probe
TW202632293APending Publication Date: 2026-08-01NIHON MICRONICS KK
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Patent Information
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- NIHON MICRONICS KK
- Filing Date
- 2025-12-12
- Publication Date
- 2026-08-01
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Figure TWG2TA001071454_001 
Figure TWG2TA001071454_002 
Figure TWG2TA001071454_003
Abstract
A probe includes a protrusion, a base material connected to the protrusion, and an inner sheath enclosed within the base material. The base material includes: a front end portion, in which the protrusion protrudes toward the object being inspected, and the protrusion is embedded within the front end portion; a plurality of arms, each having one end isolated from each other and connected to the front end portion; and a base end portion, each of the other ends of the plurality of arms being isolated from each other and connected to the base end portion. The inner sheath encloses: a front end region enclosed within the front end portion; a plurality of arm regions enclosed within the plurality of arms, each having one end connected to the front end region; and a base end region enclosed within the base end portion, each of the other ends of the plurality of arm regions being connected to the base end region. none
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