Semiconductor device and forming method thereof
TW202633135APending Publication Date: 2026-08-01TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
- Filing Date
- 2025-03-25
- Publication Date
- 2026-08-01
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Abstract
A method for forming an integrated circuit includes forming a plurality of stacked channels of a transistor and forming a plurality of interfacial dielectric structures each in contact with one of the channels. The method includes forming a plurality of inner spacers interleaved with the channels. The method includes forming a gate metal wrapped around the channels. After forming the gate metal, each inner spacer is in contact with a respective interfacial dielectric structure positioned between the inner spacer and an adjacent channel of the plurality of channels.
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