Test socket and method of manufacturing the same

Abstract

A test socket is disclosed that can effectively prevent damage to conductive portions by preventing a load from being concentrated on a specific conductive portion when testing a device under test (e.g., a semiconductor device). The test socket according to an embodiment of the present disclosure includes a first conductive portion array disposed in a first region, in which a plurality of first conductive portions have gaps with respect to an insulating support portion, and a second conductive portion array disposed in a second region different from the first region, in which a plurality of second conductive portions are supported by the insulating support portion without gaps.