Synchronized testing of light emitting diodes

Abstract

Test systems and methods are described. In one example, probe pairs are connected to a subset of a plurality of light emitting diodes (LEDs) of a wafer. Energizing pulses are sequentially applied through the probe pairs. The energizing pulses each energize individual LEDs or LED groups. Contiguous ones of the energizing pulses are activated with at least partial concurrence. Luminance measurements are detected using a photodetector assembly that is statically positioned to detect light emitted by all of the subset of the plurality of LEDs connected to the probe pairs.

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