A control method of the probe contact point

TW202636127APending Publication Date: 2026-09-01WISH TECH AUTOMATION INT CORP +1
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Patent Information

Application Number
TW114107549
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-02-27
Publication Date
2026-09-01

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Abstract

This invention is about a kind of control system and method of the probe contact point. It consists of a controller driven rotating power source that is installed on the inspection machine. The rotating power source drives the rotating disc on the inspection machine to rotate. The rotating disc can accommodate placement of the plate body. The aforementioned plate body has plural numbers of contact points for the inspecting objects and plural numbers of positioning points. Electrical testing of the inspecting object is conducted by the probe that is installed on the robot arm. Then the contact points and probe’s contacting positions are photographed by the lens of the image capturing device to perform the correction method of the contact points.
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