Method of forming a silicon on insulator substrate

TW202636853APending Publication Date: 2026-09-01SK HYNIX INC
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Patent Information

Application Number
TW114139779
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-26
Filing Date
2025-10-15
Publication Date
2026-09-01

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Abstract

A method of forming an SOI substrate including a hydrogen thermal treatment performed on a pretreated sacrificial wafer, under high temperature. A stopper layer and a semiconductor layer may be sequentially formed on a first surface of the sacrificial wafer on which the hydrogen (H2) thermal treatment was performed. The stopper layer and the semiconductor layer may be formed by an epitaxial growth process using a mixed precursor including a monosilane (MS) source and a dichlorosilane (DCS) source.
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