Information processing apparatus, inspection apparatus, information processing method, inspection method, and learning method
TW202634359APending Publication Date: 2026-08-16LASERTEC CORP
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Patent Information
- Application Number
- TW114146539
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-13
- Filing Date
- 2025-11-28
- Publication Date
- 2026-08-16
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Figure TWG2TA001073098_003
Abstract
A high-precision information processing apparatus, inspection apparatus, information processing method, inspection method, and learning method are provided. The information processing apparatus 200 of this embodiment includes: a learning unit 210 for model learning; a camera image acquisition unit 220 for acquiring camera images CI; a reference image generation unit 230 for generating reference images RI; and an evaluation unit 240 for evaluating an object 300 based on a comparison between the reference image RI and the camera image CI. The learning unit 210 includes: a structural representation data acquisition unit 211 for acquiring a plurality of structural representation data; a category differentiation unit 212 for classifying the plurality of structural representation data into any one of a plurality of categories; a representative position acquisition unit 213 for selecting representative data from structural representation data belonging to the same category and acquiring a representative position corresponding to that category; and a training unit 214 for training the model.
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