Machine and method for testing light emitting substrate

Abstract

A machine and method for testing a light emitting substrate are provided. In the method, a load board is provided in a test region. The load board includes a first conductive area and a second conductive area that have different conductivities. Afterwards, an anisotropic conductive layer is disposed on the load board and covers the first conductive area and the second conductive area. Afterwards, a light emitting substrate is retained in the test region, and one of the light emitting substrate and the load board is driven to move towards the other of the light emitting substrate and the load board, such that the anisotropic conductive layer is pressed between the light emitting substrate and the load board to form signal conduction paths. Lastly, test signals are provided to the light-emitting substrate through the load board. Therefore, the effects of shortening test time, simplifying test operation, reducing test difficulty, and increasing test accuracy can be achieved.

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