Inspection device and inspection method

TW202638074APending Publication Date: 2026-09-16TOKYO WELD CO LTD
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Patent Information

Application Number
TW114144007
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-22
Filing Date
2025-11-12
Publication Date
2026-09-16

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Abstract

The present invention provides an inspection device and an inspection method that facilitate accurate detection of anomalies in capacitors. An inspection device includes: a charging unit that performs charging of a capacitor; a discharging unit that performs discharging the capacitor; a current measurement unit that continuously measures current of the capacitor during the discharging; and an abnormality detection unit that detects an abnormality of the capacitor based on a regression line relating to a discharge characteristic, the regression line being derived from a logarithm of measured values of the current in a determination time range during the discharging and a logarithm of measurement timings of the current.
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