Equipment for predicting wafer deformation

TW202634215APending Publication Date: 2026-08-16SAMSUNG ELECTRONICS CO LTD
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Patent Information

Application Number
TW114130558
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-02-04
Filing Date
2025-08-11
Publication Date
2026-08-16

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Abstract

An equipment for predicting wafer deformation includes a transport unit that transports a wafer; a sensor unit that recognizes a plurality of edge points of the wafer being transported by the transport unit; and a control unit that projects positions of the plurality of edge points of the wafer recognized by the sensor unit onto a coordinate plane, and predicts a plane form of the wafer based on the positions of the plurality of edge points of the wafer projected onto the coordinate plane.
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