Method for establishing improved defect detection model, defect detection method and system

Abstract

A method for establishing an improved defect-detection model, a defect detection method and a system are provided. In the method for establishing the improved defect-detection model, multiple surface images of printed circuit boards are captured, and defects on each of the surface images can be labeled so as to generate a defect image dataset. A cross-scale convolution feature fusion module is used to improve structure of a neck network of an object-detection model, a last C2f module of the object-detection model is replaced by an adaptive multiscale feature extraction module, and a WIoUv3 loss function is configured to replace an original loss function of the object-detection model. The WIoUv3 loss function can be used to obtain the improved defect-detection model. The defect image dataset is used to train the improved defect-detection model that can be used to detect defects on the printed circuit board.

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