Silicon etchant composition and method for forming patterns using the same
TW202634045APending Publication Date: 2026-08-16DONGWOO FINE CHEM CO LTD
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Patent Information
- Application Number
- TW114151737
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-30
- Filing Date
- 2025-12-29
- Publication Date
- 2026-08-16
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Abstract
This invention relates to a silicon etchant composition and a method for forming patterns using the silicon etchant composition. The silicon etchant composition comprises an amino compound, a pyrazine compound, a basic compound including at least one of organic hydroxides and inorganic hydroxides, and a solvent. In the method of forming the pattern, a silicon-containing layer is formed on a substrate. A silicon protective layer is formed on a portion of the silicon-containing layer. The silicon-containing layer comprises silicon and germanium. The silicon-containing layer is etched using the silicon etchant composition.
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