Suitable determination device and suitable determination method

TW202638362APending Publication Date: 2026-09-16HITACHI HIGH TECH CORP
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Patent Information

Application Number
TW115102727
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-02-28
Filing Date
2026-01-23
Publication Date
2026-09-16

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Abstract

A suitability determination device (100) having a processor and a memory, wherein the memory stores a suitability region (25) of a learning model (23); the suitability region (25) is generated using first difference information; the first difference information represents the difference between the input image of the learning model (23) used for image processing and other images when the learning model (23) performs machine learning; the processor outputs the result of determining whether the second difference information is suitable for the suitability region (25) as suitability information (26); the second difference information represents the difference between the application image input to the learning model (23) and the output application image.
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