A method and system for adaptively increasing the service life of a button

Abstract

A method for adaptively increasing the service life of a button includes the following steps of: establishing an aging database for the button, wherein the database includes a first correlation between an aging parameter and a jiggle removal parameter; obtaining the actual measured aging parameter of the button; determining a target jiggle removal parameter based on the actual measured aging parameter and the first correlation; and removing jiggle from the button based on the target jiggle removal parameter. Compared with the prior art, the method and system of the invention can solve the problem of effectively removing jiggle from buttons after aging.

Description

Technical field

[0001] The invention relates to the field of electronic technology, especially a method of adaptively increasing keystroke service life and a system thereof. Prior technology

[0002] The commonly used switches used in keystrokes are usually mechanically elastic switches. The jitter of the key is not felt by humans, but it is important for signal analysis, because the control module that processes the key signal processes the speed at the microsecond level, and the time of the key jitter is at least in the millisecond level.

[0003] Existing anti-shake solutions usually use hardware solutions or software solutions, but hardware solutions are high cost, large volume, software solutions usually adopt a timer key anti-shake method, timer key anti-shake method principle is: keys adopt interrupt drive, when the key press after triggering key interruption Interrupt, and finally read the value of the keystroke in the timer interrupt processing function. If the value of the keystroke is still pressed, it means that this is a valid keystroke, thereby realizing the debounce of the keystroke.

[0004] However, with long-term use of keys, keystroke aging will lead to extended jitter time, and existing software solutions usually adopt a fixed debounce time, thereby not automatically adaptable adjustment to effectively deshake keys with different aging conditions. Therefore, it is necessary to provide a technology that can be adaptively adapted to increase the service life of the keystrokes to solve the problem of existing learning techniques. Contents of the invention

[0005] In view of this, the present invention provides a method of adaptively increasing the service life of the keys and its system to solve the problem of difficulty in effective anti-shake of the keys after aging of the keys.

[0006] A method for adaptively increasing the lifespan of a button includes the following steps: establishing an aging database for a button, the aging database including an aging parameter and a first correlation between a debouncing parameter and a debouncing parameter; obtaining the measured aging parameter of the button; determining a target debouncing parameter based on the measured aging parameter and the first correlation; and debouncing the button based on the target debouncing parameter.

[0007] The aging parameters include a first aging parameter and a second aging parameter. The aging database contains a first correlation between the second aging parameter and the de-shake parameter, and a second correlation between the first aging parameter and the second aging parameter. The step of obtaining the measured aging parameters of a button further includes the following steps: obtaining the measured first aging parameter of one button; and obtaining the measured second aging parameter of one button. Correspondingly, the step of determining the target de-shake parameter based on the measured aging parameter and the first correlation further includes the following steps: determining a expected second aging parameter based on the measured first aging parameter and the second correlation; and determining the target de-shake parameter based on the expected second aging parameter, the measured second aging parameter, and the first correlation.

[0008] The step of determining the target de-shake parameter based on the expected second aging parameter, the measured second aging parameter, and the first correlation further includes the following steps: when the difference between the measured second aging parameter and the corresponding expected second aging parameter is greater than a preset difference threshold, the target de-shake parameter is determined based on the measured second aging parameter and the first correlation; and when the difference between the measured second aging parameter and the corresponding expected second aging parameter is less than or equal to the preset difference threshold, the target de-shake parameter is determined based on the expected second aging parameter corresponding to the measured second aging parameter and the first correlation.

[0009] The number of measured second aging parameters is multiple. The step of determining the target de-jitter parameter based on the measured second aging parameters and the first correlation further includes the following steps: determining multiple de-jitter parameters based on the multiple measured second aging parameters and the first correlation; and determining the maximum value among the multiple de-jitter parameters as the target de-jitter parameter.

[0010] The first aging parameter includes the number of button triggers, and the second aging parameter includes one or more of the following: response time, button conduction pressure, and contact resistance.

[0011] The aging database includes a button parameter and a third correlation, which is one of the first correlation relationships. The step of establishing the aging database for a button further includes the following steps: obtaining a current button parameter; and determining the first correlation relationship based on the current button parameter and the third correlation relationship.

[0012] The button parameters include one or more of the following: button type, button material, button axial force curve, and button design parameters.

[0013] The method further includes the following steps: when the difference between the measured second aging parameter and the corresponding expected second aging parameter is greater than a preset difference threshold, an aging warning message is issued.

[0014] A system for adaptively increasing the lifespan of a key includes a detection module and a control module. The detection module detects an aging parameter of a key to obtain a measured aging parameter. The control module is electrically connected to the detection module and executes a method for adaptively increasing the lifespan of the key.

[0015] The detection module includes a counter and a resistance detection circuit. The counter is used to detect the number of times one of the buttons is triggered, and the resistance detection circuit is used to detect the contact resistance of one of the buttons.

[0016] In summary, the adaptive method for increasing button lifespan of this invention establishes a button aging database containing a first correlation between aging parameters and debouncing parameters. Then, it obtains the measured aging parameters of the buttons and finally determines the target debouncing parameters based on the measured aging parameters and the first correlation. This method can predict and infer the button aging process, adjust the target debouncing parameters according to the current aging status of the buttons, and then debouncing the buttons according to the target debouncing parameters. This achieves more precise and effective jitter suppression and delay compensation, maximizing product lifespan to achieve optimal performance and improve overall user satisfaction. It solves the problem of effectively debouncing buttons after they have aged. Simple Explanation of the Diagram

[0017]

[0018] Figure 1 is a flowchart illustrating a method for adaptively increasing the lifespan of buttons according to an embodiment of the present invention.

[0019] Figure 2 is a flowchart illustrating a method for adaptively increasing the lifespan of buttons according to Embodiment 2 of the present invention.

[0020] Figure 3 is a flowchart illustrating a method for adaptively increasing the lifespan of buttons according to Embodiment 3 of the present invention.

[0021] Figure 4 is a circuit architecture diagram illustrating an adaptively increased key lifespan system according to Embodiment 4 of the present invention.

[0022] Figure 5 is a circuit architecture diagram illustrating an adaptively increased key lifespan system according to Embodiment 4 of the present invention.

[0023] Figure 6 is a circuit diagram illustrating an adaptive system for increasing key lifespan according to Embodiment 4 of the present invention. Implementation

[0024] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are merely some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0025] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0026] 1 is a flowchart illustrating a method of adaptively increasing keystroke service life in accordance with Embodiment I of the present invention. This embodiment may be applicable to the case of deshaking the keys contained in any one of a mobile device, a game controller, an industrial control system, and a medical device comprising one or more of a smartphone, a laptop, a tablet, a smart wearable device, the method of adaptively increasing the life of the key can be performed by a control module in a system that adaptively increases the life of the key. As shown in Figure 1 , the method of adaptively increasing the life of the keystrokes consists of the following steps:

[0027] Step S110: Create one of the aging databases of one key, the aging database contains the first correlation of one aging parameter as well as one of the debounce parameters.

[0028] Among them, the aging database of the keys can be established by collecting the aging data of the keys under different conditions of use. In some embodiments, the aging data may be obtained directly from data provided by the supplier; In some embodiments, part of the aging data is obtained directly from data provided by the supplier and part of the aging data is obtained by testing.

[0029] The aging parameter refers to a parameter related to keystroke aging, in some embodiments, the aging parameter comprises one or more of the number of keystroke triggers, response time, key-on pressure, contact resistance value. The number of keystroke triggers refers to the number of times a keystroke can successfully trigger signal transmission after being under pressure or operation. Response time refers to the time from when a key is pressed until the system receives a signal and responds. Key conduction pressure refers to the pressure that needs to be applied after pressing the key to close the circuit and trigger keystroke signal transmission, key conduction pressure usually determines the touch of the key and the sensitivity of triggering. When a current passes through the mechanical contact surfaces of two conductors, the resistance of the interface part will be higher than that of the other parts, and this resistance is known as the contact resistance. In keystrokes, when the keystroke is pressed, the contacts inside the keystroke make contact with the corresponding locations on the circuit board, thereby forming a conductive pathway. However, due to the possible presence of tiny gaps, oxides, dust or other contaminants at the contact surface, as well as the unevenness of the contact surface, the current will be hindered to some extent when passing through the contact surface, thereby producing a contact resistance value.

[0030] The debounce parameter refers to the parameter that debounces the keystrokes, and in some embodiments the debounce parameter contains the debounce time. Understandably, in other embodiments, the debounce parameter may also include the debounce compensation time, which refers to the time in which the debounce time is compensated.

[0031] For buttons, the aging parameters reflecting different degrees of aging will vary, thus requiring different debouncing parameters. For example, as buttons age, the contact resistance increases, leading to a longer button bounce time, necessitating a longer debouncing time for better debouncing. Therefore, there is a correlation between button aging parameters and debouncing parameters. A primary correlation can be obtained by testing the buttons, reflecting the relationship between them. In some embodiments, this primary correlation can be presented in a table, visually illustrating the relationship between the two. In other embodiments, the primary correlation can be presented in other ways, such as using curves. The specific presentation of the primary correlation is not limited here, but merely illustrative.

[0032] Step S120: Obtain the measured aging parameters of one of the buttons.

[0033] Among them, the measured aging parameters refer to the aging parameters of the buttons that are detected during actual use.

[0034] Step S130: Determine a target de-jitter parameter based on the measured aging parameters and the first correlation.

[0035] The target debouncing parameter refers to the specific parameter value set to eliminate the impact of key bounce when dealing with key bounce problems. Since the first correlation is used to reflect the correlation between aging parameters and debouncing parameters, after obtaining the measured aging parameters, the value of the debouncing parameter under the current key aging program can be obtained based on the measured aging parameters and the first correlation, which is the target debouncing parameter.

[0036] Step S140: Perform debouncing based on the target debouncing parameters by pressing the button.

[0037] In this embodiment, the target debouncing parameter is the target debouncing duration. When a key is pressed, a key interrupt is triggered. A timer is started in the key interrupt, and the timer's timing period is the target debouncing duration. When the timer's timing period reaches the target debouncing duration, a timer interrupt is triggered. Finally, the key value is read in the timer interrupt handling function. If the key value is still in the pressed state, it means that this is a valid key press, thereby realizing the debouncing of the key.

[0038] The above solution establishes a button aging database containing the first correlation between aging parameters and debouncing parameters. It then obtains the measured aging parameters of the buttons and finally determines the target debouncing parameters based on these measured parameters and the first correlation. This allows for the prediction and inference of the button aging process, adjusting the target debouncing parameters according to the current aging status of the buttons, and then debouncing the buttons based on these parameters. This achieves more precise and effective jitter suppression and latency compensation, maximizing product lifespan and achieving optimal performance and improved overall user satisfaction. It solves the problem of effectively debouncing buttons after they have aged.

[0039] Figure 2 is a flowchart illustrating a method for adaptively increasing the lifespan of a key according to Embodiment 2 of the present invention. This embodiment improves Embodiment 1, wherein the aging parameters include a first aging parameter and a second aging parameter. The aging database includes a first correlation between the second aging parameter and the debouncing parameter, and a second correlation between the first aging parameter and the second aging parameter; wherein, in the step of obtaining the measured aging parameters of the key, the method further includes the following steps: obtaining a measured first aging parameter of one key; obtaining a measured second aging parameter of one key; correspondingly, in the step of determining the target debouncing parameter based on the measured aging parameter and the first correlation, the method further includes the following steps: determining an expected second aging parameter based on the measured first aging parameter and the second correlation; and determining the target debouncing parameter based on the expected second aging parameter, the measured second aging parameter, and the first correlation. Based on this, as shown in Figure 2, the method for adaptively increasing the lifespan of a key includes the following steps:

[0040] Step S210: Establish an aging database for the button, wherein the aging database includes a first correlation between the second aging parameter and the debouncing parameter, and a second correlation between the first aging parameter and the second aging parameter.

[0041] The second correlation refers to the relationship between the first aging parameter and the second aging parameter. In some embodiments, the first aging parameter includes the number of button triggers, and the second aging parameter includes one or more of the following: response time, button contact pressure, and contact resistance. For the same button, the response time, button contact pressure, and contact resistance will differ depending on the number of button triggers. There is a certain correlation between the number of button triggers and the response time, button contact pressure, and contact resistance. Therefore, a button aging database can be established in advance to obtain the second correlation between the first aging parameter and the second aging parameter. Furthermore, when the button's response time, button contact pressure, and contact resistance are different, the required debouncing parameters will also be different. Therefore, a button aging database can be established in advance to obtain the first correlation between the second aging parameter and the debouncing parameter.

[0042] Step S220: Obtain the first aging parameter of one of the buttons.

[0043] The measured first aging parameter refers to the first aging parameter of the button detected during actual use. In some embodiments, the first aging parameter includes the number of button triggers, which can be obtained by detecting the number of button triggers using a counter.

[0044] Step S230: Obtain the measured second aging parameter of one of the buttons.

[0045] The measured second aging parameter refers to the second aging parameter of the button detected during actual use. In some embodiments, the second aging parameter includes contact resistance, which can be obtained by detecting the contact resistance through a resistance detection circuit.

[0046] Step S240: Determine a predicted second aging parameter based on the measured first aging parameter and the second correlation.

[0047] The expected second aging parameter refers to the second aging parameter corresponding to the measured first aging parameter in the second correlation relationship, given that the first aging parameter of the current button is the same as the measured first aging parameter. In other words, the second aging parameter should be the value that the button should have during normal aging. In some embodiments, the number of second aging parameters is multiple, and therefore the determined expected second aging parameters are also multiple. For example, the first aging parameter may include the number of button triggers, and the second aging parameter may include one or more of the following: response time, button conduction pressure, and contact resistance. After obtaining the measured number of button triggers, the response time, button conduction pressure, and contact resistance corresponding to that number of button triggers can be obtained in the second correlation relationship. The obtained response time, button conduction pressure, and contact resistance are respectively the expected response time, expected button conduction pressure, and expected contact resistance.

[0048] Step S250: Determine the target de-jitter parameters based on the expected second aging parameters, the measured second aging parameters, and the first correlation.

[0049] The expected second aging parameter refers to the value that the second aging parameter should be when the button is aging normally, while the measured second aging parameter refers to the actual measured value of the second aging parameter. The deviation between the two can reflect the health status of the button. At the same time, both are related to the debouncing parameter. Therefore, the target debouncing parameter can be determined based on the expected second aging parameter, the measured second aging parameter, and the first correlation, so that the target debouncing parameter is more in line with the actual aging condition of the button, effectively suppressing button bounce. By continuously adjusting the target debouncing parameter according to the actual situation of the button, the accuracy of button bounce suppression and delay compensation can be improved, effectively extending the button's service life and reducing maintenance costs.

[0050] Step S260: Debouncing the buttons based on the target debouncing parameters.

[0051] In an optional embodiment of the present invention, the step of determining the target de-jitter parameter based on the expected second aging parameter, the measured second aging parameter, and the first correlation relationship further includes the following steps:

[0052] When the difference between the measured second aging parameter and the corresponding expected second aging parameter is greater than a preset difference threshold, the target debouncing parameter is determined based on the measured second aging parameter and the first correlation relationship. This indicates that the deviation between the measured second aging parameter and the expected second aging parameter is large, causing button malfunction. In this case, the target debouncing parameter is determined based on the measured second aging parameter and the first correlation relationship, making the obtained target debouncing parameter more consistent with the actual aging condition of the button.

[0053] When the difference between the measured second aging parameter and the corresponding expected second aging parameter is less than or equal to a preset difference threshold, the target de-jitter parameter is determined based on the expected second aging parameter corresponding to the measured second aging parameter and the first correlation relationship. This indicates that the deviation between the measured second aging parameter and the expected second aging parameter is small at this time, and the button is aging normally. In this case, the de-jitter parameter corresponding to the expected second aging parameter in the first correlation relationship is directly determined as the target de-jitter parameter.

[0054] Based on the above embodiments, the number of measured second aging parameters is multiple. The step of determining the target debouncing parameter based on the measured second aging parameters and the first correlation further includes the following steps: determining multiple debouncing parameters based on the multiple measured second aging parameters and the first correlation; and determining the maximum value among the multiple debouncing parameters as the target debouncing parameter. Specifically, when the number of measured second aging parameters is multiple, and the debouncing parameters corresponding to different measured second aging parameters are different, determining the maximum value among the multiple debouncing parameters as the target debouncing parameter can result in a larger target debouncing parameter, effectively suppressing key bounce, improving the accuracy of key bounce suppression and delay compensation, effectively extending key lifespan, and reducing maintenance costs. For example, when the measured second aging parameters include measured response time, measured key conduction pressure, and measured contact resistance, and the debouncing parameters corresponding to the measured response time, measured key conduction pressure, and measured contact resistance in the first correlation are different, the maximum value of the multiple debouncing parameters corresponding to the measured response time, measured key conduction pressure, and measured contact resistance is determined as the target debouncing parameter.

[0055] In an optional embodiment of the present invention, the method for adaptively increasing the service life of a button further includes: issuing an aging warning message when the difference between the measured second aging parameter and the corresponding expected second aging parameter is greater than a preset difference threshold.

[0056] Among them, aging warning messages are used to alert users when buttons are showing signs of excessive wear. These warning messages can be sent via hardware or software, and can take various forms, including but not limited to text, voice, and light. Upon receiving the warning message, users can understand the condition of the buttons and replace them promptly, ensuring device reliability and a positive user experience.

[0057] The following specific embodiment illustrates the implementation of this solution. First, a key aging database is established by collecting key data. Then, during key usage, the number of key triggers is measured to obtain the actual key trigger count, and the contact resistance is measured to obtain the actual contact resistance value. Based on the measured key trigger count and a second correlation, the expected contact resistance value can be obtained. Then, the measured contact resistance value and the expected contact resistance value are compared. When the difference between the measured contact resistance value and the expected contact resistance value is less than or equal to a preset difference threshold, the debouncing parameter corresponding to the expected contact resistance value in the first correlation is determined as the target debouncing parameter. When the difference between the measured contact resistance value and the expected contact resistance value is greater than the expected difference threshold, the debouncing parameter corresponding to the measured contact resistance value in the first correlation is determined as the target debouncing parameter. Thus, the target debouncing parameter can be automatically adjusted according to the actual aging condition of the key to suppress key bounce. Through continuous calculation and parameter adjustment, the accuracy of bounce suppression and delay compensation is improved, effectively extending the key's service life and reducing maintenance costs.

[0058] Figure 3 is a flowchart illustrating a method for adaptively increasing key lifespan according to Embodiment 3 of the present invention. This embodiment improves Embodiment 2, wherein the aging database includes a key parameter and a third correlation relationship (one of the first correlation relationships). The step of establishing an aging database for a key further includes the following steps: obtaining a current key parameter; and determining the first correlation relationship based on the current key parameter and the third correlation relationship. Based on this, as shown in Figure 3, the method for adaptively increasing key lifespan includes the following steps:

[0059] Step S310: Establish a button aging database. The aging database includes a first correlation between the second aging parameter and the debouncing parameter, a second correlation between the first aging parameter and the second aging parameter, and a third correlation between the button parameter and the first correlation.

[0060] In this context, button parameters refer to various characteristics and settings related to the button. In some embodiments, button parameters include one or more of the following: button type, button material, button axial force curve, and button design parameters. Button type refers to the classification of buttons based on their function, shape, and purpose. Button material refers to the material used to manufacture the button; different materials have different physical and chemical properties, thus affecting the button's feel, durability, and appearance. A button axial force curve is a graph used to describe the change in pressure required for a button at different travel distances. Button design parameters refer to various parameters that need to be considered when designing a button; these parameters affect the button's function, performance, and appearance. For buttons with different button parameters, the required debouncing parameters may differ even with the same aging parameters.

[0061] The third correlation reflects the relationship between button parameters and the first correlation. Since the specific correlation between the second aging parameter and the debouncing parameter may differ for different buttons, i.e., the first correlation may differ, the third correlation between button parameters and the first correlation can be obtained by establishing a button aging database in advance.

[0062] Step S320: Obtain the current key parameters.

[0063] Here, the current button parameters refer to the button parameters of the button that needs to be debounced.

[0064] Step S330: Determine the first correlation based on the current key parameters and the third correlation.

[0065] In this context, the third correlation relationship reflects the association between the key parameters and the first correlation relationship. Therefore, after obtaining the current key parameters, the first correlation relationship corresponding to the current key parameters in the third correlation relationship is the first correlation relationship of the key. In some embodiments, the third correlation relationship specifically reflects the association between the key parameters, the first correlation relationship, and the second correlation relationship. Thus, after obtaining the current key parameters, the first correlation relationship and the second correlation relationship can be obtained based on the current key parameters.

[0066] Step S340: Obtain the first aging parameter of one of the buttons.

[0067] Step S350: Obtain the measured second aging parameter of one of the buttons.

[0068] Step S360: Determine an expected second aging parameter based on the measured first aging parameter and the second correlation.

[0069] Step S370: Determine the target de-jitter parameters based on the expected second aging parameters, the measured second aging parameters, and the first correlation relationship.

[0070] Step S380: Debouncing the buttons based on the target debouncing parameters.

[0071] The above scheme can learn the complex characteristics of the aging process of different buttons. For different types of buttons, the first correlation relationship of the current button can be obtained through the current button parameters and the pre-established button aging database. Then, the debouncing parameters of the button under different aging conditions can be obtained based on the first correlation relationship. Therefore, it can be applied to different types of buttons and has high versatility.

[0072] Figure 4 is a circuit architecture diagram illustrating a system for adaptively increasing key lifespan according to Embodiment 4 of the present invention. As shown in Figure 4, the system for adaptively increasing key lifespan includes a detection module 1 and a control module 2. The detection module 1 is used to detect the aging parameters of the key 3 to obtain measured aging parameters. The control module 2 is electrically connected to the detection module 1 and is used to execute the method for adaptively increasing key lifespan according to any embodiment of the present invention.

[0073] In this context, detection module 1 refers to a module capable of detecting aging-related parameters of button 3 during its use. Aging parameters include one or more of the following: button 3 trigger count, response time, button 3 conduction pressure, and contact resistance. Control module 2 refers to a functional module used for logic control. In some embodiments, control module 2 includes one of MCU, FPGA, and DSP. In this embodiment, control module 2 is specifically an MCU. It is understood that in other embodiments, control module 2 may be other components; this is not specifically limited to these examples.

[0074] The system for adaptively increasing the lifespan of buttons provided in this invention has the beneficial effects of any of the above-described methods for adaptively increasing the lifespan of buttons, which will not be repeated here.

[0075] In an optional embodiment of the present invention, as shown in FIG5, the detection module 1 includes a counter 11, which is used to detect the number of times the button 3 is triggered, thereby obtaining the actual number of triggers, which is the number of times the button 3 is actually triggered. In some embodiments, the counter 11 is set independently. In other embodiments, the counter 11 may be integrated into the control module 2.

[0076] In an optional embodiment of the present invention, as shown in Figures 5 and 6, the detection module 1 further includes a resistance detection circuit 12. The resistance detection circuit 12 is used to detect the contact resistance of the button 3, thereby obtaining the measured contact resistance, which is the current actual contact resistance of the button 3. It is understood that in other embodiments, the detection module 1 may also include other components to detect aging parameters such as response time and button 3 conduction pressure. This is not specifically limited here, but is only an example.

[0077] Based on the above embodiments, as shown in Figures 5 and 6, the resistance detection circuit 12 includes an amplifier 121, an analog integrator 122, an analog-to-digital converter 123, a voltage follower 124, a first resistor 125, a second resistor 126, and a capacitor 127. The first input terminal of the amplifier 121 is electrically connected to the first terminal of the button 3, the second input terminal of the amplifier 121 is electrically connected to the second terminal of the button 3, the output terminal of the amplifier 121 is electrically connected to the input terminal of the analog integrator 122, the output terminal of the analog integrator 122 is electrically connected to the first input terminal of the analog-to-digital converter 123, the input terminal of the voltage follower 124 is electrically connected to the second terminal of the button 3, the output terminal of the voltage follower 124 is electrically connected to the second input terminal of the analog-to-digital converter 123, and the output terminal of the analog-to-digital converter 123 is electrically connected to the input terminal of the control module 2. The first connection port of the control module 2 is electrically connected to the analog integrator 122, and the second connection port of the control module 2 is electrically connected to the first terminal of the button 3. The first end of button 3 is electrically connected to power supply 4 through a first resistor 125, and the second end of button 3 is electrically connected to ground through a second resistor 126. The first input terminal of amplifier 121 is electrically connected to ground through capacitor 127. The other end of control module 2 is connected to power supply 4. In some embodiments, power supply 4 is specifically a fixed current source.

[0078] Since the contact resistance of button 3 is very small, the resulting contact resistance signal is also small. Amplifier 121 amplifies this signal to the required amplitude. In some embodiments, the contact resistance signal generated by pressing button 3 is a voltage signal, and amplifier 121 is specifically a high-voltage, low-rate voltage amplifier 121. Analog integrator 122 integrates the change in contact resistance to obtain an accumulated signal related to the change in contact resistance. This accumulated signal can be used for further signal processing or detection. Analog-to-digital converter 123 converts the analog signal generated by the change in contact resistance into a digital signal for processing by control module 2.

[0079] The voltage follower 124 accurately outputs the input contact resistance signal without amplifying or attenuating it. In the resistance detection circuit 12, the voltage follower 124 can also isolate and buffer the input contact resistance signal, preventing interference from subsequent circuits while maintaining signal integrity. The cooperation of the first resistor 125, the second resistor 126, and the voltage follower 124 provides a reference voltage, allowing the contact resistance value of button 3 to be obtained from the voltage-based contact resistance signal.

[0080] The first input terminal of amplifier 121 is electrically connected to ground through capacitor 127, thereby filtering out high-frequency noise and interference in the input signal entering amplifier 121, thus ensuring that amplifier 121 can receive a clear and stable signal.

[0081] The above scheme, through amplifier 121, analog integrator 122, analog-to-digital converter 123, voltage follower 124, first resistor 125, second resistor 126 and capacitor 127, can accurately detect the actual contact resistance of button 3, that is, the measured contact resistance.

[0082] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0083] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

[0084] 1: Detection Module

[0085] 11: Counter

[0086] 12: Resistance detection circuit

[0087] 121: Amplifier

[0088] 122: Analog Integrator

[0089] 123: Analog to Digital Converter

[0090] 124: Voltage Follower

[0091] 125: First resistor

[0092] 126: Second resistor

[0093] 127: Capacitor

[0094] 2: Control Module

[0095] 3: Buttons

[0096] 4: Power supply

[0097] S110~S140, S210~S260, S310~S380: Steps

Claims

1. A method for adaptively increasing the lifespan of a button, comprising the following steps: establishing an aging database for a button, the aging database including an aging parameter and a first correlation relationship of a debouncing parameter, and including a button parameter and a third correlation relationship of the first correlation relationship; obtaining a current button parameter; determining the first correlation relationship based on the current button parameter and the third correlation relationship; obtaining a measured aging parameter for the button; determining a target debouncing parameter based on the measured aging parameter and the first correlation relationship; and debouncing the button based on the target debouncing parameter.

2. The method for adaptively increasing the lifespan of a button as described in claim 1, wherein the aging parameter includes a first aging parameter and a second aging parameter, and the aging database includes a first correlation between the second aging parameter and the debouncing parameter, and a second correlation between the first aging parameter and the second aging parameter; wherein, The step of obtaining the measured aging parameter of the button further includes the following steps: obtaining a measured first aging parameter of the button; and obtaining a measured second aging parameter of the button; correspondingly, the step of determining the target de-shake parameter based on the measured aging parameter and the first correlation further includes the following steps: determining an expected second aging parameter based on the measured first aging parameter and the second correlation; and determining the target de-shake parameter based on the expected second aging parameter, the measured second aging parameter, and the first correlation.

3. The method for adaptively increasing the lifespan of a button as described in claim 2, wherein the step of determining the target debouncing parameter based on the expected second aging parameter, the measured second aging parameter, and the first correlation further includes the following steps: when the difference between the measured second aging parameter and the corresponding expected second aging parameter is greater than a preset difference threshold, determining the target debouncing parameter based on the measured second aging parameter and the first correlation; and when the difference between the measured second aging parameter and the corresponding expected second aging parameter is less than or equal to the preset difference threshold, determining the target debouncing parameter based on the expected second aging parameter corresponding to the measured second aging parameter and the first correlation.

4. The method for adaptively increasing the lifespan of a button as described in claim 3, wherein the number of the measured second aging parameters is multiple, and the step of determining the target debouncing parameter based on the measured second aging parameters and the first correlation further includes the following steps: determining multiple debouncing parameters based on the multiple measured second aging parameters and the first correlation; and determining the maximum value among the multiple debouncing parameters as the target debouncing parameter.

5. The method for adaptively increasing the lifespan of a button as described in any one of claims 2 to 4, wherein the first aging parameter includes a number of button triggers, and the second aging parameter includes one or more of a response time, a button conduction pressure, and a contact resistance.

6. The method for adaptively increasing the service life of a button as described in claim 1, wherein the button parameters include one or more of a button type, a button material, a button axial force curve, and a button design parameter.

7. The method for adaptively increasing the lifespan of a button as described in claim 3 or 4 further includes the following steps: when the difference between the measured second aging parameter and the corresponding expected second aging parameter is greater than a preset difference threshold, an aging warning message is issued.

8. A system for adaptively increasing the lifespan of a key, comprising: a detection module for detecting an aging parameter of a key to obtain a measured aging parameter; and a control module electrically connected to the detection module, the control module being used to execute the method for adaptively increasing the lifespan of a key according to any one of claims 1 to 7.

9. The system for adaptively increasing the lifespan of a key as described in claim 8, wherein the detection module includes a counter and a resistance detection circuit, the counter being used to detect the number of times one of the keys is triggered, and the resistance detection circuit being used to detect the contact resistance of one of the keys.

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