Methods for Automated Generation of Design Rule Documents for Semiconductor Components

Abstract

A method for automatically generating design rule documents for semiconductor components is provided. This method utilizes a processor of an electronic device to execute a test design method that predicts the most suitable component type, the number of complex experimental factors, and the desired electrostatic discharge protection capability, and provides the level of experimental factors. It also provides suggested parameter values ​​for complex undesigned factors, thereby generating a test component template. The test component template then generates a semiconductor layout. The method integrates automatic testing and measurement, analysis of measurement results, and the formulation of design rule documents to achieve the goal of automatically generating design rules.

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