Test device

Abstract

Disclosed is a test device for testing electrical characteristics of a test object. The test device includes: a socket body including an upper block and a lower block arranged so that a probe accommodating portion can be formed extending vertically; a probe including a tubular barrel that is accommodated in the probe accommodating portion and includes a flange portion protruding along an outer circumference so as to be positioned within the probe accommodating portion of the lower block; and a probe guide unit interposed between the upper block and the lower block to guide the probe to move up and down, including a guide hole having an inner diameter larger than an outer diameter of the barrel and smaller than an outer diameter of the flange portion to limit a movable range of the flange portion within the probe accommodating portion of the lower block.