A test pin holder structure

Abstract

A test pin holder structure includes: a base, a plurality of insulating support units, a plurality of spring pins, and a plurality of fixing members. The base is made of metal and has a plurality of pin holder slots distributed thereon. The insulating support units are disposed in the corresponding pin holder slots. Each set of spring pins is confined and fixed in the insulating support unit, with only the pin ends of the spring pins exposed through the surfaces at both ends of the insulating support unit. Several fixing members are locked to the base to fix the insulating support units to the base. This structure will not deform under long-term use, and is convenient and quick to repair or modify.

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