Probe, test head comprising the same, and method of manufacturing the test head

Abstract

A probe, a test head comprising the same, and a method of manufacturing the test head are disclosed. The test head comprises the probe. The probe comprises a plurality of metal strips horizontally stacked and welded to one another, wherein each of the plurality of metal strips extends longitudinally in a vertical direction. At least one of the metal strip is provided with an indented portion formed by a forging process, said indented portion being recessed in the stacking direction to define a gap. At least one of an upper end face and a lower end face of the plurality of metal strips is welded to jointly form an abutment surface configured to abut a counterpart component in the vertical direction. The process thereof is simplified, thereby reducing the manufacturing cost of the probe.

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