Image measurement method and image processing device
The DETR-based image measurement method addresses stability and accuracy issues in computer vision by automating line segment measurements, enhancing processing speed and flexibility, and reducing operational costs.
TW202632603AActive Publication Date: 2026-08-01MATERIAL ANALYSIS TECH INC
0 Cites 0 Cited by
Patent Information
- Application Number
- TW114102295
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-01-20
- Publication Date
- 2026-08-01
- Estimated Expiration
- 2045-01-19
AI Technical Summary
Technical Problem
Traditional computer vision techniques struggle with stability and accuracy when processing images with high variability or complex backgrounds, and adjusting measurement targets requires significant time and resources, increasing development costs.
Method used
An image measurement method using a modified DETR architecture that encodes input images and reference line segments into vectors, utilizing a converter encoder and decoder to predict offset results for line segments, enabling automated and accurate measurement.
Benefits of technology
The method improves processing speed and flexibility, reducing operational complexity and costs by automating line segment measurements and adapting to changing requirements without retraining.
✦ Generated by Eureka AI based on patent content.
Abstract
The embodiments of the disclosure provide an image measurement method and an image processing device. The method comprises: obtaining an input image and a plurality of reference line segments in the input image; encoding the input image into a sequence vector, and integrating the sequence vector and a positional encoding vector into a first input vector; using a transformer encoder to generate a second input vector based on the first input; using a transformer decoder to generate a predicted offset result corresponding to each of a plurality of to-be-measured line segments based on the second input vector and query information; and generating a measurement result of each to-be-measured line segment based on the predicted offset result of each to-be-measured line segment.
Need to check novelty before this filing date? Find Prior Art