A test classifying equipment and test method thereof, variable distance carrying device

Abstract

A variable distance carrying device comprises at least one shuttle car, at least one handling arm and at least one transferring device. The shuttle car is used for displacement between a handling area and a testing area, and has a plurality of sets of seats, each set of seats can be shifted along the first axis and adjusted spacing. The handling arm is provided in the handling area and is used for transporting the electronic components of the handling area to each set and removing the electronic components from each set. The transfer device is provided in the test area and is used to transport the electronic components on each set to a test location and the tested electronic components back to each set. Therefore, the invention has the advantages of variable distance and simultaneous testing of multiple electronic components.

Description

[Technical Field]

[0001] This invention relates to the field of electronic component testing, and more particularly to a structure that can be adjusted during the testing process to facilitate carrying and transporting. [Previous Technology]

[0002] Existing electronic component testing and sorting equipment can transport electronic components from the infeed area to the testing area, and after testing, transport them back to the outfeed area to achieve automated processes such as automatic testing and sorting.

[0003] However, existing electronic component testing and sorting equipment uses shuttles that can only carry one electronic component at a time during transport, significantly limiting testing efficiency. Because the shuttle can only carry one component, the testing area can only test a single electronic component, leading to a substantial decrease in equipment operating efficiency, inefficient resource allocation, and increased production line waiting time. Therefore, existing technology not only affects the smoothness of the overall production process but also poses a challenge to the industry's competitiveness. [Summary of the Invention]

[0004] To overcome the above-mentioned shortcomings, the present invention provides a test classification device and test method, and a variable distance bearing device, which can control the shuttle to change distance when it is moved to the transport area and the test area, so as to solve a number of problems in the prior art.

[0005] The present invention provides a variable-pitch carrying device, comprising: at least one shuttle, at least one transport arm, and at least one transfer device; the shuttle is used to move between a transport area and a test area, and the transport area is used to store a plurality of electronic components; the shuttle has a carrier and a plurality of sleeves, the sleeves being spaced apart on the carrier along a first axial direction and being movable along the first axial direction to adjust the spacing of the sleeves along the first axial direction; the transport arm is disposed in the transport area, and is used to transport the electronic components onto the sleeves and to remove the electronic components from the sleeves; the transfer device is disposed in the test area, and is used to transport the electronic components on the sleeves to a test position and to transport the electronic components at the test position back onto the sleeves.

[0006] In some embodiments, the variable pitch bearing device also has a drive mechanism for adjusting the spacing of the sleeves on the first axis.

[0007] In some embodiments, the sleeves are arranged along the first axis and a second axis respectively, and can be displaced along the first axis and the second axis respectively, and the drive mechanism is used to adjust the spacing of the sleeves along the first axis and the second axis.

[0008] In some embodiments, the shuttle car has a plurality of first tracks and a plurality of second tracks, the first tracks extending along the first axis, the second tracks extending along the second axis, and the first tracks being disposed on the carrier, the second tracks being slidably disposed on the first tracks, and the sleeves being slidably disposed on the second tracks respectively.

[0009] In some embodiments, the drive mechanism is connected to the second tracks and the sleeves respectively, and can drive the second tracks to move along the first axis and drive the sleeves to move along the second axis.

[0010] In some embodiments, the conveying arm has a plurality of first pickers and placers, the material transfer device has a plurality of second pickers and placers, the first pickers and placers and the second pickers and placers are arranged at intervals along the first axial direction, and the first pickers and placers have a first gap and the second pickers and placers have a second gap.

[0011] In some embodiments, the drive mechanism adjusts the spacing of the sleeves on the first axis to be equal to the first spacing when the shuttle is in the transport area, and adjusts the spacing of the sleeves on the first axis to be equal to the second spacing when the shuttle is in the test area.

[0012] In some embodiments, the transfer device has a pick-and-place section and a pressing section, the pick-and-place section being used to transport the electronic component, and the pressing section being used to press the electronic component at the test position.

[0013] In some embodiments, the crimping portion is disposed on the pick-and-place portion.

[0014] In some embodiments, the crimping portion is disposed above the test position.

[0015] The present invention also provides a testing and sorting device for testing and sorting electronic components. The testing and sorting device includes: a machine base, a feeding device, a discharging device, a testing device, the aforementioned variable-distance carrier device, and a control device. The feeding device is disposed on the machine base for accommodating at least one electronic component to be tested. The discharging device is disposed on the machine base for accommodating at least one completed electronic component. The testing device is disposed on the machine base and has a plurality of test seats, which can perform testing operations on the electronic component to be tested. The variable-distance carrier device is movably disposed on the machine base for transferring the electronic component. The control device is used to control and integrate the operation of each device to perform automated operation.

[0016] In some embodiments, the feeding device and the discharging device correspond to the transport area, and the testing device corresponds to the testing area.

[0017] The present invention further provides a testing method, comprising the following steps: Step (A): providing the above-mentioned testing and classification equipment; Step (B): the shuttle car is moved to the transport area, and the spacing of the sleeves on the first axis is adjusted to correspond to the transport arm, so that the transport arm transports the electronic component to be tested on the feeding device to the shuttle car; Step (C): the shuttle car is moved to the testing area, and the spacing of the sleeves on the first axis is adjusted to correspond to the transfer device, so that the transfer device transports the electronic component to be tested from the shuttle car to the testing seat for testing; Step (D): the transfer device transports the tested electronic component from the testing seat to the shuttle car; Step (E): the shuttle car is moved to the transport area, and the spacing of the sleeves on the first axis is adjusted to correspond to the transport arm, so that the transport arm transports the tested electronic component to the discharging device.

[0018] The following detailed description is provided with reference to specific embodiments and accompanying drawings, so that the examiners may have a further understanding of the technical features of the present invention.

Implementation Method

[0019] Please refer to Figures 1 and 3. The test and sorting equipment 1000 of the present invention is used to test and sort electronic components 70 (e.g., IC chips) and increase output. The test and sorting equipment 1000 includes a machine base 81, a feeding device 82, a discharging device 83, a testing device 84, a variable distance bearing device 100, and a control device 85.

[0020] The feeding device 82, the discharging device 83 and the testing device 84 are arranged on the machine base 81. The feeding device 82 is used to accommodate a plurality of electronic components 70 to be tested, the discharging device 83 is used to accommodate a plurality of electronic components 70 that have been tested, and the testing device 84 has a plurality of test seats 841, which can perform testing operations on the electronic components 70 to be tested.

[0021] The variable distance carrying device 100 includes at least one shuttle 10, at least one conveying arm 20, and at least one material transfer device 30. In order to achieve better conveying effect and improve its working efficiency, the variable distance carrying device 100 includes two shuttles, two conveying arms 20, and two material transfer devices 30 in this embodiment.

[0022] The shuttle 10 is slidably mounted on the slide rail 811 on the machine base 81, and can move between a transport area A1 and a test area A2. The transport area A1 is used to store a plurality of electronic components 70. In this embodiment, the feeding device 82 and the discharging device 83 correspond to the transport area A1, and the test device 84 corresponds to the test area A2.

[0023] The shuttle 10 includes a carrier 11 and a plurality of sleeves 12. The carrier 11 may be, but is not limited to, a support platform. Each sleeve 12 is spaced apart on the carrier 11 along a first axis X and is movable along the first axis X. It can be understood that by the displacement of each sleeve 12 along the first axis X, the spacing of each sleeve 12 along the first axis X can be adjusted according to different usage requirements.

[0024] The transport arm 20 is movably disposed in the transport area A1 to transport the electronic components 70 in the transport area A1 to each of the sleeves 12 of the shuttle car 10, or to remove the electronic components 70 from each of the sleeves 12 and transport them back to the transport area A1.

[0025] The transfer device 30 is movably disposed in the test area A2, and the transfer device 30 is used to transport the electronic components 70 on each sleeve 12 of the shuttle 10 to a test position (i.e., the test device 84) for testing, or to transport the tested electronic components 70 back to each sleeve 12 of the shuttle 10. For example, the shuttle 10 has four sleeves 12 and the test device 84 has four test seats 841, and the four sleeves 12 and the four test seats 841 are arranged at intervals along the first axis X, so that the test device 84 can test four electronic components 70 at the same time.

[0026] The control device 85 is used to control and integrate the operation of the various devices on the machine tool 81 to perform automated conveying, testing and sorting operations, so that the testing and sorting equipment 1000 performs automated operations.

[0027] For example, the feeding device 82 is a feeding tray, the discharging device 83 is a receiving tray, and the testing device 84 is a test circuit board, and is electrically connected to each test socket 841, so that multiple electronic components 70 can be tested simultaneously. The control device 85 is electrically connected to the variable distance carrying device 100 and the testing device 84, so as to control the related operations of the shuttle 10, the conveying arm 20 and the material transfer device 30 and the testing operations of the testing device 84.

[0028] In addition, to improve work efficiency by ensuring good flow during the handling and testing process, in some embodiments, the handling area A1 has an infeed area A11 and an outfeed area A12, and two handling arms correspond to the infeed area A11 and the outfeed area A12 respectively. The infeed area A11 and the outfeed area A12 are located on both sides of the testing area A2, so as to place the electronic components 70 before and after testing respectively. For example, the feeding area A11, the testing area A2, and the discharging area A12 are arranged along the first axis X. The feeding device 82 corresponds to the feeding area A11, and the discharging device 83 corresponds to the discharging area A12, so that the shuttle 10 can sequentially pass through the feeding area A11, the testing area A2, and the discharging area A12 along the first axis X, thereby transporting the electronic components 70 before testing from the feeding device 82 in the feeding area A11 to the testing area A2 for testing, and transporting the tested electronic components 70 to the discharging device 83 in the discharging area A12, and classifying and storing them according to the test results of each electronic component 70.

[0029] In this embodiment, the discharge device 83 has a first discharge section 831 and a second discharge section 832, and the control device 85 can classify the electronic components 70 according to the test results and transport them to the first discharge section 831 and the second discharge section 832 respectively.

[0030] In some embodiments, the variable-pitch bearing device 100 also has a drive mechanism 60. The drive mechanism 60 is electrically connected to the control device 85. The control device 85 can control the drive mechanism 60 to move each sleeve 12 on the carrier 11 in the first axis X and / or the second axis Y through preset or real-time operation, thereby adjusting the spacing of each sleeve 12 in the first axis X and the spacing in the second axis Y to meet various different usage requirements.

[0031] For example, the drive mechanism 60 may include a variety of combinations, such as a combination of a drive motor and a gear set, or a combination of a drive motor and a pulley, and drive the gear set or pulley to rotate through the drive motor, thereby driving the displacement of each sleeve 12, thereby adjusting the distance of each sleeve 12 on the first axial direction X, so as to achieve the purpose of pitch change.

[0032] In some embodiments, the conveying arm 20 has a plurality of first pick-and-place devices 21, and the material transfer device 30 has a plurality of second pick-and-place devices 311. Each first pick-and-place device 21 and each second pick-and-place device 311 are arranged at intervals along a first axial direction X, and there is a first distance S1 between each first pick-and-place device 21 and a second distance S2 between each second pick-and-place device 311.

[0033] More specifically, in existing testing equipment, the electronic components 70 are arranged with the same spacing after being housed in the feed tray (feeding device 82) and the discharge tray (discharge device 83), while the spacing of each test seat 841 of the testing device 84 is different from the spacing of the electronic components 70 in the feed tray. Therefore, each first pick-and-place device 21 of the conveying arm 20 and each second pick-and-place device 311 of the transfer device 30 need to have different spacings to correspond to the specifications of each device.

[0034] As shown in Figure 1, since each first pick-and-place device 21 and each second pick-and-place device 311 has a different spacing, when the shuttle 10 is in the transport area A1 corresponding to the transport arm 20, the drive mechanism 60 needs to adjust the spacing of each sleeve 12 in the first axial direction X to a first spacing S1 to correspond to the distance between each first pick-and-place device 21, so that each first pick-and-place device 21 can accurately transport each electronic component 70 to each sleeve 12. When the shuttle 10 is in the test area A2 corresponding to the transfer device 30, the drive mechanism 60 needs to adjust the spacing of each sleeve 12 in the first axial direction X to a second spacing S2 to correspond to the distance between each second pick-and-place device 311, so that each second pick-and-place device 311 can accurately transport each electronic component 70 to each test seat 841 of the test device 84, and each test seat 841 performs a preset test operation on each electronic component 70.

[0035] For example, the first spacing S1 of each first pick-and-place device 21 of the conveying arm 20 is 40 mm, and the second spacing S2 of each second pick-and-place device 311 of the transfer device 30 is 130 mm. When the shuttle 10 is in the feed area A11 of the conveying area A1, the drive mechanism 60 adjusts the spacing of each sleeve 12 in the first axial direction X to 40 mm. When the shuttle 10 moves to the test area A2, the drive mechanism 60 adjusts the spacing of each sleeve 12 in the first axial direction X to 130 mm. And when the shuttle 10 moves to the discharge area A12 of the conveying area A1, the drive mechanism 60 adjusts the spacing of each sleeve 12 in the first axial direction X to 40 mm again.

[0036] In some embodiments, the transfer device 30 further includes a pick-and-place section and a crimping section. The pick-and-place section includes each of the second pick-and-place devices 311, which can transport the electronic component 70. The crimping section can press down on the electronic component 70 at the test position (i.e., on the test device 84) to measure the downward pressure borne by the electronic component, ensuring the crimping quality and the yield of the electronic component 70 (this is a common technique in the art and is not the focus of this invention, so it will not be described in detail here).

[0037] In this embodiment, the crimping part includes a plurality of crimping fixtures 321. Each crimping fixture 321 of the crimping part of the transfer device 30 is disposed on each of the second pick-and-place devices 311 of the pick-and-place part, so that the crimping part can move with the pick-and-place part and correspond to each electronic component 70.

[0038] As shown in Figures 4, 5, 6, and 7, in order to further improve the efficiency of transportation, in some embodiments, the sleeves 12 on the shuttle 10 can be arranged along a first axis X and a second axis Y, respectively, so that the sleeves 12 form two or more columns. Each sleeve 12 can be displaced along the first axis X and the second axis Y, respectively, and the spacing between each sleeve 12 along the first axis X and the spacing along the second axis Y can be adjusted according to different usage requirements. For example, the number of sleeves 12 is 8, with every four sleeves 12 arranged at intervals along the first axis X to form a column, and divided into two columns arranged at intervals along the second axis Y.

[0039] Therefore, by adjusting the spacing of each sleeve 12 on the first axis X and the second axis Y through the drive mechanism 60, the present invention can correspond to the arrangement position of the electronic components 70 on the feeding device 82, thereby simultaneously transporting two or more rows of electronic components 70 and placing them on the shuttle car 10 in batches, which can reduce the number of times to move to the feeding device 82 for transport, effectively saving time and improving work efficiency.

[0040] In addition, in some embodiments, the pick-up and placement part and the crimping part may be provided separately. For example, the crimping part is provided above the test position (i.e., the test device 84) so ​​that each crimping fixture 321 can correspond to each electronic component 70, thereby achieving the crimping of the electronic component 70 (as shown in FIG5, the crimping fixture 321 can be crimped onto the electronic component 70 by axial drive).

[0041] As shown in Figure 6, in some embodiments, the shuttle 10 has a plurality of first tracks 16 and a plurality of second tracks 18. The first tracks 16 extend along a first axis X, and the second tracks 18 extend along a second axis Y. The first tracks 16 are disposed on the carrier 11, the second tracks 18 are slidably disposed on the first tracks 16, and each sleeve 12 is slidably disposed on the second tracks 18. The drive mechanism 60 is connected to each second track 18 and each sleeve 12, thereby driving each second track 18 to move along the first axis X and driving each sleeve 12 to move along the second axis Y, thereby achieving the adjustment of the spacing between each sleeve 12 along the first axis X and the second axis Y.

[0042] As shown in Figure 8, the present invention also provides a testing method, which includes the following steps:

[0043] Step (A)S101: Provide test classification equipment 1000.

[0044] Step (B) S102: The shuttle 10 is moved to the transport area A1, and the spacing of each sleeve 12 on the first axis X is adjusted to correspond to the transport arm 20, so that the transport arm 20 transports the electronic component 70 to be tested on the feeding device 82 to the shuttle 10. In this step, the control device 85 controls the shuttle 10 to move to the feeding area A11 in the transport area A1 to correspond to the feeding device 82, and adjusts each sleeve 12 to the first spacing S1, so that the transport arm 20 in the feeding area A11 can transport the electronic component 70 to be tested on the feeding device 82 to each sleeve 12 of the shuttle 10.

[0045] Step (C) S103: The shuttle 10 is moved to the test area A2, and the spacing of each sleeve 12 on the first axis X is adjusted to correspond to the transfer device 30, so that the transfer device 30 can transport the electronic component 70 to be tested from the shuttle 10 to the test seat 841 for testing. In this step, the control device 85 controls the shuttle 10 to move to the test area A2 to correspond to the test device 84, and adjusts each sleeve 12 to the second spacing S2, so that the transfer device 30 can transport the electronic component 70 to be tested on the shuttle 10 to each test seat 841 of the test device 84.

[0046] Step (D)S104: The transfer device 30 moves the tested electronic component 70 from the test stand 841 to the shuttle car 10. After the test device 84 completes the test on the electronic component 70, the control device 85 controls the transfer device 30 to move the electronic component 70 to the shuttle car 10.

[0047] Step (E) S105: The shuttle 10 moves to the transport area A1, and the spacing of each sleeve 12 on the first axis X is adjusted to correspond to the transport arm 20, so that the transport arm 20 transports the tested electronic components 70 to the discharge device 83. In this step, the control device 85 controls the shuttle 10 to move to the discharge area A12 in the transport area A1, and adjusts each sleeve 12 to the first spacing S1, so that the transport arm 20 in the discharge area A12 can transport the tested electronic components 70 on the shuttle 10 to the discharge area A12. In addition, the control device 85 can also classify the electronic components 70 according to the test results of the electronic components 70 and transport them to the first discharge section 831 and a second discharge section 832 respectively.

[0048] As can be seen from the above description, the present invention, through the variable-pitch bearing device, enables each set on the shuttle car to correspond to the pick-and-place spacing of the conveying arm and the material transfer device in different areas. This not only effectively improves the conveying efficiency, but also allows for the simultaneous testing of multiple electronic components, solving the multiple problems arising from the prior art that can only test a single electronic component. [Simplified Explanation of the Diagram]

[0049] Figure 1 is a schematic diagram of the test and classification device of the present invention. Figure 2 is a schematic diagram of the shuttle of the present invention. Figure 3 is a system block diagram of the test and classification device of the present invention. Figure 4 is a schematic diagram of another embodiment of the present invention. Figure 5 is a schematic diagram of the pressing of the present invention. Figure 6 is a schematic diagram of the shuttle of another embodiment of the present invention. Figure 7 is a system block diagram of another embodiment of the present invention. Figure 8 is a flowchart of the test method of the present invention.

Claims

1. A variable-pitch load-bearing device, comprising: At least one shuttle car for moving between a transport area and a test area, the transport area for storing a plurality of electronic components; the shuttle car has a carrier and a plurality of sleeves spaced apart on the carrier along a first axial direction and movable along the first axial direction to adjust the spacing of the sleeves along the first axial direction; at least one transport arm is disposed in the transport area for transporting the electronic components onto the sleeves and removing the electronic components from the sleeves; and at least one transfer device is disposed in the test area, the transfer device having a pick-and-place section and a pressing section, the pick-and-place section for transporting the electronic components on the sleeves to a test position, the pressing section for pressing down the electronic components at the test position, and the pick-and-place section for transporting the electronic components at the test position back to the sleeves.

2. The variable-pitch bearing device as claimed in claim 1, further comprising a drive mechanism for adjusting the spacing of the sleeves on the first axis.

3. The variable-pitch bearing device as described in claim 2, wherein, The sleeves are arranged along the first axis and the second axis respectively, and can be displaced along the first axis and the second axis respectively, and the drive mechanism is used to adjust the spacing of the sleeves along the first axis and the second axis.

4. The variable-pitch bearing device as described in claim 3, wherein, The shuttle car has a plurality of first tracks and a plurality of second tracks. The first tracks extend along the first axis, and the second tracks extend along the second axis. The first tracks are disposed on the carrier, and the second tracks are slidably disposed on the first tracks. The sleeves are slidably disposed on the second tracks respectively.

5. The variable-pitch bearing device as described in claim 4, wherein, The drive mechanism is connected to the second rails and the sleeves respectively, and can drive the second rails to move along the first axis and drive the sleeves to move along the second axis.

6. The variable-pitch bearing device as described in claim 2, wherein, The conveying arm has a plurality of first pickers and placers, and the material transfer device has a plurality of second pickers and placers. The first pickers and placers and the second pickers and placers are arranged at intervals along the first axis, and there is a first gap between the first pickers and placers and a second gap between the second pickers and placers.

7. The variable-pitch bearing device as described in claim 6, wherein, The drive mechanism adjusts the spacing of the sleeves along the first axis to be equal to the first spacing when the shuttle is in the transport area, and adjusts the spacing of the sleeves along the first axis to be equal to the second spacing when the shuttle is in the test area.

8. The variable-pitch bearing device as claimed in claim 1, wherein, The crimping part is provided on the pick-and-place part.

9. The variable-pitch bearing device as claimed in claim 1, wherein the crimping portion is disposed above the test position.

10. A test and classification device for testing and classifying electronic components, the test and classification device comprising: One machine; A feeding device is installed on the machine base to accommodate at least one electronic component to be tested; A discharge device, disposed on the machine base, for accommodating at least one electronic component to be tested; a testing device, disposed on the machine base, having a plurality of test seats, for performing testing operations on the electronic component to be tested; and a variable-distance carrying device as described in any one of claims 1 to 9, movably disposed on the machine base for transferring the electronic component. And a control device for controlling and integrating the operation of the various devices to perform automated operations.

11. The test classification device as described in claim 10, wherein, The feeding device and the discharging device correspond to the transport area, and the testing device corresponds to the testing area.

12. A testing method comprising the following steps: Step (A): providing a test classification device as described in claim 10; Step (B): the shuttle is moved to the transport area, and the spacing of the sleeves along the first axis is adjusted to align with the transport arm, such that the transport arm transports the electronic component to be tested from the feed device onto the shuttle; Step (C): the shuttle is moved to the test area, and the spacing of the sleeves along the first axis is adjusted to align with the transfer device, such that the transfer device transports the electronic component to be tested from the shuttle to the test stand for testing; Step (D): the transfer device transports the tested electronic component from the test stand onto the shuttle; and Step (E): the shuttle is moved to the transport area, and the spacing of the sleeves along the first axis is adjusted to align with the transport arm, such that the transport arm transports the tested electronic component onto the discharge device.

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