Device testing apparatus, method, electronic device, and computer-readable storage medium
TW202632917APending Publication Date: 2026-08-01LUXSHARE ITECH(ZHEJIANG) CO LTD
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Patent Information
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- LUXSHARE ITECH(ZHEJIANG) CO LTD
- Filing Date
- 2025-04-16
- Publication Date
- 2026-08-01
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Figure TWG2TA001070075_001 
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Figure TWG2TA001070075_003
Abstract
The present invention proposes a device testing apparatus, method, electronic device, and computer-readable storage medium. The device testing apparatus comprises a processing module, a conveyor module, and an NFC detection module. The target device is placed on the conveyor module, while the processing module is respectively connected to the NFC detection module and the target device. The NFC detection module is arranged opposite the conveyor module. By configuring the NFC detection module opposite the conveyor module, the target device can undergo NFC module testing directly on the production line without requiring additional movement, thereby reducing testing time. Additionally, the integration of the NFC detection module with the processing module enables automated NFC module testing, further minimizing reliance on manual labor and reducing labor costs.
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