Methods for forming a layer comprising a metal nitride or forming a threshold voltage tuning layer on a substrate and methods for filling a gap on a substrate
TW202633270APending Publication Date: 2026-08-01ASM IP HLDG BV
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Patent Information
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- ASM IP HLDG BV
- Filing Date
- 2022-02-23
- Publication Date
- 2026-08-01
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Abstract
Disclosed are methods and systems for depositing layers comprising a metal and nitrogen. The layers are formed onto a surface of a substrate. The deposition process may be a cyclical deposition process. Exemplary structures in which the layers may be incorporated include field effect transistors, VNAND cells, metal-insulator-metal (MIM) structures, and DRAM capacitors.
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