Systems and methods for inspecting materials

TW202634237APending Publication Date: 2026-08-16DOW GLOBAL TECHNOLOGIES LLC
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Patent Information

Application Number
TW115100980
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-02-14
Filing Date
2026-01-09
Publication Date
2026-08-16

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Abstract

Systems and methods of inspecting a material are provided. The method of inspecting the material includes receiving one or more images of the material and one or more training features, identifying one or more features of interest (“FOIs”) in each image of the material defined by one or more FOI physical attributes, selecting one or more matched training features based, at least in part, on a similarity between the one or more FOI physical attributes of an individual FOI and the one or more training-feature physical attributes of the one or more training features, and then determining one or more FOI chemical attributes and one or more FOI classes based at least in part on the one or more matched training features.
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