A control method of the probe contact point
TW202636127APending Publication Date: 2026-09-01WISH TECH AUTOMATION INT CORP +1
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Patent Information
- Application Number
- TW114107549
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2025-02-27
- Publication Date
- 2026-09-01
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Abstract
This invention is about a kind of control system and method of the probe contact point. It consists of a controller driven rotating power source that is installed on the inspection machine. The rotating power source drives the rotating disc on the inspection machine to rotate. The rotating disc can accommodate placement of the plate body. The aforementioned plate body has plural numbers of contact points for the inspecting objects and plural numbers of positioning points. Electrical testing of the inspecting object is conducted by the probe that is installed on the robot arm. Then the contact points and probe’s contacting positions are photographed by the lens of the image capturing device to perform the correction method of the contact points.
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