Methods for forming a layer comprising a metal nitride or forming a threshold voltage tuning layer on a substrate and methods for filling a gap on a substrate

TW202633270APending Publication Date: 2026-08-01ASM IP HLDG BV
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Patent Information

Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
ASM IP HLDG BV
Filing Date
2022-02-23
Publication Date
2026-08-01

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Abstract

Disclosed are methods and systems for depositing layers comprising a metal and nitrogen. The layers are formed onto a surface of a substrate. The deposition process may be a cyclical deposition process. Exemplary structures in which the layers may be incorporated include field effect transistors, VNAND cells, metal-insulator-metal (MIM) structures, and DRAM capacitors.
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