Handler for testing electronic components

Abstract

This invention relates to a processing machine for testing electronic components. The processing machine for testing electronic components of this invention has a supply and retrieval mechanism or a cleaning mechanism for supplying or retrieving a shielding cover, which is used to isolate the electronic components from foreign matter generated during the operating process. The cleaning mechanism cleans the upper surface of the test bench before the electronic components are loaded onto the test bench. With this invention, test errors caused by foreign matter are reduced, thereby ensuring the reliability of the test.

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