widely adopted as materials. Epoxy resins have the characteristic that the resin components and curing agent components react slowly even at room temperature in their uncured state before curing; due to this potential reactivity, the physical and chemical properties of the raw material can gradually change over time. The period during which uncured epoxy remains in a usable state is typically referred to as the storage life or pot life, and this storage life can act as a physically unavoidable constraint in managing the material.
[0003] Reactions in uncured epoxy resins can be highly dependent on storage temperature; as storage temperatures increase, the reaction rate accelerates, which can lead to a rapid depletion of shelf life. Since this temperature dependence follows the general behavior where chemical reaction rates increase exponentially with temperature, the remaining shelf life of epoxy raw materials from the same lot may vary depending on their storage history. Consequently, managing inventory based solely on the time of receipt fails to reflect the actual thermal history of the material, which can lead to errors in overestimating or underestimating the remaining shelf life.
[0004] The exhaustion of the shelf life of uncured epoxy is not merely a matter of deciding whether to discard the material; it can be directly linked to the final quality of the finished parts manufactured from it. Since raw materials with significantly depleted shelf life have already partially consumed the reactors capable of participating in the curing reaction, parts obtained by curing them may experience deterioration in heat resistance, such as reduced crosslinking density and a lowered glass transition temperature. In environments requiring tight temperature specifications, such as semiconductor inspection processes, this degradation of properties can directly lead to parts falling out of specifications and causing defects.
[0005] Meanwhile, in the business of manufacturing components for semiconductor inspection equipment, parts are produced according to the client's drawings and specifications. For parts with anticipated demand, a pre-production method—producing in advance of an order—and a build-to-order method—commuting after a confirmed order is placed—may be employed in parallel. While the pre-production method can shorten delivery times and prevent stockouts, it carries the risk of material obsolescence as storage life is exhausted during the process of securing and storing materials in advance. Conversely, the build-to-order method can reduce the risk of material obsolescence but increase the risk of delivery delays or stockouts; thus, a trade-off may exist between the two methods mediated by the physical constraint of storage life.
[0006] Conventional inventory management and production planning techniques often focus on demand forecasting and inventory turnover, operating primarily around the quantity and monetary value of materials. Consequently, they may have limitations in that they fail to quantitatively reflect the physical degradation of the materials themselves or the impact of such degradation on the quality of finished parts. Particularly for epoxy raw materials, whose shelf life changes dynamically with time and temperature, a management system may be required that estimates the remaining shelf life of individual lots in real time and consistently links this to available inventory levels, production method selection, and part quality prediction. The problem to be solved
[0007] The method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to embodiments of the present invention aims to accurately reflect the usable range of the actual material by quantitatively estimating the physical degradation experienced by the uncured epoxy raw material according to the time of receipt and storage temperature to calculate the remaining storage life of an individual lot and using this as a standard for calculating the available inventory amount.
[0008] The method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to embodiments of the present invention aims to predict the quality of a component to be produced in a specific lot in advance by linking a physical material characteristic, such as remaining storage life, with the quality of a finished component, and to prevent component defects caused by material degradation in advance by prioritizing the allocation of a lot predicted to satisfy specifications to production.
[0009] A method of operation for an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to embodiments of the present invention aims to quantify the relationship in which the risk of obsolescence associated with securing and storing the material in advance increases as the remaining storage life of the material decreases as a cost, and to automatically determine a production method suitable for each situation by comparing the costs associated with pre-production and the costs associated with order-based production.
[0010] The method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to embodiments of the present invention aims to achieve balanced inventory replenishment that prevents stockouts while suppressing material obsolescence caused by excess inventory by determining the timing of reordering by considering the variability of demand, the procurement lead time of the raw material, and the remaining storage life together.
[0011] The method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to embodiments of the present invention aims to continuously improve material management standards based on actual quality data by managing the lot introduced into production in association with the part produced therefrom, and by tracing back the cause lot when a defect occurs to update the management standards.
[0012] The technical problems of the present invention are not limited to those mentioned above, and other unmentioned technical problems will be clearly understood by those skilled in the art from the description below. means of solving the problem
[0013] A method of operation of an electronic device comprising a processor according to an embodiment of the present invention, which performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material, comprises: the processor acquiring receiving time information and storage condition information for each lot of the received epoxy raw material; the processor calculating the remaining storage life of each lot based on the acquired receiving time information and storage condition information; the processor updating the available inventory amount of each lot based on the calculated remaining storage life; the processor determining a production method as either a pre-production method, which produces the epoxy heat-resistant part before an order is placed, or a make-to-order method, which produces the epoxy heat-resistant part after an order is placed, based on demand information for the epoxy heat-resistant part and the updated available inventory amount; the processor calculating a predicted quality index of the epoxy heat-resistant part to be produced based on the remaining storage life of a specific lot, and prioritizing the allocation of a lot in which the calculated predicted quality index satisfies a standard quality to the production of the epoxy heat-resistant part; and the processor prioritizing according to the determined production method It may include the operation of introducing the epoxy raw material of the allocated lot into the production of the epoxy heat-resistant part, and managing the introduced lot and the produced epoxy heat-resistant part in association.
[0014] A method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material, which is performed by an electronic device including a processor according to an embodiment of the present invention, may further include the operation of the processor irradiating near-infrared rays onto a sample taken from a lot of the received epoxy raw material and measuring the absorbance of epoxy groups in a band of wavelengths from 4,500 nm to 6,000 nm; the operation of the processor converting the ratio of the measured absorbance to a reference absorbance decrease into a residual rate of unreacted epoxy groups; the operation of the processor downwardly correcting the remaining storage life of the lot to 0.8 times the calculated value if the converted residual rate is less than 90%; and the operation of the processor reflecting the downwardly corrected remaining storage life in updating the available inventory amount.
[0015] A method of operation of an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material, performed by an electronic device including a processor according to an embodiment of the present invention, may further include: the operation of the processor wirelessly receiving storage temperature and relative humidity at each preset measurement cycle from a wireless temperature and humidity tag attached to a lot-specific storage container of the received epoxy raw material; the operation of the processor calculating the cumulative time of the measurement interval in which the received relative humidity is 60% or higher; the operation of the processor determining that moisture absorption deterioration has occurred for the lot and increasing the reference storage life by a preset value if the calculated cumulative time exceeds 24 hours; and the operation of the processor classifying the lot as an inspection target and notifying the user terminal if reception from the wireless temperature and humidity tag is interrupted for more than a preset time.
[0016] A method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material, performed by an electronic device including a processor according to an embodiment of the present invention, may further include the operation of the processor classifying the remaining storage life of each lot into three preset sections and controlling a marking device to display markings of different colors corresponding to the classified sections on the storage container of the lot; the operation of the processor controlling the conveying equipment to transfer the lot classified into the section with the shortest remaining storage life among the three sections to a location closest to the outlet of the conveying equipment; the operation of the processor receiving the remaining weight of each lot from a weight sensor provided in the conveying equipment and excluding lots whose received remaining weight is less than a preset minimum input weight from the available inventory amount; and the operation of the processor recording the identification information of the lot released through the outlet as the identification information of the lot released into the production. Effects of the invention
[0017] The effects of the operation method of an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of epoxy raw materials according to embodiments of the present invention are described as follows.
[0018] According to one embodiment of the present invention, since the degradation experienced by uncured epoxy raw materials can be quantitatively estimated based on storage temperature and elapsed time, precise inventory management corresponding to the actual remaining storage life of individual lots can be implemented, unlike conventional methods that rely simply on the order of receipt. Through this, waste caused by prematurely discarding materials that are still usable and errors caused by introducing already degraded materials into production can be reduced simultaneously.
[0019] According to one embodiment of the present invention, the quality of parts to be produced from a specific lot can be predicted in advance by linking the physical properties of the material with the quality of the finished part, thereby blocking the input of materials expected to be substandard at a pre-production stage. Accordingly, defects discovered at the post-completion inspection stage can be reduced, and resources required for rework and disposal due to defects can be saved.
[0020] According to one embodiment of the present invention, obsolescence costs, which increase inversely proportional to the remaining storage life, can be reflected as a factor in determining the production method. Thus, an optimal production strategy can be selected depending on the situation by shortening the delivery time through pre-production when the storage life is sufficient and switching to order-based production when the storage life is insufficient to suppress material waste.
[0021] According to one embodiment of the present invention, since the timing of reordering can be determined by comprehensively considering demand variability, procurement lead time, and remaining shelf life, the risk of delivery delays due to stockouts and the risk of material obsolescence due to excess inventory can be managed simultaneously. Through this, losses associated with holding inventory can be minimized while maintaining stable supply capabilities.
[0022] According to one embodiment of the present invention, by managing the relationship between a lot introduced into production and a part produced therefrom, the material lot that caused the defect can be traced back, thereby allowing the accumulation of correlations between specific material characteristics and part defects. By continuously strengthening the quality standards and shelf life standards of the material based on the accumulated data, the reliability of the entire management system can be gradually improved. Brief explanation of the drawing
[0023] FIG. 1 is a block diagram showing the components of an electronic device according to one embodiment of the present invention. FIG. 2 is a block diagram showing the components of a system in which an operation method of an electronic device is performed to determine a material-component linked inventory management and production method based on the remaining storage life of an epoxy raw material according to one embodiment of the present invention. FIG. 3 is a flowchart of the operation method of an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to one embodiment of the present invention. FIG. 4 is a specific flowchart of operation included in the method of operation of an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to one embodiment of the present invention. In relation to the description of the drawings, the same or similar reference numerals may be used for identical or similar components. Specific details for implementing the invention
[0024] Hereinafter, some embodiments of the present invention will be described in detail with reference to exemplary drawings. It should be noted that in assigning reference numerals to the components of each drawing, the same components are given the same reference numeral whenever possible, even if they are shown in different drawings. Furthermore, in describing the embodiments of the present invention, if it is determined that a detailed description of related known components or functions would hinder understanding of the embodiments of the present invention, such detailed description is omitted.
[0025] In describing the components of the embodiments of the present invention, terms such as first, second, A, B, (a), (b), etc., may be used. These terms are intended merely to distinguish the components from other components, and the essence, order, or sequence of the components is not limited by such terms. Furthermore, unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as generally understood by those skilled in the art to which the present invention pertains. Terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant technology, and should not be interpreted in an ideal or overly formal sense unless explicitly defined in this application.
[0026] Hereinafter, embodiments of the present invention will be described in detail with reference to FIGS. 1 to 4.
[0027] FIG. 1 is a block diagram showing the components of an electronic device according to one embodiment of the present invention.
[0028] According to one embodiment, the electronic device (100) may include a memory (110), a processor (120), a communication interface (130), and / or a display device (140). The configuration of the electronic device (100) illustrated in FIG. 1 is exemplary and the embodiments of the present invention are not limited thereto. For example, the electronic device (100) may further include components not illustrated in FIG. 1 (e.g., a user interface, an input device, a notification unit, a sensor unit, or at least one of any combination thereof).
[0029] According to one embodiment, the memory (110) may store instructions or data. For example, the memory (110) may store one or more instructions that cause the electronic device (100) to perform various operations when executed by the processor (120).
[0030] For example, the memory (110) may be implemented as a single chipset with the processor (120). The processor (120) may include at least one of a communication processor or a modem.
[0031] For example, the memory (110) can store various information related to the electronic device (100). For example, the memory (110) can store information regarding the operation history of the processor (120). For example, the memory (110) can store input data acquired by the electronic device (100), output data output by the electronic device (100), data acquired from an external server, a wearable device, a plurality of cameras and / or user terminals, etc.
[0032] For example, the memory (110) may include multiple storage devices of different types. For example, the memory (110) may include volatile and / or non-volatile storage media. For example, the memory (110) may include at least one of RAM (random-access memory), ROM (read only memory), eMMC (Embedded Multi-Media Card), or any combination thereof.
[0033] The steps of the method or algorithm described in connection with the embodiments disclosed in this specification may be directly implemented in hardware, software modules, or a combination of both, executed by the processor (120). The software modules may reside in a storage medium (i.e., memory (110)) such as RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, a hard disk, a removable disk, or a CD-ROM.
[0034] For example, the memory (110) is coupled to a processor (120), and the processor (120) can read information from a storage medium and write information to a storage medium. Alternatively, the memory (110) may be integrated with the processor (120). The memory (110) and the processor (120) may reside within an application-specific integrated circuit (ASIC). The ASIC may reside within a user terminal. Alternatively, the memory (110) and the processor (120) may reside as separate components within the user terminal.
[0035] According to one embodiment, the processor (120) may be operatively connected to the memory (110), the communication interface (130), and / or the display device (140). For example, the processor (120) may control the operation of the memory (110), the communication interface (130), and / or the display device (140).
[0036] According to one embodiment, the communication interface (130) may support the establishment of a direct (e.g., wired) communication channel or a wireless communication channel between an electronic device (100) and an external device (e.g., user terminal (210) of FIG. 2, external server (220), etc.), and the performance of communication through the established communication channel. The communication interface (130) may include one or more communication processors that operate independently of the processor (120) (e.g., application processor) and support direct (e.g., wired) communication or wireless communication. According to one embodiment, the communication interface (130) may include a wireless communication module (e.g., cellular communication module, short-range wireless communication module, or GNSS (global navigation satellite system) communication module) or a wired communication module (e.g., LAN (local area network) communication module, or power line communication module). Among these communication modules, the corresponding communication module can communicate with an external electronic device through a first network (e.g., a short-range communication network such as Bluetooth, WiFi (wireless fidelity) direct, or IrDA (infrared data association)) or a second network (e.g., a legacy cellular network, a 5G network, a next-generation communication network, the Internet, or a long-range communication network such as a computer network (e.g., LAN or WAN). These various types of communication modules may be integrated into a single component (e.g., a single chip) or implemented as multiple separate components (e.g., multiple chips). The wireless communication module can identify or authenticate the electronic device (100) within a communication network, such as the first network or the second network, using subscriber information (e.g., International Mobile Subscriber Identifier (IMSI)) stored in a subscriber identification module.
[0037] According to one embodiment, the display device (140) may include at least one output device that provides various information and a user interface to the user.
[0038] For example, the display device (140) may include a display device, an audio output device, a virtual reality output device, etc.
[0039] For example, the display device (140) can provide the user with various types of user interfaces described in the present invention visually and / or audibly.
[0040] The components of the electronic device (100) illustrated in FIG. 1 are exemplary, and embodiments of the present invention are not limited thereto.
[0041] At least some of the embodiments of the present invention may be implemented as artificial intelligence (AI) through a processor (120) and memory (110) of an electronic device (100). The processor (120) may be composed of one or more processors, and the one or more processors may be general-purpose processors such as a CPU, AP, DSP (digital signal processor), etc., graphics-dedicated processors such as a GPU, VPU (vision processing unit), or artificial intelligence-dedicated processors such as an NPU. The one or more processors may be controlled to process input data according to predefined operation rules or artificial intelligence models stored in memory (110). Alternatively, if the one or more processors are artificial intelligence-dedicated processors, the artificial intelligence-dedicated processors may be designed with a hardware structure specialized for processing a specific artificial intelligence model.
[0042] The predefined operation rules or artificial intelligence models are characterized by being created through learning. Here, being created through learning means that a predefined operation rules or artificial intelligence models are created by a basic artificial intelligence model being trained using multiple learning data by a learning algorithm to perform a desired characteristic (or purpose). Such learning may be performed within the electronic device (100) itself where the artificial intelligence according to the present invention is performed, or through a separate server and / or system. Examples of learning algorithms include supervised learning, unsupervised learning, semi-supervised learning, or reinforcement learning, but are not limited to the examples described above.
[0043] An artificial intelligence model may be composed of multiple neural network layers. Each of the multiple neural network layers has multiple weight values and can perform neural network operations through operations between the results of previous layers and the multiple weights. The multiple weights possessed by the multiple neural network layers can be optimized based on the learning results of the artificial intelligence model. For example, the multiple weights can be updated so that the loss value or cost value obtained from the artificial intelligence model during the learning process is reduced or minimized. Artificial neural networks may include, but are not limited to, deep neural networks (DNN), convolutional neural networks (CNN), recurrent neural networks (RNN), restricted Boltzmann machines (RBM), deep belief networks (DBN), bidirectional recurrent deep neural networks (BRDNN), or deep Q-networks.
[0044] In the process of estimating the remaining storage life of individual lots, the electronic device (100) may utilize an artificial intelligence model that takes as input various additional information such as humidity, whether it has been opened, and temperature deviation of the storage location, as well as storage temperature and elapsed time. This artificial intelligence model can be trained in a regression form using storage history accumulated for multiple lots and actual measured remaining reactivity data as training data, and can improve the accuracy of estimating the remaining storage life by reflecting complex degradation behaviors that are difficult to capture with a physical model alone.
[0045] The electronic device (100) may utilize an artificial intelligence model that takes as input the composition information of the raw material and the curing process conditions, along with the remaining storage life, in the process of calculating the predicted quality indicator of the part to be produced from a specific lot. This artificial intelligence model can be used to accurately predict the quality of the finished part for a new lot and to determine in advance whether the specifications are satisfied by learning the relationship between the measured glass transition temperature of the part produced in the past and the remaining storage life of the material introduced into the part.
[0046] In the process of predicting demand information, the electronic device (100) may utilize an artificial intelligence model that has learned time-series data such as past order history, seasonality, and production plans by orderer. Since this artificial intelligence model can estimate not only the average level of demand but also its variability, it can be reflected in the process of determining safety stock levels and reordering timing, thereby contributing to the balanced management of stockout risk and excess inventory risk.
[0047] The electronic device (100) may utilize an artificial intelligence model that adjusts the relative magnitudes of holding costs, obsolescence costs, and stockout costs according to the situation during the process of determining the production method. This artificial intelligence model can be used to gradually improve the policy of selecting the more advantageous method between pre-production and order-based production based on remaining storage life and demand conditions by learning past production method choices and the resulting actual costs and delivery performance in the form of reinforcement learning.
[0048] The electronic device (100) can utilize an artificial intelligence model that learns patterns between defect history and material characteristics in the process of identifying the cause lot and updating management standards when a defect occurs. This artificial intelligence model can learn which remaining storage life range causes the defect rate to rise rapidly and automatically suggest an upward range for quality standards and storage life standards, thereby contributing to the continuous adjustment of management standards to match actual quality data without the intervention of a manager.
[0049] FIG. 2 is a block diagram showing the components of a system in which an operation method of an electronic device is performed to determine a material-component linked inventory management and production method based on the remaining storage life of an epoxy raw material according to one embodiment of the present invention.
[0050] According to one embodiment, a system in which an operation method of an electronic device is performed to determine a material-part linked inventory management and production method based on the remaining storage life of an epoxy raw material may include an electronic device (100), a user terminal (210), and an external server (220).
[0051] The electronic device (100) can operate based on a hardware configuration including a processor, memory, and communication circuits, and the processor of the electronic device (100) can perform a series of operations regarding material management and production planning by executing instructions stored in memory. The memory can store data such as receiving information, storage condition history, remaining storage life, available inventory quantity, and association information between lots and parts, and can include both volatile memory and non-volatile memory to manage temporary data during operations and data that must be continuously stored, respectively. Through this hardware configuration, the electronic device (100) can process and update a large amount of lot information in real time.
[0052] The processor of the electronic device (100) may be implemented as a single physical computing unit, or it may be implemented distributed across multiple computing cores or multiple physical units. For example, if the number of lots to be processed is large and the computing load is high, the electronic device (100) may be configured to separate computing resources responsible for calculating the remaining storage life and computing resources responsible for determining the production method and process them in parallel. By distributing the computing load in this way, the electronic device (100) can provide management results without delay even in situations where the material status is frequently updated.
[0053] The electronic device (100) may be installed in the form of a physical server within the workplace, or it may be implemented as a server located in a remote data center or as a virtual computing resource provided in a cloud computing environment. When the electronic device (100) is implemented in a cloud computing environment, computing resources can be flexibly expanded or contracted according to the amount of data to be processed or the complexity of the computation, so it can be operated efficiently according to changes in the scale of the business. The initial introduction cost and operation method of the electronic device (100) may vary depending on this implementation form.
[0054] The electronic device (100) may include a communication circuit for exchanging data with a user terminal (210) and an external server (220), and may support various communication methods including wired and wireless communication networks. The electronic device (100) may encrypt and transmit / receive data to prevent falsification or leakage of data during the communication process, or perform an authentication procedure to verify the authority of the connecting user terminal (210). Through such security processing, the electronic device (100) can ensure that information regarding material management and production plans is reliably managed.
[0055] The electronic device (100) can continuously accumulate processing results to secure data regarding the relationship between material management and component quality over the long term. The electronic device (100) can analyze the accumulated data to improve management standards or increase the accuracy of predictions, and if necessary, the accumulated data can be transmitted to an external server (220) for separate analysis or storage. As a central device encompassing the processing, accumulation, and utilization of data, the electronic device (100) can perform a key role in the management system linking materials and components.
[0056] The user terminal (210) is a device used by a manager or worker to exchange information with an electronic device (100), and can be implemented as various types of terminals including a display, input means, and communication functions. The user terminal (210) may be implemented as a fixed desktop computer and used in a management office, or implemented as a portable tablet or smartphone and used while moving in a warehouse or production site. Depending on the implementation type, the environment in which the user terminal (210) is used and the configuration of the screen provided may vary.
[0057] The user terminal (210) can provide a screen configuration for displaying information provided by the electronic device (100) in a form that is easy for the manager to understand. For example, the user terminal (210) can help the manager intuitively understand the condition of the material by displaying the remaining storage life of each lot as a list or chart, or by displaying different colors according to the intervals of the remaining storage life. The user terminal (210) can support the manager in checking the necessary information step by step by displaying detailed information about the lot or part when the manager selects it.
[0058] The user terminal (210) may provide various input means for transmitting the manager's input to the electronic device (100). The user terminal (210) may receive information through input means such as a keyboard or a mouse, or may receive information by directly manipulating the screen through a touch screen. Additionally, the user terminal (210) may include means for reading barcodes or identification labels to support the worker in quickly inputting identification information of materials. The user terminal (210) may enable information from the site to be conveniently transmitted to the electronic device (100) through these input means.
[0059] The user terminal (210) can receive various notifications from the electronic device (100) and transmit them to the administrator. The user terminal (210) can receive notifications regarding events such as the arrival of a reordering time, the occurrence of materials expected to be substandard, or the occurrence of lots requiring inspection, and notify the administrator of these events through methods such as screen display, sound, or vibration. The user terminal (210) can vary the notification method according to the urgency of the notification so that matters requiring immediate response are quickly transmitted to the administrator.
[0060] Multiple user terminals (210) may be simultaneously connected to and used with the electronic device (100), and different permissions may be assigned to each user terminal (210). For example, a user terminal (210) used by a manager may be granted the authority to change management standards or approve orders, while a user terminal (210) used by a field worker may be granted the authority to view information or record the removal of materials. By distinguishing permissions in this way, the user terminal (210) ensures that the viewing and manipulation of information are carried out within an appropriate scope, thereby maintaining the reliability of the management system.
[0061] The external server (220) is a device located outside the electronic device (100) that exchanges data with the electronic device (100), and can perform the role of providing information required by the electronic device (100) or receiving and utilizing the processing results of the electronic device (100). The external server (220) may include multiple servers operated by different entities, such as material suppliers, ordering parties, and warehouse management entities, and the electronic device (100) can collect or transmit necessary information by individually linking with each external server (220). In this way, the external server (220) can serve as a channel connecting the electronic device (100) with the external environment.
[0062] The external server (220) is implemented as a server operated by a material supplier and can provide information such as the material procurement lead time, available supply quantity, and material reaction characteristics to the electronic device (100). The electronic device (100) can receive this information and use it to improve the accuracy of calculating the remaining storage life or determining the reordering time, and can transmit the generated order request to the external server (220) to initiate the ordering process. The external server (220) can thus mediate the exchange of information between the electronic device (100) and the material supplier.
[0063] The external server (220) is implemented as a server operated by the ordering party and can provide information such as ordering plans for parts, demand information, and required specifications to the electronic device (100). The electronic device (100) can receive this information and use it for demand forecasting, determining production methods, and calculating predicted quality indicators, and can also transmit production performance or information related to parts and materials to the external server (220) to share with the ordering party. The external server (220) can contribute to ensuring that material management and parts supply align with the ordering party's plans by linking information between the electronic device (100) and the ordering party in this way.
[0064] An external server (220) can perform the role of relaying data collected by a measuring device installed in a warehouse or production site to an electronic device (100). For example, the external server (220) can collect data from an environmental sensor that measures the temperature and humidity of the warehouse or a measuring means that measures the condition of a material and transmit it to the electronic device (100), and the electronic device (100) can use this as input for storage condition information or remaining storage life correction. The external server (220) can thus perform the function of aggregating and relaying data between various measuring devices and the electronic device (100).
[0065] The external server (220) can perform processing to convert the format of data or maintain security during the process of exchanging data with the electronic device (100). Since the external servers (220) operated by different entities may use different data formats or communication protocols, the electronic device (100) and the external server (220) can be interconnected through processing to convert the data into a mutually understandable format. Additionally, the external server (220) can ensure that information exchanged between companies is safely managed by encrypting data or verifying access rights during communication with the electronic device (100).
[0066] FIG. 3 is a flowchart of the operation method of an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to one embodiment of the present invention.
[0067] According to one embodiment, components of a system in which a method of operation of an electronic device for determining a material-component linked inventory management and production method based on the remaining storage life of an epoxy raw material is performed may perform the operations disclosed in FIG. 3. For example, among the components included in the system in which a method of operation of an electronic device for determining a material-component linked inventory management and production method based on the remaining storage life of an epoxy raw material is performed, at least some of the components included in the electronic device (100) (e.g., memory (110), processor (120), communication interface (130), and display device (140) of FIG. 1) may be configured to perform the operations of FIG. 3.
[0068] In the following embodiments, the operations S310 to S360 may be performed sequentially, but are not necessarily performed sequentially. For example, the order of each operation may be changed, and at least two operations may be performed in parallel. Additionally, content corresponding to or overlapping with the above description in relation to FIG. 3 may be briefly explained or omitted.
[0069] According to one embodiment, the processor (120) can obtain receiving time information and storage condition information for each lot of received epoxy raw material (S310).
[0070] The processor of the electronic device (100) can classify the epoxy raw materials received in the warehouse into lots, and obtain receiving time information indicating when each lot was received and storage condition information indicating in what environment each lot is stored. Here, a lot may refer to a group of materials produced in the same manufacturing batch and considered to have the same reactivity and characteristics, and each lot is assigned unique identification information, which can serve as a standard for tracking the materials in all subsequent management processes. By managing this lot-specific information individually, the processor of the electronic device (100) can distinguish and handle lots that were received at different times and stored under different conditions, even if they are the same type of epoxy raw material.
[0071] The receiving time information may include the date or time when a specific lot is brought into the warehouse and incorporated into the management target, and in some cases, may also include additional time information such as the time when the material was manufactured or the time when it was shipped from the supplier. For example, the processor of the electronic device (100) records that the receiving time for a specific lot is a specific time on a specific year, month, and day, and can use this to calculate how long the material has been stored based on this time. Since the receiving time information can serve as a reference point on the time axis to reflect the characteristic that the storage life is depleted over time, obtaining accurate time information can be a factor determining the accuracy of the calculation of the remaining storage life later.
[0072] Storage condition information is information indicating the physical conditions of the environment in which a specific lot is stored, and may include, typically, storage temperature, and additional conditions such as humidity, exposure to light, and sealing. Since the reaction progress of uncured epoxy is sensitive to temperature, storage temperature can be a key condition for determining the rate at which the storage life is exhausted. For example, even if a lot stored under refrigeration and a lot stored at room temperature are received at the same time, their storage life may be exhausted at different rates over time, and the processor of the electronic device (100) can identify the storage temperature of each lot individually and reflect this difference in management.
[0073] The method by which the processor of the electronic device (100) obtains information on the time of entry and storage conditions can be implemented in various ways. The processor of the electronic device (100) may obtain information by receiving information directly entered by an administrator through a user terminal (210), or it may obtain information on the time of entry and lot identification by automatically receiving it from a device that reads a barcode or electronic tag attached to the material. In addition, the processor of the electronic device (100) may continuously obtain a history of storage temperatures that change during the storage period by periodically receiving storage conditions measured by a temperature sensor or environmental measuring device installed in the warehouse via an external server (220).
[0074] The processor of the electronic device (100) can store the acquired receiving time information and storage condition information in association with lot identification information and manage them in a form that can be referenced in subsequent processing. If the storage conditions are not constant and fluctuate during the storage period, the processor of the electronic device (100) can record different storage temperatures for each time interval and manage them by cumulatively reflecting the conditions of each interval. Since the information acquired and managed in this way serves as basic data that reflects the actual time elapsed and thermal history experienced by individual lots, it can serve as a starting point for enabling inventory management that corresponds to the actual state of the material.
[0075] According to one embodiment, the processor (120) can calculate the remaining storage life of each lot based on the acquired receiving time information and storage condition information (S320).
[0076] The processor of the electronic device (100) can calculate the remaining storage life, which indicates how much longer each lot remains in a usable state at the current time, based on the acquired receiving time information and storage condition information. The remaining storage life may refer to the remaining period during which the epoxy raw material of a specific lot remains in a state where it can be used for normal component manufacturing, and can be understood as the value obtained by subtracting the amount consumed due to the passage of time and storage conditions from the initial storage life when the material was first available for use. By individually calculating the remaining storage life for each lot, the processor of the electronic device (100) can quantitatively determine the state of the material not only in terms of quantity but also in terms of the usable period.
[0077] When calculating the remaining storage life, the processor of the electronic device (100) may consider the time elapsed from the time of receipt to the present and the storage temperature to which the material was exposed during that period. Since the depletion of the storage life of uncured epoxy has the characteristic that it proceeds faster the longer the time and the higher the storage temperature, the processor of the electronic device (100) may combine these two factors to estimate the actual degree of depletion of each lot. For example, among two lots received at the same time, the lot stored at a relatively higher temperature may be calculated to have a shorter remaining storage life than the lot stored at a lower temperature, and this difference may result in reflecting the degree of physical degradation of the material.
[0078] If storage conditions fluctuate during the storage period, the processor of the electronic device (100) can calculate the remaining storage life by accumulating the amount consumed according to the storage temperature of each time interval. For example, if a specific lot is initially stored in a refrigerated state and then moved to a room temperature for storage, the processor of the electronic device (100) can calculate the total amount consumed by reflecting the gradual consumption in the refrigerated section and the accelerated consumption in the room temperature section, respectively. A calculation method that reflects such fluctuating conditions can provide a remaining storage life that corresponds to the thermal history experienced by the actual material, thereby contributing to increasing the accuracy of management.
[0079] The processor of the electronic device (100) stores the calculated remaining storage life in association with lot identification information and can periodically update it as time passes. Since the remaining storage life is a value that decreases over time, the processor of the electronic device (100) can recalculate the remaining storage life of each lot at a set period or whenever storage conditions change to maintain it in an up-to-date state. The remaining storage life updated in this way is provided in a form that an administrator can view through a user terminal (210), and can serve as a basis for determining which lot should be used first.
[0080] The remaining storage life calculated by the processor of the electronic device (100) can serve as a key indicator commonly referenced in various processes, such as updating available inventory, calculating predicted quality indicators, and determining production methods. Since the remaining storage life is calculated as a quantitative value representing the physical state of the material, the processor of the electronic device (100) can use this value as a medium to link material management, component quality management, and production planning into a single consistent system. Therefore, the accurate calculation of the remaining storage life can serve as a foundation for the management system of the entire invention to operate reliably.
[0081] According to one embodiment, the processor (120) can update the available stock amount of each lot based on the calculated remaining storage life (S330).
[0082] The processor of the electronic device (100) can update the available stock quantity, which represents the amount of material that can actually be input into the production of parts for each lot, based on the calculated remaining storage life. The available stock quantity may refer to the portion of the total quantity of material physically present in the warehouse that is judged to be usable for manufacturing parts with normal quality at the current time, and may be a concept distinct from a simple stock quantity. The processor of the electronic device (100) can accurately reflect the amount of material actually usable by including materials from lots with sufficient remaining storage life in the available stock quantity and excluding materials from lots whose remaining storage life has been exhausted or is insufficient from the available stock quantity.
[0083] The processor of the electronic device (100) can determine whether to include the material of a lot in the available inventory by comparing the remaining storage life of each lot with a predetermined standard. For example, if the remaining storage life of a specific lot is sufficient, the processor of the electronic device (100) can fully include the quantity of the material of that lot in the available inventory. Conversely, if the remaining storage life of a specific lot does not meet the standard, the processor of the electronic device (100) can exclude the material of that lot from the available inventory to prevent a situation where deteriorated material is mistaken for normal inventory and put into production.
[0084] The update of available inventory can be performed dynamically over time. Materials from a lot may be included in the available inventory immediately after being received, but may be excluded from the available inventory if their remaining storage life decreases below a certain threshold over time. The processor of the electronic device (100) can recalculate the available inventory in conjunction with the periodic update of the remaining storage life, thereby allowing changes in the physical state of the materials to be reflected in inventory management in real time. Such dynamic updating can be a feature that is fundamentally distinguished from static inventory management that does not take into account the deterioration of the materials.
[0085] The processor of the electronic device (100) can not only manage available inventory by lot, but also calculate and manage the sum of available inventory across multiple lots for the same type of epoxy raw material. Through this, the processor of the electronic device (100) can comprehensively determine how much of the material required to produce a specific part is currently secured and can detect this early if a shortage is expected. For example, even if the physical inventory quantity is sufficient, if a large number of lots have insufficient remaining storage life, the processor of the electronic device (100) can identify that the available inventory is actually insufficient and notify the manager.
[0086] The processor of the electronic device (100) can provide the updated available inventory amount to the manager via the user terminal (210) or use it as input for subsequent processing, such as determining the production method and the timing of reordering. Since the available inventory amount represents the actual usable amount reflecting the physical deterioration of the material, production planning and inventory replenishment based on this can enable decisions that correspond to the actual state of the material. Therefore, the accurate updating of the available inventory amount can serve as a key link connecting the physical constraint of storage life to production and inventory management.
[0087] According to one embodiment, the processor (120) can determine the production method based on demand information for the epoxy heat-resistant part and the updated available inventory amount, either a pre-production method in which the epoxy heat-resistant part is produced before ordering or a post-order production method in which it is produced after ordering (S340).
[0088] Based on demand information for epoxy heat-resistant parts and updated available inventory levels, the processor of the electronic device (100) can determine the production method as either a pre-production method, which produces parts in advance before an order is placed, or a post-order production method, which produces parts after an order is placed. The pre-production method involves producing parts with predicted demand in advance and holding them in inventory before an order is confirmed, which can be advantageous for shortening delivery times and preventing stockouts. The post-order production method involves starting production after an order is confirmed, which can be advantageous for suppressing unnecessary inventory and material obsolescence. By selecting the more suitable method between the two depending on the situation, the processor of the electronic device (100) can achieve a balance between delivery times and material waste.
[0089] The processor of the electronic device (100) can utilize demand information as an important basis when determining the production method. Demand information may include predictions regarding the scale and frequency with which a specific part will be required in the future, and may be derived based on the orderer's past order history or production plans. For example, if the demand for a specific part is predicted to be continuous and stable, the processor of the electronic device (100) may tend to choose a pre-production method, judging that there is a high probability that the inventory will be depleted even if produced in advance. Conversely, if the demand is irregular or difficult to predict, the processor of the electronic device (100) may choose a build-to-order production method, considering the risk that the pre-produced part will not be depleted and will remain unused.
[0090] The processor of the electronic device (100) can also use the updated available inventory amount as a basis for determining the production method. Since the available inventory amount is the actual usable amount reflecting the remaining storage life of the material, the processor of the electronic device (100) can consider together whether pre-production is possible with the currently secured material and whether the material can be consumed before it becomes obsolete if it is put into pre-production. For example, if a sufficient amount of material with a long remaining storage life is secured, the processor of the electronic device (100) can select a pre-production method by determining that the material can be converted into a pre-production component before it becomes obsolete.
[0091] The processor of the electronic device (100) can determine different production methods depending on the type of component and time. Since demand conditions and the remaining storage life of the material change over time even for the same component, the processor of the electronic device (100) may determine that a pre-production method is advantageous at a specific time and that a made-to-order production method is advantageous at another time. Such a decision to flexibly switch production methods according to the situation rather than fixing the production method can result in reflecting both the physical constraints of the material and fluctuations in demand.
[0092] The processor of the electronic device (100) can present the determined production method to the manager through the user terminal (210) or automatically generate production instructions based on the result of the determination. The manager can check the production method presented by the processor of the electronic device (100) through the user terminal (210) and adjust it as needed, and the adjusted result can be transmitted back to the electronic device (100) and reflected in subsequent processing. Since such determination of the production method is a process of concretizing the physical constraint of the material's shelf life into a production plan, it can play a role in organically connecting material management and production operations.
[0093] According to one embodiment, the processor (120) can calculate a predicted quality index for an epoxy heat-resistant component produced based on the remaining storage life of a specific lot, and can prioritize allocating a lot that satisfies the standard quality based on the calculated predicted quality index to the production of the epoxy heat-resistant component (S350).
[0094] The processor of the electronic device (100) can calculate a predicted quality index for an epoxy heat-resistant part to be produced from a specific lot based on the remaining storage life of that lot, and can preferentially allocate lots that satisfy the standard quality based on the calculated predicted quality index to the production of parts. The predicted quality index may refer to a value that quantitatively indicates the level of quality expected to be exhibited by a finished part when a part is manufactured using the material of a specific lot, and may, for example, be an indicator indicating the heat resistance characteristics of the finished part. By calculating the predicted quality index based on the relationship between the remaining storage life, which is the physical state of the material, and the quality of the finished part, the processor of the electronic device (100) can estimate the quality of the part in advance at the pre-production stage.
[0095] As the remaining shelf life of the uncured epoxy is exhausted, the components capable of participating in the curing reaction decrease, and thus the heat resistance of the finished part tends to deteriorate. Therefore, the processor of the electronic device (100) can calculate a higher predicted quality index for lots with a longer remaining shelf life and a lower predicted quality index for lots with a shorter remaining shelf life. For example, the processor of the electronic device (100) can predict that if a specific lot has a sufficient remaining shelf life, the part to be produced from that lot will satisfy the specifications, and if a lot has a significantly depleted shelf life, the part to be produced from that lot will fail to meet the specifications. This prediction can be the result of utilizing the fact that the physical properties of the material and the quality of the part are linked.
[0096] The processor of the electronic device (100) can determine whether to input the material of each lot into production by comparing the calculated predicted quality indicator with the standard quality. Here, the standard quality may refer to the minimum quality level required for the finished part to satisfy the specifications of the ordering party, and may be set differently depending on the type of part or the requirements of the ordering party. The processor of the electronic device (100) determines that a lot in which the predicted quality indicator satisfies the standard quality is a lot suitable for production, and may exclude from production or lower the priority of a lot in which the predicted quality indicator does not meet the standard quality.
[0097] The processor of the electronic device (100) can select a lot to be allocated for production in priority among multiple lots whose predicted quality indicators satisfy the standard quality. For example, the processor of the electronic device (100) can induce the material to be used before it becomes obsolete by prioritizing the allocation of lots that still satisfy the standard quality but have a relatively short remaining storage life. Such priority allocation can be carried out in a way that minimizes material waste while ensuring the production of parts that meet specifications, and can contribute to achieving both goals of quality assurance and material efficiency.
[0098] The processor of the electronic device (100) can provide the results of the calculation of the predicted quality indicator and the priority allocation results to the manager through the user terminal (210), thereby allowing the manager to determine in advance which lot is suitable for input into which part production. Priority allocation based on the predicted quality indicator enables proactive management that predicts quality before the material is input into production and blocks the input of unsuitable materials, thus contributing to reducing defects found during the inspection stage after completion. Therefore, the calculation of the predicted quality indicator and priority allocation can be a key process that directly links the physical characteristics of the material to part quality management.
[0099] According to one embodiment, the processor (120) may input epoxy raw material of a lot allocated first according to a determined production method into the production of an epoxy heat-resistant part, and may manage the input lot and the produced epoxy heat-resistant part in association (S360).
[0100] The processor of the electronic device (100) can input epoxy raw material from a lot allocated first according to a determined production method into the production of epoxy heat-resistant parts, and can manage the input lot and the parts produced therefrom by associating them with each other. Inputting into production may mean the process of supplying material from a specific lot to an actual part manufacturing process to make it into a finished part through curing and processing, and the processor of the electronic device (100) can maintain a correspondence between the material and the part by recording which lot's material was used in the production of which part. This association management can serve as the basis for managing the flow from the material to the finished part in a traceable form.
[0101] The processor of the electronic device (100) may vary the timing and method of material input according to the previously determined production method. If the pre-production method is determined, the processor of the electronic device (100) may input materials from a lot allocated first into production before the order is confirmed, thereby manufacturing parts in advance and securing them as inventory. If the order-based production method is determined, the processor of the electronic device (100) may input materials from a lot allocated first into production after the order is confirmed, thereby suppressing unnecessary inventory formation and material obsolescence. In either method, the processor of the electronic device (100) may secure the quality of the finished parts by prioritizing the input of lots whose predicted quality indicators satisfy the standard quality.
[0102] The processor of the electronic device (100) can update the available inventory amount of a lot by deducting that amount during the process of inputting the material into production. Since the available inventory amount of a lot decreases when the material of a specific lot is consumed in production, the processor of the electronic device (100) can maintain the accuracy of the inventory information by reflecting the available inventory amount in real time in correspondence with the input amount. Through this, the processor of the electronic device (100) can consistently manage the consumption of the material and the inventory status, and provide the latest inventory information for subsequent production planning and reordering decisions.
[0103] The processor of the electronic device (100) may record identification information of the lot used to manufacture the part by linking it to each part in order to associate the input lot with the produced part. For example, if a specific part is manufactured using a material from a specific lot, the processor of the electronic device (100) may store the identification information of the lot together with the management information of the part so that when the part is later looked up, it can be determined what material it was manufactured from. This association information can be used to trace back the material that caused the problem when a problem occurs in the finished part, or to analyze the impact of the characteristics of a specific material on the quality of the part.
[0104] The processor of the electronic device (100) can provide the relationship between the materials and parts managed in this way to the manager through the user terminal (210) or transmit it to an external server (220) to share it with the system of the ordering party or the supplier. Since the relationship management between materials and parts increases the transparency of the production history and enables rapid identification of the cause when quality problems occur, it can play a role in ensuring that management starting from the physical state of the materials is completed as quality management of the finished parts. In this way, the processor of the electronic device (100) can implement an integrated management system that links materials and parts by consistently managing the input of materials, the production of parts, and the relationship between them.
[0105] FIG. 4 is a specific flowchart of operation included in the method of operation of an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material according to one embodiment of the present invention.
[0106] According to one embodiment, components of a system in which a method of operation of an electronic device for determining a material-component linked inventory management and production method based on the remaining storage life of an epoxy raw material is performed may perform the operations disclosed in FIG. 4. For example, among the components included in the system in which a method of operation of an electronic device for determining a material-component linked inventory management and production method based on the remaining storage life of an epoxy raw material is performed, at least some of the components included in the electronic device (100) (e.g., memory (110), processor (120), communication interface (130), and display device (140) of FIG. 1) may be configured to perform the operations of FIG. 4.
[0107] In the following embodiments, the operations of S410 to S430 may be performed sequentially, but are not necessarily performed sequentially. For example, the order of each operation may be changed, and at least two operations may be performed in parallel. Additionally, content corresponding to or overlapping with the above description in relation to FIG. 4 may be briefly explained or omitted.
[0108] According to one embodiment, the processor (120) can calculate the storage life decay rate of the lot based on the storage temperature included in the storage condition information (S410).
[0109] The processor of the electronic device (100) can calculate a storage life decay rate, which indicates the rate at which the storage life of the lot is exhausted, based on the storage temperature included in the storage condition information. The storage life decay rate can be understood as a value indicating how quickly the storage life is exhausted per unit time, and it can be interpreted that the larger the decay rate, the faster the storage life of the material is exhausted, and the smaller the decay rate, the slower the storage life is exhausted. Since the reaction proceeding in uncured epoxy has the characteristic of accelerating as the temperature increases, the processor of the electronic device (100) can calculate a large decay rate for lots with high storage temperatures and a small decay rate for lots with low storage temperatures.
[0110] The reason the processor of the electronic device (100) calculates the storage life decay rate in conjunction with the storage temperature may be that the deterioration of uncured epoxy is not determined solely by the passage of time but is largely dependent on the temperature environment to which the material is exposed. For example, a lot stored in a refrigerated state may have a long storage life because the reaction progress is suppressed and the decay rate is calculated to be small, whereas a lot stored at room temperature or a higher temperature may have its storage life quickly depleted because the reaction is accelerated and the decay rate is calculated to be large. By individually calculating the decay rate that varies according to the storage temperature for each lot, the processor of the electronic device (100) can reflect the actual storage environment faced by each lot in the calculation of the remaining storage life.
[0111] The processor of the electronic device (100) can calculate and apply a single decay rate when the storage temperature is maintained constant during the storage period, and when the storage temperature fluctuates during the storage period, it can calculate and apply a decay rate corresponding to the storage temperature of each time interval for each interval. For example, if a specific lot is initially stored in a refrigerated state and then moved to a room temperature for storage, the processor of the electronic device (100) can calculate a small decay rate for the refrigerated interval and a large decay rate for the room temperature interval, thereby distinguishing and reflecting the degree of depletion for each interval. Calculating the decay rate for each interval in this way can be a method of precisely reflecting the fluctuating storage environment.
[0112] The processor of the electronic device (100) may utilize information related to the reaction characteristics of the material to calculate the storage life decay rate. Since the reaction sensitivity to temperature may vary depending on the type of epoxy raw material, the processor of the electronic device (100) may refer to the reaction characteristics determined for each material to calculate different decay rates depending on the type of material even under the same temperature conditions. This information on reaction characteristics may be obtained from technical data provided by the material supplier or from previously performed test results, and may be transmitted to the electronic device (100) via an external server (220) to be reflected in the calculation of the decay rate.
[0113] The processor of the electronic device (100) can store the calculated storage life decay rate in association with lot identification information and use it as an intermediate value for calculating the remaining storage life. Since the storage life decay rate is a value that quantitatively indicates the rate of physical degradation of the material, the processor of the electronic device (100) can perform an operation to convert an environmental condition called storage temperature into a usable period called remaining storage life using this value as a medium. Therefore, the accurate calculation of the decay rate can serve as a prerequisite for reflecting temperature-dependent material degradation in the management system.
[0114] According to one embodiment, the processor (120) can calculate the remaining storage life based on the calculated storage life decay rate and the elapsed time from the time of entry (S420).
[0115] The processor of the electronic device (100) can calculate the remaining storage life of the lot based on the calculated storage life decay rate and the elapsed time from the time of receipt. Here, the elapsed time may refer to the time that has passed from the time a specific lot was received until the present, and the processor of the electronic device (100) can calculate the elapsed time by comparing the information at the time of receipt with the current time. Since the remaining storage life has a relationship where it is calculated to be smaller as the decay rate increases and the elapsed time increases, the processor of the electronic device (100) can combine these two factors to quantitatively determine how much longer each lot remains in a usable state at the current time.
[0116] The processor of the electronic device (100) can calculate different remaining storage lifespans depending on the decay rate, even for lots that have elapsed the same elapsed time, by considering the decay rate and the elapsed time together. For example, among two lots that were received at the same time and have elapsed the same amount of time, the lot that was stored at a high temperature and has a large decay rate may have a shorter remaining storage life than the lot that was stored at a low temperature and has a small decay rate. In this way, the processor of the electronic device (100) can derive a remaining storage life corresponding to the thermal history actually experienced by the material by combining the element of the elapsed time and the element of the decay rate due to temperature.
[0117] The processor of the electronic device (100) can calculate the remaining storage life by cumulatively reflecting the decay rate of each time interval and the elapsed time of that interval when the storage temperature fluctuates during the storage period. For example, if a specific lot is stored in a refrigerated state for a certain period and then stored at room temperature for the remainder of the period, the processor of the electronic device (100) can calculate the gradual depletion in the refrigerated interval and the accelerated depletion in the room temperature interval, respectively, sum them up to calculate the total depletion amount, and then calculate the remaining storage life by subtracting this from the initial storage life. This cumulative reflection can be a calculation method that accurately reflects the actual situation where the storage environment changes.
[0118] The processor of the electronic device (100) can periodically update the calculated remaining storage life as time passes. Since the elapsed time increases as time goes by, the remaining storage life continuously decreases, and the processor of the electronic device (100) can update the elapsed time at a set period and recalculate the remaining storage life accordingly to maintain it in the latest state. In addition, if the storage temperature is newly changed, the processor of the electronic device (100) can adjust the subsequent depletion rate by reflecting the decay rate corresponding to the changed temperature, thereby allowing the change in the storage environment to be immediately reflected in the remaining storage life.
[0119] The processor of the electronic device (100) can provide the calculated remaining storage life to the manager via the user terminal (210) or use it as an input for subsequent processing, including updating available inventory and calculating predicted quality indicators. Since the remaining storage life is a quantitative value calculated by combining the decay rate and elapsed time, the processor of the electronic device (100) can consistently determine the availability and priority of use of the material based on this value. Therefore, the calculation of the remaining storage life based on the decay rate and elapsed time can be a method of managing temperature-dependent degradation and time-dependent degradation by integrating them into a single value.
[0120] According to one embodiment, the processor (120) may exclude epoxy raw material of a lot whose calculated remaining storage life is less than the standard storage life from the available inventory (S430).
[0121] The processor of the electronic device (100) may exclude epoxy raw material of a lot whose calculated remaining storage life is less than the standard storage life from the available inventory. Here, the standard storage life may refer to the lower limit of the minimum remaining storage life required for the material to be recognized as being usable for producing parts of normal quality, and materials whose remaining storage life has decreased below this value may be treated as difficult to guarantee part quality. The processor of the electronic device (100) may compare the remaining storage life of each lot with this standard and exclude materials of lots that do not meet the standard from the actual usable inventory.
[0122] The reason the processor of the electronic device (100) excludes lots with a standard storage life below the available inventory is that there is a high risk that the finished parts will not meet specifications if materials with an excessively depleted remaining storage life are introduced into production. Since the heat resistance of the parts after curing may rapidly deteriorate if the remaining storage life of uncured epoxy falls below a certain level, the processor of the electronic device (100) can prevent a situation in which deteriorated materials are mistaken for normal inventory and introduced into production by excluding such materials from the available inventory in advance. This exclusion process can serve as a safety mechanism that directly reflects the physical state of the material in inventory management.
[0123] The processor of the electronic device (100) can set a standard storage life differently depending on the type of material or the required quality of the component. For materials used in components requiring high heat resistance, a relatively high standard storage life can be set so that they are excluded even if only a small portion of the remaining storage life is depleted, and for materials used in components where relatively relaxed quality is allowed, a low standard storage life can be set so that they are used for a longer period. For example, the processor of the electronic device (100) can determine whether to include materials with the same remaining storage life differently depending on which component they are assigned to production.
[0124] The processor of the electronic device (100) may treat lots excluded from available inventory as items for complete disposal, or manage them by classifying them into a separate state. For example, the processor of the electronic device (100) may exclude lots determined to be below a standard storage life from available inventory but separately mark them as materials physically present in a warehouse, allowing an administrator to check their status through a user terminal (210) and decide on subsequent actions such as disposal or return. By classifying and managing excluded materials in this way, the processor of the electronic device (100) can clearly distinguish between physical inventory and available inventory and maintain transparency in management.
[0125] The processor of the electronic device (100) can also dynamically perform the process of excluding available stock as the remaining storage life is periodically updated. Materials from a lot may initially be included in the available stock as they satisfy the standard storage life, but may be automatically excluded from the available stock if the remaining storage life decreases below the standard as time passes. The processor of the electronic device (100) can notify the manager in advance of lots that are close to being excluded to induce priority depletion, thereby contributing to reducing material waste by ensuring that the materials are utilized in production before they fall below the standard storage life and are discarded.
[0126] According to one embodiment, a method of operation for an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material may further include: an operation in which a processor calculates a safety stock amount based on the variability of demand information and the procurement lead time of the epoxy raw material; an operation in which the processor determines a reordering time for the epoxy raw material based on the calculated safety stock amount and the remaining storage life; and an operation in which the processor generates an order request for the epoxy raw material when the reordering time is reached.
[0127] The processor of the electronic device (100) can calculate a safety stock amount to prepare for uncertainties in supply and demand based on the variability of demand information and the lead time for procuring epoxy raw materials. The safety stock amount may refer to an additional amount of stock secured to prevent stockouts in preparation for situations where demand increases more than expected or the procurement of materials is delayed more than expected, and may be a reserve calculated separately from the stock required to meet normal demand. By calculating this safety stock amount, the processor of the electronic device (100) can mitigate the risk of production being halted due to a shortage of materials even in uncertain situations.
[0128] The volatility of demand information may refer to the degree to which the demand for a specific part fluctuates significantly around an average level; the greater the volatility, the higher the likelihood that actual demand will deviate significantly from the forecast, and thus a larger safety stock may be required. For example, if the order quantity for a specific part fluctuates significantly from time to time, the processor of the electronic device (100) may calculate a large safety stock to prepare for a situation where demand surges. Conversely, for a part where demand remains stable at a constant level, the processor of the electronic device (100) may calculate a relatively small safety stock to suppress unnecessary inventory holding.
[0129] The procurement lead time refers to the period required from the time the epoxy raw material is ordered from the supplier until the material is actually received and becomes available for use. The longer the procurement lead time, the larger the safety stock amount may be, as more inventory must be secured in advance to meet demand during that period. For example, if the procurement of the material takes a long time, the processor of the electronic device (100) may calculate a large safety stock amount to prevent the inventory from being depleted before the procurement is completed. The processor of the electronic device (100) may receive procurement lead time information from an external server (220) linked to the material supplier and reflect it in the calculation of the safety stock amount.
[0130] The processor of the electronic device (100) can reflect two uncertainty factors simultaneously by calculating the safety stock amount by considering both demand variability and procurement lead time. When demand fluctuates significantly and the procurement lead time is long, the processor of the electronic device (100) can calculate a particularly large safety stock amount because both factors act in a way that increases the risk of stockouts. Conversely, when demand is stable and the procurement lead time is short, the processor of the electronic device (100) can calculate a small safety stock amount by determining that the risk of stockouts is low. This method of calculating by combining the two factors can contribute to securing an appropriate level of spare stock that is suitable for the situation.
[0131] The processor of the electronic device (100) can use the calculated safety stock amount as an input for determining the reordering time, and can also consider the safety stock amount so that it does not conflict with the remaining storage life of the material. Since securing a large safety stock amount reduces the risk of stockouts but increases the risk of the material being stored for a long time and its storage life being exhausted, the processor of the electronic device (100) can adjust the safety stock amount to strike a balance between the conflicting goals of preventing stockouts and suppressing material obsolescence. Therefore, the calculation of the safety stock amount can serve as the basis for a stock replenishment plan that takes into account the physical constraints of the material.
[0132] The processor of the electronic device (100) can determine the reordering time, which is the point at which the epoxy raw material must be reordered, based on the calculated safety stock amount and remaining storage life. The reordering time may refer to a point in time when the current inventory decreases to a certain level and there is a risk of a shortage of inventory before procurement is completed if new materials are not ordered. The processor of the electronic device (100) can continuously monitor whether the inventory has reached this point and, if it has, trigger an order, thereby managing the inventory so that it does not run out even considering the procurement lead time.
[0133] The processor of the electronic device (100) can reflect a safety stock level when determining the reorder timing, taking into account a margin for uncertainty in addition to the inventory level required to meet normal demand. For example, the level of the inventory requiring reordering can be set by adding the safety stock level to the expected demand during the procurement lead time, and the time when the actual inventory decreases to this level can be determined as the reorder timing. By reflecting the safety stock level in this way, the processor of the electronic device (100) can induce reordering with a margin to prevent stockouts even if demand increases or procurement is delayed during the procurement period.
[0134] The processor of the electronic device (100) can take into account the remaining storage life when determining the reordering time, so that physical constraints of the material are reflected in the inventory replenishment. If the remaining storage life of the currently held inventory is short and it is expected that a significant portion will decrease below the standard storage life within the procurement lead time, the processor of the electronic device (100) may determine that it is difficult to continue maintaining such material as actual available inventory and advance the reordering time. Conversely, if the remaining storage life of the held inventory is sufficient, the processor of the electronic device (100) may determine that the material will remain in a usable state even during the procurement period and delay the reordering time.
[0135] When determining the reorder timing, the processor of the electronic device (100) may also consider the risk of material obsolescence due to excessively early ordering. If the reorder timing is set too early, the risk of the newly procured material being stored for a long time before use and its shelf life being exhausted increases, and if the reorder timing is set too late, the risk of inventory running out during the procurement period increases; therefore, the processor of the electronic device (100) may determine the reorder timing as a point that balances these two risks. For example, the processor of the electronic device (100) may evaluate the risk of stockout and the risk of obsolescence together and select the reorder timing as a point where the newly procured material can be consumed before it becomes obsolete, while ensuring that inventory is not depleted during the procurement period.
[0136] The processor of the electronic device (100) can dynamically recalculate the reorder time by reflecting the updated available inventory quantity and remaining storage life in order to continuously monitor the determined reorder time. If demand is depleted faster than expected or the remaining storage life of the material decreases faster than expected, the processor of the electronic device (100) can adjust the reorder time forward and notify the manager through the user terminal (210) to induce preparation for ordering. In this way, the determination of the reorder time can be a dynamic process that is adjusted according to changes in the material condition and demand situation, rather than a fixed value.
[0137] The processor of the electronic device (100) can generate an order request for epoxy raw material when the reorder time determined by the inventory is reached. An order request may refer to information requesting the supply of material from a supplier to replenish materials expected to be in short supply, and may include information such as the type and quantity of the material to be ordered and the desired delivery date. By generating an order request immediately upon detecting the arrival of the reorder time, the processor of the electronic device (100) can reduce the risk of stockout by ensuring that inventory replenishment is carried out without delay.
[0138] The processor of the electronic device (100) can calculate an appropriate order quantity when generating an order request. The order quantity can be determined within a range where the procured material is consumed within its shelf life, while satisfying future expected demand and safety stock levels. For example, the processor of the electronic device (100) can reflect a quantity in the order request that balances the risk of obsolescence and the frequency of ordering, taking into account that if an excessively large amount is ordered at once, there is a high risk that the material's shelf life will be exhausted before it is used. Calculating the order quantity while considering the shelf life in this way can be a method of reflecting the physical constraints of the material at the ordering stage.
[0139] The processor of the electronic device (100) can process the generated order request in various ways. The processor of the electronic device (100) can present the order request to the manager via the user terminal (210) so that the order proceeds after the manager approves it, and can support the manager in adjusting and confirming the order quantity or delivery date. In addition, the processor of the electronic device (100) can transmit the generated order request to the material supplier's system via an external server (220) so that the order procedure is automatically initiated. In this way, the method of processing the order request can be implemented in various ways depending on the degree of intervention by the manager.
[0140] The processor of the electronic device (100) can track and manage the progress status of an order even after the order request has been generated. During the process from the receipt of the order to the procurement and delivery of materials, the processor of the electronic device (100) can receive information such as the order progress or the expected delivery time from an external server (220) and reflect it in the inventory plan. For example, if a situation is detected where procurement is delayed more than expected, the processor of the electronic device (100) can respond to the risk of stockouts by reflecting this and readjusting the reordering time or generating an additional order request. Through this, the processor of the electronic device (100) can include the uncertainty after the order in its management scope.
[0141] The processor of the electronic device (100) can store and manage the history regarding the creation, processing, and tracking of order requests in association with lot identification information. Newly procured and received materials are again classified by lot, and information on the time of receipt and storage conditions is obtained, and subsequently, can be incorporated into a management flow that includes calculating the remaining storage life and updating the available inventory amount. In this way, the creation of an order request can serve as a starting point for inventory replenishment and play a role in continuing the cyclical flow of material management, and the processor of the electronic device (100) can consistently manage the entire process from ordering to receipt and depletion.
[0142] According to one embodiment, a method of operation for an electronic device that performs material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material may further include: a processor calculating a holding cost and an obsolescence cost corresponding to a pre-production method; a processor calculating an obsolescence cost as the remaining storage life is shorter; and a processor determining a pre-production method if the sum of the calculated holding cost and obsolescence cost is less than the stockout cost corresponding to a build-to-order method, and determining a build-to-order method otherwise.
[0143] The processor of the electronic device (100) can calculate holding costs and obsolescence costs corresponding to the pre-production method. Since the pre-production method involves securing materials in advance or manufacturing parts in advance and holding them as inventory before an order for parts is confirmed, costs associated with storing materials or parts and costs associated with the loss of value due to material degradation during storage may occur together. By calculating each of these two types of costs, the processor of the electronic device (100) can quantitatively determine the economic burden incurred when adopting the pre-production method.
[0144] Holding costs may refer to costs incurred while holding materials or parts in inventory, and may include factors such as costs for renting and managing a warehouse, opportunity costs of funds tied up in inventory, and costs for refrigeration or maintaining a constant temperature required during storage. For example, if uncured epoxy is stored in a refrigerated state to delay the depletion of its shelf life, the processor of the electronic device (100) may reflect the costs incurred in operating the refrigeration equipment in the holding costs. Since holding costs typically tend to increase in proportion to the quantity and duration of inventory holding, the processor of the electronic device (100) may calculate holding costs by considering the quantity held and the expected holding period.
[0145] Obsolescence costs may refer to the costs associated with the loss of value when a material loses its storage life while being stored and can no longer be used for normal component production. Since uncured epoxy loses its storage life over time and eventually becomes unsuitable for component production, this loss of value can be a cost unique to the pre-production method. The processor of the electronic device (100) can quantify and calculate the risk of the material becoming obsolete and being discarded, and the resulting loss, as obsolescence costs, thereby incorporating the economic loss caused by the physical constraint of storage life into the management scope.
[0146] The processor of the electronic device (100) can calculate holding costs and obsolescence costs as separate components for evaluating the pre-production method, and can reflect the fact that the nature of the two costs is different. Holding costs are costs incurred from the act of holding inventory itself, regardless of the physical degradation of the material, whereas obsolescence costs are costs resulting from physical degradation caused by the exhaustion of the material's storage life. By calculating these two costs separately, the processor of the electronic device (100) can evaluate the general burden associated with holding inventory and the burden associated with the degradation specific to the material, respectively, and reflect this in the decision of the production method.
[0147] The processor of the electronic device (100) can reflect the calculated holding costs and obsolescence costs differently depending on the type of component or the characteristics of the material. In the case of a component using a material with a short shelf life and strict storage conditions, the processor of the electronic device (100) can calculate both the holding costs and obsolescence costs significantly, so the burden of the pre-production method can be evaluated as high. Conversely, in the case of a component using a material with a long shelf life and easy storage, the processor of the electronic device (100) can calculate both costs low, so the burden of the pre-production method can be evaluated as low. The costs calculated in this way can serve as basic data for comparison in determining the production method thereafter.
[0148] The processor of the electronic device (100) can calculate a higher obsolescence cost as the remaining storage life becomes shorter. This may reflect the fact that the risk of obsolescence associated with securing and holding the material in advance is greater because materials with a short remaining storage life are more likely to become obsolete and discarded without being used. By linking the remaining storage life and the obsolescence cost in an inverse relationship, the processor of the electronic device (100) can allow the physical condition of the material to be directly reflected in the economic evaluation.
[0149] The method by which the processor of the electronic device (100) calculates obsolescence costs inversely proportional to the remaining storage life can have the effect of making it disadvantageous to use the material in pre-production as the degree of degradation of the material increases. For example, in the case of a material with a sufficient remaining storage life, the processor of the electronic device (100) may calculate a low obsolescence cost by determining that the material is likely to be used before it becomes obsolete. Conversely, in the case of a material with a significantly depleted remaining storage life, the processor of the electronic device (100) may calculate a high obsolescence cost by determining that the material is likely to be discarded without being used.
[0150] The processor of the electronic device (100) can calculate the obsolescence cost by maintaining it at a low level when the remaining storage life is close to the initial storage life, and gradually increasing the obsolescence cost as the remaining storage life is exhausted. For example, at the time immediately after the material is received and most of the remaining storage life remains, the obsolescence cost is calculated to be almost non-existent; at the time when the remaining storage life decreases to less than half as time passes, the obsolescence cost is calculated to be substantial; and at the time when the remaining storage life approaches the standard storage life, the obsolescence cost is calculated to be very large. This method can be a calculation that reflects the actual situation where the risk of pre-production increases as the degradation of the material progresses.
[0151] The processor of the electronic device (100) can quantitatively link the physical degradation of the material and the selection of the production method through the obsolescence cost calculated in this way. Since the obsolescence cost is calculated to be inversely proportional to the remaining storage life, the obsolescence cost when a material with a short remaining storage life is introduced into pre-production increases, making the pre-production method relatively disadvantageous, while the obsolescence cost of a material with a long remaining storage life is low, making the pre-production method relatively advantageous. This linkage can serve as a key mechanism for reflecting the physical constraint of the material's storage life in the decision of the production method.
[0152] The processor of the electronic device (100) can dynamically recalculate obsolescence costs as the remaining storage life is periodically updated. As time passes and the remaining storage life of a specific material decreases, the processor of the electronic device (100) can re-evaluate the advantages and disadvantages of using that material for pre-production by reflecting the increased obsolescence costs accordingly. Through this, the processor of the electronic device (100) can continuously update the evaluation of the production method in accordance with changes in the state of the material, and can cause a material that was advantageous for pre-production at a specific point in time to be re-evaluated as a material advantageous for order-based production as time passes and obsolescence costs increase.
[0153] The processor of the electronic device (100) may decide to use the pre-production method if the sum of the calculated holding costs and obsolescence costs is less than the stockout cost corresponding to the order-based production method, and otherwise decide to use the order-based production method. Here, the stockout cost may refer to losses that may occur when production begins after an order is placed by adopting the order-based production method, and may include factors such as losses due to delivery delays or opportunities lost due to the inability to supply immediately. The processor of the electronic device (100) may select the economically advantageous method between the two methods by comparing the costs of the pre-production method and the costs of the order-based production method.
[0154] The reason the processor of the electronic device (100) takes the sum of holding costs and obsolescence costs as the total cost of the pre-production method and compares it with the stockout cost may be that the nature of the costs incurred by each method is different. The pre-production method generates holding costs and obsolescence costs by securing and storing materials or parts in advance, whereas the order-based production method generates stockout costs because it cannot supply immediately upon ordering due to not securing them in advance. The processor of the electronic device (100) can evaluate these conflicting cost structures in the form of a comparison and make a rational decision to select the method with the lower total cost.
[0155] The processor of the electronic device (100) can specifically implement the influence of the remaining storage life of the material on the selection of the production method through such cost comparison. In the case of a material with a sufficient remaining storage life, the obsolescence cost is calculated to be low, and since the sum with the holding cost is likely to be smaller than the stockout cost, the processor of the electronic device (100) may have a tendency to select the pre-production method. Conversely, in the case of a material with a significantly depleted remaining storage life, the obsolescence cost is calculated to be high, and since the sum with the holding cost is likely to exceed the stockout cost, the processor of the electronic device (100) may have a tendency to select the order-based production method. In this way, the production method can be implemented to naturally switch according to the physical state of the material.
[0156] The processor of the electronic device (100) calculates the results of cost comparison differently depending on the type of part or the time, and can select different production methods depending on the situation, even for the same part. For example, in the case of a part using a material with stable demand and a sufficient remaining shelf life, the processor of the electronic device (100) may determine that the pre-production method is advantageous. On the other hand, even for the same part, when time passes and the remaining shelf life of the material is exhausted and obsolescence costs increase, the processor of the electronic device (100) may determine that the order-based production method is advantageous and switch the production method. Such dynamic decisions can result in a reflection of changes in the material condition and demand situation.
[0157] The processor of the electronic device (100) can present the production method determined by cost comparison to the manager through the user terminal (210), and can provide the holding cost, obsolescence cost, and stockout cost that served as the basis for the decision together so that the manager can verify the validity of the decision. The manager can review the production method and cost information presented through the user terminal (210) and, if necessary, adjust the calculation criteria for each cost or modify the decision result. Thus, determining the production method by cost comparison is a process of converting the physical constraints of the material into an economic evaluation and concretizing it into a production plan, and thus can serve as a key judgment for reflecting the physical factor of shelf life into production operations.
[0158] According to one embodiment, a method of operation of an electronic device for performing material-part linked inventory management and production method determination based on the remaining storage life of an epoxy raw material may further include: a processor storing identification information of a lot input into a produced epoxy heat-resistant part in association; a processor identifying an associated lot when a defect occurs in the produced epoxy heat-resistant part; and a processor updating upward a reference quality or reference storage life corresponding to the identified lot.
[0159] The processor of the electronic device (100) can store identification information of the lot used in the manufacture of the produced epoxy heat-resistant part by associating it with the part. Here, the lot identification information may refer to unique information assigned to distinguish a specific lot from another lot, and may include information such as a lot number, the date of receipt, and the type of material. The processor of the electronic device (100) can maintain the correspondence between the part and the material in a form that can be verified even after the fact by recording for each completed part which lot's material the part was manufactured from.
[0160] The reason the processor of the electronic device (100) stores lot identification information associated with a part may be that the quality exhibited by the finished part is closely linked to the characteristics of the material used in that part. Since physical characteristics such as the remaining shelf life or thermal history of uncured epoxy can affect the heat resistance of the part after curing, recording which part was manufactured with which state of material allows the cause of the part's quality to be traced back to the material stage. Through this associated storage, the processor of the electronic device (100) can manage the flow from the material to the part in a traceable form.
[0161] The processor of the electronic device (100) can implement various methods for associating parts and lot identification information. The processor of the electronic device (100) may assign unique part identification information to each part and store the lot identification information corresponding to the part identification information, and if a single part is manufactured from materials supplied from multiple lots, it may store the related multiple lot identification information together. In addition, the processor of the electronic device (100) may store the parts produced at a specific production time by grouping the lot introduced at that time with the parts produced at that time together.
[0162] The processor of the electronic device (100) can store additional information, such as the remaining storage life or predicted quality indicator of a lot, in addition to lot identification information stored in association with a part. For example, if the remaining storage life of a lot that was input at the time a specific part was produced is recorded, it can be used to analyze the relationship with the state of the material when evaluating the quality of the part later. By accumulating this additional information, the processor of the electronic device (100) can obtain data to determine the correlation between the physical state of the material and the quality of the part.
[0163] The processor of the electronic device (100) can provide the information stored in association through the user terminal (210) to the manager or transmit it to an external server (220) to share it with the system of the ordering party or the supplier. The manager can look up which lot of material a specific part was manufactured from through the user terminal (210), thereby ensuring transparency of the production history. Since such association storage serves as a basis for tracing back the material that caused the defect when it occurs later, it can serve as a starting point for part quality control.
[0164] The processor of the electronic device (100) can identify the lot stored in association with the component when a defect occurs in the produced epoxy heat-resistant component. Here, a defect may refer to a state in which the finished component does not satisfy the specifications of the ordering party or the required quality standards, and may include cases where the heat resistance characteristics do not meet the required level, such as when the glass transition temperature of the component falls below the lower limit of the specification. The processor of the electronic device (100) can identify the material that may have caused the defect by confirming which lot of material the component was manufactured from for the component determined to be defective.
[0165] The reason the processor of the electronic device (100) identifies the associated lot when a defect occurs is to determine the possibility that the defect in the part may be caused by physical degradation of the material. Since manufacturing a part with a material in which the remaining shelf life of uncured epoxy has been excessively depleted can lead to a decrease in heat resistance and cause a defect, identifying the lot associated with the defective part allows for the analysis of how the remaining shelf life or storage conditions of that lot are related to the defect. The processor of the electronic device (100) can utilize this identification to determine the cause of the defect at the material stage.
[0166] In the process of identifying a lot associated with a defective part, the processor of the electronic device (100) may refer to lot identification information previously stored in association with the part. The processor of the electronic device (100) may identify a lot associated with the defect by querying lot identification information corresponding to the part based on the part identification information of the defective part. If a single part is manufactured from materials supplied from multiple lots, the processor of the electronic device (100) may identify all multiple related lots and estimate a lot highly associated with the defect by comparing the remaining storage life or storage conditions of each lot.
[0167] The processor of the electronic device (100) can analyze information regarding the identified lot to determine the relationship between defects and material characteristics. For example, if the lots identified from multiple defective parts commonly have a low remaining storage life or a history of exposure to high storage temperatures, the processor of the electronic device (100) can determine that defects occur intensively in a specific remaining storage life range or under specific storage conditions. By analyzing the characteristics of the identified lot in this way, the processor of the electronic device (100) can quantitatively understand which material condition causes the part defects.
[0168] The processor of the electronic device (100) can provide the identification result of the lot associated with the occurrence of a defect to the manager through the user terminal (210). The manager can check which lot is associated with the defect through the user terminal (210) and determine follow-up actions, such as checking other parts manufactured from the same lot or taking care of other materials with the same characteristics. For example, if a specific lot is identified as being associated with a defect, the processor of the electronic device (100) can contribute to preventing the spread of the defect by presenting other parts manufactured from that lot as targets for inspection together.
[0169] The processor of the electronic device (100) can update the standard quality or standard shelf life corresponding to the identified lot upward. Here, the standard quality may refer to the minimum quality level required for the finished part to satisfy specifications, and the standard shelf life may refer to the lower limit of the remaining shelf life required for the material to be recognized as usable in normal part production. When a lot associated with defects is identified, the processor of the electronic device (100) can prevent a situation in which materials in a similar condition are re-entered into production and cause defects by adjusting these standards in a stricter direction.
[0170] The reason the processor of the electronic device (100) updates the standard upward may be that the occurrence of defects suggests that the existing standard was insufficient to filter out actual defects. If a defect occurs in a material that was put into production after being judged to satisfy a specific remaining storage life or predicted quality indicator, it is possible that the judgment standard was excessively lenient; therefore, the processor of the electronic device (100) may strengthen the standard so that materials in a similar state are excluded thereafter. Such standard updating can be a process of improving management standards based on actual quality data.
[0171] The processor of the electronic device (100) can more strictly exclude from available stock materials whose remaining storage life does not meet the new standard by updating the reference storage life upward. For example, if defects repeatedly occur in a part manufactured with a material having a specific remaining storage life level, the processor of the electronic device (100) can raise the reference storage life to a higher level so that only materials with a longer remaining storage life are subsequently fed into production. This can reduce the possibility of recurrence of defects caused by material degradation.
[0172] The processor of the electronic device (100) can update the standard quality upward so that only materials whose predicted quality indicators satisfy the new standard are prioritized for production. For example, if a defect occurs even though it was predicted to satisfy the existing standard quality, the processor of the electronic device (100) can raise the standard quality to a higher level so that only materials predicted to satisfy the specifications more comfortably are subsequently introduced into production. Such reinforcement of the standard quality can contribute to increasing the stability of component quality by operating the priority allocation based on the predicted quality indicator more conservatively.
[0173] The processor of the electronic device (100) can implement a cyclic structure in which management standards are continuously adjusted to correspond to actual quality data by repeatedly performing upward updates of such standards as the history of defect occurrences accumulates. Since the associated lot is identified and the corresponding standard is updated whenever a defect occurs, the processor of the electronic device (100) can gradually strengthen management standards while minimizing intervention by the manager. The results of these updates can be provided to the manager through the user terminal (210) to verify the validity of the standard change, thereby enabling a system in which material management and component quality management develop in conjunction.
[0174] Meanwhile, the processor of the electronic device (100) can calculate the predicted glass transition temperature of the epoxy heat-resistant component to be produced from a specific lot based on the remaining storage life and initial storage life of the lot as a predicted quality indicator, and the following mathematical formula 1 can be used.
[0175] <Mathematical Formula 1>
[0176]
[0177] The processor of the electronic device (100) may take Tg, which represents the predicted glass transition temperature in Equation 1, as the target for calculation. Here, the glass transition temperature is the temperature at which a polymer material transitions from a glass state to a rubber state and can be a physical property representing the heat resistance characteristics of an epoxy heat-resistant component. Since components for semiconductor inspection equipment must maintain their shape and rigidity within a narrow temperature range, components with a glass transition temperature below the lower limit of the standard may soften in the usage environment and be judged as defective. The processor of the electronic device (100) can predict the heat resistance characteristics of the component in advance by estimating the glass transition temperature from the physical state of the material rather than taking actual measurements after completion.
[0178] The processor of the electronic device (100) may treat Tg0, which represents the glass transition temperature of the unheated state in Equation 1, as the upper limit of the glass transition temperature obtained in an ideal state where the material is not heated at all. Tg0 may correspond to the maximum value at which the predicted glass transition temperature converges when the remaining storage life is equal to the initial storage life and there is no depletion, and the processor of the electronic device (100) may obtain Tg0 from technical data provided by the material supplier or from the actual measured value of a part manufactured with the unheated material, receive it via an external server (220), or refer to it as a preset value.
[0179] The processor of the electronic device (100) may treat Tgmin, which represents the lower limit of the glass transition temperature that converges upon complete degradation in Equation 1, as the lower limit of the glass transition temperature exhibited by a component manufactured from a material whose storage life has been mostly exhausted. Tgmin may correspond to the minimum value at which the predicted glass transition temperature converges when the remaining storage life approaches zero, and the processor of the electronic device (100) may obtain and reference Tgmin from the actual value of a component manufactured from a comparative example material whose storage life has been exhausted. Tg0 and Tgmin may serve to limit the predicted value to be within a physically valid range by defining the upper and lower limits that the predicted glass transition temperature can take, respectively.
[0180] The processor of the electronic device (100) can treat L / L0, which is the ratio of L representing the remaining storage life and L0 representing the initial storage life in Equation 1, as a dimensionless normalized indicator indicating how much of the material's remaining storage life remains compared to the initial. Since L and L0 are values that have already been calculated in the preceding process or set for each material, the processor of the electronic device (100) can calculate L / L0 by referring to them without separate additional measurements. If L / L0 is close to 1, the material is in a state where it has hardly deteriorated, and if it is close to 0, the material is in a state where it has almost been depleted; therefore, the processor of the electronic device (100) can compare materials with different initial storage lives on the same scale through this ratio.
[0181] The processor of the electronic device (100) can treat k, which represents the degradation sensitivity coefficient in Equation 1, as a value that determines how rapidly the predicted glass transition temperature changes in response to changes in the remaining storage life ratio. Since the glass transition temperature drops steeply near the critical point as k increases and changes gradually as k decreases, the processor of the electronic device (100) can reflect the degradation behavior that varies depending on the type of material through k. The processor of the electronic device (100) can determine and reference k in a regression manner by corresponding Equation 1 to the measured values of the glass transition temperatures of parts manufactured with comparative example materials of various remaining storage life levels.
[0182] The processor of the electronic device (100) can treat r, which represents the threshold point of the remaining storage life ratio where a sharp drop occurs in Equation 1, as the position of the remaining storage life ratio where the predicted glass transition temperature begins to drop rapidly. In the range where L / L0 is sufficiently larger than r, the predicted glass transition temperature maintains a high value close to Tg0, and when L / L0 decreases near r, the glass transition temperature drops rapidly and converges toward Tgmin. The processor of the electronic device (100) can obtain and reference this r from the remaining storage life ratio where the glass transition temperature begins to drop rapidly below the lower specification limit in comparative example data, and by adjusting r, different sharp drop points can be reflected for each material.
[0183] The fact that the processor of the electronic device (100) calculates the predicted glass transition temperature in the form of Equation 1 can correspond to the physical fact that the decrease in the glass transition temperature due to the decrease in the remaining storage life ratio does not exhibit linear behavior at a constant rate throughout the entire range, but rather non-linear behavior that proceeds rapidly near a specific critical point. Uncured epoxy does not significantly degrade the heat resistance of the component after curing while there is a considerable remaining storage life, but when the remaining storage life falls below a certain level, the crosslinking density decreases rapidly, and the glass transition temperature may show a tendency to drop steeply. The processor of the electronic device (100) can quantitatively reproduce this rapid drop behavior by using a function that is gradual near the critical point, drops sharply, and then becomes gradual again.
[0184] The processor of the electronic device (100) can compare the predicted glass transition temperature calculated through Equation 1 with the standard quality corresponding to the lower limit of the glass transition temperature required by the standard, and prioritize allocating lots in which the predicted glass transition temperature satisfies the standard quality for production. At this time, since Equation 1 includes the threshold point r as an explicit parameter, the processor of the electronic device (100) can preemptively identify lots before the remaining storage life ratio approaches r, thereby blocking the input of materials expected to be substandard in advance. While a method of simply allocating materials in order of maximum remaining storage life does not consider the point of sharp decline and carries the risk of inputting materials near the lower limit of the standard, Equation 1 makes a judgment based on the point of sharp decline, so materials with a high risk of substandard quality can be excluded more accurately.
[0185] The differential effect obtained by the processor of the electronic device (100) using mathematical formula 1 may be that it quantitatively converts the remaining storage life, which is the physical state of the material, into the glass transition temperature, which is a specific physical property of the finished part, and even reflects the non-linear drop characteristic of the relationship. Through this, the processor of the electronic device (100) can connect material management and part quality management into a single formula, thereby preventing the production of substandard parts in advance and contributing to reducing defects found during inspection after completion. In addition, by specifying the critical point r as a parameter, the processor of the electronic device (100) can adjust the prediction criteria to match the drop point of the material even if the type of material or part changes, thereby securing scalability applicable to various materials and parts.
[0186] Meanwhile, the processor of the electronic device (100) can calculate the storage life decay rate based on the storage temperature and the reaction characteristics of the material, and the following mathematical formula 2 can be used.
[0187] <Mathematical Formula 2>
[0188]
[0189] The processor of the electronic device (100) can treat lambda (λ), which represents the storage life decay rate in Equation 2, as the rate at which the storage life is exhausted per unit time, and can interpret that the larger lambda is, the faster the storage life of the material is exhausted. Since Equation 2 follows a form that expresses the behavior of the chemical reaction rate increasing exponentially with respect to absolute temperature, the processor of the electronic device (100) can reflect in lambda the physical characteristic that the degradation of uncured epoxy accelerates exponentially rather than being simply proportional to temperature.
[0190] The processor of the electronic device (100) may treat A, which represents the frequency factor in mathematical formula 2, as a measure of the frequency at which a reaction of the material can occur, and A may be a value determined according to the type and composition of the material. The processor of the electronic device (100) may obtain A from reaction characteristic data or prior test results provided by the material supplier and receive it via an external server (220), or refer to it as a pre-set value. Since A is a value representing the reactivity of the material itself regardless of temperature, the processor of the electronic device (100) can calculate a larger attenuation rate for a material with a large A value even under the same temperature conditions.
[0191] The processor of the electronic device (100) can treat E, which represents the activation energy in Equation 2, as the magnitude of the energy barrier required for the reaction of the material to proceed, and the greater E is, the greater the sensitivity of the decay rate to temperature change. The processor of the electronic device (100) can obtain and reference E from the reaction characteristic data of the material or from values derived from the degradation rate measured at various temperatures. Since E determines how sensitively the degradation behavior of the material responds to temperature, the processor of the electronic device (100) can reflect the temperature sensitivity of each material in the calculation of the decay rate through E.
[0192] The processor of the electronic device (100) can treat R, representing the gas constant in Equation 2, as a physically determined constant, and R can be referenced as a pre-set fixed value. The processor of the electronic device (100) can obtain T, representing the storage temperature expressed in absolute temperature in Equation 2, from the storage temperature included in the storage condition information, and can reference the measured storage temperature by converting it into an absolute temperature scale. Since T is located in the exponent term of the denominator, the processor of the electronic device (100) can reflect in the calculation result the relationship in which the decay rate increases rapidly when the storage temperature rises and the decay rate decreases rapidly when the storage temperature falls.
[0193] The processor of the electronic device (100) can calculate the remaining storage life based on the calculated storage life decay rate and the elapsed time from the time of entry, and the following mathematical formula 3 can be used.
[0194] <Mathematical Formula 3>
[0195]
[0196] The processor of the electronic device (100) may take L, which represents the remaining storage life in Equation 3, as the subject of calculation, and Equation 3 may express the behavior in which the initial storage life decreases exponentially according to the product of the decay rate and the elapsed time. Since this form of exponential decrease corresponds to the physical characteristic that the degradation of the material does not proceed by a constant amount over time but proceeds at a rate proportional to the remaining storage life, the processor of the electronic device (100) can reproduce the behavior in which the remaining storage life decreases gradually at first, but the absolute magnitude of the decrease changes as time passes.
[0197] The processor of the electronic device (100) may treat L0, which represents the initial storage life in Equation 3, as the initial value of the storage life that was available at the time the material was received, and L0 may be a value determined according to the type of material. The processor of the electronic device (100) may obtain and reference L0 from storage life data provided by the material supplier or from prior test results. The processor of the electronic device (100) may refer to Lambda, which represents the storage life decay rate in Equation 3, as a value calculated in Equation 2, and may calculate and reference t, which represents the elapsed time, from the difference between the information at the time of receipt and the current time.
[0198] When the storage temperature fluctuates during the storage period, the processor of the electronic device (100) can calculate the decay rate corresponding to each time interval using Equation 2 and sequentially apply Equation 3 to the elapsed time of each interval to cumulatively calculate the remaining storage life. For example, if the material is stored through a refrigerated interval and an ambient temperature interval, the processor of the electronic device (100) can calculate the final remaining storage life by reflecting a gradual decrease corresponding to a small decay rate in the refrigerated interval and a steep decrease corresponding to a large decay rate in the ambient temperature interval, and by concatenating the decrease results of each interval. This application by interval can be a method that accurately reflects the fluctuating storage environment.
[0199] The fact that the processor of the electronic device (100) utilizes a combination of mathematical formulas 2 and 3 may have technical significance in that it forms a two-stage structure that converts an environmental condition called storage temperature into an intermediate value called a decay rate, and converts that decay rate and elapsed time into a usable period called remaining storage life. By processing temperature dependency and time dependency separately into two formulas without mixing them into a single formula, the processor of the electronic device (100) can calculate the remaining storage life by independently reflecting the influence of each condition even in situations where the storage temperature fluctuates.
[0200] The differentiating effect obtained by the processor of the electronic device (100) using mathematical formulas 2 and 3 may be that, unlike a method that determines the usability of a material based solely on the order of receipt or elapsed time, it calculates the remaining storage life by quantitatively reflecting the temperature history actually experienced by the material. Through this, the processor of the electronic device (100) can assign different remaining storage lives depending on the storage temperature even for materials received at the same time, and simultaneously reduce errors such as prematurely discarding usable materials or mistaking already degraded materials for normal inventory. In addition, since the remaining storage life calculated in mathematical formulas 2 and 3 is commonly referenced in subsequent processing including the calculation of the predicted glass transition temperature and the calculation of obsolescence costs, the processor of the electronic device (100) can consistently link material management, quality management, and production planning on a single quantitative basis.
[0201] Meanwhile, the processor of the electronic device (100) can calculate the re-order point based on the demand rate per unit period, the standard deviation of demand, the procurement lead time, and a safety factor corresponding to the target service level, and the following mathematical formula 4 can be used.
[0202] <Mathematical Formula 4>
[0203]
[0204] The processor of the electronic device (100) may take the ROP, which represents the reorder point in Equation 4, as the target for calculation, and the ROP may be treated as the inventory level at which a new order must be initiated to prevent stockouts during the procurement period when the inventory held decreases to this level. The processor of the electronic device (100) may continuously compare the updated available inventory amount with the ROP and determine the point at which the available inventory amount decreases below the ROP as the reorder point. Since Equation 4 takes the form of summing the average required amount expected during the procurement period and the margin for uncertainty, the processor of the electronic device (100) may determine the reorder level by distinguishing between these two parts.
[0205] The processor of the electronic device (100) can treat the product of d and Ld, which is the first term on the right side of Equation 4, as the amount of demand expected to be consumed on average during the procurement period. Here, d, representing the demand rate per unit period, may mean the amount of a specific part or the material used for that part consumed on average during a unit period, and the processor of the electronic device (100) can derive and reference d from past consumption records included in the demand information. Ld, representing the procurement lead time, may mean the period required from the time the material is ordered until it is received and becomes available for use, and the processor of the electronic device (100) can receive and reference Ld from an external server (220) connected to the material supplier. By multiplying d and Ld, the processor of the electronic device (100) can calculate the amount of inventory expected to be consumed until procurement is completed.
[0206] The processor of the electronic device (100) can treat the product of the square root of sigma and Ld, which is the second term on the right side of mathematical formula 4, as a safety stock quantity to prepare for uncertainty in demand and procurement, and this term can correspond to the safety stock quantity calculated in the preceding process. Here, z, which represents a safety factor corresponding to the target service level, may mean a value determined from the target service level indicating to what extent stockouts will not be allowed, and as the service level is set higher, z becomes larger, and the safety stock quantity may increase. The processor of the electronic device (100) can refer to z, which corresponds to the target service level set by the administrator through the user terminal (210), and reflect the management policy regarding the degree of stockout allowance in the calculation of the reorder point.
[0207] The processor of the electronic device (100) can treat sigma, which represents the standard deviation of demand in mathematical formula 4, as a value indicating how significantly demand fluctuates around the mean per unit period, and interpret that the larger the sigma, the greater the volatility of demand. The processor of the electronic device (100) can derive and reference sigma from the dispersion of past consumption performance included in the demand information. By reflecting the square root of Ld, which represents the procurement lead time, the processor of the electronic device (100) can reflect in the safety stock quantity the relationship in which the uncertainty of demand fluctuation accumulated during that period increases as the procurement period becomes longer.
[0208] The processor of the electronic device (100) proportional to the square root of the term corresponding to the safety stock quantity in mathematical formula 4, rather than simply proportional to the procurement lead time, can correspond to the statistical property that when period-by-period demand fluctuations occurring independently accumulate, the magnitude of the total fluctuation increases in proportion to the square root of the period. By utilizing this form, the processor of the electronic device (100) can secure the necessary margin without calculating the safety stock quantity excessively large when the procurement lead time is long. If the safety stock quantity were simply proportional to the procurement lead time, the safety stock quantity would become excessively large when the procurement period is long, potentially leading to excess inventory and material obsolescence; however, the form of proportional to the square root can suppress such excess.
[0209] The fact that the processor of the electronic device (100) calculates the reorder point using mathematical formula 4 may have technical significance in that it separates and calculates the average required amount during the procurement period and the margin for uncertainty. The processor of the electronic device (100) can quantitatively determine the reorder level to prevent stockouts by reflecting predictable average demand through the first term on the right side and reflecting unpredictable fluctuations through the second term on the right side. In particular, the processor of the electronic device (100) can reflect a management policy regarding whether to prioritize preventing stockouts or suppressing inventory at the reorder point by adjusting a safety factor representing the target service level.
[0210] The differentiating effect obtained by the processor of the electronic device (100) using mathematical formula 4 may be that the reorder point is not set as a fixed value but is dynamically calculated according to changes in the demand rate, demand volatility, and procurement lead time. If demand increases, volatility increases, or procurement lead time becomes longer, the processor of the electronic device (100) can calculate the reorder point upward to respond to the risk of stockouts, and in the opposite case, calculate the reorder point downward to suppress unnecessary inventory holding. Furthermore, the processor of the electronic device (100) can contribute to achieving the conflicting goals of preventing stockouts and suppressing material obsolescence in a balanced manner by considering the reorder point calculated by mathematical formula 4 together with the remaining storage life of the material and adjusting the reorder timing so that excessive orders that are difficult to exhaust within the procurement period are not made.
[0211] Meanwhile, the processor of the electronic device (100) can calculate the obsolescence cost based on the remaining storage life and the initial storage life, and the following mathematical formula 5 can be used.
[0212] <Mathematical Formula 5>
[0213]
[0214] The processor of the electronic device (100) may take Co, which represents the obsolescence cost in Equation 5, as the subject of calculation, and Co may be treated as the cost incurred when the storage life of the material is exhausted and its value is lost while the material is stored. Since Equation 5 has a form in which the obsolescence cost increases in proportion to the degree to which the remaining storage life decreases compared to the initial storage life, the processor of the electronic device (100) can directly convert the degree of physical degradation of the material into an economic cost.
[0215] The processor of the electronic device (100) can treat L / L0, which is the ratio of L representing the remaining storage life and L0 representing the initial storage life in Equation 5, as a dimensionless normalized indicator indicating how much of the material's remaining storage life remains compared to the initial. Since the processor of the electronic device (100) refers to L as a value already calculated in a previous process and refers to L0 as a value determined according to the type of material, L / L0 can be calculated without separate additional measurement. The processor of the electronic device (100) can treat the term obtained by subtracting L / L0 from 1 in Equation 5 as the ratio of the storage life that the material has already consumed, and if this value is close to 0, it can be interpreted that the material is in a state where it has hardly deteriorated, and if it is close to 1, it can be interpreted that the material is in a state where it has almost consumed.
[0216] The processor of the electronic device (100) may treat c0, which represents the unit obsolescence cost coefficient in mathematical formula 5, as the magnitude of the loss that occurs when the material is completely obsolete and the entire quantity is discarded, and c0 may be a value determined by reflecting the acquisition price of the material or the processing costs associated with disposal. The processor of the electronic device (100) may obtain and reference c0 as a value derived from the procurement unit price of the material or the disposal history, and may set c0 differently depending on the type of material or the quantity secured. Since c0 is a coefficient that determines the scale of obsolescence costs, the processor of the electronic device (100) may set c0 larger for expensive materials or materials secured in large quantities so that the risk of obsolescence is reflected more significantly.
[0217] The processor of the electronic device (100) can calculate the obsolescence cost close to zero when the remaining storage life is equal to the initial storage life and there is no depletion according to mathematical formula 5, and can calculate the obsolescence cost as a value close to the unit obsolescence cost coefficient as the remaining storage life is depleted and approaches zero. For example, at the time immediately after the material is received and most of the remaining storage life remains, the depletion rate is small and the obsolescence cost is calculated low, and at the time when time passes and the remaining storage life is reduced by half, the depletion rate increases and the obsolescence cost can be calculated at half the level of the unit obsolescence cost coefficient. In this way, the processor of the electronic device (100) can quantitatively implement a relationship in which the obsolescence cost increases in conjunction with the decrease in the remaining storage life.
[0218] The fact that the processor of the electronic device (100) calculates the obsolescence cost based on the remaining storage life ratio as in Equation 5 may have technical significance in that it reflects the fact that the risk of obsolescence of the material is determined not merely by the passage of time, but by the degree of storage life actually consumed by the material. Since the remaining storage life is consumed differently depending on the storage temperature even after the same period has elapsed, the processor of the electronic device (100) can reflect the actual thermal history experienced by the material in the cost calculation by using the remaining storage life ratio, rather than time, as the basis for the obsolescence cost. In addition, since Equation 5 is defined in a direction in which the obsolescence cost increases with respect to the remaining storage life ratio, the relationship in which the obsolescence cost is calculated as much as the remaining storage life is shorter can be clearly implemented in the formula.
[0219] The differential effect obtained by the processor of the electronic device (100) using Equation 5 may be that it provides a medium that quantitatively links the physical degradation of the material and the selection of the production method. Since the obsolescence cost is calculated in conjunction with the ratio of the remaining storage life, the processor of the electronic device (100) can calculate a large obsolescence cost when a material with a short remaining storage life is introduced into pre-production, thereby making the pre-production method unfavorable, and calculate a small obsolescence cost for a material with a long remaining storage life, thereby making the pre-production method favorable. Since this obsolescence cost is subsequently compared with the holding cost and the stockout cost to determine the production method, the processor of the electronic device (100) can secure a key mechanism through Equation 5 that reflects the physical constraint of storage life in the determination of the production method.
[0220] The processor of the electronic device (100) can dynamically recalculate the obsolescence cost according to Equation 5 as the remaining storage life is periodically updated. As time passes and the remaining storage life of a specific material decreases, the processor of the electronic device (100) can reflect the increased depletion rate in Equation 5 to calculate the obsolescence cost upward, thereby re-evaluating the advantages and disadvantages of using that material for pre-production. Such dynamic recalculation can contribute to continuously reflecting changes in the state of the material in the production plan by causing a material that was advantageous for pre-production at a specific point in time to be re-evaluated as advantageous for order-based production as the obsolescence cost increases over time.
[0221] Meanwhile, the processor of the electronic device (100) can determine the production method by comparing the sum of the holding cost and obsolescence cost corresponding to the pre-production method with the stockout cost corresponding to the order-based production method, and the following mathematical formula 6 can be used.
[0222] <Mathematical Formula 6>
[0223]
[0224] The processor of the electronic device (100) can use mathematical formula 6 as a criterion for judgment, and if mathematical formula 6 is satisfied, decide on a pre-production method, and if mathematical formula 6 is not satisfied, decide on a build-order method. Since mathematical formula 6 has a form in which the total cost when adopting the pre-production method is placed on the left side and the cost when adopting the build-order method is placed on the right side to directly compare the two, the processor of the electronic device (100) can perform the judgment of selecting the method with the smaller total cost between the two methods by reducing it to whether the inequality holds.
[0225] The processor of the electronic device (100) may treat Ch, representing the holding cost in Equation 6, as the cost incurred while securing and storing materials or parts in advance in a pre-production method, and Ch may be a value determined by the quantity stored and the expected storage period. The processor of the electronic device (100) may obtain and reference Ch as a value derived from warehouse operating costs, the opportunity cost of funds tied up in inventory, and the cost required to maintain storage conditions. The processor of the electronic device (100) may refer to Co, representing the obsolescence cost in Equation 6, as a value calculated based on the remaining storage life in the preceding process, and since Co is a value that is calculated to be larger as the remaining storage life is shorter, the physical state of the material may be reflected in the left side of the inequality.
[0226] The processor of the electronic device (100) may treat Cs, which represents the cost of missing parts in mathematical formula 6, as a loss that may occur when production begins after an order is placed by adopting a made-to-order production method, and Cs may be a value determined by reflecting the loss due to delivery delays or the opportunity lost due to the inability to supply immediately. The processor of the electronic device (100) may obtain and reference Cs as a value derived from past delivery delay history or contract conditions with the ordering party, and may set Cs differently depending on the type of part or the delivery time required by the ordering party. For example, in the case of a part that requires immediate supply, the processor of the electronic device (100) may set Cs to a large value so that the burden of the made-to-order production method is significantly reflected.
[0227] Comparing the sum of holding costs and obsolescence costs with the stockout costs as in Equation 6 of the processor of the electronic device (100) may have technical significance in that it places the costs of different natures caused by the pre-production method and the order-based production method, respectively, onto a single comparable standard. Since the pre-production method generates holding costs and obsolescence costs by securing in advance, whereas the order-based production method generates stockout costs by not securing in advance, the processor of the electronic device (100) can determine which method is economically advantageous by comparing the two conflicting cost structures using an inequality and using a clear conditional expression.
[0228] Incorporating the obsolescence cost as a component of the left side of Equation 6 by the processor of the electronic device (100) can have a differentiating effect in that it directly reflects the influence of the remaining storage life of the material on the selection of the production method in terms of whether the inequality holds true. In the case of a material with a sufficient remaining storage life, the obsolescence cost is calculated to be small, so the sum of the left side is likely to be smaller than the shortage cost; thus, the processor of the electronic device (100) may have a tendency to select the pre-production method. In the case of a material with a significantly depleted remaining storage life, the obsolescence cost is calculated to be large, so the sum of the left side is likely to exceed the shortage cost; thus, the processor of the electronic device (100) may have a tendency to select the order-based production method. In this way, the processor of the electronic device (100) can be implemented so that the production method naturally switches according to the physical state of the material.
[0229] The processor of the electronic device (100) can make the validity of Equation 6 change depending on the time point, as the obsolescence cost included in the left side of Equation 6 changes as the remaining storage life is periodically updated. For a material for which the pre-production method was selected because Equation 6 was valid at a specific time point due to a low obsolescence cost, if time passes, the remaining storage life is exhausted and the obsolescence cost increases, Equation 6 is no longer valid and the material can be switched to a build-to-order production method. Through this dynamic switching, the processor of the electronic device (100) can continuously re-determine the production method in accordance with changes in the material state and cost structure, unlike a method that applies a fixed production method.
[0230] The differentiating effect obtained by the processor of the electronic device (100) using Equation 6 may be that the decision on the production method is made using a clear conditional formula of comparing quantified costs, rather than the manager's experience or qualitative criteria. The processor of the electronic device (100) can determine the production method based on consistent criteria through a series of processes that calculate each cost and determine whether Equation 6 is valid, and can provide each cost that served as the basis for the decision to the manager through the user terminal (210) to verify the validity of the decision. Through this, the processor of the electronic device (100) can complete a consistent judgment system through Equation 6 that converts the physical constraint of the material's storage life into an economic evaluation and concretizes it into a decision on the production method.
[0231] Additionally or generally, according to one embodiment, a method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material may further include the following operations: the processor irradiating a sample taken from a lot of received epoxy raw material with near-infrared rays and measuring the absorbance of epoxy groups in a band of wavelengths from 4,500 nm to 6,000 nm; the processor converting the ratio of the measured absorbance to a reference absorbance decrease into a residual rate of unreacted epoxy groups; the processor downward correcting the remaining storage life of the lot to 0.8 times the calculated value if the converted residual rate is less than 90%; and the processor reflecting the downward corrected remaining storage life in updating the available inventory amount.
[0232] The processor of the electronic device (100) can irradiate near-infrared light onto a sample taken from a lot of received epoxy raw material and measure the absorbance of the epoxy group in a specific wavelength band. Here, near-infrared light may refer to light in a band with a wavelength longer than visible light and shorter than mid-infrared light, and can serve as a measurement means to determine the state of a specific functional group inside the material without physically destroying or chemically treating the sample. The processor of the electronic device (100) can obtain a signal indicating the absorbance from the sample by controlling a measurement means including a light source that irradiates near-infrared light and a detector that detects reflected or transmitted light.
[0233] The processor of the electronic device (100) can use a wavelength range of 4,500 nm or more and 6,000 nm or less as a range for measuring absorbance. Since the epoxy groups contained in the uncured epoxy can exhibit unique absorption characteristics in this wavelength range, the processor of the electronic device (100) can indirectly determine the quantitative state of the epoxy groups contained in the sample by measuring the absorbance in this range. For example, a sample with a large amount of unreacted epoxy groups remaining may show a relatively large absorbance in this range, and a sample in which the reaction has proceeded and the epoxy groups have been consumed may show a relatively small absorbance, so the processor of the electronic device (100) can determine the degree of reaction progress of the material through the magnitude of the absorbance.
[0234] The wavelength range of 4,500 nm or more and 6,000 nm or less may be a range determined by confirming, through a preliminary experiment, the range in which the epoxy groups contained in the uncured epoxy clearly exhibit unique absorption characteristics for multiple reference samples with different degrees of reaction progress. The processor of the electronic device (100) may refer to the range in which the absorption characteristics of the epoxy groups appear most clearly, depending on the composition of the material or the spectral characteristics of the measuring means, as the range reconfirmed through the preliminary experiment.
[0235] The processor of the electronic device (100) can implement various methods for measuring absorbance from a sample. The processor of the electronic device (100) can take a small amount of sample from a lot and feed it into a measuring means, and receive and obtain the absorbance value returned by the measuring means. In addition, if the measuring means is installed in a warehouse or inspection process, the processor of the electronic device (100) can receive the absorbance measurement results via an external server (220), and can manage the measurement time and lot identification information together so that they can be referenced in subsequent processing. To increase the reliability of the measurement, the processor of the electronic device (100) can take the average of absorbances measured multiple times for the same sample or adopt a value with outliers removed as the absorbance.
[0236] The processor of the electronic device (100) can maintain the measurement conditions constant or correct the measurement value by considering that conditions such as the temperature or thickness of the sample may affect the measurement result when measuring absorbance. For example, the processor of the electronic device (100) can control the measurement means to perform the measurement only when the temperature of the sample is within a predetermined range, or adjust the measurement value by applying a coefficient that corrects the deviation of absorbance according to the thickness of the sample. Through such condition management, the processor of the electronic device (100) can secure the absorbance between lots in a form that allows comparison based on the same standard.
[0237] The processor of the electronic device (100) can convert the ratio of the measured absorbance to the reference absorbance into the residual rate of unreacted epoxy groups. Here, the reference absorbance may refer to the absorbance measured when the material is not degraded at all, and may be a value set by being measured in advance from a sample in which unreacted epoxy groups are intact. The residual rate of unreacted epoxy groups may refer to the ratio of epoxy groups that remain without participating in the reaction among the epoxy groups originally present in the material, and the larger this value, the more reaction capacity the material has remaining.
[0238] The reason the processor of the electronic device (100) converts the rate of decrease in absorbance into a retention rate may be that the absorbance of the epoxy group corresponds to the amount of epoxy group remaining in the sample, so a decrease in absorbance indicates the consumption of the epoxy group. For example, if the measured absorbance is the same as the reference absorbance, the processor of the electronic device (100) determines that the epoxy group has hardly been consumed and converts the retention rate to a high value, and if the measured absorbance has decreased significantly compared to the reference absorbance, it determines that a substantial portion of the epoxy group has been consumed and converts the retention rate to a low value. In this way, the processor of the electronic device (100) can convert an optical measurement value called absorbance into a retention rate that indicates the chemical state of the material.
[0239] The processor of the electronic device (100) can apply the corresponding relationship between absorbance and the retention rate according to a pre-set conversion standard. The processor of the electronic device (100) can obtain in advance the relationship between the absorbance measured for a plurality of reference samples, the degree of reaction progress of which is known, and the actual retention rate of the sample, and can convert the retention rate from the measured absorbance by referring to this relationship. For example, the processor of the electronic device (100) can calculate how much the absorbance has decreased by compared to the reference absorbance, and can derive and refer to the retention rate corresponding to the degree of decrease from the conversion standard.
[0240] The processor of the electronic device (100) stores the converted remaining rate in association with lot identification information and can use it as a separate indicator to compare with the remaining storage life calculated based on time and temperature. Since the remaining rate is a value that directly reflects the chemical state of the material based on actual measurements, the processor of the electronic device (100) can use it as a basis to verify whether the remaining storage life estimated from time and temperature corresponds to the actual state of the material. For example, if the estimated remaining storage life appears to be sufficient but the remaining rate is converted to be low, the processor of the electronic device (100) can recognize that the material is in a deteriorated state that has progressed further than estimated.
[0241] The processor of the electronic device (100) can adjust the remaining storage life of the lot downward to 0.8 times the calculated value if the converted remaining rate is less than 90%. Here, the value of 90% remaining rate can serve as a criterion for determining whether the unreacted epoxy group has been consumed by more than 10% compared to the initial value, and a material with a remaining rate below this criterion can be treated as having undergone additional degradation that is not detected by time and temperature-based estimation alone. By not trusting the estimated remaining storage life of such a material as is and adjusting it to a more conservative value, the processor of the electronic device (100) can prevent a situation in which the degraded material is overestimated and put into production.
[0242] The processor of the electronic device (100) applying a correction factor of 0.8 times to the remaining storage life may be intended to quantitatively reflect the discrepancy when the actual chemical state indicates that deterioration has progressed more than the estimated physical state. For example, even if the remaining storage life calculated based on time and temperature appears as a specific period, if the remaining rate is measured to be less than 90%, the processor of the electronic device (100) may adopt a value corresponding to 0.8 times that period as the corrected remaining storage life to calculate the actual usable period as shorter. Such correction may be a method to resolve the discrepancy between the estimation and the actual measurement in a safe manner.
[0243] The processor of the electronic device (100) can operate by maintaining the estimated remaining storage life as is when the remaining rate is 90% or more, and applying a downward correction only when the remaining rate is less than 90%. Through this, the processor of the electronic device (100) can selectively apply corrections only to materials where deterioration is confirmed in actual measurement, without applying unnecessary corrections to normal materials where the estimation and actual measurement match. Such selective correction can contribute to reflecting measurement results in management while preventing usable materials from being excluded prematurely due to excessive adjustments.
[0244] The judgment criterion of a 90% retention rate and the correction factor of 0.8 times may be values determined through a preliminary experiment to measure quality by manufacturing parts with multiple materials having different retention rate levels, such as the point where the quality degradation of the part becomes significant when the unreacted epoxy group is consumed by more than a certain proportion compared to the initial level, and the degree to which the estimated remaining storage life in that case is lowered to match the actual measurement. The processor of the electronic device (100) may refer to the retention rate criterion and the correction factor as values re-determined through the preliminary experiment according to the type of material or the quality level required for the part, and for materials in which the quality degradation appears rapidly, the retention rate criterion may be set higher or the correction factor may be set smaller and applied.
[0245] The processor of the electronic device (100) can store the history of applying downward correction in association with lot identification information and manage the remaining storage life before and after the correction together. The processor of the electronic device (100) can notify the administrator via the user terminal (210) that correction has been applied to a specific lot, thereby supporting the administrator in further checking the condition of the material or considering priority depletion. In addition, the processor of the electronic device (100) can use the lot or material type to which correction is repeatedly applied as a basis for re-examining the accuracy of the time and temperature-based estimation itself.
[0246] The processor of the electronic device (100) can reflect the downwardly corrected remaining storage life in the update of the available inventory. The processor of the electronic device (100) can maintain inventory information that is more consistent with the actual state of the material by determining whether to include the material of the lot in the available inventory based on the remaining storage life corrected based on actual measurement rather than the estimated remaining storage life prior to correction. For example, even if a lot was included in the available inventory because its remaining storage life satisfied the standard prior to correction, if the remaining storage life decreases below the standard after correction, the processor of the electronic device (100) can exclude the material of that lot from the available inventory.
[0247] The processor of the electronic device (100) can use the available inventory amount reflecting the corrected remaining storage life as an input for subsequent processing, including determining the production method, calculating predicted quality indicators, and determining the reordering time. Since the corrected remaining storage life is reflected based on actual measurements, the subsequent judgment performed by the processor of the electronic device (100) can reflect the actual state of the material more precisely than when relying only on time and temperature estimation. For example, if the correction reflects that the risk of obsolescence of a specific lot is actually greater, the processor of the electronic device (100) can determine the production method in a way that suppresses the input of that material into pre-production.
[0248] The processor of the electronic device (100) can provide the result of reflecting the corrected remaining storage life to the manager through the user terminal (210), so that the manager can recognize inventory fluctuations resulting from the measurement. The processor of the electronic device (100) can notify the manager if the available inventory amount has decreased due to the correction, and can support the review of reordering if a shortage is expected. Through this, the processor of the electronic device (100) can enable the optical measurement result to be quickly linked to inventory management and production planning.
[0249] The processor of the electronic device (100) can continuously reflect the actual degradation of the material over time in management by periodically repeating the remaining storage life correction based on near-infrared measurement. The processor of the electronic device (100) can recalculate the remaining rate by remeasuring the absorbance at fixed intervals or immediately before the material is put into production, and if necessary, recalculate the remaining storage life to update the available inventory amount. In this way, the processor of the electronic device (100) can implement precise inventory management that considers both the physical and chemical states of the material by combining management based on estimation and verification based on actual measurement.
[0250] Additionally or generally, according to one embodiment, a method of operation of an electronic device for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material may further include: a processor wirelessly receiving storage temperature and relative humidity at preset measurement cycles from a wireless temperature and humidity tag attached to a lot-specific storage container of an incoming epoxy raw material; a processor calculating the cumulative time of a measurement interval in which the received relative humidity is 60% or higher; if the calculated cumulative time exceeds 24 hours, the processor determining that moisture absorption degradation has occurred for the lot and increasing the reference storage life by a preset value; and if reception from the wireless temperature and humidity tag is interrupted for more than a preset time, the processor classifying the lot as an inspection target and notifying a user terminal.
[0251] The processor of the electronic device (100) can wirelessly receive the storage temperature and relative humidity at preset measurement intervals from a wireless temperature and humidity tag attached to a lot-specific storage container of the received epoxy raw material. Here, a wireless temperature and humidity tag may refer to a small device comprising a sensor that measures temperature and humidity and a communication unit that wirelessly transmits the measured values, and may be individually attached to the storage container of each lot to serve as a means of measuring the environmental conditions of the location where the lot is placed in real time. The processor of the electronic device (100) receives the signal transmitted by this wireless temperature and humidity tag and can determine, on a lot-by-lot basis, what temperature and humidity each lot in the warehouse is actually exposed to.
[0252] The reason the processor of the electronic device (100) receives environmental conditions individually from wireless temperature and humidity tags attached to each lot's storage container may be that the temperature and humidity may differ depending on the location even within the same warehouse. For example, since lots placed near the entrance or far from the refrigeration equipment may be exposed to higher temperatures or humidity than lots in other locations, the processor of the electronic device (100) can obtain the local environmental conditions that each lot actually experiences, rather than the representative value of the entire warehouse, individually through the wireless temperature and humidity tags. Through this, the processor of the electronic device (100) can precisely reflect the different storage environments for each lot in its management.
[0253] The processor of the electronic device (100) can continuously record changes in environmental conditions over time by receiving values from wireless temperature and humidity tags at preset measurement intervals. For example, the processor of the electronic device (100) can receive the storage temperature and relative humidity transmitted by each wireless temperature and humidity tag at regular time intervals, thereby accumulating the history of environmental conditions for each lot in chronological order. The measurement interval can be adjusted according to the characteristics of the material or the environmental stability of the warehouse, and the processor of the electronic device (100) can set the measurement interval shorter to receive values more frequently when environmental fluctuations are severe.
[0254] The processor of the electronic device (100) can implement various methods for receiving values from wireless temperature and humidity tags. The processor of the electronic device (100) can collect signals from each wireless temperature and humidity tag via a receiving device installed in a warehouse and receive them through an external server (220), and can manage each value by recording together with the identification information of the wireless temperature and humidity tag that transmitted the value, the corresponding lot identification information, and the time of reception. Considering that errors occurring during the communication process may be included in the received values, the processor of the electronic device (100) can perform processing to exclude values showing an abnormally large deviation or filter out outliers by comparing them with values at adjacent times.
[0255] The processor of the electronic device (100) can utilize the received storage temperature as an input for calculating the storage life decay rate and remaining storage life as described above, and can utilize the received relative humidity as a separate input for determining moisture absorption degradation. Since relative humidity can affect the degree to which the material absorbs moisture, separate from the storage temperature affecting the reaction rate of the material, the processor of the electronic device (100) can treat the two values as information reflecting different degradation mechanisms. Through this, the processor of the electronic device (100) can manage degradation caused by temperature and degradation caused by humidity together.
[0256] The processor of the electronic device (100) can calculate the accumulated time of the measurement interval in which the received relative humidity is 60% or higher. Here, the measurement interval may refer to the time interval between each point in time when a value is received from a wireless temperature and humidity tag, and the processor of the electronic device (100) can determine whether the relative humidity in each measurement interval is 60% or higher and accumulate the time of the corresponding interval. The value of 60% relative humidity may serve as a standard indicating the lower limit of the humidity level at which uncured epoxy absorbs moisture and hygroscopic deterioration may proceed, and the longer the material is exposed to humidity above this value, the greater the risk of deterioration due to hygroscopic absorption.
[0257] The reason the processor of the electronic device (100) accumulates the time during the interval when the relative humidity is 60% or higher may be that moisture absorption degradation proceeds based on the total amount of time exposed to high humidity, rather than the instantaneous humidity at a specific point in time. For example, if a material is briefly exposed to high humidity and then immediately returns to low humidity, moisture absorption may not proceed significantly, but if high humidity persists for a long time, the material may absorb a significant amount of moisture and deteriorate. To reflect this cumulative characteristic, the processor of the electronic device (100) can quantify the risk of moisture absorption by summing the time during the interval when the humidity is above a reference level, rather than the humidity at individual points in time.
[0258] When calculating the cumulative time, the processor of the electronic device (100) can sum up the time of the measurement intervals where the relative humidity is 60% or higher, regardless of whether such intervals appear continuously or intermittently. For example, if a specific lot is exposed to high humidity for a certain period, then recovers to low humidity, and then is exposed to high humidity again, the processor of the electronic device (100) can calculate the time of each of the two exposure intervals separately and sum them up into a single cumulative time. This summing method can be a method that can reflect the accumulated effect even when intermittent humidity exposure is repeated.
[0259] The processor of the electronic device (100) can store the calculated accumulated time in association with lot identification information and continuously update it over time. Whenever a new value is received from a wireless temperature and humidity tag, the processor of the electronic device (100) can update the time of that section by adding it to the existing accumulated time if the relative humidity of the corresponding measurement section is 60% or higher. Through this, the processor of the electronic device (100) can always determine the total amount of time exposed to high humidity since each lot was received, and can use this accumulated time as a basis for determining moisture absorption degradation.
[0260] If the calculated cumulative time exceeds 24 hours, the processor of the electronic device (100) determines that moisture absorption deterioration has occurred for the lot and can increase the standard storage life by a preset value. Here, the value of 24 hours can serve as a standard indicating the upper limit of the cumulative time at which moisture absorption deterioration is allowed not to progress significantly even when the material is exposed to an environment with a relative humidity of 60% or higher. For lots where the cumulative time exceeds this standard, the processor of the electronic device (100) treats the deterioration caused by moisture absorption as having progressed and can adjust the management of the material more strictly.
[0261] When the processor of the electronic device (100) raises the standard storage life for a lot determined to have moisture-absorbing deterioration, it may mean setting a higher lower limit for the remaining storage life required for the material to be recognized as usable in normal part production. Since a material that has undergone moisture-absorbing deterioration poses a greater risk to part quality than a normal material with the same remaining storage life, the processor of the electronic device (100) can prevent the material from being treated as a normal material and put into production by raising the standard storage life. For example, for a lot determined to have moisture-absorbing deterioration, additional risk due to moisture absorption can be reflected in management by ensuring that it is included in the available inventory only when it has a longer remaining storage life.
[0262] The processor of the electronic device (100) can apply a preset value for the range of increasing the standard storage life, and this value can be set differently depending on the degree of moisture absorption degradation. For example, the processor of the electronic device (100) can adjust the strictness of management in proportion to the degree of moisture absorption exposure by increasing the standard storage life slightly for lots where the accumulated time slightly exceeds 24 hours, and increasing the standard storage life significantly for lots where the accumulated time greatly exceeds 24 hours. This method can contribute to differentially determining whether the material is usable depending on the severity of moisture absorption degradation.
[0263] The standard humidity of 60% relative humidity and the standard cumulative time of 24 hours may be values determined through a preliminary experiment in which the quality of the part is measured after curing by storing the material under different humidity and exposure time conditions, and the humidity level at which the uncured epoxy raw material begins to undergo significant deterioration due to moisture absorption and the time limit for which the deterioration remains within an acceptable range even when exposed to that humidity. The processor of the electronic device (100) may refer to the standard humidity and standard cumulative time as values re-determined through the preliminary experiment according to the moisture absorption characteristics of the material or the quality level required for the part, and for materials sensitive to moisture absorption, values may be applied in which the standard humidity is set lower or the standard cumulative time is set shorter.
[0264] The processor of the electronic device (100) can store the results of the moisture absorption degradation judgment and the increased standard storage life in association with lot identification information and reflect this in the update of available inventory. As the standard storage life is increased, materials from lots where moisture absorption degradation has been determined and whose remaining storage life does not meet the new standard may be excluded from the available inventory. The processor of the electronic device (100) can notify the manager of the results of such judgment and standard change through the user terminal (210) to support the manager in reviewing the priority depletion or separate inspection of the relevant materials.
[0265] The processor of the electronic device (100) can reflect the continuously changing humidity exposure conditions after the material is received in the management by repeatedly performing a moisture absorption degradation determination over time. If the accumulated time continues to increase and exceeds a new threshold, the processor of the electronic device (100) can strengthen management to further increase the standard storage life or to prioritize the exhaustion or exclusion of the material. Through this, the processor of the electronic device (100) can implement multifaceted material management that reflects both degradation caused by temperature and degradation caused by humidity.
[0266] The processor of the electronic device (100) may classify the lot as a subject for inspection and notify the user terminal (210) if reception from the wireless temperature and humidity tag is interrupted for longer than a preset time. Here, interruption of reception may mean that a state in which a value is not received from a specific wireless temperature and humidity tag continues even after a predetermined measurement cycle has been reached, and the processor of the electronic device (100) may determine whether reception has been interrupted by determining whether the time elapsed since the last time a value was received exceeds a preset time.
[0267] The reason the processor of the electronic device (100) classifies a lot for which reception has been interrupted as a target for inspection may be that the interruption of reception means that the environmental conditions of that lot can no longer be identified, and thus a blind spot in management may occur. Reception may be interrupted due to various causes such as power depletion or failure of the wireless temperature and humidity tag, communication failure, or relocation of the storage container, and in such situations, it is not possible to know what temperature and humidity the lot is exposed to, so even if deterioration progresses, it may not be possible to reflect this in management. By classifying such a lot as a target for inspection, the processor of the electronic device (100) can prevent the management gap from being left unattended.
[0268] The processor of the electronic device (100) can set a time that serves as a criterion for determining reception interruption in relation to the measurement cycle. For example, the processor of the electronic device (100) can determine reception interruption when a value is not received for a period of time corresponding to several times the normal measurement cycle, thereby preventing misjudgment of temporary communication delays or occasional reception omissions as reception interruption. A determination criterion with such a margin can contribute to suppressing the excessive occurrence of unnecessary inspection notifications by distinguishing between normal fluctuations and actual abnormal conditions.
[0269] The processor of the electronic device (100) can notify the user terminal (210) of information regarding a lot classified as an inspection target, thereby inducing the manager to directly check the status of the lot. The processor of the electronic device (100) can include in the notification identification information of the lot whose reception has been discontinued, the time when the value was last received, and the environmental conditions at that time, to help the manager quickly grasp the situation. For example, after receiving the notification through the user terminal (210), the manager can inspect or replace the wireless temperature and humidity tag of the storage container, and if necessary, separately inspect the material condition of the lot and reflect it in management.
[0270] When the reception interruption state is resolved and the reception of values from the wireless temperature and humidity tag resumes, the processor of the electronic device (100) can release the lot from inspection and return it to the normal management flow. The processor of the electronic device (100) can continue to determine moisture absorption deterioration by accumulating environmental conditions after reception resumes, and can maintain transparency in management by separately recording that environmental conditions were not verified during the period when reception was interrupted. Through this, the processor of the electronic device (100) can clearly reflect this in the management system even if the continuity of measurement is temporarily lost, and minimize the risk associated with the management gap.
[0271] Additionally or generally, according to one embodiment, a method of operation of an electronic device for performing material-part linked inventory management and production method determination based on the remaining storage life of an epoxy raw material may further include: a processor controlling a marking device to classify the remaining storage life of each lot into three preset sections and to mark a different color marking corresponding to the classified section on a storage container of the lot; a processor controlling a conveying facility to transfer a lot classified into the section with the shortest remaining storage life among the three sections to a location closest to the outlet of the conveying facility; a processor receiving the remaining weight of each lot from a weight sensor provided in the conveying facility and excluding lots whose received remaining weight is less than a preset minimum input weight from the available inventory amount; and a processor recording the identification information of the lot released through the outlet as the identification information of the lot released into production.
[0272] The processor of the electronic device (100) can classify the remaining storage life of each lot into three preset sections and control the marking device to display a different color marking corresponding to the classified section on the storage container of the lot. Here, the three sections are ranges set to distinguish materials according to the size of the remaining storage life, and may be divided, for example, into a section with sufficient remaining storage life, a section with an intermediate level of remaining storage life, and a section with little remaining storage life. The processor of the electronic device (100) can determine which of these three sections the remaining storage life of each lot belongs to and determine the color corresponding to that section.
[0273] The reason the processor of the electronic device (100) controls the marking device to display the remaining storage life in color is to allow the condition of the material to be immediately identified visually at the work site. For example, the processor of the electronic device (100) may control the marking device to display a green-colored marking on lots with a sufficient remaining storage life, a yellow-colored marking on lots with an intermediate level, and a red-colored marking on lots with little remaining storage life. Such color-coded marking can help the worker intuitively recognize the material to be used first without having to check the remaining storage life value of each individual lot.
[0274] A marking device may refer to a device capable of displaying a color on the surface of a storage container, and may be implemented in various forms such as by spraying color ink, attaching a color label, or illuminating a color display. A processor of an electronic device (100) can transmit color information determined for a specific lot to the marking device and control the marking device to display that color on the storage container. To check whether the marking has been displayed correctly, the processor of the electronic device (100) may receive a signal indicating completion of display from the marking device or receive a result of verification from a means for detecting the displayed color.
[0275] The processor of the electronic device (100) can control the marking device to update the color of the marking when the section to which the lot belongs changes as the remaining storage life decreases over time. For example, if the remaining storage life of a specific lot decreases and moves from a sufficient section to an intermediate section, the processor of the electronic device (100) can control the marking device to change the marking of the storage container from a green color to a yellow color. Through such color updating, the processor of the electronic device (100) can ensure that changes in the state of the material are continuously reflected in the visual display at the site.
[0276] The processor of the electronic device (100) can control the conveying equipment to transfer a lot classified as having the shortest remaining storage life among the three sections to a location closest to the outlet of the conveying equipment. Here, the conveying equipment may refer to equipment capable of moving storage containers within a warehouse, and may be implemented in the form of a conveyor, a transfer robot, or a conveying device of an automated warehouse. The outlet may refer to a location from which materials are removed from the warehouse to be input into production, and lots placed closer to the outlet may be more likely to be removed first and input into production.
[0277] The reason the processor of the electronic device (100) transfers the lot with the shortest remaining storage life to the location closest to the exit port may be to physically induce the materials at high risk of obsolescence to be consumed first. Since materials with little remaining storage life are at high risk of becoming obsolete and being discarded if left as they are, the processor of the electronic device (100) may place these materials in a location where they can be easily removed so that they are used preferentially. Such physical placement may be a method of implementing the principle of priority consumption based on remaining storage life to the actual location of materials in the warehouse.
[0278] When the processor of the electronic device (100) controls the conveying facility to adjust the position of the lot, it may consider the section to which each lot belongs and the distance to the outlet together. For example, the processor of the electronic device (100) may control the conveying facility to move the lot in the section with the shortest remaining storage life to a position adjacent to the outlet, and to place the lot in the section with sufficient remaining storage life to a position far from the outlet. When the section of the lot changes due to a decrease in the remaining storage life, the processor of the electronic device (100) may update the physical placement according to the change in the state of the material by controlling the conveying facility to transfer the lot again to a position closer to the outlet.
[0279] The processor of the electronic device (100) can receive information regarding the current location of each lot or whether the transfer is completed from the transfer facility during the process of controlling the transfer facility, and can verify whether the transfer was carried out as intended. The processor of the electronic device (100) can adjust the transfer order so as not to interfere with storage containers with different paths during the transfer process, or manage by updating the location information of the transferred lot. Through this, the processor of the electronic device (100) can reliably implement the physical placement of the material based on the remaining storage life.
[0280] The processor of the electronic device (100) receives the remaining weight of each lot from a weight sensor provided in the conveying facility, and may exclude lots whose received remaining weight is less than a preset minimum input weight from the available inventory. Here, the weight sensor may refer to a means for measuring the weight of a storage container being transported on the conveying facility, and the processor of the electronic device (100) may receive the result of measuring the remaining weight of each lot during the transport process. The remaining weight may refer to the weight of the material remaining in the storage container, and may be a value that decreases as the material is consumed in production.
[0281] The reason the processor of the electronic device (100) excludes lots with a remaining weight less than the minimum input weight from the available inventory is that lots with an excessively small amount of material remaining may be difficult to effectively input into actual part production. Here, the minimum input weight may refer to the minimum weight required for the material to be effectively input to produce one part, and materials that fall short of this value may be difficult to use for producing a complete part due to insufficient remaining quantity. By excluding such lots with insufficient remaining quantity from the available inventory, the processor of the electronic device (100) can ensure that only materials capable of being input into actual production are reflected in the available inventory.
[0282] The processor of the electronic device (100) can perform a process of comparing the remaining weight and the minimum input weight at the time of transfer through the conveying facility. For example, if the remaining weight measured by the weight sensor during the process of transferring a specific lot to the outgoing port falls short of the minimum input weight, the processor of the electronic device (100) can exclude that lot from the available inventory and exclude it from being input into production. By utilizing the actual weight at the time of transfer in this way, the processor of the electronic device (100) can prevent a situation in which a material with insufficient remaining quantity is input into production due to a discrepancy between the quantity in the ledger and the actual remaining quantity.
[0283] The processor of the electronic device (100) can notify the manager via the user terminal (210) of information regarding lots determined to be less than the minimum input weight, thereby supporting the manager in determining the processing direction of the material. For example, the processor of the electronic device (100) can separately indicate lots with insufficient remaining quantity so that the manager can take subsequent measures such as merging the material with another lot or disposing of it. Through this, the processor of the electronic device (100) can prevent materials with insufficient remaining quantity from being left unmanaged and maintain the accuracy of inventory information.
[0284] The processor of the electronic device (100) can record the identification information of a lot that has been discharged through an outlet as the identification information of a lot that has been put into production. The processor of the electronic device (100) can identify the lot that has been transported to the outlet through a conveying facility and actually discharged, and can store the identification information of that lot as the identification information of the material put into production at that time. Through this, the processor of the electronic device (100) can record which lot has actually been discharged and used in production based on the physical fact of discharge.
[0285] The reason the processor of the electronic device (100) records the identification information of the outgoing lot as an input lot may be that the lot decided to be input according to the plan and the lot actually outgoing and used may be different. For example, during the outgoing process, if the remaining quantity of a specific lot is insufficient, another lot may be outgoing instead, or due to the adjustment of the transfer order, a lot different from the plan may be outgoing first. By recording the input lot based on the lot that passed through the outgoing port, the processor of the electronic device (100) can secure an accurate input history that corresponds to the actual outgoing fact rather than the plan.
[0286] The processor of the electronic device (100) may utilize an identification means installed at the outlet to identify the lot that has been released. For example, the processor of the electronic device (100) may identify the lot that has been released by receiving lot identification information from a means that reads an identification label attached to a storage container passing through the outlet, or by receiving information regarding the lot that has passed through the outlet from a return facility. The processor of the electronic device (100) may manage the correspondence between the material and the part based on the physical fact of release by storing the identification information of the lot thus identified in association with the part being produced at that time.
[0287] The processor of the electronic device (100) can utilize the result of recording the identification information of the outgoing lot as an input lot for the aforementioned association management of materials and parts and for lot identification in the event of a defect. Since an accurate input history based on the fact of outgoing is secured, the processor of the electronic device (100) can accurately trace back the lot actually used when a defect occurs in a specific part thereafter. Through this, the processor of the electronic device (100) can link physical outgoing with material history management, thereby increasing the accuracy of tracing the flow from the material to the part.
[0288] The processor of the electronic device (100) can accurately maintain the available inventory amount after the outflow by updating the change in the remaining weight of the lot along with the record of the outflowed lot. Since the remaining weight of the lot decreases when the material is outflowed and put into production, the processor of the electronic device (100) can update the remaining weight and the available inventory amount in correspondence with the outflow amount. Through this, the processor of the electronic device (100) can manage outflow, input, and inventory updating as a single consistent flow, so that physical material management, starting with color marking and control of the return equipment, is completed with the updating of inventory information.
[0289] The above description is merely an illustrative explanation of the technical concept of the present invention, and those skilled in the art to which the present invention pertains will be able to make various modifications and variations within the scope of the essential characteristics of the present invention.
[0290] Accordingly, the embodiments disclosed in this invention are intended to illustrate, not limit, the technical concept of the invention, and the scope of the technical concept of the invention is not limited by these embodiments. The scope of protection of this invention shall be interpreted by the claims below, and all technical concepts within an equivalent scope shall be interpreted as being included within the scope of rights of this invention.
Claims
Claim 1 A method of operation of an electronic device comprising a processor for performing material-component linked inventory management and production method determination based on the remaining storage life of an epoxy raw material, wherein the processor performs the operation of obtaining receiving time information and storage condition information for each lot of the received epoxy raw material; the processor performs the operation of calculating the remaining storage life of each lot based on the obtained receiving time information and storage condition information; the processor performs the operation of updating the available inventory amount of each lot based on the calculated remaining storage life; the processor performs the operation of determining a production method as either a pre-production method, which produces the epoxy heat-resistant part before an order is placed, or a make-to-order method, which produces the epoxy heat-resistant part after an order is placed, based on demand information for the epoxy heat-resistant part and the updated available inventory amount; the processor performs the operation of calculating a predicted quality index for the epoxy heat-resistant part to be produced based on the remaining storage life of a specific lot, and prioritizing the allocation of a lot in which the calculated predicted quality index satisfies a standard quality for the production of the epoxy heat-resistant part; and the processor performs the operation of the epoxy of the lot prioritized according to the determined production method The operation of inputting raw materials into the production of the epoxy heat-resistant parts and managing the inputted lot and the produced epoxy heat-resistant parts in association; the operation of the processor calculating the storage life decay rate of the corresponding lot based on the storage temperature included in the storage condition information; the operation of the processor calculating the remaining storage life based on the calculated storage life decay rate and the elapsed time from the time of receipt; the operation of the processor excluding the epoxy raw materials of the lot whose calculated remaining storage life is less than the standard storage life from the available inventory; the operation of the processor calculating the holding cost and obsolescence cost corresponding to the pre-production method; the operation of the processor calculating the obsolescence cost as the remaining storage life is shorter;A method of operation of an electronic device for performing material-component linked inventory management and production method determination, comprising: an operation in which the processor determines the pre-production method if the sum of the calculated holding cost and the obsolescence cost is less than the stockout cost corresponding to the order-based production method, and determines the order-based production method otherwise. Claim 2 delete Claim 3 A method of operation of an electronic device for performing material-component linked inventory management and production method determination, wherein, in claim 1, the processor calculates a safety stock amount based on the variability of the demand information and the procurement lead time of the epoxy raw material; the processor determines a reordering time for the epoxy raw material based on the calculated safety stock amount and the remaining storage life; and the processor generates an ordering request for the epoxy raw material when the reordering time is reached. Claim 4 delete Claim 5 A method of operation of an electronic device for performing material-part linked inventory management and production method determination, wherein, in claim 1, the processor stores identification information of the lot introduced into the produced epoxy heat-resistant part in association with it; the processor identifies the associated lot when a defect occurs in the produced epoxy heat-resistant part; and the processor updates the reference quality or reference storage life corresponding to the identified lot upward.
Citation Information
Patent Citations
Electronic apparatus for generating ordering information by predicting usage of raw materials based on sales predicted through artificial intelligence model
KR102906706B1
