Device and method for automated defect detection

Abstract

Mechanisms are disclosed for detecting one or more defects in a system. In-system and externally observable events are received. Active state information is derived from the in-system and externally observable events. If a memory update is required based on facts from the semantic memory, an episodic memory and a working memory are updated. Actions required from a procedural memory are extracted based on the updated episodic memory and the updated working memory. A prompt is executed on a generative language model to produce a model reasoning output. Reproduction steps are derived from the episodic memory, based on a determination that a defect is present from the model reasoning output. A defect signal is generated and provided to a testing user.

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