Chemical mechanical polishing slurry
TW202637788APending Publication Date: 2026-09-16ANJI MICROELECTRONICS TECH (SHANGHAI) CO LTD
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Patent Information
- Application Number
- TW114148368
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-25
- Filing Date
- 2025-12-10
- Publication Date
- 2026-09-16
Abstract
The invention provides a chemical mechanical polishing slurry for semiconductor material manufacturing processes, comprising: nano α-alumina abrasive particles, a dispersant, a dispersing aid, an organic carboxylic acid, an oxidizing agent, water, and a pH adjuster. It is characterized by good dispersibility, strong stability, low particle size, and long-term stability. The invention employs the synergistic effect of an amphoteric surfactant and an anionic polymer to promote the dispersion of alumina abrasive particles in the polishing slurry through a steric hindrance stabilization mechanism, ensuring the long-term stability of the polishing slurry system without affecting tungsten polishing.
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