Measuring instrument, measuring system and measuring method

TW202633387APending Publication Date: 2026-08-01TOKYO ELECTRON LTD
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-11-17
Publication Date
2026-08-01

Smart Images

  • Figure TWG2TA001071155_001
    Figure TWG2TA001071155_001
  • Figure TWG2TA001071155_002
    Figure TWG2TA001071155_002
  • Figure TWG2TA001071155_003
    Figure TWG2TA001071155_003
Patent Text Reader

Abstract

An exemplary embodiment of the measuring device of the present invention includes a first sensor, a second sensor, and a circuit board. The first sensor includes an imaging device for capturing images of both the mounting stage and the ring member within the same field of view. The second sensor includes either a first electrostatic capacitance sensor or a second electrostatic capacitance sensor. The first electrostatic capacitance sensor measures the electrostatic capacitance between the substrate and the ring member disposed to the side of the substrate when the substrate is placed on the mounting stage. The second electrostatic capacitance sensor measures the electrostatic capacitance between the substrate and the mounting stage disposed below the substrate when the substrate is placed on the mounting stage.
Need to check novelty before this filing date? Find Prior Art