Test tool

Abstract

A test tool is used to position a chip on a test circuit board and includes a positioning base and a pressing member. The test circuit board has a plurality of contacts and a probe base with a plurality of probes. The positioning base has a hole for accommodating the chip. The positioning base is positioned on the test circuit board and receives the probe base to make the probes contained in the hole to be connected to the pins and aligned with the contacts. A wall of the hole is formed with two engaging grooves opposite to each other. An engaging end portion of each elastic arm of the pressing member forms a hook protruding toward the engaging groove and presses the chip when the hook is engaged with the engaging groove, for connecting pins of the chip to the contacts via the probes.

Description

[Technical Field]

[0001] This invention relates to a test fixture, and more particularly to a test fixture for positioning a chip under test for electrical connection to a test circuit board. [Previous Technology]

[0002] Generally, after the packaged chip is manufactured, it must be placed into the receiving slot of the test fixture, and the top cover of the test fixture must be placed on top to press the packaged chip and electrically connect it to the test circuit board for subsequent chip testing. Therefore, the structural design of existing test fixtures on the market is often too complex, which increases the manufacturing cost of the fixture and affects the ease of operation. In addition, since most test circuit boards do not have holes for the test fixture to be directly attached, it is often necessary to make an additional alignment block and carrier board, and use a large number of screws or metal fasteners to fix the receiving slot and top cover of the test fixture to the test circuit board. This results in a time-consuming and labor-intensive fixture positioning and fixing process, which greatly increases the chip testing time and cost. [Summary of the Invention]

[0003] Therefore, the object of the present invention is to provide a test fixture for positioning the chip under test for electrical connection to the test circuit board, so as to solve the above-mentioned problems.

[0004] According to one embodiment, the test fixture of the present invention is suitable for positioning a chip under test for electrical connection to a test circuit board. The chip under test has a plurality of pins, the test circuit board has a plurality of test contacts and a probe holder, the probe holder having a plurality of probes, and the test fixture includes a positioning base and a pressing member. The positioning base has a through hole for accommodating the chip under test and positioning it on the test circuit board and fitting the probe holder, such that the plurality of probes are accommodated in the through hole to mate with the plurality of pins and align with the plurality of test contacts. The wall of the through hole forms two opposing engagement grooves. The pressing member has two spring arms, one pressing end of each spring arm protruding into the engagement groove to form a hook, and when the pressing member is pressed into the through hole to align and engage with the engagement groove, it presses against the chip under test, so that the plurality of pins are electrically connected to the plurality of test contacts via the plurality of probes.

[0005] In summary, the test fixture provided by the present invention uses a positioning base to engage a probe holder so that the probes of the probe holder and the pins of the chip under test are aligned with each other and the test contacts of the test circuit board. Next, after inserting a pressing member into the through hole of the positioning base to press the chip under test downwards, the chip under test can be electrically connected to the test circuit board via the probe holder. In this way, through the simple pressing operation described above, the electrical connection between the chip under test and the test circuit board can be quickly and easily completed, effectively solving the problem mentioned in the prior art where the test fixture structure design was too complex, resulting in increased manufacturing costs and difficult operation, thereby greatly improving the ease of operation of the test fixture.

[0006] The advantages and spirit of the present invention can be further understood from the following detailed description of the invention and the accompanying drawings.

Implementation Method

[0007] The following description, accompanied by illustrations, illustrates the technical content of the present invention through specific embodiments. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different embodiments. Various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the spirit of the present invention. In particular, the structural design and positional relationships of the various components in the drawings (such as the structural proportions and arrangement of the test fixture / chip under test / test circuit board / protruding electronic components / probe holders, etc.) are for illustrative purposes only and do not represent the actual implementation of the present invention.

[0008] Please refer to Figures 1, 2 and 3. Figure 1 is a top view of a test fixture 10 according to an embodiment of the present invention mounted on a test circuit board 1. Figure 2 is an exploded view of the test fixture 10 in Figure 1. Figure 3 is a cross-sectional view of the test fixture 10 in Figure 1 along section line AA. In order to clearly show the structural design of the test fixture 10, the test circuit board 1 and the protruding electronic components on it are only drawn with simple lines. As for the relevant description of the test circuit design and electronic component configuration of the test circuit board 1, it is common in the prior art and will not be repeated here.

[0009] As can be seen from Figures 1 to 3, the test fixture 10 is applicable to the testing of semiconductor wafers that have been packaged (as shown in Figure 3, a wafer 12 under test is positioned and electrically connected to the test circuit board 1 for subsequent wafer testing). The wafer 12 under test may have a plurality of pins 13, and the test circuit board 1 may have a plurality of test contacts 2 and a probe holder 3. The probe holder 3 is provided with a plurality of probes 4 as a bridging and conducting device for electrically connecting the plurality of pins 13 of the wafer 12 under test and the plurality of test contacts 2 of the test circuit board 1.

[0010] The test fixture 10 includes a positioning base 14 and a pressing member 16. The positioning base 14 has a through hole 18 to accommodate the chip under test 12 and to position it on the test circuit board 1 and to attach the probe holder 3, such that a plurality of probes 4 are accommodated in the through hole 18 to mate with a plurality of pins 13 of the chip under test 12 and to align with a plurality of test contacts 2. The wall of the through hole 18 has two engaging grooves 20 that are opposite to each other. The pressing member 16 can preferably be inverted U-shaped (but is not limited thereto) and has two spring arms 22. One pressing end P of each spring arm 22 protrudes into the engaging groove 20 to form a hook 24. Thus, when the user applies force to clamp the pressing member 16 so that the pressed and narrowed pressing member 16 can be inserted into the through hole 18 and the hook 24 is aligned with the engaging groove 20, and then the pressing member 16 is released, the spring arm 22 of the pressing member 16 can elastically return to its original position so that the hook 24 engages with the engaging groove 20, and the pressing end P of the spring arm 22 can correspondingly press the chip under test 12 downward, so that a plurality of pins 13 can be electrically connected to a plurality of test contacts 2 (as shown in Figure 3) via a plurality of probes 4 for subsequent chip testing.

[0011] More specifically, the present invention can preferably employ a 3D printing process (the relevant process description is common in the prior art and will not be repeated here) to manufacture the positioning base 14 and the pressing member 16. For example, please refer to Figures 2, 3, 4 and 5. Figure 4 is a partially enlarged schematic diagram of the pressing member 16 in Figure 2, and Figure 5 is a partially enlarged schematic diagram of the positioning base 14 in Figure 2. As shown in Figures 2 to 5, the pressing member 16 can be formed by stacking along a thickness direction T through a 3D printing process to have surface layer marks. The positioning base 14 can be formed by stacking multiple structures 15 in layers through a 3D printing process to have surface layer marks. In this way, through the friction generated by the contact between the surface layer marks of the positioning base 14 and the pressing member 16 and the lateral elastic restoring force provided by the spring arm 22, the hook 24 can be more firmly positioned and engaged in the engaging groove 20 (as shown in Figure 3) to provide appropriate pressure to press the chip under test 12, thereby reliably completing the electrical connection between the chip under test 12 and the test circuit board 1.

[0012] Furthermore, in this embodiment, as shown in Figure 3, the engaging groove 20 preferably has an engaging inclined surface 26 and a horizontal limiting surface 28, and the horizontal limiting surface 28 and the engaging inclined surface 26 are preferably at a 45-degree angle (but not limited to this). In this way, the hook 24 can abut against the engaging inclined surface 26 to be positioned in the engaging groove 20, and the horizontal limiting surface 28 can be used to stop the hook 24 to effectively prevent the hook 24 from accidentally disengaging from the engaging groove 20 due to improper operation. Furthermore, the present invention can further employ a spring arm stop design. For example, as shown in Figures 2 to 4, the two spring arms 22 of the pressing member 16 (but not limited to this, it can also be designed with only a single spring arm having an abutment block) can each protrude an abutment block 23 (preferably cylindrical). The opposing abutment blocks 23 can abut against each other when the pressing member 16 is subjected to excessive pressure to prevent the spring arms 22 from continuing to bend excessively inward and break, thereby improving the service life and operational reliability of the pressing member 16.

[0013] Regarding the positioning design of the test fixture 10, as shown in Figures 1 to 3, the test circuit board 1 may have at least one first protruding electronic component 5 and at least one second protruding electronic component 6 (which may be common circuit board components such as power sockets or M.2 slots, one of each is shown in Figure 1, but not limited thereto) located on opposite sides of a plurality of test contacts 2. The two positioning guide grooves 30 may be recessed inward from opposite sides of the positioning base 14, and the test fixture 10 may further include a first positioning block structure 32 and a second positioning block structure 34.

[0014] The first positioning block structure 32 has a first positioning hole structure 36, and two first positioning arms 38 extend from the positions of the first positioning block structure 32 corresponding to the positioning base 14 on opposite sides. Two first protruding ribs 40 protrude from the two first positioning arms 38 toward the two positioning guide grooves 30. Similarly, the second positioning block structure 34 has a second positioning hole structure 42, and two second positioning arms 44 extend from the positions of the second positioning block structure 34 corresponding to the positioning base 14 on opposite sides. Two second protruding ribs 46 protrude from the two second positioning arms 44 toward the two positioning guide grooves 30. The first protruding ribs 40 and the second protruding ribs 46 can preferably be equilateral triangular prism structures (but are not limited to this), and the positioning guide grooves 30 can be correspondingly equilateral triangular to cooperate with the first protruding ribs 40 and the second protruding ribs 46 to improve the structural stability between the positioning guide grooves 30 and the first protruding ribs 40 and the second protruding ribs 46.

[0015] Through the above design, the first positioning hole structure 36 and the second positioning hole structure 42 can be respectively fitted onto the first protruding electronic component 5 and the second protruding electronic component 6, and the two first protruding ribs 40 and the two second protruding ribs 46 can be slidably inserted into the two positioning guide grooves 30, so that the two first positioning arms 38 and the two second positioning arms 44 surround and clamp the positioning base 14 (as shown in Figure 1), thereby stably positioning the positioning base 14 on the detection circuit board 1.

[0016] It should be noted that the present invention can preferably be manufactured using a 3D printing process to manufacture the first positioning block structure 32 and the second positioning block structure 34. The following description takes the formation of the first positioning block structure 32 using a 3D printing process as an example. The description of the 3D printing process for the second positioning block structure 34 can be deduced by analogy and will not be repeated here. Please refer to Figures 1, 5 and 6. Figure 6 is a partially enlarged schematic diagram of the first positioning block structure 32 in Figure 2. As shown in Figures 1, 5 and 6, the first positioning block structure 32 can be formed by stacking a plurality of structures 33 in layers through a 3D printing process and has surface layer marks. The thickness of each structure 33 of the first positioning block structure 32 can preferably be equal to or a multiple of the thickness of each structure 15 of the positioning base 14 (for example, the thickness of each structure 33 can be equal to 0.4 mm and the thickness of each structure 15 can be equal to 0.2 mm, but is not limited thereto). In this way, through the surface friction between the wavy surface layer marks formed by the plurality of structures 33 and the first protruding electronic component 5, the first positioning hole structure 36 can be securely fitted onto the first protruding electronic component 5, thereby improving the structural bonding stability between the first positioning block structure 32 and the detection circuit board 1. In addition, through the friction generated by the contact of the surface layer marks of the plurality of structures 15 and the plurality of structures 33, the positioning guide groove 30 can be tightly fitted with the first protruding rib 40, thereby improving the structural engagement strength between the positioning base 14 and the first positioning block structure 32, so that the positioning base 14 can be more securely positioned on the detection circuit board 1.

[0017] In summary, the test fixture provided by the present invention uses a positioning base to engage a probe holder so that the probes of the probe holder and the pins of the chip under test are aligned with each other and the test contacts of the test circuit board. Next, after inserting a pressing member into the through hole of the positioning base to press the chip under test downwards, the chip under test can be electrically connected to the test circuit board via the probe holder. In this way, through the simple pressing operation described above, the electrical connection between the chip under test and the test circuit board can be quickly and easily completed, effectively solving the problem mentioned in the prior art where the test fixture structure design is too complex, resulting in increased manufacturing costs and difficulty in operation, thereby greatly improving the ease of operation of the test fixture. In addition, through the above-mentioned positioning block design, the test fixture of the present invention can directly utilize the socketing and fixing between the positioning block and the protruding electronic components of the test circuit board, and the interlocking between the positioning block and the positioning base, to securely position the positioning base on the test circuit board without any time-consuming and labor-intensive screw / metal fastener locking operations, thus greatly reducing chip testing time and cost.

[0018] It is worth mentioning that the present invention is not limited to the dual-block clamping design of the above embodiments. It can also adopt a single positioning block limiting design to simplify the positioning block design of the test fixture. Alternatively, the present invention can also adopt a multi-positioning block splicing design to improve the assembly and application flexibility of the test fixture, thereby avoiding the problem of the overall structure of the positioning block being too large due to the distance between the protruding electronic components and the test contacts.

[0019] For example, please refer to Figure 7, which is a top view of a test fixture 100 according to another embodiment of the present invention mounted on a test circuit board 1. Elements in this embodiment that have the same symbols as those mentioned in the above embodiments represent elements with the same or similar structures and functions, and their related descriptions can be deduced by analogy to the above embodiments. As shown in Figure 7, unlike the above embodiments, in this embodiment, the test fixture 100 includes a positioning base 14, a pressing member 16, and a first positioning block structure 102. The first positioning block structure 102 has a first positioning hole structure 36, two first positioning arms 104 extending from opposite sides of the first positioning block structure 102 corresponding to the positioning base 14, and two first protruding ribs 40 protruding from the two first positioning arms 104 toward two positioning guide grooves 30 (not shown in the figure, their related descriptions can be deduced by analogy to Figure 2).

[0020] Through the above design, the first positioning hole structure 36 can be sleeved on the first protruding electronic component 5, and the first rib 40 of each first positioning arm 104 can slide into the corresponding positioning guide groove 30, so that the test fixture 100 can position and accommodate the positioning base 14 between the two first positioning arms 104 through the first positioning block structure 102, thereby fixing the positioning base 14 on the test circuit board 1. As for other derivative designs of the test fixture 100 (such as 3D printing process design, snap-fit ​​groove structure design, positioning block / positioning base structure thickness design, rib / positioning guide groove structure design, etc.), their related descriptions can be deduced by analogy with the above embodiments, and will not be repeated here.

[0021] In addition, please refer to Figure 8, which is a top view of a test fixture 150 according to another embodiment of the present invention mounted on a test circuit board 1. Components in this embodiment that have the same symbols as those mentioned in the above embodiments represent components with the same or similar structures and functions, and their related descriptions can be deduced by analogy from the above embodiments. As shown in Figure 8, unlike the above embodiments, in this embodiment, the first protruding electronic component 5 includes two adjacent protruding electronic components 7, the second protruding electronic component 6 includes two adjacent protruding electronic components 8, and the test fixture 150 includes a positioning base 14, a pressing member 16, a first positioning block structure 152, and a second positioning block structure 154.

[0022] The first positioning block structure 152 includes two first positioning blocks 156 and has a first positioning hole structure 158. The first positioning hole structure 158 includes two first positioning holes 160 respectively formed in the two first positioning blocks 156, and two first positioning arms 162 respectively extend from the two first positioning blocks 156. The second positioning block structure 154 includes two second positioning blocks 164 and has a second positioning hole structure 166. The second positioning hole structure 166 includes two second positioning holes 168 respectively formed in the two second positioning blocks 164, and two second positioning arms 170 respectively extend from the two second positioning blocks 164. The two first protruding ribs 40 and the two second protruding ribs 46 can protrude from the two first positioning arms 162 and the two second positioning arms 170 respectively into the two positioning guide grooves 30 (not shown in the figure, the relevant description can be deduced by referring to Figure 2).

[0023] Through the above design, the two first positioning holes 160 can be respectively fitted onto two adjacent protruding electronic components 7, and the two second positioning holes 168 can be respectively fitted onto two adjacent protruding electronic components 8. The first rib 40 of each first positioning arm 162 and the second rib 46 of each second positioning arm 170 can be slidably inserted into the corresponding positioning guide groove 30, so that the two first positioning arms 162 and the two second positioning arms 170 surround and clamp the positioning base 14, thereby stably positioning the positioning base 14 on the test circuit board 1. As for other derivative designs of the test fixture 150 (such as 3D printing process design, snap-fit ​​groove structure design, positioning block / positioning base structure thickness design, rib / positioning guide groove structure design, etc.), their related descriptions can be deduced by analogy with the above embodiments, and will not be repeated here.

[0024] In practical applications, the engagement design of the positioning base and the positioning block structure of the present invention is not limited to the concave-convex engagement design shown in Figure 3, but can also adopt a convex-concave engagement design. For example, please refer to Figure 9, which is a cross-sectional schematic diagram of a test fixture 10' proposed according to another embodiment of the present invention. In this embodiment, the elements mentioned in the above embodiment have the same symbols as those in the above embodiment, which represent having the same or similar structure and function, and the relevant descriptions can be deduced by analogy with the above embodiment. As can be seen from Figure 9, unlike the above embodiment, in this embodiment, the test fixture 10' includes a pressing member 16, a positioning base 14', a first positioning block structure 32' and a second positioning block structure (not shown in the figure), and two protruding ribs 40' are respectively formed from the opposite sides of the positioning base 14'.

[0025] The first positioning block structure 32' has a first positioning hole structure 36. The two first positioning arms 38' can be extended from the positions of the first positioning block structure 32' corresponding to the positions of the positioning base 14', and the two positioning guide grooves 30' can be recessed from the positions of the two first positioning arms 38' corresponding to the positions of the two protruding ribs 40'. Through the above design, the first positioning hole structure 36 of the first positioning block structure 32' can be sleeved on the first protruding electronic component 5, and the two protruding ribs 40' of the positioning base 14' can be slidably inserted into the two positioning guide grooves 30' of the first positioning block structure 32', so that the positioning base 14' is positioned and accommodated between the two first positioning arms 38'.

[0026] In addition, the second positioning block structure of the test fixture 10' can also adopt a similar convex-concave interlocking design (the relevant descriptions of the second positioning hole structure / second positioning arm / second positioning guide groove can be deduced from Figure 9, and will not be repeated here) to produce a positioning arm clamping and positioning effect, thereby working together with the first positioning block structure 32' to firmly position the positioning base 14' on the test circuit board 1. As for other derivative designs of the test fixture 10' (such as 3D printing process design, interlocking groove structure design, positioning block / positioning base structure thickness design, convex rib / positioning guide groove structure design, etc.), the relevant descriptions can be deduced from the above embodiments, and will not be repeated here. The above description is only a preferred embodiment of the present invention. All equivalent changes and modifications made within the scope of the claims of the present invention should be included in the scope of the present invention. [Simplified Explanation of the Diagram]

[0027] Figure 1 is a top view of a test fixture installed on a test circuit board according to one embodiment of the present invention. Figure 2 is an exploded view of the test fixture in Figure 1. Figure 3 is a cross-sectional view of the test fixture in Figure 1 along section line AA. Figure 4 is a partially enlarged view of the pressing member in Figure 2. Figure 5 is a partially enlarged view of the positioning base in Figure 2. Figure 6 is a partially enlarged view of the first positioning block structure in Figure 2. Figure 7 is a top view of a test fixture installed on a test circuit board according to another embodiment of the present invention. Figure 8 is a top view of a test fixture installed on a test circuit board according to another embodiment of the present invention. Figure 9 is a cross-sectional view of a test fixture according to another embodiment of the present invention.

Claims

1. A test fixture suitable for positioning a chip under test for electrical connection to a test circuit board, the chip under test having a plurality of pins, the test circuit board having a plurality of test contacts and a probe holder having a plurality of probes, the test fixture comprising: a positioning base having a through hole for receiving the chip under test and positioning it on the test circuit board and for engaging the probe holder, such that the plurality of probes are received in the through hole to mate with the plurality of pins and align with the plurality of test contacts, the through hole wall forming two opposing engagement grooves; and a pressing member having two spring arms, each spring arm having a pressing end protruding into the engagement groove to form a hook, and pressing the chip under test when the pressing member is pressed into the through hole to align and engage with the engagement groove, such that the plurality of pins are electrically connected to the plurality of test contacts via the plurality of probes.

2. The test fixture as described in claim 1, wherein the test circuit board further has at least one first protruding electronic component, and two positioning guide grooves are respectively recessed inward from opposite sides of the positioning base. The test fixture further includes: a first positioning block structure having a first positioning hole structure, two first positioning arms extending from the first positioning block structure at positions corresponding to the opposite sides of the positioning base, two first ribs protruding from the two first positioning arms toward the two positioning guide grooves, the first positioning hole structure being sleeved on the at least one first protruding electronic component and the two first ribs slidingly penetrating the two positioning guide grooves to position and accommodate the positioning base between the two first positioning arms.

3. The test fixture as described in claim 2, wherein the at least one first protruding electronic element comprises two adjacent protruding electronic elements, the first positioning block structure comprises two first positioning blocks, the first positioning hole structure comprises two first positioning holes respectively formed in the two first positioning blocks, and the two first positioning arms respectively extend from the two first positioning blocks; the two first positioning holes are respectively sleeved on the two adjacent protruding electronic elements and the two first ribs are respectively slidably inserted into the two positioning guide grooves to position and accommodate the positioning base between the two first positioning arms.

4. The test fixture as described in claim 2, wherein the positioning base and the first positioning block structure are both formed by stacking multiple structural layers through a 3D printing process.

5. The test fixture as described in claim 4, wherein the thickness of each structure of the first positioning block structure is equal to or a multiple of the thickness of each structure of the positioning base.

6. The test fixture as claimed in claim 5, wherein the thickness of each structure of the first positioning block structure is equal to 0.4 mm, and the thickness of each structure of the positioning base is equal to 0.2 mm.

7. The test fixture as described in claim 2, wherein the first rib is an equilateral triangular prism structure and the positioning guide groove is an equilateral triangle to engage with the first rib in a concave-convex fit.

8. The test fixture as claimed in claim 2, wherein the test circuit board further has at least one second protruding electronic component, the at least one first protruding electronic component and the at least one second protruding electronic component are respectively located on opposite sides of the plurality of test contacts, the test fixture further includes: a second positioning block structure having a second positioning hole structure, two second positioning arms extending from the second positioning block structure at positions corresponding to the opposite sides of the positioning base, two second protruding ribs protruding from the two second positioning arms toward the two positioning guide grooves, the first positioning hole structure and the second positioning hole structure being respectively sleeved on the at least one first protruding electronic component and the at least one second protruding electronic component, and the two first protruding ribs and the two second protruding ribs slidingly penetrating the two positioning guide grooves, such that the two first positioning arms and the two second positioning arms surround and clamp the positioning base.

9. The test fixture as claimed in claim 8, wherein the at least one second protruding electronic element comprises two adjacent protruding electronic elements, the second positioning block structure comprises two second positioning blocks, the second positioning hole structure comprises two second positioning holes respectively formed in the two second positioning blocks, and the two second positioning arms respectively extend from the two second positioning blocks; the two second positioning holes are respectively fitted onto the two adjacent protruding electronic elements, such that the two second positioning blocks are positioned on the circuit board.

10. The test fixture as claimed in claim 8, wherein the positioning base, the first positioning block structure and the second positioning block structure are all formed by stacking a plurality of structural layers through a 3D printing process.

11. The test fixture as claimed in claim 10, wherein the thickness of each of the first positioning block structure and the second positioning block structure is equal to or a multiple of the thickness of each of the positioning base structures.

12. The test fixture as claimed in claim 11, wherein the thickness of each of the first positioning block structure and the second positioning block structure is equal to 0.4 mm, and the thickness of each of the positioning base structures is equal to 0.2 mm.

13. The test fixture as claimed in claim 8, wherein the first rib and the second rib are equilateral triangular prism structures, and the positioning guide groove is equilateral triangular to engage with the first rib and the second rib in a concave-convex fit.

14. The test fixture as described in claim 1, wherein the pressing member is inverted U-shaped.

15. The test fixture as claimed in claim 1, wherein the pressing member is formed by stacking along a thickness direction through a 3D printing process, and the positioning base is formed by stacking a plurality of structural layers through a 3D printing process.

16. The test fixture as claimed in claim 1, wherein at least one of the two spring arms of the pressing member protrudes inwardly by an abutment block to prevent the pressing member from excessively deflecting under pressure.

17. The test fixture as claimed in claim 1, wherein the engagement groove has a horizontal limiting surface and an engagement ramp, the horizontal limiting surface stopping the hook to prevent the hook from disengaging from the engagement groove, and the hook abutting against the engagement ramp to be positioned within the engagement groove.

18. The test fixture as claimed in claim 17, wherein the horizontal limiting surface is at a 45-degree angle to the engaging ramp.

19. The test fixture as claimed in claim 1, wherein the test circuit board further has at least one first protruding electronic component, and two protruding ribs are respectively formed from opposite sides of the positioning base, the test fixture further includes: a first positioning block structure having a first positioning hole structure, two first positioning arms respectively extending from the first positioning block structure at positions corresponding to the opposite sides of the positioning base, two first positioning guide grooves respectively recessed from the two first positioning arms at positions corresponding to the two protruding ribs, the first positioning hole structure being sleeved on the at least one first protruding electronic component and the two protruding ribs respectively slidingly passing through the two first positioning guide grooves to position and accommodate the positioning base between the two first positioning arms.

20. The test fixture as claimed in claim 19, wherein the test circuit board further has at least one second protruding electronic component, the at least one first protruding electronic component and the at least one second protruding electronic component are respectively located on opposite sides of the plurality of test contacts, the test fixture further includes: a second positioning block structure having a second positioning hole structure, two second positioning arms extending from the second positioning block structure at positions corresponding to the opposite sides of the positioning base, two second positioning guide grooves recessed from the two second positioning arms at positions corresponding to the two protruding ribs, the first positioning hole structure and the second positioning hole structure being respectively sleeved on the at least one first protruding electronic component and the at least one second protruding electronic component, and the two protruding ribs slidingly penetrating the two first positioning guide grooves and the two second positioning guide grooves, such that the two first positioning arms and the two second positioning arms surround and clamp the positioning base.

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