Machine learning devices for images, image processing systems equipped with machine learning devices for images, and machine learning methods for images.

TW202638310APending Publication Date: 2026-09-16HITACHI HIGH TECH CORP
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Patent Information

Application Number
TW114131404
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-11
Filing Date
2025-08-18
Publication Date
2026-09-16

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Abstract

The machine learning apparatus of the present invention comprises: a dataset memory unit storing a first dataset; a first model learned using the first dataset; a degradation detection unit detecting degradation of the inference result inferred by the first model for an inference object image from an external device; a dataset processing unit processing the first dataset to obtain a second dataset based on the degradation detection result of the degradation detection unit; a relearning dataset memory unit storing the second dataset; and a second model learned using the second dataset; and further comprises: a differential verification unit acquiring a first inference result and a second inference result obtained by inferring the data in the dataset memory unit and the relearning dataset memory unit using the first model, and a third inference result and a fourth inference result obtained by inferring the data in the dataset memory unit and the relearning dataset memory unit using the second model, and providing evaluation results of the changes between the first inference result and the second inference result, and the changes between the third inference result and the fourth inference result.
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