Test device

Abstract

Disclosed is a test device for testing electrical characteristics of a test object. The test device includes a socket body including a ground-probe accommodating portion for accommodating a ground probe, a signal-probe accommodating portion for accommodating a signal probe, and a tubular ground post protruding from one support surface in an extending direction of the ground-probe accommodating portion and surrounding an end portion of the ground probe; and a sheet-shaped probe supporting portion disposed on the support surface, and including a signal probe through-hole through which an end portion of the signal probe passes, and a post through-hole through which the ground post passes.