Reflection-based phase contrast microscope system

TW202638116APending Publication Date: 2026-09-16APPL MATERIALS ISRAEL LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW114140206
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-06
Filing Date
2025-10-17
Publication Date
2026-09-16

Smart Images

  • Figure TWG2TA001076331_001
    Figure TWG2TA001076331_001
  • Figure TWG2TA001076331_002
    Figure TWG2TA001076331_002
  • Figure TWG2TA001076331_003
    Figure TWG2TA001076331_003
Patent Text Reader

Abstract

A reflective phase contrast microscope system, and a corresponding inspection system are described. The phase contrast microscope comprises an illumination channel, a collection channel, a space variant beam splitting unit and an objective lens arrangement. The space variant beam splitting unit comprises a pattern of transmitting regions and at least one partly reflecting region. Wherein the partly reflecting regions have a form that, when reflecting light toward the objective lens or coming from the objective lens, the reflected light pattern forms a ring illumination pattern.
Need to check novelty before this filing date? Find Prior Art