Handling system for testing electronic component and adapter for seating of electronic component

Abstract

Disclosed herein is a handling system (HS) for testing an electronic component (ED). The handling system (HS) includes: a handler (100) configured to feed an electronic component to a tester, or to collect an electronic component from the tester; a stacker (200) provided to feed a customer tray (CT) to the handler (100), or to collect a customer tray (CT) from the handler (100); and a transfer device (300) configured to transfer a customer tray (CT). The handler (110) includes: an adapter (110) configured to carry one electronic component (ED), and also configured such that a seating width is adjustable; at least one moving hand (130) configured to move an electronic component (ED) from a customer tray (CT) to the adapter (110), or to move an electronic component from the adapter (110) to a customer tray (CT); an opener (140) configured to open the adapter (110); and a test hand (170) configured to grip and move the adapter (110) and then electrically connect the electronic component to the tester.