Monomer, polymer, chemically amplified resist composition, and pattern forming process

TW202637547APending Publication Date: 2026-09-16SHIN ETSU CHEMICAL CO LTD
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Patent Information

Application Number
TW114150725
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-24
Filing Date
2025-12-23
Publication Date
2026-09-16
Patent Text Reader

Abstract

A polymer obtained from a monomer having a monocyclic lactam structure has excellent solvent solubility. A chemically amplified resist composition comprising the polymer exhibits a high sensitivity and contrast and forms a pattern of satisfactory profile having improved lithography properties such as EL, LWR, CDU and DOF.
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