Selective deposition of silicon oxide on metal surfaces

TW202637870APending Publication Date: 2026-09-16ASM IP HLDG BV
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Patent Information

Application Number
TW115122102
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2020-03-30
Filing Date
2021-03-11
Publication Date
2026-09-16

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Abstract

Methods for selective deposition of silicon oxide films on metal or metallic surfaces relative to dielectric surfaces are provided. A dielectric surface of a substrate may be selectively passivated relative to a metal or metallic surface, such as by exposing the substrate to a silylating agent. Silicon oxide is then selectively deposited on the metal or metallic surface relative to the passivated oxide surface by contacting the metal surface with a metal catalyst and a silicon precursor comprising a silanol.
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