Automatic photometric bench with an increased measuring path

PL249950B1Active Publication Date: 2026-07-20POLITECHNIKA WARSZAWSKA
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Patent Information

Authority / Receiving Office
PL · PL
Patent Type
Patents
Current Assignee / Owner
POLITECHNIKA WARSZAWSKA
Filing Date
2024-11-14
Publication Date
2026-07-20
Patent Text Reader

Abstract

The subject of the application is an automatic photometric bench comprising stationary guides arranged longitudinally to the bench axis and located on supports, a measuring track located in the guides on which a carriage with a photometric head is movably mounted, characterized in that above the carriage (3) located in the initial position at the first end of the bench, at least two flat mirrors (5a) are mounted on a frame facing each other and positioned at an angle of 45 degrees to the longitudinal axis of the photometric bench, and above the mirrors (5a) a photometric head (6) is mounted, wherein the photometric head (6) is connected to a photocurrent meter (7), which photocurrent meter (7) is further connected to a central control and measurement unit (8), which is connected to a linear motor (10) by means of a microprocessor system (9), and at the other end of the bench there is a stand (4) for a radiation source,above which at least two flat mirrors (5b) are mounted on a frame, facing each other and set at an angle of 45 degrees to the longitudinal axis of the photometric bench,
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