Inspection device and inspection method

TW202638037APending Publication Date: 2026-09-16KIOXIA CORP
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Patent Information

Application Number
TW114117330
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-14
Filing Date
2025-05-08
Publication Date
2026-09-16

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Abstract

The purpose of this invention is to improve the inspection accuracy of cavity defects using ultrasound. According to the inspection apparatus of the embodiment, the processor uses a detector to irradiate a reference point on a substrate from the side of a second main surface; the detector receives a first reflected wave reflected from the reference point; based on the time from the irradiation of the first ultrasound to the receipt of the first reflected wave, a first time required to receive the reflected wave reflected from the first cavity defect is estimated, and a first detection period is set based on the first time; based on the time from the irradiation of the first ultrasound to the receipt of the first reflected wave, a second time required to receive the reflected wave reflected from the second cavity defect is estimated, and a second detection period is set based on the second time.
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