Temperature monitoring system, reactor including the same, and temperature monitoring device

TW202629977APending Publication Date: 2026-07-16LPE SPA
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Patent Information

Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
LPE SPA
Filing Date
2025-10-23
Publication Date
2026-07-16

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Abstract

A temperature monitoring system for measuring the temperature of a substrate in a reactor comprising: (i) a reaction chamber suitable for the deposition of a film on a deposition surface of a substrate; (ii) a temperature monitoring device comprising an optical device, a remote sensing thermometer, and a supporting device. The remote sensing thermometer comprises at least one detector of IR radiation adapted for temperature measurements. The reaction chamber is provided with at least one aperture; the at least one optical device is adapted to: (i) intercept IR radiation emitted from at least one point of the deposition surface of the substrate through the aperture; and (ii) divert the intercepted IR radiation to the detector.
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