SYSTEM FOR ANALYSING A CPT PROBE

Abstract

A system for testing the sensitivity of a cone penetration test, CPT, probe to radial input forces is disclosed. The system comprises a mounting unit configured to receive a CPT probe and a force application unit configured to engage the CPT probe with a force when the CPT probe is mounted in the mounting unit. The force application unit is configured to apply the force to the CPT probe from a radial direction relative to the longitudinal aXis of the CPT probe. Unlocking insights from Geo-Data, the present invention further relates to improvements in sustainability and environmental developments: together we create a safe and liveable world.

Description

TECHNICALFIELD

[0001] This disclosure relates to methods, systems, and computer readable media for determining at least one characteristic of a CPT probe. Unlocking insights from Geo-Data, the present invention further relates to improvements in sustainability and environmental developments: togetherwe create a safe and liveable world. BACKGROUND

[0002] There is a general and ongoing need to improve data acquisition of subsurface surveying. The determination of subsurface characteristics is used to identify objects below the surface of the ground, as well as determining the soil characteristics, such as soil type, density, moisture content, shear modulus, and the like, which may be used in foundation planning and / or management. Subsurface information may be used for e.g., site characterisation for infrastructure projects, foundation calculations, and the like. For such applications, it is important to generate a comprehensive understanding of the subsurface with a high degree of accuracy in an efcient manner.

[0003] One ofthe methods ofperforming such tests is generally known as a cone penetration test (CPT). The cone penetration test is a geotechnical investigation method for determining, for example, soil and groundwater characteristics. In such a test, a cone penetration test probe, also known as a cone penetrometer, is pushed into the soil to perform a measurement or measurements. Typical parameters measured by such a CPT probe are cone tip resistance and sleeve friction. Pore-water pressure can additionally be measured where the test is a piezocone penetration test (CPTu). The test method comprises pushing an instrumented CPT probe, with the tip (cone end) facing down, into the ground at a controlled rate. The CPT probe may be mounted to a rod. The rod may, in turn, be mounted to a platform or a truck. Also mounted to the platform or truck is an advancing mechanism for advancing the rod and probe into the ground, such as a hydraulic ram.

[0004] Prior to using a CPT probe in such a test, it is important to determine that the CPT probe is functioning correctly. It is also important to obtain detailed information about various characteristics of the CPT probe, such as its dimensions at various portions, such that the CPT procedure can be accurately planned and executed using, for example, appropriate driving forces to drive the CPT probe into the ground.

[0005] Unfortunately, current systems for determining such information aboutCPT probes are rudimentary and typically require a lot ofmanual steps to be performed. This reduces the precision and reliability of the data obtained. It would be advantageous to provide systems and methods which address the shortcomings of existing systems for analysing CPT probes. OVERVIEW

[0006] The present disclosure provides systems and methods which address the above described problems and provide for improved accuracy, efciency and reliability in analysing characteristics of a CPT probe.

[0007] According to an aspect of the present disclosure, a is disclosed. The system may be congured to determine at least one characteristic of the CPT probe. The system may additionally or alternatively be congured to test the sensitivity ofthe CPT probe to radial input forces. Any ofthe system components described below can be combined in any suitable combination depending on which aspect ofthe CPT probe is to be analysed.

[0008] The system comprises a mounting unit congured to receive the CPT probe. This provides a mechanism to hold the CPT probe in place during analysis.

[0009] Where the system is congured to determine at least one characteristic of the CPT probe, the system may comprise a sensor congured to measure at least one characteristic ofthe CPT probe. Typically the sensor is an optical sensor, however in some examples another type of sensor such as an ultrasonic sensor can be used. In the following, the sensor will be assumed to be an optical sensor for ease ofunderstanding, however this is not intended to be limiting.

[0010] The characteristic may comprise a dimension of the CPT probe. Optionally, the dimension comprises: a diameter ofat least a portion oftheCPT probe, a length ofat least a portion of the CPT probe, and / or a surface area of at least a portion of the CPT probe. Any suitable characteristic ofthe CPT probe can be measured by the optical sensor. For example, a diameter or length ofsome or the whole ofthe CPT probe can be measured. This measurement may relate to the friction sleeve portion ofthe CPT probe. Alternatively, or additionally, a height, surface area, or other characteristic ofthe cone end portion ofthe CPT probemay be measured.

[0011] Where the system is congured to test the sensitivity ofthe CPT probe to radial input forces, the system may comprise a force application unit congured to engage the CPT probe with a force when the CPT probe is mounted in the mounting unit. The force application unit may be congured to apply the force to the CPT probe from a radial direction relative to the longitudinal axis of the CPT probe. The longitudinal axis of the CPT probe may be considered as the axis dened between the tip ofthe CPT probes cone and the CPT probes base, in other words an axis that goes down the longitudinal (axial) centre ofthe CPT probe.

[0012] The disclosed system may provide a mechanism to easily and efciently apply a force to a CPT probe from a radial, also referred to as a lateral or sideways, direction. Preferably, the radial direction is exactly perpendicular to the longitudinal axis of the CPT probe. An ideal CPT probe should only register forces applied inthe longitudinal direction. Accordingly, by performing this test, the performance level of a CPT probe can be assessed. In particular, if the CPT probe registers a reading above an acceptable threshold when the radial force is applied to it, then the CPT probe can be indicated as being defective. This test also indirectly tests the CPT probes sensitivity to bending, which is caused by the radial force being applied. The disclosed system provides a mechanism for performing such tests in a repeatable, systematic and precise way.

[0013] The force applied by the force application unit, when present, may be between 50N and 150N, preferably between SON and 120N, more preferably between9ON and 1 ION. Forces in these ranges have been found to be particularly suitable for testing the sensitivity ofCPT probes to radial forces. In some examples, the system may be congured to determine a type of the CPT probe and, based on this determination, select an appropriate force to apply as indicated by, for example, a lookup table or code stored in a database.

[0014] The force application unit, when present, may comprise a lowerable mass. Engaging the CPT probe with the force may thus comprise moving the lowerable mass from a raised to a lowered position, such that the mass comes into contact with and applies its weight to the CPT probe. A lowerable mass that can be lowered into contact with the CPT probe provides a simple and reliable mechanism for applying a lateral force to the CPT probe. After the test is complete, the mass can be raised or lifted and the test is then ready to be repeated as required, such as after repositioning of the CPT probe. The mass may be raised and lowered using any suitable means such as a screw bolt, spindle, or belt drive. In other implementations, the force application unit may comprise an actuator that is congured to engage and exert a predetermined force on the CPT probe.

[0015] The force application unit, when present, may comprise a support member congured to support themasswhen themass is in the raised position. The supportmembermay be congured to disengage from the mass once the mass is in contact with the CPT probe. Such a support member, such as a latch or nger, may in otherwords support the mass when it is raised but then disengage once the mass is resting on the CPT probe. This ensures that the full weight ofthe mass comes to rest on the CPT probe, ensuring precision and repeatability ofthe test because it is then known precisely howmuch weight is being applied to the CPT probe.

[0016] The system may comprise a driving unit congured to move, in relative terms, the CPT probe relative to the optical sensor and / or the force application unit in a longitudinal direction of the CPT probe. The longitudinal direction may be considered as a direction which is parallel with or along the longitudinal axis ofthe CPT probe.

[0017] The system may comprise a rotating unit congured to rotate, in relative terms, the CPT probe relative to the optical sensor and / or the force application unit. The rotation may be performed about the longitudinal axis ofthe CPT probe. The rotating unit may comprise aworm gear congured to drive rotation of the CPT probe. A worm gear provides a simple, reliable mechanical means by which to rotate the CPT probe. Other suitable rotating units and mechanisms for rotating the CPT probe will be apparent to a skilled reader. For example, any suitable rotor, drive belt, or similar means may be used to provide this function. The same or a similar mechanism may, alternatively or additionally, be used to rotate the optical sensor and / or the force application unit about the CPT probe.

[0018] The disclosed system may thus provide a mechanism to easily and efciently perform analysis ofthe CPT probe atvarious positions. Where an optical sensor is provided, the CPT probe can be mounted and then moved longitudinally and / or rotated relative to the optical sensor to enable different areas of the CPT probe surface to be analysed by the sensor in a repeatable, systematic and precise way. For example, a certain characteristic of the CPT probe may be analysed based on scanning the surface of a portion ofthe CPT probe, afterwhich the CPT probe and optical sensormay be rotated and / ormoved longitudinally relative to one another such that a different portion ofthe CPT probe can be scanned. In this manner, an extensive analysis ofsome or all ofthe CPT probe surface may be conducted. Where a force application unit is provided, the CPT probe can similarly be mounted and then moved longitudinally and / or rotated relative to the force application unit to enable a force to be applied to different areas of the CPT probe in a repeatable, systematic and preciseway. For example, themassmay be lowered onto theCPT probe to test its sensitivity at a given position. The mass may then be raised and the CPT probe or mass may be longitudinally moved and / or rotated. The mass may then be lowered into contact with the CPT probe once again to test its sensitivity at this new longitudinal and / or rotational position. This procedure may be performed multiple times, for example at a series of longitudinal and / or rotational positions. It will be appreciated that the driving and rotating unit may move the CPT probe, the force application unit, the optical sensor, or some or all ofthese components to generate the required relative motion to enable different portions ofthe CPT probe to be analysed.

[0019] The mounting unit used to hold the CPT probe in use may be provided on a rail system to enable the mounting unit, and thus the CPT probe, to move in the longitudinal direction. The driving unit may be congured to drive a spindle in order to move the CPT probe in the longitudinal direction along such a rail system. A spindle provides a simple, reliable mechanical means by which to longitudinally move the mounting unit (and thus the CPT probe mounted thereon, in use). Other suitable driving units and mechanisms for longitudinally moving the CPT probe will be apparent to a skilled reader. For example, a track or slidermay be used along which the mounting unit may move or slide under action of the driving unit. The same or a similar mechanism may, alternatively or additionally, be used to move the optical sensor described above.

[0020] The mounting unit may comprise a connector congured to connect electronically to the CPT probe in order to enable data transfer from the CPT probe, preferably wherein the electronic connection is via a slip ring. CPT probes comprise electronic components and circuitry so as to record data when performing CPT tests in the eld. Advantageously, the mounting unit may be congured to interface and connect electronically with this CPT probe componentry so that data can be read from the CPT probe before, during, or after analysis ofthe CPT probe. This may enable proper functioning of the componentry of the CPT probe to be analysed. Further, an electrical connection may be used to determine a characteristic ofthe CPT probe, such as a type, make, size, or model number which can be used to inform the analysis being performed. For example, differentCPT probes may require different testing regimes such as different numbers or types ofportions that need to be measured. Use ofa slip ring ensures that the CPT probe can rotate, such as under operation of the rotating unit and / or during mounting / dismounting without any cables associated with the electronic connection becoming twisted. In alternative arrangements, data transfer to and / or from the CPT probe may be performed wirelessly, for example using a wireless transmitter connected to the CPT probe.

[0021] Where the system comprises a driving unit and a rotating unit, the driving unit and rotating unit may in some implementations be operated independently. By enabling the longitudinal and rotational movements to be performed independently, the scope of possible movement and subsequent analysis is increased, providing a more versatile system. For example, the CPT probe may be analysed at a plurality ofrotational positions whilst remaining stationary in the longitudinal direction. After this, the CPT probe may be moved longitudinally such that a different portion ofthe CPT probe may be scanned. Once repositioned, readings may be taken at another plurality of rotational positions and so on. Any suitable combination of longitudinal and rotational movements ofthe CPT probe or optical sensormay be used in order to build up a more complete picture ofthe characteristics ofthe CPT probe.

[0022] The components ofthe system, such as the driving unit, rotating unit, force application unit, and optical sensor may be powered in any suitable manner such as via motors, batteries and the like.

[0023] Where the system comprises an optical sensor, the optical sensor may dene a measuring location atwhich the at least one characteristic ofthe CPT probe can be measured, and wherein the driving unit is congured to move the CPT probe in a longitudinal direction through the measuring location. Dening a measuring location in this manner enables the optical sensor to remain stationary, while the CPT probe is moved relative to it. This is benecial because optical sensors often need to be precisely calibrated, such thatmovement ofthe sensor is disadvantageous. By keeping the optical sensor stationary, the system is made more reliable and simple. Sequential or continuous movement of the surface of the CPT probe past the measuring location dened by the optical sensor may be considered as scanning ofthe CPT probe by the optical sensor.

[0024] The system may comprise a user interface congured, in response to a user input, to: cause the driving unit to move the CPT probe and the optical sensor and / or force application unit relative to one another inthe longitudinal direction; and / or cause the rotating unit to rotate the CPT probe and the optical sensor and / or force application unit relative to one another about the longitudinal axis ofthe CPT probe. A user interface such as a pedal, paddle, button, switch, touch screen or gesture detection mechanism can enable a user ofthe system to easily interface with the system in an intuitive manner so as to move and adjust the relative position ofthe CPT probe. A separate user interface (e.g. pedal, paddle, button, switch, touch screen or gesture detection mechanism) may be provided to operate each component of the system. The user interface may comprise a foot-operated user interface, optionally a pedal. A foot-operated user interface advantageously enables hands-free operation ofthe system, leaving the user free to perform other tasks with their hands.

[0025] The mounting unit used to hold the CPT probe in use may be congured to receive the CPT probe in a screw-t engagement. A screw-t engagement between the CPT probe and the mounting unit provides a secure and reliable mounting mechanism for the CPT probe. The rotating unit may be congured to rotate the mounting unit about the same longitudinal axis as the CPT probe. In this case, the rotating unitmay be congured to rotate the CPT probe, once mounted, by rotating the mounting unit. This provides a simple and reliable mechanism for rotating the CPT probe. Where the mounting unit is congured to receive the CPT probe in a screw-t engagement, this arrangement can further be particularly useful at mounting / dismounting time because a user can then simply hold the CPT probe stationary while actuating the rotating unit to cause the mounting unit to spin and thereby engage or disengage the CPT probe. This is signicantly less strenuous than requiring a user to manually screw or unscrew the CPT probe onto or off the mounting unit. This functionality further synergises with a foot-operated user interface, ifsuch an interface is used, because this leaves the user free to use both hands to hold the CPT probe in place while it engages or disengages the mounting unit.

[0026] The system may comprise a controller congured to operate one ormore ofthe driving unit, the rotating unit, the optical sensor, and the force application unit in order to determine the at least one characteristic of the CPT probe and / or to test the sensitivity of the CPT probe to radial input forces. Movement and analysis ofthe CPT probe may therefore be computer-implemented, using a controller that is congured to position theCPT probe, using the driving and rotating units, and then obtain a measurement associated with theCPT probe using the optical sensor and / or force application unit. The controller may comprise any suitable computer apparatus comprising a processor and memory congured to execute machine-readable instructions.

[0027] The system may comprise a frame to which one or more ofthe mounting unit, driving unit, rotating unit, optical sensor, and force application unit are connected. A frame may provide structural stability to the system and may enable ease of transportation as all components are connected together. Additional components ofthe system, ifpresent, may also be connected to the frame, including but not limited to the user interface and controller.

[0028] According to another aspect of the disclosure, a method of analysing a CPT probe is provided. The method may use some or all ofthe components described above.

[0029] The method may comprise determining at least one characteristic of the CPT probe. The method may comprise adjusting a relative position of a CPT probe that is mounted on a mounting unit and an optical sensor. The relative position may be adjusted by: moving, using a driving unit, the CPT probe and / or the optical sensor in a longitudinal direction ofthe CPT probe; and / or by rotating, using a rotating unit, the CPT probe and / or the optical sensor about the longitudinal axis ofthe CPT probe. After adjusting the relative position ofthe CPT probe and the optical sensor, the method may comprise measuring, using the optical sensor, at least one characteristic ofthe CPT probe.

[0030] As noted above in respect ofthe disclosed system, this method provides away to easily and efciently measure, using an optical sensor, at least one characteristic of the CPT probe. In particular, because the CPT probe can be mounted and then have its relative position (longitudinal and / or rotational) relative to the sensor modied, different areas ofthe CPT probe surface can be analysed by the sensor in a repeatable, systematic and precise way. As noted above, the relative longitudinal and rotational motion of the CPT probe and the optical sensor can be achieved by moving the CPT probe only, by moving the optical sensor only, orby moving both the CPT probe and the optical sensor.

[0031] The method may comprise repeating the determination ofthe characteristic ofthe CPT probe by readjusting the relative position ofthe CPT probe and the optical sensor. Readjusting the relative position ofthe CPT probe and the optical sensormay comprise: moving, using the driving unit, the CPT probe and / or the optical sensor in the longitudinal direction; and / or rotating, using the rotating unit, the CPT probe and / or the optical sensor about the longitudinal axis of the CPT probe. The method may then comprise measuring, at the readjusted position and using the optical sensor, the at least one characteristic ofthe CPT probe.

[0032] Repeating the analysis of the CPT probe at different longitudinal positions and / or rotations in this manner enables a more complete analysis of the CPT probe to be conducted. Because the longitudinal and rotational readjustment is performedby the driving and rotating units, this method can be performed quickly and efciently with minimal or no manual adjustment required.

[0033] The at least one characteristic of the CPT probe may be measured at a plurality of relative longitudinal positions ofthe CPT probe and optical sensor. This enables the CPT probe to be analysed at a number ofpositions along its longitudinal length. In one example, the diameter of a lter element and ofa lower, middle, and upper section ofthe friction sleeve ofthe CPT probe may be analysed. In some cases, these measurements may all be performed at the same rotational position so as to reduce the number ofvariables being analysed. In some examples, measurements can be taken continuously over the full length ofthe CPT probe portion being analysed.

[0034] The at least one characteristic of the CPT probe may be measured at a plurality of relative rotational positions of the CPT probe and optical sensor. This enables the CPT probe to be analysed at a number of rotational positions. In one example, the diameter of the cylindrical part of the cone of the CPT probe may be measured at three rotational positions (e.g. 0 degrees, 120 degrees, 240 degrees). In some cases, these measurements may all be performed at the same relative longitudinal position such as at the interface between the cone and the friction sleeve of the CPT probe, so as to reduce the number ofvariables being modied at any one time.

[0035] The at least one characteristic of the CPT probe may be measured at: 120 degree rotational intervals, rotational intervals ofless than 120 degrees, or rotational intervals ofbetween 30 and 120 degrees, optionally wherein the rotational intervals are equal. Any suitable rotational interval can be used. For example, measurements can be taken every 60 or 45 degrees. Alternatively, measurements can be taken continuously over the full circumference of the CPT probe portion being analysed.

[0036] The method may comprise testing the sensitivity of the CPT probe to radial input forces. The method may in that case comprise applying, using a force application unit, a force to a CPT probe that is mounted in a mounting unit, wherein the force is applied to the CPT probe from a radial direction relative to the longitudinal axis of the CPT probe. The method may comprise recording, while the force is applied, a response signal from the CPT probe.

[0037] As noted above, performing such a test can determine whether or not the CPT probe is overly sensitive to radial forces and / or bending, which can be a sign of a defective CPT probe. The response signal may be recorded in memory of the CPT probe itself and / or transmitted to an external controller for recordal by the external controller. As noted above, this data transmittal from the CPT probe may happen in real time as the test is conducted, or the data may be obtained from the CPT probe at a later time. Preferably, the response signal is recorded throughout the test at a frequency of at least 1 Hz. Preferably, the response signal is recorded after a threshold time has elapsed since the force has been applied to the CPT probe. This ensures consistency in the measurement and ensures any force or mass applied against the CPT probe has settled into place.

[0038] Recording a response signal from the CPT probe may comprise recording one or more of: the apparent cone resistance, the sleeve friction, the pore pressure; the temperature, and the inclination recorded or measured by the CPT probe. These parameters are important indicators of whether the CPT probe is performing (i.e. responding to input signals) correctly. In some examples, the minimum and maximum values ofsome or all ofthe above parameters is recorded and reported.

[0039] The method may comprise comparing one or more parameters identied by the response signal to a threshold and, ifthe one ormore parameters exceed the threshold, determining that the CPT probe is defective. As noted above, a CPT probe that is too sensitive to radial input forces or bending caused by such forces may be defective. This determination can be recorded, for example in memory ofthe CPT probe and / or of a controller. The determination may be identied to a user, such as via a user interface or readout. The step ofcomparing the one ormore parameters identied by the response signal to a threshold may comprise a step ofconverting the raw readout data of the CPT probe to a different unit ofmeasurement or indication which makes it easier to compare to a known threshold. In one such example, the raw count data ofthe CPT probe may be converted to kPa. The term exceed a threshold in this context can include exceeding the threshold both in the positive and negative sense, in other words being too high or too low relative to the threshold.

[0040] The method may further comprise repeating the force sensitivity test at a second rotational position of the CPT probe by removing the force from the CPT probe, readjusting a relative position of the CPT probe and the force application unit, re-applying, using the force application unit and from a / the radial direction, the force to theCPT probe atthe readjusted relative rotational position, and recording, while the force is re-applied, a second response signal from the CPT probe.

[0041] The readjusting may comprise rotating, using a rotating unit, the CPT probe and / or the force application unit about the longitudinal axis ofthe CPT probe. Repeating the analysis ofthe CPT probe at different relative rotational positions enables a more complete analysis of the CPT probe to be conducted. Because the rotational readjustment is performed by the rotating unit, this method can be performed quickly and efciently with minimal or no manual adjustment required. As noted above, the relative rotational motion ofthe CPT probe and the force application unit can be achieved by moving the CPT probe only, by moving the force application unit only, or by moving both the CPT probe and the force application unit.

[0042] The sensitivity of the CPT probe to radial forces may be measured at three or more relative rotational positions of the CPT probe. This enables the CPT probe to be analysed at a number ofrelative rotational positions. In one example, the testmay be repeated at three rotational positions (e.g. 0 degrees, l20 degrees, 240 degrees). The sensitivity of the CPT probe to radial forces may be measured at:120-degree rotational intervals, rotational intervals of less than 120 degrees; rotational intervals ofbetween 30 and 120 degrees; or rotational intervals of45 degrees. Any suitable rotational interval can be used. The rotational intervals may be equal. Alternatively, measurements can be taken continuously over the full circumference of the CPT probe portion being analysed.

[0043] The method may further comprise repeating the force sensitivity test at a second longitudinal position ofthe CPT probe by: removing the force from the CPT probe, readjusting a relative position of the CPT probe and the force application unit, re-applying, using the force application unit and from the radial direction, the force to the CPT probe at the readjusted relative longitudinal position and recording, while the force is re-applied, a second response signal from the CPT probe. The readjusting may comprise moving, using a driving unit, the CPT probe and / or the force application unit in a longitudinal direction. Repeating the analysis of the CPT probe at different longitudinal positions enables a more complete analysis of the CPT probe to be conducted. Because the longitudinal readjustment is performed by the driving unit, this method canbe performed quickly and efciently withminimal orno manual adjustment required. As noted above, the relative longitudinal motion of the CPT probe and the force application unit can be achieved by moving the CPT probe only, by moving the force application unit only, or by moving both the CPT probe and the force application unit.

[0044] The force may be applied to the CPT probe in a region that is distal from the point of xation between the CPT probe and the mounting unit. By applying the force to a point ofthe CPT probe that is distal (i.e. distanced away from, not proximal) to the point where the CPT probe is mounted, the rotational moment (and thus thebending force) applied to theCPT probe is increased. This improves the test ofthe probes sensitivity to radial input forces because the strain applied to the CPT probe will be higher, increasing the likelihood that a defect is identiable if present. In some cases the CPT probe may be mounted to the mounting unit at the opposite end to where the CPT cone is provided. In this case, the most distal point ofthe CPT probe from the point ofxation is the end of the cone. However, in practice it may be difcult to reliably apply the force to the cone region, because the force applicator (e.g. mass) may tend to slip offdue to the cones shape. Accordingly, the force may advantageously be applied to the region of the CPT probe where the cone meets or abuts the friction sleeve, which is the most distal point of the CPT probe from the xing point that is cylindrical and thus enables a rm connection or abutment of the force applicator. Where the system comprises an optical sensor, this sensor can be used to accurately identify the point where the cone meets or abuts the friction sleeve so as to determine the point at which the force should be applied. Preferably, the force is applied to the CPT probe in a region that is between 400mm and 600mm from the point of xation between the CPT probe and the mounting unit. Tests in this region have been shown to yield reliable results. In other examples, different distances may be used.

[0045] The force may be applied to the CPT probe for a duration of at least 5 seconds, preferably between 5 and 30 seconds. The present inventors have identied that performing the test for at least this time ensures a reliable test result. Performing the test for between 5 and 30 seconds provides an optimum balance between reliability and efciency in terms ofnot taking too long for each test.

[0046] The method may further comprise mounting the CPT probe to the mounting unit. This may be performed manually by a user or autonomously, such as by a robot. The robot may be under control ofthe controller.

[0047] Mounting the CPT probe to the mounting unit may comprise: abutting the CPT probe to the mounting unit; and actuating the rotating unit so as to rotate the mounting unit, thereby causing the mounting unit to engage with the CPT probe in a screw-t. This provides a simple means to connect the CPT probe to the mounting unit in a manner that does not require the CPT probe to rotate. This means the CPT probe can be held substantially stationary, which makes the connection process less strenuouswhen performed by a user. This is highly benecial given a user may mount a large number of CPT probes over the course of a day, week or year. It will be appreciated that the same process can be used in reverse (by reversing the direction of rotation) when dismounting the CPT probe from the mounting unit, providing similar benets.

[0048] The methods disclosed herein may be performed by one or more computing devices, such as a controller of the analysis system. Accordingly, one or more computing devices congured to perform any of the methods disclosed herein is disclosed. Further, a computer program comprising instructions which, when the program is executed by one or more computing devices, cause the one or more computing devices to carry out any ofthe methods disclosed herein is disclosed. Further, a computer-readable medium comprising instructions which, when executed by one or more computing devices, cause the one or more computing devices to carry out any of the methods disclosed herein is disclosed.

[0049] The term apparatus as used herein may refer to either a single apparatus or plural apparatus and should not be understood as being particularly limited to either a single discrete apparatus or a plurality of discrete apparatus unless a particular apparatus is further described as such.

[0050] The above mentioned and other features and advantages ofthe disclosure will be best understood from the following description referring to the attached drawings. In the drawings, like reference numerals denote identical parts or parts performing an identical or comparable function or operation. BRIEF DESCRIPTION OF THEDRAWINGS

[0051] In order to describe the manner in which the above-recited and other advantages and features of the disclosure can be obtained, a more particular description of the principles briey described above will be rendered by reference to specic embodiments thereof which are illustrated in the appended drawings. Understanding that these drawings depict only exemplary embodiments of the disclosure and are therefore not to be considered to be limiting of its scope, the principles herein are described and explained with additional specicity and detail through the use ofthe accompanying drawings in which:

[0052] FIG. 1 shows a comprising a probe scanning subsystem and a force sensitivity subsystem,

[0053] FIG. 2 shows the probe scanning subsystem in further detail in perspective view,

[0054] FIG. 3 shows the probe scanning subsystem in further detail from a side-on view,

[0055] FIG. 4 shows the force sensitivity subsystem in further detail in a rst perspectiveview,

[0056] FIG. 5 shows the force sensitivity subsystem in further detail in a second perspective view,

[0057] FIG. 6 shows a method ofdetermining at least one characteristic of a CPT probe;

[0058] FIG. 7 shows a method oftesting the sensitivity of a CPT probe to radial input forces, and

[0059] FIG. 8 shows a schematic diagram ofa computing device that can be used to implement the methods ofthe present disclosure. DETAILED DESCRIPTION

[0060] Examples contemplated by the present disclosure will now be described in more detail with reference to the accompanying drawings. The disclosed subject matter should not be construed as limited to only the embodiments set forth herein. Rather, the illustrated embodiments are provided by way of example to convey the scope of the subject matter to those skilled in the art.

[0061] FIG. 1 shows a system 100 for analysing a CPT probe 400. The system comprises two subsystems. A rst subsystem 200, referred to as a probe scanning subsystem hereafter, is congured to determine at least one characteristic of the CPT probe 400. The probe scanning subsystem 200 achieves this by moving and rotating the CPT probe 400 and scanning the CPT probe 400 with an optical scanner. A second subsystem 300, referred to as a force sensitivity subsystem hereafter, is congured to testthe sensitivity oftheCPT probe 400 to radial input forces. The force sensitivity subsystem 300 achieves this by moving and rotating the CPT probe 400 and applying a radial input force to the CPT probe 400 using a force application unit. As can be seen from Figure 1, both the probe scanning subsystem 200 and force sensitivity subsystem 300 can be provided as part of the same single analysis system 100. Both subsystems 200, 300 and their components canbe connected or afxed to one another, for examplevia aframe (not shown)which provides structural stability to the system and enables ease oftransportation.

[0062] While itmay be advantageous to provide both subsystems 200, 300 as part ofthe same single system 100, this is not necessary, and the subsystems can also function and be provided independently. Accordingly, while components of one subsystem 200, 300 may synergise with those ofthe other subsystem 200, 300 (as described more fully below), the features ofone are not essential for functioning ofthe other.

[0063] The subsystems 200, 300 will now be described in further detail with reference to FIGs 2-5. For ease ofunderstanding, the subsystems 200, 300 are shown and described independently. However, it will be appreciated that the described functionality and componentry applies equally in implementations where the subsystems 200, 300 are provided together as part ofa single system 100 as is the case in FIG. 1.

[0064] Turning now to FIG. 2, the probe scanning subsystem 200 is shown in greater detail from a perspective view. Certain components are hidden to aid visibility.

[0065] The probe scanning subsystem 200 can be used for determining characteristics ofCPT probes, such as CPT probe 400 shown in FIG. 2. The probe scanning subsystem 200 comprises a mounting unit 202 congured to receive the CPT probe 400.

[0066] In this example implementation, the mounting unit 202 is congured to receive the CPT probe 400 in a screw-t engagement such that the CPT probe 400 can be screwed into the mounting unit 202 during mounting. The CPT probe 400 can similarly be unscrewed from the mounting unit 202 during dismounting. Such a screw-t engagement between the CPT probe 400 and the mounting unit 202 provides a secure and reliable mounting mechanism which can be easily performed by both ahuman or a robotic operator.

[0067] CPT probes typically comprise componentry and electronics congured, in use, to determine properties ofthe environment inwhich theCPT probe is provided, in particular aground or soil environment during a CPT test. Advantageously, in this example implementation the mounting unit 202 comprises a connector congured to connect electronically to this componentry ofthe CPT probe 400 in order to enable data transfer from the CPT probe 400. Data can be both read from and written to the CPT probe 400 via the connector, as required. Reading ofdata from the CPT probe 400 may in some cases be performed to check the type ofCPT probe 400 that is being tested. Reading ofdata from the CPT probe 400 may also form a step in an analysis method ofthe CPT probe 400, as described in further detail below with respect to Figure 7. In this example implementation, the electronic connection between the mounting unit 202 and the CPT probe 400 includes a slip ring that enables CPT probe 400 and / or mounting unit 202 to spin without any cables attached thereto becoming twisted or tangled.

[0068] The example probe scanning subsystem 200 further comprises an optical sensor 212 congured to measure at least one characteristic ofthe CPT probe 400. The optical sensor 212 in this example denes a measuring location atwhich the at least one characteristic ofthe CPT probe 400 can be measured. By altering the relative position of the optical sensor 212 and CPT probe 400, different portions ofthe CPT probe 400 can be placed at the measuring location as described more fully below to enable the optical sensor 212 to analyse different portions of the CPT probe 400.

[0069] In this example implementation, optical sensor 212 comprises a transmitting portion and an opposing receiving portion. The transmitting portion is congured to transmit parallel light rays that are received by the receiving portion. When an object, such as CPT probe 400, is moved in between the transmitting and receiving portions, the optical sensor 212 will detect that certain light rays are being blocked by the object and are not being received by the receiving portion. Based on this, a shadow of the object can be determined, from which the dimensions of the object can be inferred. In some implementations, additional or alternative types of optical sensor 212 can be used, for example sensors which determine characteristics ofan object based on light rays reected from the object. Optical sensor 212 may thus comprise any suitable components including light emitters, light receivers, lasers, cameras, lenses and the like enabling optical analysis ofthe CPT probe.

[0070] It will be appreciated that, depending on the type of optical sensor 212 used, various characteristics of the CPT probe 400 may be determined including dimensions, shapes, colours, markings or other visually identiable characteristics ofthe CPT probe 400. In some examples the characteristic may comprise a diameter of at least a portion of the CPT probe 400, a length or height of at least a portion ofthe CPT probe 400, or a surface area of at least a portion ofthe CPT probe 400. The portion ofthe CPT probe 400 may be some or all ofthe cone end portion 400a or some or all ofthe cylindrical friction sleeve portion 400b ofthe CPT probe 400.

[0071] By determining characteristics such as these, the probe scanning subsystem 200 can identify, for example, one or more of the following: what kind of probe the CPT probe 400 is; whether its dimensions, shape, or appearance are as expected, whether there are any signs of damage, structural vulnerability, or poor construction; whether the CPT probe 400 is the correct or an expected shape, or, more generally, whethertheCPT probe 400 has the correct or an expected appearance. Determining whether a particular characteristic is correct or as expected may involve comparing the characteristic to a predetermined threshold or base value, such as may be set by ISO standards and the like. Deviations beyond a given threshold or range may be identied as indicating a problem with the CPT probe 400. In this manner, probe scanning subsystem 200 can contribute to checking and ensuring proper functioning, design, and construction ofCPT probe 400. This in turn ensures that a given CPT probe 400 is appropriately congured for obtaining reliable and accurate data in the eld during aCPT procedure.

[0072] The example probe scanning subsystem 200 further includes a driving unit 204 congured to move the CPT probe 400 in a longitudinal direction ofthe CPT probe, denoted by the arrow marked X. It will be appreciated that this longitudinal motion may be forwards (towards the optical sensor 212) as well as backwards (away from the optical sensor 212).

[0073] This longitudinal movement enables the CPT probe 400 and the optical sensor 212 to move relative to one another which in turn allows the optical sensor 212 to be aligned with and scan or image different portions ofthe CPT probe 400 as described above. In the present example implementation the relative movement is achieved by moving the CPT probe 400 and keeping optical sensor 212 stationary. However, it will be appreciated that in alternative arrangements the optical sensor 212 may be moved (for example by driving unit 204) while the CPT probe 400 is kept stationary, or alternatively both the optical sensor 212 and CPT probe 400 may be moved.

[0074] In the present example, mounting unit 202 is provided on a rail system and driving unit 204 is congured to drive a spindle 206 in order to move the mounting unit 202 and thus CPT probe 400 in the longitudinal direction X along the rail system. The driving force provided by driving unit 204 can be provided by any suitable motor, battery or other power source.

[0075] The example probe scanning subsystem 200 further includes a rotating unit 208 congured to rotate the CPT probe 400 and the optical sensor 212 relative to one another about the longitudinal axis ofthe CPT probe 400. This rotational motion is denoted by the arrow marked r in FIG. 2. It will be appreciated that the rotational motion may be clockwise as well as anti- clockwise.

[0076] Similarly to the longitudinal movement caused by driving unit 204 discussed above, rotational movement ofthe CPT probe 400 also enables the CPT probe 400 and the optical sensor 212 to move relative to one another in a rotational sense, which again allows the optical sensor 212 to be aligned with and scan or image different portions ofthe CPT probe 400. In the present example implementation the relative movement is achieved by rotating the CPT probe 400 and keeping optical sensor 212 stationary. However, it will be appreciated that in alternative arrangements the optical sensor 212 may be rotated about the CPT probe 400 (for example by rotating unit 208) while the CPT probe 400 is kept stationary, or alternatively both the optical sensor 212 and CPT probe 400 may be moved.

[0077] In the present example, the rotating unit 208 is congured to rotate the mounting unit 202, which in turn rotates CPT probe 400 held in mounting unit 202. Accordingly, in this implementation, the mounting unit 202 is rotated about the same longitudinal axis as the CPT probe 400. Othermechanisms for rotating CPT probe 400 will be apparent and rotation ofthe CPT probe 400 need not require rotation of the mounting unit 202 for example where a slip ring type engagement between the mounting unit 202 and CPT probe 400 is used.

[0078] In the present example, the rotating unit 208 comprises aworm gear 210 congured to drive rotation ofthe mounting unit202 (and thus theCPT probe 400). Rotating unit 208 andworm gear 210 can be driven by any suitable motor, battery or other power source.

[0079] As can be seen, the example implementation shown enables the driving unit 204 and rotating unit 208 to be operated independently. This enables the CPT probe 400 to be rotated and moved longitudinally independently. This in turn enables precise control of the position of the CPT probe 400 relative to optical sensor 212, which in turn allows the part ofCPT probe 400 being imaged by optical sensor 212 to be precisely controlled.

[0080] FIG. 3 shows the probe scanning subsystem 200 from a side-on view. Here, the longitudinal axis ofCPT probe 400, and thus the longitudinal direction referred to above, is in the plane ofthe page and points left to right (or right to left). The rotational motion referred to above is in this view into (or out of) the page. It can be seen that in this example implementation optical sensor 212 denes a measuring location at the far left end of probe scanning subsystem 200 as viewed in FIG. 3. This movement location represents a location or point through which the CPT probe 400 can be moved and rotated to enable different portions of the CPT probe 400 to be analysed by the optical sensor 212.

[0081] Turning now to FIG. 4, the force sensitivity subsystem 300 discussed above in relation to FIG. 1 is shown in further detail and from a front perspective view. Certain components are hidden to aid visibility.

[0082] The force sensitivity subsystem 300 can be used for testing the sensitivity of a CPT probe, such as CPT probe 400 shown in FIGs. 1-3, to radial input forces. As described above, an ideal CPT probe 400 responds only to input forces received in the longitudinal direction, that is the direction in which the probe is entering the ground during a CPT test (equivalent to direction X shown in FIGs. 2 and 3). In reality, no CPT probe 400 is completely ideal and so some registering of radial forces (e.g. lateral forces coming from the side of the probe, generally perpendicular to direction X) will occur. This means that radial input forces applied to the CPT probe 400 will affect signals recorded by the CPT probe to at least a certain extent.A threshold of acceptable sensitivity to such lateral forces can be set to ensure a given CPT probe is functioning acceptably and in a manner that will result in reliable and accurate measurements during CPT tests. The force sensitivity subsystem 300 ofthe present disclosure allows the sensitivity ofa CPT probe 400 to be tested in a systematic, repeatable and preciseway such that the application ofradial input forces on the CPT probe 400 can be assessed.

[0083] In order to perform the force sensitivity test, a mounting unit congured for receiving a CPT probe and holding it in place is provided. Advantageously, in some implementations the same mounting unit 202 as described above in relation to the probe scanning subsystem 200 can be used. In other words, the force sensitivity subsystem 300 and probe scanning subsystem 200 may share the same mounting unit 202 (as shown in FIG. 1). The mounting unit202 and CPT cone 404 are not shown in FIGs. 4 or 5.

[0084] Force sensitivity subsystem 300 further comprises a force application unit congured to engage the CPT probe 400 with a force when the CPT probe 400 is mounted in the mounting unit 202. The force application unit is congured to apply a force to the CPT probe 400 from a radial (also referred to as a sideways or lateral) direction relative to the longitudinal axis of the CPT probe 400. Preferably, the force is congured to be applied approximately or exactly perpendicularly to the longitudinal axis ofthe CPT probe 400, i.e. perpendicularly to direction X shown in FIGs. 2 and 3. The force application unit may comprise any suitable mechanism for applying a force to the side ofthe CPT probe 400.

[0085] In some implementations, the force application unit comprises an actuator such as a bar, probe, ormember that is congured to be moved into contact with the CPT probe 400 in order to apply the required radial force. In the implementation of FIG. 4, the force application unit comprises a lowerable mass 304. Use of a lowerable mass 304 provides a simple way to reliably apply a force of a known magnitude to the CPT probe 400. In particular, engaging the CPT probe 400 with the force may comprise moving the mass 304 from a raised to a lowered position such that the mass 304 comes into contact with and rests on (applies its weight to) the CPT probe 400. The force being applied to the CPT probe 400 is then the weight ofthe mass 304, which is a stable and xed value that can be measured before the test. Suitable lowerable mass 304 values include a mass with a weight of between 50N and 150N, preferably between SON and 120N, more preferably between 90N and 110N. Weights in these ranges have been found to be particularly suitable for testing the sensitivity ofCPT probes to radial forces. Different types or sizes ofCPT probe may benet from testing using different weights. In some examples, the system 100 may therefore be congured to determine a type of the CPT probe and, based on this determination, select an appropriate weight to apply as indicated by, for example, a lookup table or code stored in a database.

[0086] A rst set ofguide rails 302 may be congured to guide the lowerable mass 304 as it is raised and lowered into and out ofcontact with the CPT probe 400. In particular, the guide rails 302 may enable the lowerable mass 304 to be raised to a sufcient height such thatCPT probe 400 can be placed underneath the lowerable mass 304 with a clearance. Once the CPT probe 400 is suitably positioned, the lowerable mass 304 can then be lowered down into contact with the CPT probe 400.

[0087] FIG. 5 shows a reverse perspective view of the example force sensitivity subsystem 300 ofthe present implementation. As canbe seen, a supportmember308 attached to the lowerable mass 304 is provided on a second set of guide rails 306. Movement of the support member 308 along these rails 306 is, in this example, driven by turning of a spindle 310. The support member 308 is (detachably) coupled to the lowerable mass 304, such that motion of the support member 308 moves the lowerable mass 304 relative to the guiding system 302 on the reverse side of the force sensitivity subsystem 300.

[0088] Advantageously, in this example, the supportmember 308 is detachably coupled to the lowerable mass 304. In particular, the supportmember is congured to support the lowerable mass 304 when the mass is in the raised position but is congured to disengage from the mass 304 once the mass is in contact with the CPT probe 400. Such a coupling may be provided, for example, by a bar, latch, or nger extending from the support member 308 and engaging a portion of the lowerable mass 304. Once the mass 304 comes into contact with the CPT probe 400, disengagement of the support member 308 from the mass 304 can be achieved by continuing to turn the spindle 310. The supportmember 308 will then continue to move downward under action of the spindle 310, whereas the mass 304 will remain in place because it has come into contact with the CPT probe 400. This causes the support member 308 to disengage from the lowerable mass 304. The support member 308 is then no longer in contact with the lowerable mass 304, meaning that the full weight ofthe mass 304 is resting on theCPT probe 400. This is advantageous as it improves the accuracy and reliability of the test, given the precise size of the force being applied to the CPT probe 400 is then known. When it is required to disengage the mass 304 from the CPT probe 400, the spindle 310 can be turned in the opposite direction. This raises the support member 308 until it comes back into contact with and re-engages with the lowerable mass 304. Further turning ofthe spindle 310 then moves the supportmember 308 and the now-coupled mass 304 upwards and out ofcontact with the CPT probe 400.

[0089] Irrespective of precisely how the force is applied, by applying a radial force to CPT probe 400, the response ofthe CPT probe 400 to the radial force can be analysed. For example, a response signal of the CPT probe 400 during the time in which the radial force is applied can be recorded. The response signal may be indicative of one or more of the following: the apparent cone resistance; the sleeve friction, the pore pressure; the temperature; and the inclination as measured by the CPT probe 400. Measuring these or other signals while a radial force is applied to the CPT cone 400 enables a determination ofwhether the CPT cone is functioning correctly and within acceptable tolerances. Determining whether a particular response signal or determined parameter is acceptable may involve comparing the response signal or parameter to a predetermined threshold or base value, such as may be set by ISO standards and the like. Deviations beyond a given threshold or range may be identied as indicating a problem with the CPT probe 400. In this manner, force sensitivity subsystem 300 can contribute to checking and ensuring proper functioning ofCPT probe 400. This in turn ensures that a given CPT probe 400 is appropriately congured for obtaining reliable and accurate data in the eld during a CPT procedure. It can be seen, therefore, that force sensitivity subsystem 300 synergises with the aims and advantages ofprobe scanning subsystem 200.

[0090] As in the case ofthe probe scanning subsystem 200, it can be advantageous to use force sensitivity subsystem 300 to test aCPT probe 400 in a number ofpositions, both longitudinal and rotational. Force sensitivity subsystem may therefore advantageously comprise a driving unit congured to move the CPT probe 400 and the force application unit relative to one another in a longitudinal direction of the CPT probe. Force sensitivity subsystem may alternatively or additionally advantageously comprise a rotating unit congured to rotate the CPT probe 400 and the force application unit about the longitudinal axis of the CPT probe. Advantageously, the driving unit may be driving unit 204 of the probe scanning subsystem 200. Advantageously, the rotating unit may be rotating unit 208 of the probe scanning subsystem 200. In other words, the force sensitivity subsystem 300 and probe scanning subsystem 200 may share the same driving unit 204 and rotating unit 208 (as shown in FIG. 1). By using these driving and rotating units, a CPT probe 400 can be positioned at a given longitudinal and / or rotational position relative to the force application unit (e.g. relative to lowerable mass 304). A radial force can then be applied to CPT probe 400 by the force application unit at that position. The longitudinal and / or rotational position ofCPT probe 400 can then be changed, and the radial force can be reapplied in the new position. In the present example implementation the relative movement is achieved by rotating / moving the CPT probe 400 and keeping the force application unit stationary. However, it will be appreciated that in alternative arrangements the force application unitmay be rotated about the CPT probe 400 while the CPT probe 400 is kept stationary, or alternatively both the force application unit and CPT probe 400 may be moved. If the force application unit is to be rotated, then an actuator based design is preferable to a lowerable weight based design.

[0091] It will be appreciated that the probe analysis system 100 may comprise any suitable mechanism for controlling the various components described above, such as the various components ofthe probe scanning subsystem 200 or the force sensitivity subsystem 300. In some examples, some or all of the components may be computer controlled, in other words their functions can be controlled in response to instructions transmitted by a controller such as the example controller described below in reference to FIG. 8.

[0092] In some examples, the system 100 (optionally a controller of the system) comprises one or more user interface, through which some or all ofthe components ofthe system 100 can be controlled by a user. For example, one or more user interfaces may be used to operate the driving unit 204, the rotating unit 208, the optical sensor 212, the force application unit, or any other component ofthe system 100. The one or more user interfaces may be used to change the relative position oftwo or more components ofthe system 100. The one or more user interfaces may take any suitable form, including but not limited to hand or foot operated interfaces such as a pedal, paddle, button, switch, touch screen or gesture detection device. Foot-operated interfaces are particularly advantageous for use with the present system 100 because they enable an operator to keep their hands free for other tasks such as interacting with components of the system 100 or operating a controller such as a computing device. Where a user interface is used to rotate the mounting unit 202, this can synergise particularly well with CPT cones that are mounted to the mounting unit 202 using a screw t. This is because a user can simply hold the CPT cone in place in abutment with the mounting unit 202, while causing the rotating unit 208 to rotate the mounting unit 202. This rotation will cause the CPT cone to engage the mounting unit 202 and avoids the need to manually rotate or screw the CPT cone into place. This reduces strain on the operator which is very benecial as operators may mount a large number ofCPT cones in succession. It will be appreciated that the same principle applies in reversewhen CPT cones are dismounted, in which case the mounting unit 202 can be caused to rotate in the opposite direction. This principle works particularly well when the user interface in question is foot-operated, because in that case the user has both hands free to hold the CPT cone in place.

[0093] Methods of using the disclosed system 100 for CPT probe analysis will already be apparent from the above descriptions of the various components and subsystems 200, 300 ofthe system 100. To further aid understanding, particular example methods of using the respective probe scanning and force sensitivity subsystems 200, 300 will now be described with reference to FIGs. 6 and 7.

[0094] Turning rst to FIG. 6, an example method of determining at least one characteristic of aCPT probe is shown. The method may be performed using the probe scanning subsystem 200 described above.

[0095] The method may comprise an initial step 600 of mounting the CPT probe to the mounting unit. The CPT probe can be mounted to the mounting unit in any suitable manner, using any suitable fastening mechanism or means. The mounting should preferably be reversible such that the CPT probe can be detached from the mounting unit after testing. The mounting may be performed manually by a user or autonomously, such asby a robot. The robotmay beunder control of a controller.

[0096] As discussed above, in some implementations the mounting may be by a screw-t connection. In that case, mounting the CPT probe to the mounting unitmay comprise abutting the CPT probe to the mounting unit and actuating the rotating unit so as to rotate the mounting unit, thereby causing the mounting unit to engage with the CPT probe in a screw t.

[0097] Next, at step 602, themethodmay comprise adjusting a relative position ofthemounted CPT probe and an optical sensor, such as optical sensor 212 described above. This enables the CPT probe to be analysed by the optical sensor at a specic desired position. The adjusting may comprise moving, using a driving unit (such as driving unit 204 described above), the CPT probe and / or the optical sensor in a longitudinal direction ofthe CPT probe. The adjusting may comprise rotating, using a rotating unit (such as rotating unit 208 described above), the CPT probe and / or the optical sensor about the longitudinal axis ofthe CPT probe.

[0098] Once the desired relative position of the CPT probe and the optical sensor has been obtained, for example once a measuring location of the optical sensor has been aligned with a portion ofthe CPT probe which it is desired to analyse, the method may proceed to step 604 which comprises measuring, using the optical sensor, at least one characteristic of the CPT probe. As discussed above, any suitable feature of the CPT probe may be measured at this stage, including but not limited to: a diameter of at least a portion ofthe CPT probe; a length of at least a portion ofthe CPT probe; and a surface area of at least a portion ofthe CPT probe.

[0099] It will be appreciated that the methodmay then be repeated as many times as necessary, for the same CPT probe or for differentCPT probes.

[0100] Ifthe sameCPT probe is tobe analysed again, then in one example step 604may simply be repeated with the CPT probe at the same position. This may be done if repeat measurements are desired. Alternatively, the CPT probe may rst be repositioned such that a different portion of the CPT probe can be scanned and analysed by the optical sensor. In that case, the method may return to step 602 and the relative position of the CPT probe and the optical scanner may be adjusted.

[0101] Where the relative position is to be readjusted, the method may comprise readjusting the relative position ofthe CPT probe and the optical sensorby moving, using the driving unit, the CPT probe and / or the optical sensor in the longitudinal direction. The readjusting may comprise rotating, using the rotating unit, the CPT probe and / or the optical sensor about the longitudinal axis of the CPT probe. Once the readjustment is completed and the CPT probe is at the (new) desired position, the method may repeat step 604 and measure, at the readjusted position and using the optical sensor, at least one characteristic ofthe CPT probe. The use ofthe previously discussed driving unit 204 and rotational unit 208 to perform the repositioning ofthe CPT probe mean that measurements can be taken at a large number ofrelative positions quickly and easily with minimal manual input required.

[0102] In some implementations, the at least one characteristic of the CPT probe can be measured at a plurality ofrelative longitudinal positions oftheCPT probe and optical sensor and / or at a plurality of relative rotational positions of the CPT probe and optical sensor. In some implementations, each CPT probe may be analysed at three rotational positions, each separated by 120 degrees. In other implementations, rotational intervals ofless than 120 degrees may be used. Preferably, although not necessarily, the rotational intervals are equal such that a uniform analysis ofthe CPT probe is performed. Rotational and longitudinal repositioning during analysis may be incremental, in otherwords the readjustment may be performed and then the optical scanner may scan the CPT probe at the new position. Alternatively, the readjustment may be continuous and the optical scannermay scan the CPT probe throughout the continuous rotation and / or longitudinal movement.

[0103] If a new probe is to be analysed, then the previous probe may be removed and the method may return to step 600 in respect ofthe new probe. The method may then repeat as needed until the new probe has been sufciently analysed. In this manner, a large number ofCPT probes can be quickly analysed in the same reliable, repeatable and accurate manner.

[0104] Turningnow to FIG. 7, an example method oftesting the sensitivity of aCPT probe to radial input forces is shown. The methodmay be performed using the force sensitivity subsystem 300 described above.

[0105] The method may comprise an initial step 700 ofmounting the CPT probe to a mounting unit. This step may be substantially the same as step 600 of FIG. 6 described above, and so the same considerations and potential implementations discussed above in respect of step 600 apply equally to step 700.

[0106] The method may then comprise a step 702 ofadjusting the relative position ofthe CPT probe and a force application unit, such as the force application unit described above in relation to force sensitivity subsystem 300. This step may be substantially the same as step 602 of FIG. 6 described above, and so the same considerations and potential implementations discussed above in respect of step 602 apply equally to step 702, with the only difference being that in the case of FIG. 7 it is the relative position of the CPT probe and the force application unit that is being adjusted, rather than the relative position of the CPT probe and an optical sensor in the case of FIG. 6.

[0107] Next, at step 704, the method comprises applying, using a force application unit (such as discussed above in relation to force sensitivity subsystem 300), a force to a CPT probe that is mounted in a mounting unit (such as mounting unit 202 discussed above). As discussed above, the force is applied to the CPT probe from a radial direction relative to the longitudinal axis of the CPT probe. The force may be applied in any suitable manner. In one example implementation, as discussed above, the force is applied using a lowerable weight that is caused to come into contact with and rest on (apply its weight to) the CPT probe.

[0108] In some implementations the force may be applied to the CPT probe in a region that is distal from the point of xation between the CPT probe and the mounting unit so as to create a largermoment about the xation point and thereby increase the stress underwhich the CPT probe is placed during the test. This increases the likelihood that a defect is identied during analysis. Preferably the force is applied to the CPT probe for a duration of at least 5 seconds, preferably between 5 and 30 seconds, to ensure reliable data capture.

[0109] At step 706, the method comprises recording, while the force is applied, a response signal from the CPT probe. CPT probes comprise componentry and electronics congured to measure various parameters that are useful for conducting CPT tests, as is known in the art. By analysing and recordinghow the CPT probe responds while the radial input force is being applied, correct functioning ofthe CPT probe can be investigated. In particular, as described above, in an ideal case CPT probes should be oblivious to radial input forces, that is, their readings should not change as a result ofradial input forces. The signals recorded at step 706 may be recorded locally at memory ofthe CPT probe and / or at a controller ofthe system 100 based on data obtained (e.g. read from) from the CPT probe. The signals recorded may relate to, for example, the apparent cone resistance, the sleeve friction, the pore pressure, the temperature, or the inclination detected or measured by the CPT probe.

[0110] At step 708, the method comprises comparing one or more parameters identied by the response signal to a threshold. The threshold may be a known or predetermined threshold that represents an expected or correct reading for a given value or parameter. By checking whether the reading obtained from the probe at step 706 corresponds to or is near this known threshold, it can be determined whether the CPT probe is working correctly. The comparing at step 706 may be performed locally by a processor ofthe CPT probe and / or at a controller ofthe system 100 based on data obtained (e.g. readfrom) from theCPT probe. The comparing ofstep 708 canbe performed for any number of signals or parameters measured or recorded by the CPT probe while the radial force was being applied to it. In some cases, raw output data from the CPT probe may rst be converted to another unit, measurement or property prior to comparison as is known in the art. For example, raw count data from the CPT probe may be converted to a measurement in kPa to make it easier to compare to known threshold or base values.

[0111] Next, at step 710, the method may comprise determining, based on one or more parameter exceeding a threshold at step 708, that the CPT probe is defective. Such a nding may be alerted to a user or a control device in any suitable manner so as to prompt further investigation, repair and / or discarding of the CPT probe. It will be appreciated that, if no deviation from the threshold is detected or ifthe deviation is acceptable (for example as determined by ISO standards or the like), then step 710 may not occur and the CPT probe may instead be determined to be in good working order.

[0112] The method ofFIG. 7 may be repeated at any number ofrotational and / or longitudinal positions of the CPT probe relative to the force application unit, in the same manner as was discussed above in relation to FIG. 6. The radial force may be applied to any number ofportions or locations ofthe CPT probe. The method may therefore comprise repeating the force sensitivity test at a second rotational position of the CPT probe by removing the force from the CPT probe and readjusting a relative position ofthe CPT probe and the force application unit. The readjusting may be performed by rotating, using a rotating unit, the CPT probe and / or the force application unit aboutthe longitudinal axis oftheCPT probe. The readjustingmay alternatively or additionally be performed by moving, using a driving unit, the CPT probe and / or the force application unit in a longitudinal direction. After repositioning, themethodmay comprise re-applying, using the force application unit, the radial force to the CPT probe at the readjusted relative rotational and / or longitudinal position and recording, while the force is re-applied, a second response signal from the CPT probe.

[0113] The force sensitivity test may be performed multiple times for the same CPT probe at the same or at different positions. In some implementations, the sensitivity of the CPT probe is measured at three or more relative rotational positions ofthe CPT probe. For example, the testmay be conducted at three rotational positions each separated by 120 degree rotational intervals. In other examples, rotational intervals ofless than 120 degreesmay be used. Preferably the rotational intervals are equal to ensure uniformity, as discussed above in reference to FIG. 6.

[0114] After testing a given CPT probe, the CPT probe may be replaced by a new CPT probe and the method may be repeated for the newCPT probe.

[0115] In some examples, the methods ofFIGs. 6 and 7 may be performed synergistically. In particular, the comparison at step 708 of FIG. 7 of a signal recorded by the CPT probe to a threshold value may rely on a known dimension of the CPT probe. This may be the case, for example, when converting between a raw data unit recorded by the CPT probe and a more useful representative unit ofmeasurement that can easily be compared to aknown threshold. In this case, the method ofFIG. 6 may be performed to identify the dimension of the CPT probe in question, thereby enabling the required conversion and the completion ofthe comparison of step 708 ofFIG. 7. In this manner, the disclosed methods and systems can be used synergistically. One example use ofthis is when converting from raw count output data produced by a CPT probe to a value in kPa, which is a more useful unit for further analysis. This conversion can be done based on the force applied to the CPT probe and aknown surface area ofthe cone tip and sleeve portions ofthe CPT probe. The present system 100, and in particular the probe scanning subsystem 200, can be used to obtain the required dimension data such that said surface areas can be calculated, enabling the required conversion from counts to kPa.

[0116] More generally, the disclosed methods and systems can also be used to quickly analyse a CPT probe in a number of different ways using a single system. Where the probe scanning subsystem 200 and force sensitivity subsystem 300 share a single mounting unit, the methods of FIG. 6 and 7 can be performed consecutively or simultaneously and without having to dismount the CPT probe. Where the probe scanning subsystem 200 and force sensitivity subsystem 300 share a single driving and rotating unit, the system can be simplied and may require fewer controls and user interfaces.

[0117] The method of FIGs. 6 and 7, as well as all other methods disclosed herein, may in some implementations be performed autonomously, such as by one or more computing devices. FIG. 8 shows an example computing device 800 suitable for carrying out part or all ofthe methods described above. Such a computing device may be provided as (part of) a controller that forms part of or is in connection with the probe analysis system 100.

[0118] It will be appreciated that some method steps may be automated by a computer system whilst other steps of the method may be performed by a human. For example, the mounting steps 600 and 700 may be performed by ahuman while the remaining steps ofthe methods are performed by the computer system. In that case, steps 602 and 702 onwards respectively can be considered as self-dened, independent (computer-implemented) methods in their own rights that can be carried out independently of initial steps 600 and 700.

[0119] FIG. 8 shows a block diagram ofone implementation of a processing system 800 in the form of a computing device within which a set ofinstructions for causing the computing device to perform any one or more of the methodologies discussed herein may be executed. In alternative implementations, the computing device may be connected (e.g., networked) to other machines in a Local Area Network (LAN), an intranet, an extranet, or the Internet. The computing device may operate in the capacity ofa server or a client machine in a client-server network environment, or as a peer machine in a peer-to-peer (or distributed) network environment. The computing device may be a personal computer (PC), a tablet computer, a set-top box (STB), a Personal Digital Assistant (PDA), a cellulartelephone, aweb appliance, a server, anetwork router, switch orbridge, or any machine capable of executing a set of instructions (sequential or otherwise) that specify actions to be taken by that machine. Further, while only a single computing device is illustrated, the term computing device shall also be taken to include any collection of machines (e.g., computers) that individually or jointly execute a set (or multiple sets) of instructions to perform any one or more ofthe methodologies discussed herein.

[0120] The example processing system 800 includes a processor 802, a main memory 804 (e.g., read-only memory (ROM), ash memory, dynamic random access memory (DRAM) such as synchronousDRAM(SDRAM) orRambusDRAM (RDRAM), etc.), a static memory 806 (e.g., ash memory, static random access memory (SRAM), etc.), and a secondary memory (e.g., a data storage device 818), which communicate with each other via a bus 830.

[0121] Processor 802 represents one or more general-purpose processors such as a microprocessor, central processing unit, or the like. More particularly, the processor 802 may be a complex instruction set computing (CISC) microprocessor, reduced instruction set computing (RISC) microprocessor, very long instruction word (VLIW) microprocessor, processor implementing other instruction sets, or processors implementing a combination ofinstruction sets. Processor 802 may also be one or more special-purpose processors such as an application specic integrated circuit (ASIC), a eld programmable gate array (FPGA), a digital signal processor (DSP), network processor, or the like. Processor 802 is congured to execute the processing logic (instructions 822) for performing the operations and steps discussed herein.

[0122] The processing system 800 may further include a network interface device 808. The processing system 800 also may include a video display unit 810 (e.g., a liquid crystal display (LCD) or a cathode ray tube (CRT)), an alphanumeric input device 812 (e.g., a keyboard or touchscreen), a cursor control device 814 (e.g., a mouse or touchscreen), and an audio device 816 (e.g., a speaker).

[0123] It will be apparent that some features ofthe processing system 800 shown inFIG. 8 may be absent. For example, the processing system 800 may have no need for display device 810 (or any associated adapters). This may be the case, for example, for particular server-side computer apparatuses which are used only for their processing capabilities and do not need to display information to users. Similarly, user input device 812 may not be required. In its simplest form, processing system 800 comprises processor 802 and main memory 804.

[0124] The data storage device 818 may include one or more machine-readable storage media (or more specically one or more non-transitory computer-readable storage media) 828 on which is stored one or more sets ofinstructions 822 embodying any one or more ofthe methodologies or functions described herein. The instructions 822 may also reside, completely or at least partially, within the main memory 804 and / or within the processor 802 during execution thereof by the processing system 800, the main memory 804 and the processor 802 also constituting computer- readable storage media 828.

[0125] The various methods described above may be implemented by a computer program. The computer program may include computer code arranged to instruct one or more computing devices to perform the functions of one or more of the various methods described above. The computer program and / or the code for performing such methods may be provided to an apparatus, such as a computer, on one or more computer readable media or, more generally, a computer program product. The computer readable media may be transitory or non-transitory. The one or more computer readable media could be, for example, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, or a propagation medium for data transmission, for example for downloading the code over the Internet. Alternatively, the one or more computer readable media could take the form of one or more physical computer readable media such as semiconductor or solid state memory, magnetic tape, a removable computer diskette, a random access memory (RAM), a read-only memory (ROM), a rigid magnetic disc, and an optical disk, such as a CD-ROM, CD-R / W orDVD.

[0126] The computer program is executable by the processor 802 to perform functions ofthe systems and methods described herein.

[0127] In an implementation, the modules, components, and other features described herein can be implemented as discrete components or integrated in the functionality of hardware components such as ASICS, FPGAs, DSPs, or similar devices.

[0128] A hardware component is a tangible (e.g., non-transitory) physical component (e.g., a set ofone or more processors) capable ofperforming certain operations and may be congured or arranged in a certain physical manner. A hardware componentmay include dedicated circuitry or logic that is permanently congured to perform certain operations. A hardware componentmay be or include a special-purpose processor, such as a eld programmable gate array (FPGA) or an ASIC. A hardware component may also include programmable logic or circuitry that is temporarily congured by software to perform certain operations.

[0129] Accordingly, the phrase hardware component should be understood to encompass a tangible entity that may be physically constructed, permanently congured (e.g., hardwired), or temporarily congured (e.g., programmed) to operate in a certain manner or to perform certain operations described herein.

[0130] In addition, the modules and components canbe implemented asrmware or functional circuitry within hardware devices. Further, the modules and components can be implemented in any combination of hardware devices and software components, or only in software (e.g., code stored or otherwise embodied in a machine-readable medium or in a transmission medium).

[0131] The preceding detailed description is merely exemplary in nature and is not intended to limit the disclosure and its uses. Furthermore, there is no intention to be bound by any expressed or implied theory presented in the preceding technical eld, background, brief summary or the detailed description.

[0132] Examples of the present disclosure may be described herein in terms of functional and / or logical block components and various processing steps. It should be appreciated that such block components may be realised by any number of hardware, software, and / or rmware components congured to perform the specied functions. For example, an example ofthe present disclosure may employ various integrated circuit components, e.g., memory elements, digital signal processing elements, logic elements, look-up tables, or the like, which may carry out a variety offunctions under the control ofone or more microprocessors or other control devices. In addition, those skilled in the art will appreciate that examples of the present disclosure may be practised in conjunction with any number of systems, and that the systems described herein are merely exemplary embodiments ofthe present disclosure.

[0133] For the sake of brevity, conventional techniques compared to signal processing, data transmission, signalling, control and other functional aspects of the systems (and the individual operating components of the systems) may not be described in detail herein. Furthermore, the connecting lines shown in the various gures contained herein are intended to represent example functional relationships and / orphysical couplingsbetween thevarious elements. It shouldbe noted thatmany alternative or additional functional relationships or physical connection may be present in an example ofthe present disclosure.

[0134] Those skilled in the art will recognise that a wide variety ofmodications, alterations, and combinations can be made with respect to the above described examples without departing from the scope of the disclosed concepts, and that such modications, alterations, and combinations are to be viewed as being within the ambit ofthe disclosed concepts.

[0135] Further modications in addition to those described above may be made to the structures and techniques described herein without departing from the spirit and scope of the invention. Accordingly, although specic examples have been described, these are examples only and are not limiting upon the scope ofthe invention.

[0136] Also disclosed are the following clauses:

[0137] A1.A system for determining at least one characteristic ofa cone penetration test, CPT, probe, the system comprising: a mounting unit congured to receive a CPT probe; an optical sensor congured to measure at least one characteristic oftheCPT probe; a driving unit congured to move the CPT probe and the optical sensor relative to one another in a longitudinal direction of the CPT probe; and a rotating unit congured to rotate the CPT probe and the optical sensor relative to one another about the longitudinal axis ofthe CPT probe.

[0138] A2. The system of clause A1, wherein the mounting unit is provided on a rail system, and wherein the driving unit is congured to drive a spindle in order to move the CPT probe in the longitudinal direction along the rail system.

[0139] A3. The system of clause A1 or A2, wherein the rotating unit comprises aworm gear congured to drive rotation ofthe CPT probe.

[0140] A4. The system ofany ofclauses A1-A3, wherein the driving unit and rotating unit can be operated independently.

[0141] A5. The system of any of clauses A1-A4, wherein the mounting unit comprises a connector congured to connect electronically to the CPT probe in order to enable data transfer from the CPT probe, preferably wherein the electronic connection is via a slip ring.

[0142] A6. The system of any of clauses A1-A5, wherein the optical sensor denes a measuring location atwhich the at least one characteristic ofthe CPT probe can be measured, and wherein the driving unit is congured to move the CPT probe in a longitudinal direction through the measuring location.

[0143] A7. The system of any of clauses A1-A6, further comprising a user interface congured, in response to a user input, to: cause the driving unit to move the CPT probe and the optical sensor relative to one another in the longitudinal direction; and / or cause the rotating unit to rotate the CPT probe and the optical sensor relative to one another about the longitudinal axis ofthe CPT probe.

[0144] A8. The system ofclause A7, wherein the user interface comprises a foot-operated user interface, optionally a pedal.

[0145] A9. The system of any of clauses A1-A8, wherein the mounting unit is congured to receive the CPT probe in a screw-t engagement.

[0146] A10. The system of any of clauses A1-A9, wherein the rotating unit is congured to rotate the mounting unit about the same longitudinal axis as the CPT probe.

[0147] A11. The system of any of clauses A1-A10, wherein the at least one characteristic of the CPT probe comprises a dimension of the CPT probe, optionally wherein the dimension comprises: a diameter of at least a portion of the CPT probe; a length of at least a portion of the CPT probe; and / or a surface area of at least a portion ofthe CPT probe.

[0148] A12. The system ofany of clauses A1-A11, further comprising a controller congured to operate the driving unit, the rotating unit and the optical sensor in order to determine the at least one characteristic ofthe CPT probe.

[0149] A13. The system ofany of clauses A1-A12, further comprising a force application unit congured to engage the CPT probe with a forcewhen the CPT probe is mounted in the mounting unit, wherein the force application unit is congured to apply the force to the CPT probe from a radial direction relative to the longitudinal axis ofthe CPT probe.

[0150] A14. The system of any of clauses A1-A13, further comprising a frame to which the mounting unit, driving unit, rotating unit, and optical sensor are connected.

[0151] A15. A method of determining at least one characteristic of a cone penetration test, CPT, probe, the method comprising: adjusting a relative position of a CPT probe that is mounted on mounting unit and an optical sensor by: moving, using a driving unit, the CPT probe and / or the optical sensor in a longitudinal direction of the CPT probe; and / or rotating, using a rotating unit, the CPT probe and / or the optical sensor about the longitudinal axis of the CPT probe; and after adjusting the relative position oftheCPT probe and the optical sensor, measuring, using the optical sensor, at least one characteristic ofthe CPT probe.

[0152] A16. The method ofclause A15, further comprising repeating the determination ofthe characteristic of the CPT probe by: readjusting the relative position of the CPT probe and the optical sensor by: moving, using the driving unit, the CPT probe and / or the optical sensor in the longitudinal direction; and / or rotating, using the rotating unit, the CPT probe and / or the optical sensor about the longitudinal axis ofthe CPT probe; and measuring, at the readjusted position and using the optical sensor, the at least one characteristic ofthe CPT probe.

[0153] A17. The method of clause A16, wherein the at least one characteristic of the CPT probe is measured at a plurality of relative longitudinal positions of the CPT probe and optical sensor.

[0154] A18. The method of clause A16 or A17, wherein the at least one characteristic of the CPT probe is measured at a plurality ofrelative rotational positions ofthe CPT probe and optical sensor.

[0155] A19. The method of clause A18, wherein the at least one characteristic of the CPT probe is measured at:120 degree rotational intervals; rotational intervals ofless than 120 degrees; or rotational intervals ofbetween 30 and 120 degrees, optionally wherein the rotational intervals are equal.

[0156] A20. The method of any of clauses A15-A19, further comprising mounting the CPT probe to the mounting unit.

[0157] A21. The method ofclause A20, wherein mounting the CPT probe to the mounting unit comprises: abutting the CPT probe to the mounting unit; and actuating the rotating unit so as to rotate the mounting unit, thereby causing the mounting unit to engage with the CPT probe in a screw-t.

[0158] A22. A controller comprising a processor and memory, congured to perform the method ofany of clauses A15-A21.

[0159] A23. A computer-readable medium comprising instructions which, when executed by a controller comprising a processor and memory, cause the controller to carry out the method of any of clauses A15-A21.

[0160] B1. A system for testing the sensitivity of a cone penetration test, CPT, probe to radial input forces, the system comprising: a mounting unit congured to receive a CPT probe; and a force application unit congured to engage the CPT probe with a force when the CPT probe is mounted in the mounting unit, wherein the force application unit is congured to apply the force to the CPT probe from a radial direction relative to the longitudinal axis ofthe CPT probe.

[0161] B2. The system of clause B1, wherein the force is between SON and 150N, preferably between SON and 120N, more preferably between 90N and 110N.

[0162] B3. The system of clause B1 or B2, wherein the force application unit comprises a lowerable mass and wherein engaging the CPT probe with the force comprises moving the mass from a raised to a lowered position such that the mass comes into contact with and applies its weight to the CPT probe.

[0163] B4. The system of clause B3, wherein the force application unit comprises a support member congured to support the mass when the mass is in the raised position, and wherein the support member is congured to disengage from the mass once the mass is in contact with the CPT probe.

[0164] B5. The system ofany of clauses B1-B4, further comprising: a driving unit congured to move the CPT probe and the force application unit relative to one another in a longitudinal direction ofthe CPT probe; and / or a rotating unit congured to rotate the CPT probe and the force application unit about the longitudinal axis ofthe CPT probe.

[0165] B6. The system of any of clauses B1-B5, wherein the mounting unit comprises a connector congured to connect electronically to the CPT probe in order to enable data transfer from the CPT probe, preferably wherein the electronic connection is via a slip ring.

[0166] B7. The system ofany of clauses B1-B6, further comprising a controller congured to operate the force application unit.

[0167] B8. The system of any of clauses B1-B7, further comprising: an optical sensor congured to measure at least one characteristic ofthe CPT probe.

[0168] B9. The system of any of clauses B1-B8, further comprising a frame to which the mounting unit and force application unit are connected.

[0169] B10. A method oftesting the sensitivity of a cone penetration test, CPT, probe to radial input forces, the method comprising: applying, using a force application unit, a force to a CPT probe that is mounted in a mounting unit, wherein the force is applied to the CPT probe from a radial direction relative to the longitudinal axis ofthe CPT probe; and recording, while the force is applied, a response signal from the CPT probe.

[0170] B1 1. Themethod ofclauseB10, further comprising: comparing one ormore parameters identied by the response signal to a threshold; and if the one or more parameters exceed the threshold, determining that the CPT probe is defective.

[0171] B12. The method of clause B10 or B11, further comprising repeating the force sensitivity test at a second rotational position of the CPT probe by: removing the force from the CPT probe; readjusting a relative position of the CPT probe and the force application unit by rotating, using a rotating unit, the CPT probe and / or the force application unit about the longitudinal axis of the CPT probe; re-applying, using the force application unit and from a / the radial direction, the force to the CPT probe at the readjusted relative rotational position; and recording, while the force is re-applied, a second response signal from the CPT probe.

[0172] B13. The method of clause B12, wherein the sensitivity ofthe CPT probe is measured at three or more relative rotational positions ofthe CPT probe.

[0173] B14. The method of clause B13, wherein the sensitivity ofthe CPT probe is measured at: 120 degree rotational intervals; rotational intervals ofless than 120 degrees; rotational intervals of between 30 and 120 degrees; or rotational intervals of 45 degrees; optionally Wherein the rotational intervals are equal.

[0174] B15. The method of any of clauses B10-B14, further comprising repeating the force sensitivity test at a second longitudinal position ofthe CPT probe by: removing the force from the CPT probe; readjusting a relative position of the CPT probe and the force application unit by moving, using a driving unit, the CPT probe and / or the force application unit in a longitudinal direction, re-applying, using the force application unit and from the radial direction, the force to the CPT probe at the readjusted relative longitudinal position; and recording, while the force is re- applied, a second response signal from the CPT probe.

[0175] B16. The method ofany of clauses B10-B15, wherein the force is applied to the CPT probe in a region that is distal from the point ofxation between the CPT probe and the mounting unit.

[0176] B17. The method ofany of clauses B10-B16, wherein the force is applied to the CPT probe for a duration of at least 5 seconds, preferably between 5 and 30 seconds.

[0177] B18. The method ofany ofclauses B10-B17, wherein recording a response signal from the CPT probe comprises recording one or more of: the apparent cone resistance; the sleeve friction; the pore pressure; the temperature; and the inclination.

[0178] B19. A controller comprising a processor and memory, congured to perform the method ofany of clauses B10-B18.

[0179] B20. A computer-readable medium comprising instructions which, when executed by a controller comprising a processor and memory, cause the controller to carry out the method of any of clauses B10-B18.

Claims

1. System for testing the sensitivity of a cone penetration test (cone penetration test, CPT) probe for radial input forces, where the system the the following includes: a mounting unit configured to receive a CPT probe; and a force application unit configured to the CPT probe with a to apply force when the CPT probe is secured in the mounting unit, where the force application unit is configured to apply the force on the CPT- to exercise probe from a radial direction with respect to the longitudinal axis of the CPT probe.

2. System according to claim 1, where the unit of force exertion is a comprises a retractable mass and where the engagement of the CPT probe with the force the moving the mass from a raised to a lowered position involves such that the mass comes into contact with and exerts its weight on the probe.

3. System within the meaning of claim 2, where the unit of force exertion is a includes a support element configured to support the mass when the mass is in the raised position and where the support element is configured to release the mass as soon as the mass in is in contact with the CPT probe.

4. System pursuant to any prior conclusion, further comprising: a drive unit configured to the CPT probe and the to move force application units relative to each other in a longitudinal direction of the CPT probe; and / or a rotation unit configured to the CPT probe and the to rotate the force application unit around the longitudinal axis of the CPT probe.

5. System in accordance with a preceding conclusion, where the fastening unit a includes connector configured to connect electronically to the CPT probe to enable data transfer from the CPT probe, preferably whereby the electronic connection via a slip ring.

6. System in accordance with a prior claim, further comprising a frame with which the fastening unit and force application unit are connected.

7. Procedure for testing the sensitivity of a cone penetration test (cone penetration test, CPT) probe for radial input forces, where the method includes the following: the application, by means of a force application unit, of a force on a CPT probe mounted in a mounting unit, where the force is exerted on the CPT probe from a radial direction relative to the longitudinal axis of the CPT probe; and the recording, while force is being applied, of a reaction signal from the CPT probe.

8. Method pursuant to claim 7, further comprising: comparing one or more parameters that are identified by the response signal with a threshold value; and if one or more parameters exceed the threshold value, determining that the CPT probe is defective.

9. Method in accordance with claim 7 or 8, further comprising repeating the force sensitivity test on a second rotating position of the CPT probe by: removing the force from the CPT probe; readjusting a relative position of the CPT probe and the force exertion unit by rotating, with the aid of a rotation unit, of the CPT probe and / or the force application unit around the longitudinal axis of the CPT probe probe; the re-exercise, with the aid of the force application unit and from a / the radial direction of the force on the CPT probe on the readjusted relative rotation position; and the taking up, while the force is applied again, of a second Response signal from the CPT probe.

10. Procedure according to conclusion 9, whereby the sensitivity of the CPT probe is measured at three or more relative rotation positions of the CPT probe.

11. Method according to one of conclusions 7-10, further comprising the repetition of the strength sensitivity test on a second longitudinal position of the CPT probe by: removing the force from the CPT probe; readjusting a relative position of the CPT probe and the force exertion unit by moving, with the aid of a drive unit, of the CPT probe and / or the force application unit in a longitudinal direction; reapplying, with the aid of the force application unit and from the radial direction of the force on the CPT probe on the readjusted relative longitudinal position; and the taking up, while the force is applied again, of a second Response signal from the CPT probe.

12. Method according to one of claims 7-11, whereby the force is applied on the CPT probe in an area distal to the attachment point between the CPT probe and the mounting unit.

13. Method according to one of conclusions 7-12, involving the inclusion of a The response signal from the CPT probe includes the recording of one or more of the following: an apparent cone resistance; a sleeve friction; a pore print; a temperature; and a slope.

14. Control system comprising a processor and memory, which are configured to carry out the procedure in accordance with one of conclusions 7-13.

15. Computer-readable medium comprising instructions which, when these by a control comprising a processor and memory be executed, effect that the control system performs the method according to one of conclusions 7-13.

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