Semiconductor testing equipment

TW202636934APending Publication Date: 2026-09-01NIHON MICRONICS KK
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Patent Information

Application Number
TW114147435
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-26
Filing Date
2025-12-04
Publication Date
2026-09-01

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Abstract

The tester comprises: a test substrate unit on which a device under test for testing a semiconductor circuit is mounted; a plurality of substrate units electrically connected to the device under test via the test substrate unit; and a body unit having a receiving portion for accommodating the plurality of substrate units; the test substrate unit being detachably mounted on the body unit with the opening of the receiving portion closed. none
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