Information processing methods, information processing devices and computer programs

TW202636942APending Publication Date: 2026-09-01TOKYO ELECTRON LTD
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Patent Information

Application Number
TW114140105
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-10-31
Filing Date
2025-10-17
Publication Date
2026-09-01

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Abstract

This invention provides an information processing method, which easily identifies sensors whose measurement data is abnormal when an anomaly occurs in a substrate processing apparatus. The information processing apparatus of this embodiment acquires measurement data obtained from a plurality of sensors installed in the substrate processing apparatus according to a time series. Furthermore, based on the acquired measurement data, the information processing apparatus calculates the degree of anomalousness for each sensor at each time interval, and identifies an anomaly ranking for each sensor based on the degree of anomalousness at each time interval. Then, based on the identified anomaly ranking, the information processing apparatus generates a graph representing the time-varying nature of the degree of anomalousness of each sensor.
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